{"id":"https://openalex.org/W81089015","doi":"https://doi.org/10.1109/tr.2014.2299495","title":"Reliability Properties of $(n,f,k)$ Systems","display_name":"Reliability Properties of $(n,f,k)$ Systems","publication_year":2014,"publication_date":"2014-01-31","ids":{"openalex":"https://openalex.org/W81089015","doi":"https://doi.org/10.1109/tr.2014.2299495","mag":"81089015"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2014.2299495","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2014.2299495","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044582544","display_name":"Ioannis S. Triantafyllou","orcid":"https://orcid.org/0000-0002-7512-5217"},"institutions":[{"id":"https://openalex.org/I154757721","display_name":"University of Piraeus","ror":"https://ror.org/02qs84g94","country_code":"GR","type":"education","lineage":["https://openalex.org/I154757721"]}],"countries":["GR"],"is_corresponding":true,"raw_author_name":"Ioannis S. Triantafyllou","raw_affiliation_strings":["Department of Statistics and Insurance Science, University of Piraeus, Piraeus, Greece","Dept. of Stat. & Insurance Sci., Univ. of Piraeus, Piraeus, Greece"],"affiliations":[{"raw_affiliation_string":"Department of Statistics and Insurance Science, University of Piraeus, Piraeus, Greece","institution_ids":["https://openalex.org/I154757721"]},{"raw_affiliation_string":"Dept. of Stat. & Insurance Sci., Univ. of Piraeus, Piraeus, Greece","institution_ids":["https://openalex.org/I154757721"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041687981","display_name":"Markos V. Koutras","orcid":"https://orcid.org/0000-0001-5160-2405"},"institutions":[{"id":"https://openalex.org/I154757721","display_name":"University of Piraeus","ror":"https://ror.org/02qs84g94","country_code":"GR","type":"education","lineage":["https://openalex.org/I154757721"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Markos V. Koutras","raw_affiliation_strings":["Department of Statistics and Insurance Science, University of Piraeus, Piraeus, Greece","Dept. of Stat. & Insurance Sci., Univ. of Piraeus, Piraeus, Greece"],"affiliations":[{"raw_affiliation_string":"Department of Statistics and Insurance Science, University of Piraeus, Piraeus, Greece","institution_ids":["https://openalex.org/I154757721"]},{"raw_affiliation_string":"Dept. of Stat. & Insurance Sci., Univ. of Piraeus, Piraeus, Greece","institution_ids":["https://openalex.org/I154757721"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5044582544"],"corresponding_institution_ids":["https://openalex.org/I154757721"],"apc_list":null,"apc_paid":null,"fwci":4.2322,"has_fulltext":false,"cited_by_count":33,"citation_normalized_percentile":{"value":0.94302915,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"63","issue":"1","first_page":"357","last_page":"366"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11720","display_name":"Probability and Risk Models","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/notation","display_name":"Notation","score":0.7958382368087769},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7032758593559265},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.5079737305641174},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.5030617117881775},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42828431725502014},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.40660011768341064},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.38507765531539917},{"id":"https://openalex.org/keywords/discrete-mathematics","display_name":"Discrete mathematics","score":0.3701244592666626},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.15049433708190918},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.11831611394882202},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09255263209342957},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.0699632465839386}],"concepts":[{"id":"https://openalex.org/C45357846","wikidata":"https://www.wikidata.org/wiki/Q2001982","display_name":"Notation","level":2,"score":0.7958382368087769},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7032758593559265},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.5079737305641174},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.5030617117881775},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42828431725502014},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.40660011768341064},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.38507765531539917},{"id":"https://openalex.org/C118615104","wikidata":"https://www.wikidata.org/wiki/Q121416","display_name":"Discrete mathematics","level":1,"score":0.3701244592666626},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.15049433708190918},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.11831611394882202},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09255263209342957},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.0699632465839386},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2014.2299495","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2014.2299495","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W1498308418","https://openalex.org/W1975061404","https://openalex.org/W1978703917","https://openalex.org/W1979793002","https://openalex.org/W1988103641","https://openalex.org/W2002064555","https://openalex.org/W2004567334","https://openalex.org/W2008312948","https://openalex.org/W2010026686","https://openalex.org/W2012130689","https://openalex.org/W2016812856","https://openalex.org/W2019897186","https://openalex.org/W2027855608","https://openalex.org/W2033944127","https://openalex.org/W2036370633","https://openalex.org/W2062979175","https://openalex.org/W2084802219","https://openalex.org/W2085988852","https://openalex.org/W2090696917","https://openalex.org/W2097166167","https://openalex.org/W2107928274","https://openalex.org/W2112126398","https://openalex.org/W2113776339","https://openalex.org/W2114225483","https://openalex.org/W2125540076","https://openalex.org/W2127784852","https://openalex.org/W2130461218","https://openalex.org/W2133939054","https://openalex.org/W2156099708","https://openalex.org/W2159854031","https://openalex.org/W2168614764","https://openalex.org/W2325167669","https://openalex.org/W2482597653","https://openalex.org/W2504767107","https://openalex.org/W2750031545"],"related_works":["https://openalex.org/W2504004674","https://openalex.org/W4234640806","https://openalex.org/W2322306178","https://openalex.org/W2803158971","https://openalex.org/W2418268462","https://openalex.org/W2374141191","https://openalex.org/W4386007221","https://openalex.org/W4251848739","https://openalex.org/W4311657253","https://openalex.org/W2966700615"],"abstract_inverted_index":{"In":[0,52],"the":[1,21,34,55,86],"present":[2,79],"article":[3],"we":[4,32,66],"study":[5],"several":[6,80],"reliability":[7,50,72],"properties":[8],"of":[9,37,88],"<formula":[10,24,58,89],"formulatype=\"inline\"":[11,25,59,90],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[12,26,60,91],"xmlns:xlink=\"http://www.w3.org/1999/xlink\"><tex":[13,27,61,92],"Notation=\"TeX\">$(n,":[14,93],"f,":[15,94],"k)$</tex></formula>":[16,95],"systems.":[17,96],"More":[18],"specifically,":[19],"for":[20,44,54],"special":[22],"case":[23,57],"Notation=\"TeX\">$k":[28],"=":[29],"2$</tex></formula>":[30],",":[31,65],"deduce":[33],"generating":[35],"function":[36],"a":[38],"system's":[39],"reliability,":[40],"and":[41,49,78,82],"discuss":[42],"techniques":[43],"evaluating":[45],"its":[46],"signature":[47],"vector":[48],"function.":[51],"addition,":[53],"general":[56],"Notation=\"TeX\">$(k":[62],"\\geq":[63],"2)$</tex></formula>":[64],"establish":[67],"some":[68],"stochastic":[69],"comparisons":[70],"between":[71],"structures'":[73],"lifetimes":[74,87],"using":[75],"their":[76],"signatures,":[77],"results":[81],"applications":[83],"pertaining":[84],"to":[85]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":4},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}