{"id":"https://openalex.org/W2037355783","doi":"https://doi.org/10.1109/tr.2013.2270424","title":"A Bayesian Approach for System Reliability Analysis With Multilevel Pass-Fail, Lifetime and Degradation Data Sets","display_name":"A Bayesian Approach for System Reliability Analysis With Multilevel Pass-Fail, Lifetime and Degradation Data Sets","publication_year":2013,"publication_date":"2013-07-02","ids":{"openalex":"https://openalex.org/W2037355783","doi":"https://doi.org/10.1109/tr.2013.2270424","mag":"2037355783"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2013.2270424","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2013.2270424","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003022560","display_name":"Weiwen Peng","orcid":"https://orcid.org/0000-0001-9535-9187"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Weiwen Peng","raw_affiliation_strings":["School of Mechanical, Electronic and Industrial Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","Sch. of Mech., Electron., & Ind. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical, Electronic and Industrial Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Sch. of Mech., Electron., & Ind. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113467060","display_name":"Hong\u2010Zhong Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hong-Zhong Huang","raw_affiliation_strings":["School of Mechanical, Electronic and Industrial Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","Sch. of Mech., Electron., & Ind. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical, Electronic and Industrial Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Sch. of Mech., Electron., & Ind. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070592593","display_name":"Min Xie","orcid":"https://orcid.org/0000-0002-8500-8364"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Min Xie","raw_affiliation_strings":["Department of System Engineering and EngineeringManagement, City University of Hong Kong, Hong Kong, China","Dept. of Syst. Eng. & Eng. Manage., City Univ. of Hong Kong, Kowloon, China"],"affiliations":[{"raw_affiliation_string":"Department of System Engineering and EngineeringManagement, City University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I168719708"]},{"raw_affiliation_string":"Dept. of Syst. Eng. & Eng. Manage., City Univ. of Hong Kong, Kowloon, China","institution_ids":["https://openalex.org/I168719708"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101589277","display_name":"Yuan\u2010Jian Yang","orcid":"https://orcid.org/0000-0001-7113-1989"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuanjian Yang","raw_affiliation_strings":["School of Mechanical, Electronic and Industrial Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","Sch. of Mech., Electron., & Ind. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical, Electronic and Industrial Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Sch. of Mech., Electron., & Ind. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100606482","display_name":"Yu Liu","orcid":"https://orcid.org/0000-0003-4320-2721"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Liu","raw_affiliation_strings":["School of Mechanical, Electronic and Industrial Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","Sch. of Mech., Electron., & Ind. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical, Electronic and Industrial Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Sch. of Mech., Electron., & Ind. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5003022560"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":null,"apc_paid":null,"fwci":18.3618,"has_fulltext":false,"cited_by_count":66,"citation_normalized_percentile":{"value":0.99191489,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"62","issue":"3","first_page":"689","last_page":"699"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7347985506057739},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6635635495185852},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6465844511985779},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.5979185700416565},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.5702371597290039},{"id":"https://openalex.org/keywords/bayesian-network","display_name":"Bayesian network","score":0.47759485244750977},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.29743868112564087},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22228536009788513},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1968345046043396}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7347985506057739},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6635635495185852},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6465844511985779},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.5979185700416565},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5702371597290039},{"id":"https://openalex.org/C33724603","wikidata":"https://www.wikidata.org/wiki/Q812540","display_name":"Bayesian network","level":2,"score":0.47759485244750977},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.29743868112564087},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22228536009788513},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1968345046043396},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2013.2270424","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2013.2270424","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.5799999833106995}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":50,"referenced_works":["https://openalex.org/W1468265268","https://openalex.org/W1517555081","https://openalex.org/W1527260353","https://openalex.org/W1550064664","https://openalex.org/W1982286208","https://openalex.org/W1991588194","https://openalex.org/W2000439368","https://openalex.org/W2008202990","https://openalex.org/W2012552489","https://openalex.org/W2017899835","https://openalex.org/W2019981073","https://openalex.org/W2035100231","https://openalex.org/W2065641649","https://openalex.org/W2065692764","https://openalex.org/W2067266460","https://openalex.org/W2070645909","https://openalex.org/W2072430699","https://openalex.org/W2072755336","https://openalex.org/W2073057596","https://openalex.org/W2076466470","https://openalex.org/W2079777527","https://openalex.org/W2083875149","https://openalex.org/W2083899047","https://openalex.org/W2085506416","https://openalex.org/W2088490356","https://openalex.org/W2093095043","https://openalex.org/W2093188623","https://openalex.org/W2105931800","https://openalex.org/W2106675691","https://openalex.org/W2107680533","https://openalex.org/W2108681209","https://openalex.org/W2110554687","https://openalex.org/W2110699330","https://openalex.org/W2118873553","https://openalex.org/W2120614393","https://openalex.org/W2128592203","https://openalex.org/W2137951154","https://openalex.org/W2147197289","https://openalex.org/W2158303746","https://openalex.org/W2159365100","https://openalex.org/W2199343381","https://openalex.org/W2332605258","https://openalex.org/W2462462151","https://openalex.org/W2950314238","https://openalex.org/W3038331081","https://openalex.org/W4232685182","https://openalex.org/W4246386643","https://openalex.org/W4255988776","https://openalex.org/W4388319802","https://openalex.org/W6857876722"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"Reliability":[0],"analysis":[1,150],"of":[2,52,127,142,151],"complex":[3],"systems":[4],"is":[5,146],"a":[6,19,45,95,124,132,152],"critical":[7],"issue":[8],"in":[9,39],"reliability":[10,24,76,108,149],"engineering.":[11],"Motivated":[12],"by":[13],"practical":[14,97],"needs,":[15],"this":[16,129],"paper":[17],"investigates":[18],"Bayesian":[20,47,118],"approach":[21,79,130,145],"for":[22,49,74,99,107,135],"system":[23,69,75,136],"assessment":[25,109],"and":[26,64,93,110,138],"prediction":[27,111],"with":[28,86,148],"multilevel":[29,53,88],"heterogeneous":[30,54],"data":[31,55,66],"sets.":[32,56],"Two":[33],"major":[34],"imperatives":[35],"have":[36],"been":[37],"handled":[38],"the":[40,50,59,82,105,116,143],"proposed":[41,117,144],"approach,":[42],"which":[43],"provides":[44],"comprehensive":[46],"framework":[48],"integration":[51],"In":[57,103],"particular,":[58],"pass-fail":[60,89],"data,":[61,63,92],"lifetime":[62,91],"degradation":[65],"at":[67],"different":[68],"levels":[70],"are":[71,112],"combined":[72],"coherently":[73,114],"analysis.":[77],"This":[78],"goes":[80],"beyond":[81],"alternatives":[83],"that":[84],"deal":[85],"solely":[87],"or":[90],"presents":[94],"more":[96],"tool":[98],"real":[100],"engineering":[101],"applications.":[102],"addition,":[104],"indices":[106],"constructed":[113],"within":[115],"framework.":[119],"It":[120],"gives":[121],"rise":[122],"to":[123],"natural":[125],"manner":[126],"incorporating":[128],"into":[131],"decision-making":[133],"procedure":[134],"operation":[137],"management.":[139],"The":[140],"effectiveness":[141],"illustrated":[147],"navigation":[153],"satellite.":[154]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":10},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":8},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":8},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}