{"id":"https://openalex.org/W2053986364","doi":"https://doi.org/10.1109/tr.2013.2270415","title":"Reliability of Series-Parallel Systems With Random Failure Propagation Time","display_name":"Reliability of Series-Parallel Systems With Random Failure Propagation Time","publication_year":2013,"publication_date":"2013-07-01","ids":{"openalex":"https://openalex.org/W2053986364","doi":"https://doi.org/10.1109/tr.2013.2270415","mag":"2053986364"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2013.2270415","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2013.2270415","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022208409","display_name":"Gregory Levitin","orcid":"https://orcid.org/0000-0002-2107-8291"},"institutions":[{"id":"https://openalex.org/I80687555","display_name":"Israel Electric (Israel)","ror":"https://ror.org/01p8dnv11","country_code":"IL","type":"company","lineage":["https://openalex.org/I80687555"]}],"countries":["IL"],"is_corresponding":true,"raw_author_name":"Gregory Levitin","raw_affiliation_strings":["Israel Electric Corp, Haifa, Haifa, IL","Reliability Dept., Israel Electr. Corp., Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Israel Electric Corp, Haifa, Haifa, IL","institution_ids":["https://openalex.org/I80687555"]},{"raw_affiliation_string":"Reliability Dept., Israel Electr. Corp., Haifa, Israel","institution_ids":["https://openalex.org/I80687555"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114377940","display_name":"Liudong Xing","orcid":"https://orcid.org/0000-0003-1606-1644"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liudong Xing","raw_affiliation_strings":["Collaborative Autonomic Computing Laboratory, School of Computer Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China","Collaborative Autonomic Comput. Lab., Univ. ofElectronics Sci. & Technol. of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"Collaborative Autonomic Computing Laboratory, School of Computer Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Collaborative Autonomic Comput. Lab., Univ. ofElectronics Sci. & Technol. of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034860356","display_name":"Hanoch Ben-Haim","orcid":null},"institutions":[{"id":"https://openalex.org/I80687555","display_name":"Israel Electric (Israel)","ror":"https://ror.org/01p8dnv11","country_code":"IL","type":"company","lineage":["https://openalex.org/I80687555"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Hanoch Ben-Haim","raw_affiliation_strings":["Reliability Department, Israel Electric Corporation Limited, Haifa, Israel","Reliability Dept., Israel Electr. Corp., Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Reliability Department, Israel Electric Corporation Limited, Haifa, Israel","institution_ids":["https://openalex.org/I80687555"]},{"raw_affiliation_string":"Reliability Dept., Israel Electr. Corp., Haifa, Israel","institution_ids":["https://openalex.org/I80687555"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113616242","display_name":"Yuanshun Dai","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuanshun Dai","raw_affiliation_strings":["Collaborative Autonomic Computing Laboratory, School of Computer Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China","Collaborative Autonomic Comput. Lab., Univ. ofElectronics Sci. & Technol. of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"Collaborative Autonomic Computing Laboratory, School of Computer Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Collaborative Autonomic Comput. Lab., Univ. ofElectronics Sci. & Technol. of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5022208409"],"corresponding_institution_ids":["https://openalex.org/I80687555"],"apc_list":null,"apc_paid":null,"fwci":17.4882,"has_fulltext":false,"cited_by_count":69,"citation_normalized_percentile":{"value":0.99082786,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"62","issue":"3","first_page":"637","last_page":"647"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-block-diagram","display_name":"Reliability block diagram","score":0.7820461988449097},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7314420342445374},{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.6436449885368347},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.5987336039543152},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5777612924575806},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5158621668815613},{"id":"https://openalex.org/keywords/series-and-parallel-circuits","display_name":"Series and parallel circuits","score":0.4983959197998047},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.4571947157382965},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.42707934975624084},{"id":"https://openalex.org/keywords/block-diagram","display_name":"Block diagram","score":0.42039763927459717},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.41384562849998474},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26329702138900757},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.2542512118816376},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2423395812511444},{"id":"https://openalex.org/keywords/fault-tree-analysis","display_name":"Fault tree analysis","score":0.19403931498527527}],"concepts":[{"id":"https://openalex.org/C18074226","wikidata":"https://www.wikidata.org/wiki/Q7310986","display_name":"Reliability block diagram","level":3,"score":0.7820461988449097},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7314420342445374},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.6436449885368347},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.5987336039543152},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5777612924575806},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5158621668815613},{"id":"https://openalex.org/C95023266","wikidata":"https://www.wikidata.org/wiki/Q55738334","display_name":"Series and parallel circuits","level":3,"score":0.4983959197998047},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.4571947157382965},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.42707934975624084},{"id":"https://openalex.org/C149227320","wikidata":"https://www.wikidata.org/wiki/Q884718","display_name":"Block diagram","level":2,"score":0.42039763927459717},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.41384562849998474},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26329702138900757},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.2542512118816376},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2423395812511444},{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.19403931498527527},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2013.2270415","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2013.2270415","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W642414339","https://openalex.org/W651391931","https://openalex.org/W1559737650","https://openalex.org/W1968389769","https://openalex.org/W1969567850","https://openalex.org/W1972616617","https://openalex.org/W1980217872","https://openalex.org/W1984229396","https://openalex.org/W2002676906","https://openalex.org/W2003558009","https://openalex.org/W2014560923","https://openalex.org/W2027486186","https://openalex.org/W2028837311","https://openalex.org/W2069452837","https://openalex.org/W2071907743","https://openalex.org/W2072430699","https://openalex.org/W2074521934","https://openalex.org/W2076663976","https://openalex.org/W2084198549","https://openalex.org/W2103452377","https://openalex.org/W2110084489","https://openalex.org/W2120952376","https://openalex.org/W2121112693","https://openalex.org/W2125911189","https://openalex.org/W2129159945","https://openalex.org/W2130091450","https://openalex.org/W2131069178","https://openalex.org/W2137984519","https://openalex.org/W2139272526","https://openalex.org/W2140018358","https://openalex.org/W2147455959","https://openalex.org/W2149342955","https://openalex.org/W2155405999","https://openalex.org/W3096364625","https://openalex.org/W4255988776","https://openalex.org/W6620895753","https://openalex.org/W6657577495"],"related_works":["https://openalex.org/W2809205509","https://openalex.org/W2914999846","https://openalex.org/W2348369745","https://openalex.org/W4309760074","https://openalex.org/W2483838562","https://openalex.org/W2084019529","https://openalex.org/W2576318233","https://openalex.org/W208206822","https://openalex.org/W2586159183","https://openalex.org/W1990124150"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"an":[3,99],"algorithm":[4,73],"for":[5,107],"evaluating":[6],"the":[7,41,77,114],"reliability":[8,85],"and":[9,82,95],"performance":[10],"distribution":[11],"of":[12,25,50,53,91,93,110],"complex":[13],"non-repairable":[14],"series-parallel":[15],"multi-state":[16],"systems":[17],"with":[18,67],"common":[19,115],"cause":[20,48,116],"failures":[21,26,42,49],"caused":[22],"by":[23,98,113],"propagation":[24,32,58],"in":[27],"system":[28,54],"elements.":[29,55],"The":[30,56,71,102],"failure":[31,57],"can":[33,47],"have":[34],"a":[35,64,68,83],"selective":[36],"effect,":[37],"which":[38],"means":[39],"that":[40],"originating":[43],"from":[44],"different":[45,51],"elements":[46,94,111],"subsets":[52],"time":[59],"is":[60,74,105],"assumed":[61],"to":[62],"be":[63],"random":[65],"value":[66],"given":[69],"distribution.":[70],"suggested":[72],"based":[75],"on":[76],"universal":[78],"generating":[79],"function":[80],"approach,":[81],"generalized":[84],"block":[86],"diagram":[87],"method":[88],"(recursive":[89],"aggregation":[90],"pairs":[92],"their":[96],"replacement":[97],"equivalent":[100],"one).":[101],"evaluation":[103],"procedure":[104],"repeated":[106],"each":[108],"combination":[109],"affected":[112],"failures.":[117],"Illustrative":[118],"examples":[119],"are":[120],"provided.":[121]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":8},{"year":2018,"cited_by_count":9},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":9},{"year":2014,"cited_by_count":5},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}