{"id":"https://openalex.org/W2090298807","doi":"https://doi.org/10.1109/tr.2013.2259195","title":"A Multistage Sequential Test Allocation for Software Reliability Estimation","display_name":"A Multistage Sequential Test Allocation for Software Reliability Estimation","publication_year":2013,"publication_date":"2013-04-26","ids":{"openalex":"https://openalex.org/W2090298807","doi":"https://doi.org/10.1109/tr.2013.2259195","mag":"2090298807"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2013.2259195","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2013.2259195","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049996716","display_name":"Kamel Rekab","orcid":null},"institutions":[{"id":"https://openalex.org/I75421653","display_name":"University of Missouri\u2013Kansas City","ror":"https://ror.org/01w0d5g70","country_code":"US","type":"education","lineage":["https://openalex.org/I75421653"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Rekab","raw_affiliation_strings":["Department of Mathematics and Statistics, University of Missouri-Kansas City, Kansas, MO, USA","Dept. of Math. & Stat., Univ. of Missouri-Kansas City, Kansas City, MO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mathematics and Statistics, University of Missouri-Kansas City, Kansas, MO, USA","institution_ids":["https://openalex.org/I75421653"]},{"raw_affiliation_string":"Dept. of Math. & Stat., Univ. of Missouri-Kansas City, Kansas City, MO, USA","institution_ids":["https://openalex.org/I75421653"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042557132","display_name":"Herbert H. Thompson","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"H. Thompson","raw_affiliation_strings":["Security Innovation, Melbourne, FL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Security Innovation, Melbourne, FL, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5107837750","display_name":"Wei Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I75421653","display_name":"University of Missouri\u2013Kansas City","ror":"https://ror.org/01w0d5g70","country_code":"US","type":"education","lineage":["https://openalex.org/I75421653"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wei Wu","raw_affiliation_strings":["Department of Mathematics and Statistics, University of Missouri-Kansas City, Kansas, MO, USA","Dept. of Math. & Stat., Univ. of Missouri-Kansas City, Kansas City, MO, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mathematics and Statistics, University of Missouri-Kansas City, Kansas, MO, USA","institution_ids":["https://openalex.org/I75421653"]},{"raw_affiliation_string":"Dept. of Math. & Stat., Univ. of Missouri-Kansas City, Kansas City, MO, USA","institution_ids":["https://openalex.org/I75421653"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":3.3218,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.92631329,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"62","issue":"2","first_page":"424","last_page":"433"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/estimator","display_name":"Estimator","score":0.6354564428329468},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6012851595878601},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5511358976364136},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.539649486541748},{"id":"https://openalex.org/keywords/importance-sampling","display_name":"Importance sampling","score":0.49850893020629883},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.47366222739219666},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.4591493010520935},{"id":"https://openalex.org/keywords/bayes-theorem","display_name":"Bayes' theorem","score":0.45081526041030884},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.42674127221107483},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.3966851830482483},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3925971984863281},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.36652907729148865},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.3536158800125122},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.24591737985610962},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13163602352142334},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1138353943824768},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.0986502468585968}],"concepts":[{"id":"https://openalex.org/C185429906","wikidata":"https://www.wikidata.org/wiki/Q1130160","display_name":"Estimator","level":2,"score":0.6354564428329468},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6012851595878601},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5511358976364136},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.539649486541748},{"id":"https://openalex.org/C52740198","wikidata":"https://www.wikidata.org/wiki/Q1539564","display_name":"Importance sampling","level":3,"score":0.49850893020629883},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.47366222739219666},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4591493010520935},{"id":"https://openalex.org/C207201462","wikidata":"https://www.wikidata.org/wiki/Q182505","display_name":"Bayes' theorem","level":3,"score":0.45081526041030884},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.42674127221107483},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.3966851830482483},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3925971984863281},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.36652907729148865},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.3536158800125122},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.24591737985610962},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13163602352142334},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1138353943824768},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.0986502468585968},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2013.2259195","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2013.2259195","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W88925012","https://openalex.org/W199944580","https://openalex.org/W1697627165","https://openalex.org/W1849667096","https://openalex.org/W1903821330","https://openalex.org/W1963842340","https://openalex.org/W1964642955","https://openalex.org/W1988520084","https://openalex.org/W2015123066","https://openalex.org/W2060166917","https://openalex.org/W2060958500","https://openalex.org/W2067232019","https://openalex.org/W2105150259","https://openalex.org/W2112670506","https://openalex.org/W2117963349","https://openalex.org/W2120340873","https://openalex.org/W2125539770","https://openalex.org/W2133188103","https://openalex.org/W2133192812","https://openalex.org/W2141794768","https://openalex.org/W2142445767","https://openalex.org/W2144361182","https://openalex.org/W2144956041","https://openalex.org/W2156771646","https://openalex.org/W2164501290","https://openalex.org/W2625063822","https://openalex.org/W2796556654","https://openalex.org/W4213201159","https://openalex.org/W4285719527","https://openalex.org/W6603622287","https://openalex.org/W6608152521","https://openalex.org/W6637582811","https://openalex.org/W6678758231","https://openalex.org/W6679930802"],"related_works":["https://openalex.org/W4287880334","https://openalex.org/W4366700029","https://openalex.org/W4285230481","https://openalex.org/W4385769873","https://openalex.org/W2015759683","https://openalex.org/W4281634296","https://openalex.org/W4319161863","https://openalex.org/W2371687270","https://openalex.org/W4307819175","https://openalex.org/W4311888330"],"abstract_inverted_index":{"We":[0,91,103],"propose":[1],"a":[2,73,109],"method":[3],"to":[4,7,17,43],"determine":[5],"how":[6],"sequentially":[8],"allocate":[9],"test":[10,37,51],"cases":[11,38,52],"among":[12],"partitions":[13],"of":[14,27,35,50,81,125],"the":[15,19,24,28,32,48,69,106,114,126,131],"software":[16,36],"minimize":[18],"expected":[20,127],"loss":[21,128],"incurred":[22,129],"by":[23,136],"Bayes":[25,138],"estimator":[26,139],"overall":[29,132],"reliability":[30,60,133],"when":[31,130],"total":[33],"number":[34],"is":[39,57,134],"fixed.":[40],"In":[41],"contrast":[42],"fixed":[44,116],"sampling":[45,111,117],"schemes,":[46],"where":[47],"proportion":[49],"taken":[53],"from":[54,83,89,108],"each":[55],"partition":[56],"determined":[58],"before":[59],"testing":[61,70,86],"begins,":[62],"we":[63,77,101],"make":[64],"allocation":[65],"decisions":[66],"dynamically":[67],"throughout":[68],"process.":[71],"Using":[72],"fully":[74],"Bayesian":[75],"approach,":[76],"can":[78],"take":[79],"advantage":[80],"information":[82],"previous":[84],"functional":[85],"and":[87,119,142],"insights":[88],"developers.":[90],"then":[92],"refine":[93],"these":[94],"estimates":[95],"in":[96,123],"an":[97],"iterative":[98],"manner":[99],"as":[100],"sample.":[102],"also":[104],"compare":[105],"results":[107],"multistage":[110],"scheme":[112],"with":[113],"optimal":[115],"scheme,":[118],"demonstrate":[120],"its":[121,137],"superiority":[122],"terms":[124],"estimated":[135],"both":[140],"theoretically":[141],"through":[143],"Monte":[144],"Carlo":[145],"simulations.":[146]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":4},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":3}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}