{"id":"https://openalex.org/W2000201823","doi":"https://doi.org/10.1109/tr.2013.2240901","title":"Using Single Error Correction Codes to Protect Against Isolated Defects and Soft Errors","display_name":"Using Single Error Correction Codes to Protect Against Isolated Defects and Soft Errors","publication_year":2013,"publication_date":"2013-01-29","ids":{"openalex":"https://openalex.org/W2000201823","doi":"https://doi.org/10.1109/tr.2013.2240901","mag":"2000201823"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2013.2240901","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2013.2240901","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058001228","display_name":"Costas Argyrides","orcid":"https://orcid.org/0000-0002-9869-2345"},"institutions":[{"id":"https://openalex.org/I4210104221","display_name":"Limassol General Hospital","ror":"https://ror.org/00v7z6m55","country_code":"CY","type":"healthcare","lineage":["https://openalex.org/I4210104221","https://openalex.org/I4210137065"]}],"countries":["CY"],"is_corresponding":false,"raw_author_name":"Costas Argyrides","raw_affiliation_strings":["Research Division, EVOLVI.T., Limassol, Cyprus","Res. Div., EVOLVI.T., Limassol, Cyprus"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Division, EVOLVI.T., Limassol, Cyprus","institution_ids":["https://openalex.org/I4210104221"]},{"raw_affiliation_string":"Res. Div., EVOLVI.T., Limassol, Cyprus","institution_ids":["https://openalex.org/I4210104221"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080322790","display_name":"Pedro Reviriego","orcid":"https://orcid.org/0000-0003-2540-5234"},"institutions":[{"id":"https://openalex.org/I3020445194","display_name":"Universidad Nebrija","ror":"https://ror.org/03tzyrt94","country_code":"ES","type":"education","lineage":["https://openalex.org/I3020445194"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Pedro Reviriego","raw_affiliation_strings":["Departmento de Ingenieria Informatica, Universidad Antonio de Nebrija, Madrid, Spain","Dept. de Ing. Inf., Univ. Antonio de Nebrija, Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Departmento de Ingenieria Informatica, Universidad Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]},{"raw_affiliation_string":"Dept. de Ing. Inf., Univ. Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044495372","display_name":"Juan Antonio Maestro","orcid":"https://orcid.org/0000-0001-7133-9026"},"institutions":[{"id":"https://openalex.org/I3020445194","display_name":"Universidad Nebrija","ror":"https://ror.org/03tzyrt94","country_code":"ES","type":"education","lineage":["https://openalex.org/I3020445194"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Juan Antonio Maestro","raw_affiliation_strings":["Departmento de Ingenieria Informatica, Universidad Antonio de Nebrija, Madrid, Spain","Dept. de Ing. Inf., Univ. Antonio de Nebrija, Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Departmento de Ingenieria Informatica, Universidad Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]},{"raw_affiliation_string":"Dept. de Ing. Inf., Univ. Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.2325,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.81160624,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"62","issue":"1","first_page":"238","last_page":"243"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.8459281921386719},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7581648826599121},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.7174299955368042},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7008944153785706},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6510102152824402},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.6111215949058533},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4584926664829254},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.17347395420074463},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1371193826198578}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.8459281921386719},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7581648826599121},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.7174299955368042},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7008944153785706},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6510102152824402},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.6111215949058533},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4584926664829254},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.17347395420074463},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1371193826198578},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2013.2240901","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2013.2240901","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","score":0.4099999964237213,"display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1922918362","https://openalex.org/W1980073965","https://openalex.org/W2021708499","https://openalex.org/W2029692888","https://openalex.org/W2090813909","https://openalex.org/W2110196049","https://openalex.org/W2116556855","https://openalex.org/W2118637853","https://openalex.org/W2119482888","https://openalex.org/W2124241199","https://openalex.org/W2127178251","https://openalex.org/W2134822007","https://openalex.org/W2151529344","https://openalex.org/W2154138727","https://openalex.org/W2159103279","https://openalex.org/W2165023673","https://openalex.org/W2167950192","https://openalex.org/W2169087039","https://openalex.org/W2171372273","https://openalex.org/W2342204193","https://openalex.org/W6677993950"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W2110842462","https://openalex.org/W4233757488"],"abstract_inverted_index":{"Different":[0],"techniques":[1,13],"have":[2,31,93],"been":[3,32],"used":[4,16,24],"to":[5,34,39,63,75,92,126],"deal":[6,40],"with":[7,41],"defects":[8],"and":[9,108],"soft":[10,26,64,77],"errors.":[11,27,78],"Repair":[12],"are":[14,23,90],"commonly":[15],"for":[17,25],"defects,":[18,68],"while":[19],"error":[20,36,57],"correction":[21,37,58],"codes":[22,38],"Recently,":[28],"some":[29],"proposals":[30],"made":[33],"use":[35,56],"defects.":[42],"In":[43],"this":[44],"paper,":[45],"we":[46],"analyze":[47],"the":[48,70,136],"impact":[49,96],"on":[50,97],"reliability":[51,105,121],"of":[52,72,124,130,138],"such":[53],"approaches":[54],"that":[55,82,102,113,129],"codes,":[59],"which":[60],"in":[61,122],"addition":[62],"errors":[65],"can":[66,103,117],"resolve":[67],"at":[69,135],"cost":[71,137],"reduced":[73],"ability":[74],"correct":[76],"The":[79,110],"results":[80,111],"showed":[81],"low":[83,95],"defect":[84,132],"rates":[85],"or":[86],"small":[87],"memory":[88,134],"sizes":[89],"required":[91],"a":[94,100,119,131,139],"reliability.":[98],"Additionally,":[99],"technique":[101],"improve":[104],"is":[106],"proposed":[107],"analyzed.":[109],"show":[112],"our":[114],"new":[115],"approach":[116],"achieve":[118],"similar":[120],"terms":[123],"time":[125],"failure":[127],"as":[128],"free":[133],"more":[140],"complex":[141],"decoding":[142],"algorithm.":[143]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-15T18:14:33.161393","created_date":"2025-10-10T00:00:00"}