{"id":"https://openalex.org/W2006347217","doi":"https://doi.org/10.1109/tr.2012.2220697","title":"Methodology and Framework for Predicting Helicopter Rolling Element Bearing Failure","display_name":"Methodology and Framework for Predicting Helicopter Rolling Element Bearing Failure","publication_year":2012,"publication_date":"2012-10-05","ids":{"openalex":"https://openalex.org/W2006347217","doi":"https://doi.org/10.1109/tr.2012.2220697","mag":"2006347217"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2012.2220697","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2012.2220697","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056682232","display_name":"Donald S. Siegel","orcid":"https://orcid.org/0000-0002-7668-9751"},"institutions":[{"id":"https://openalex.org/I63135867","display_name":"University of Cincinnati","ror":"https://ror.org/01e3m7079","country_code":"US","type":"education","lineage":["https://openalex.org/I63135867"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Siegel","raw_affiliation_strings":["NSF Center for Intelligent Maintenance Systems, University of Cincinnati, Cincinnati, OH, USA","NSF Center for Intell. Maintenance Syst., Univ. of Cincinnati, Cincinnati, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NSF Center for Intelligent Maintenance Systems, University of Cincinnati, Cincinnati, OH, USA","institution_ids":["https://openalex.org/I63135867"]},{"raw_affiliation_string":"NSF Center for Intell. Maintenance Syst., Univ. of Cincinnati, Cincinnati, OH, USA","institution_ids":["https://openalex.org/I63135867"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057391264","display_name":"Canh Ly","orcid":null},"institutions":[{"id":"https://openalex.org/I166416128","display_name":"DEVCOM Army Research Laboratory","ror":"https://ror.org/011hc8f90","country_code":"US","type":"government","lineage":["https://openalex.org/I1304082316","https://openalex.org/I1330347796","https://openalex.org/I166416128","https://openalex.org/I2802705668","https://openalex.org/I4210154437"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. Ly","raw_affiliation_strings":["Sensors and Electron Devices Directorate, Army Research Laboratory, Adelphi, MD, USA","Sensors & Electron Devices Directorate, Army Res. Lab., Adelphi, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sensors and Electron Devices Directorate, Army Research Laboratory, Adelphi, MD, USA","institution_ids":["https://openalex.org/I166416128"]},{"raw_affiliation_string":"Sensors & Electron Devices Directorate, Army Res. Lab., Adelphi, MD, USA","institution_ids":["https://openalex.org/I166416128"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100686648","display_name":"Jay Lee","orcid":"https://orcid.org/0000-0002-4022-4274"},"institutions":[{"id":"https://openalex.org/I63135867","display_name":"University of Cincinnati","ror":"https://ror.org/01e3m7079","country_code":"US","type":"education","lineage":["https://openalex.org/I63135867"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Lee","raw_affiliation_strings":["NSF Center for Intelligent Maintenance Systems, University of Cincinnati, Cincinnati, OH, USA","NSF Center for Intell. Maintenance Syst., Univ. of Cincinnati, Cincinnati, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NSF Center for Intelligent Maintenance Systems, University of Cincinnati, Cincinnati, OH, USA","institution_ids":["https://openalex.org/I63135867"]},{"raw_affiliation_string":"NSF Center for Intell. Maintenance Syst., Univ. of Cincinnati, Cincinnati, OH, USA","institution_ids":["https://openalex.org/I63135867"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":9.5443,"has_fulltext":false,"cited_by_count":74,"citation_normalized_percentile":{"value":0.97817056,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"61","issue":"4","first_page":"846","last_page":"857"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13891","display_name":"Engineering Diagnostics and Reliability","score":0.9764999747276306,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/prognostics","display_name":"Prognostics","score":0.925114631652832},{"id":"https://openalex.org/keywords/maintainability","display_name":"Maintainability","score":0.7858211994171143},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.653998613357544},{"id":"https://openalex.org/keywords/bearing","display_name":"Bearing (navigation)","score":0.57838374376297},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.5210644602775574},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5070273876190186},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5045555830001831},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.4999048709869385},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4702405333518982},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45295485854148865},{"id":"https://openalex.org/keywords/rolling-element-bearing","display_name":"Rolling-element bearing","score":0.43736323714256287},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4333621859550476},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.35914814472198486},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.27173346281051636}],"concepts":[{"id":"https://openalex.org/C129364497","wikidata":"https://www.wikidata.org/wiki/Q3042561","display_name":"Prognostics","level":2,"score":0.925114631652832},{"id":"https://openalex.org/C160713754","wikidata":"https://www.wikidata.org/wiki/Q1389965","display_name":"Maintainability","level":2,"score":0.7858211994171143},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.653998613357544},{"id":"https://openalex.org/C199978012","wikidata":"https://www.wikidata.org/wiki/Q1273815","display_name":"Bearing (navigation)","level":2,"score":0.57838374376297},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.5210644602775574},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5070273876190186},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5045555830001831},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.4999048709869385},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4702405333518982},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45295485854148865},{"id":"https://openalex.org/C2780155820","wikidata":"https://www.wikidata.org/wiki/Q1335987","display_name":"Rolling-element bearing","level":3,"score":0.43736323714256287},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4333621859550476},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.35914814472198486},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.27173346281051636},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C198394728","wikidata":"https://www.wikidata.org/wiki/Q3695508","display_name":"Vibration","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2012.2220697","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2012.2220697","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Responsible consumption and production","id":"https://metadata.un.org/sdg/12","score":0.550000011920929}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W31508836","https://openalex.org/W188541142","https://openalex.org/W255442360","https://openalex.org/W277489198","https://openalex.org/W1586444875","https://openalex.org/W1964511482","https://openalex.org/W1964551425","https://openalex.org/W1982755720","https://openalex.org/W1985110006","https://openalex.org/W1991906603","https://openalex.org/W1996131785","https://openalex.org/W2005881572","https://openalex.org/W2017337590","https://openalex.org/W2019732711","https://openalex.org/W2026155476","https://openalex.org/W2033266347","https://openalex.org/W2033430622","https://openalex.org/W2034319311","https://openalex.org/W2043281016","https://openalex.org/W2104960492","https://openalex.org/W2107776973","https://openalex.org/W2110464191","https://openalex.org/W2119479037","https://openalex.org/W2137496824","https://openalex.org/W2148720028","https://openalex.org/W2149956719","https://openalex.org/W2181676524","https://openalex.org/W2246196420","https://openalex.org/W2338165865","https://openalex.org/W2514683513","https://openalex.org/W2621394575","https://openalex.org/W3196784244","https://openalex.org/W4235594362","https://openalex.org/W4285719527","https://openalex.org/W6609548081","https://openalex.org/W6635042280","https://openalex.org/W6676456677","https://openalex.org/W6703911694","https://openalex.org/W6792804623","https://openalex.org/W6800528024"],"related_works":["https://openalex.org/W2908973203","https://openalex.org/W2340423614","https://openalex.org/W4281808365","https://openalex.org/W2335478004","https://openalex.org/W3164007574","https://openalex.org/W2801712269","https://openalex.org/W1872896676","https://openalex.org/W2156691445","https://openalex.org/W2045186954","https://openalex.org/W2064011721"],"abstract_inverted_index":{"The":[0,85,110],"enhanced":[1],"ability":[2],"to":[3,93,120],"predict":[4],"the":[5,18,41,81,101,121,152,162,170,175],"remaining":[6,63,76],"useful":[7,77],"life":[8,64,78],"of":[9,23,43,91,116,177],"helicopter":[10,25,29,82],"drive":[11,45],"train":[12,46],"components":[13],"offers":[14],"potential":[15],"improvement":[16],"in":[17],"safety,":[19],"maintainability,":[20],"and":[21,31,99,129,144,188],"reliability":[22],"a":[24,44,88,104,114,135],"fleet.":[26],"Current":[27],"existing":[28,142],"health":[30,130,143],"usage":[32,145,185],"monitoring":[33,146],"systems":[34],"provide":[35],"diagnostic":[36],"information":[37],"that":[38],"indicates":[39],"when":[40],"condition":[42],"component":[47],"is":[48,159],"degraded;":[49],"however,":[50],"prediction":[51,122,139,179,192],"techniques":[52,67],"are":[53],"not":[54,69],"currently":[55],"used.":[56],"Although":[57],"various":[58],"algorithms":[59,140],"exist":[60],"for":[61,80,137],"providing":[62],"predictions,":[65],"prognostic":[66],"have":[68],"fully":[70],"matured.":[71],"This":[72,132],"particular":[73],"study":[74,150],"addresses":[75],"predictions":[79],"oil-cooler":[83],"bearings.":[84],"paper":[86],"proposes":[87],"general":[89],"methodology":[90,112],"how":[92],"perform":[94],"rolling":[95],"element":[96],"bearing":[97],"prognostics,":[98],"presents":[100],"results":[102],"using":[103,161,169],"robust":[105],"regression":[106],"curve":[107],"fitting":[108],"approach.":[109],"proposed":[111,163],"includes":[113],"series":[115,191],"processing":[117],"steps":[118],"prior":[119],"routine,":[123],"including":[124,138],"feature":[125,127],"extraction,":[126],"selection,":[128],"assessment.":[131],"approach":[133],"provides":[134],"framework":[136],"into":[141],"systems.":[147],"A":[148],"case":[149],"with":[151,181],"data":[153],"collected":[154],"by":[155],"Impact":[156],"Technology,":[157],"LLC.":[158],"analysed":[160],"methodology.":[164],"Future":[165],"work":[166],"would":[167],"consider":[168],"same":[171],"methodology,":[172],"but":[173],"comparing":[174],"accuracy":[176],"this":[178],"method":[180],"Bayesian":[182],"filtering":[183],"techniques,":[184],"based":[186],"methods,":[187],"other":[189],"time":[190],"methods.":[193]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":8},{"year":2021,"cited_by_count":8},{"year":2020,"cited_by_count":10},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":5},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":6}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}