{"id":"https://openalex.org/W2110554687","doi":"https://doi.org/10.1109/tr.2011.2170254","title":"An Approach to Reliability Assessment Under Degradation and Shock Process","display_name":"An Approach to Reliability Assessment Under Degradation and Shock Process","publication_year":2011,"publication_date":"2011-10-14","ids":{"openalex":"https://openalex.org/W2110554687","doi":"https://doi.org/10.1109/tr.2011.2170254","mag":"2110554687"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2011.2170254","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2011.2170254","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110259837","display_name":"Zhonglai Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhonglai Wang","raw_affiliation_strings":["School of Mechanical, Electronic, and Industrial Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","Sch. of Mech., Univ. of Electron. Sci. & Technol. of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical, Electronic, and Industrial Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Sch. of Mech., Univ. of Electron. Sci. & Technol. of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069596116","display_name":"Hong\u2010Zhong Huang","orcid":"https://orcid.org/0000-0003-4478-8349"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hong-Zhong Huang","raw_affiliation_strings":["School of Mechanical, Electronic, and Industrial Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","Sch. of Mech., Univ. of Electron. Sci. & Technol. of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical, Electronic, and Industrial Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Sch. of Mech., Univ. of Electron. Sci. & Technol. of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100653134","display_name":"Yan\u2010Feng Li","orcid":"https://orcid.org/0000-0002-9121-1465"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanfeng Li","raw_affiliation_strings":["School of Mechanical, Electronic, and Industrial Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","Sch. of Mech., Univ. of Electron. Sci. & Technol. of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical, Electronic, and Industrial Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Sch. of Mech., Univ. of Electron. Sci. & Technol. of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028727957","display_name":"Ning\u2010Cong Xiao","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ning-Cong Xiao","raw_affiliation_strings":["School of Mechanical, Electronic, and Industrial Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","Sch. of Mech., Univ. of Electron. Sci. & Technol. of China, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical, Electronic, and Industrial Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Sch. of Mech., Univ. of Electron. Sci. & Technol. of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":null,"apc_paid":null,"fwci":23.1973,"has_fulltext":false,"cited_by_count":148,"citation_normalized_percentile":{"value":0.99481354,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":100},"biblio":{"volume":"60","issue":"4","first_page":"852","last_page":"863"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/shock","display_name":"Shock (circulatory)","score":0.7034905552864075},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.6789527535438538},{"id":"https://openalex.org/keywords/impulse","display_name":"Impulse (physics)","score":0.6686183214187622},{"id":"https://openalex.org/keywords/electric-shock","display_name":"Electric shock","score":0.6181910634040833},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6065851449966431},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6053584814071655},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.5623844861984253},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.464058518409729},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4331156015396118},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23502078652381897},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.14364859461784363},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14356940984725952},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.09332418441772461}],"concepts":[{"id":"https://openalex.org/C2781300812","wikidata":"https://www.wikidata.org/wiki/Q178061","display_name":"Shock (circulatory)","level":2,"score":0.7034905552864075},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6789527535438538},{"id":"https://openalex.org/C70836080","wikidata":"https://www.wikidata.org/wiki/Q837940","display_name":"Impulse (physics)","level":2,"score":0.6686183214187622},{"id":"https://openalex.org/C2776099285","wikidata":"https://www.wikidata.org/wiki/Q244404","display_name":"Electric shock","level":2,"score":0.6181910634040833},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6065851449966431},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6053584814071655},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.5623844861984253},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.464058518409729},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4331156015396118},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23502078652381897},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.14364859461784363},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14356940984725952},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.09332418441772461},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2011.2170254","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2011.2170254","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W23490659","https://openalex.org/W75581641","https://openalex.org/W642414339","https://openalex.org/W642501955","https://openalex.org/W1561528710","https://openalex.org/W1966750990","https://openalex.org/W1973617983","https://openalex.org/W1976089264","https://openalex.org/W1982286208","https://openalex.org/W2040468805","https://openalex.org/W2045685739","https://openalex.org/W2048082785","https://openalex.org/W2048227639","https://openalex.org/W2059872949","https://openalex.org/W2069007351","https://openalex.org/W2090749763","https://openalex.org/W2096731208","https://openalex.org/W2114087231","https://openalex.org/W2114911208","https://openalex.org/W2119777027","https://openalex.org/W2126463812","https://openalex.org/W2132049856","https://openalex.org/W2136362079","https://openalex.org/W2137951154","https://openalex.org/W2143368359","https://openalex.org/W2143861988","https://openalex.org/W2151176860","https://openalex.org/W2152154988","https://openalex.org/W2155994276","https://openalex.org/W2354971256","https://openalex.org/W4229663176","https://openalex.org/W4230321676","https://openalex.org/W4239218596","https://openalex.org/W4247981926","https://openalex.org/W6683110800"],"related_works":["https://openalex.org/W2534928293","https://openalex.org/W2150099345","https://openalex.org/W2379773606","https://openalex.org/W3004580327","https://openalex.org/W1998384210","https://openalex.org/W3012501961","https://openalex.org/W2042729523","https://openalex.org/W2138734817","https://openalex.org/W2146720862","https://openalex.org/W2060246408"],"abstract_inverted_index":{"Product":[0],"performance":[1,62],"usually":[2],"degrades":[3],"with":[4,51,103,115],"time.":[5],"When":[6],"shocks":[7,25,44,60,101,113],"exist,":[8],"the":[9,18,72,84,87,98,110,126],"degradation":[10,23,37,85],"could":[11],"be":[12],"more":[13],"rapid.":[14],"This":[15],"research":[16],"investigates":[17],"reliability":[19,49],"analysis":[20],"when":[21],"typical":[22],"and":[24,40,78],"are":[26,31,63,95],"involved.":[27],"Three":[28],"failure":[29,41,53,73],"modes":[30,54],"considered:":[32],"catastrophic":[33],"(binary":[34],"state)":[35],"failure,":[36],"(continuous":[38],"processes),":[39],"due":[42],"to":[43,124],"(impulse":[45],"processes).":[46],"The":[47,57],"overall":[48],"equation":[50],"three":[52],"is":[55,122],"derived.":[56],"effects":[58],"of":[59,89],"on":[61],"classified":[64],"into":[65],"two":[66],"types:":[67],"a":[68,76,79,90,104],"sudden":[69],"increase":[70],"in":[71,83,109],"rate":[74],"after":[75,86],"shock,":[77],"direct":[80],"random":[81],"change":[82],"occurrence":[88],"shock.":[91],"Two":[92],"shock":[93],"scenarios":[94],"considered.":[96],"In":[97],"first":[99],"scenario,":[100,112],"occur":[102,114],"fixed":[105],"time":[106,117],"period;":[107],"while":[108],"second":[111],"varying":[116],"periods.":[118],"An":[119],"engineering":[120],"example":[121],"given":[123],"demonstrate":[125],"proposed":[127],"methods.":[128]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":10},{"year":2022,"cited_by_count":10},{"year":2021,"cited_by_count":11},{"year":2020,"cited_by_count":20},{"year":2019,"cited_by_count":11},{"year":2018,"cited_by_count":14},{"year":2017,"cited_by_count":15},{"year":2016,"cited_by_count":13},{"year":2015,"cited_by_count":9},{"year":2014,"cited_by_count":8},{"year":2013,"cited_by_count":12},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}