{"id":"https://openalex.org/W2126079984","doi":"https://doi.org/10.1109/tr.2011.2161700","title":"An Efficient SER Estimation Method for Combinational Circuits","display_name":"An Efficient SER Estimation Method for Combinational Circuits","publication_year":2011,"publication_date":"2011-07-21","ids":{"openalex":"https://openalex.org/W2126079984","doi":"https://doi.org/10.1109/tr.2011.2161700","mag":"2126079984"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2011.2161700","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2011.2161700","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030729124","display_name":"Natalja Kehl","orcid":null},"institutions":[{"id":"https://openalex.org/I889804353","display_name":"Robert Bosch (Germany)","ror":"https://ror.org/01fe0jt45","country_code":"DE","type":"company","lineage":["https://openalex.org/I889804353"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Natalja Kehl","raw_affiliation_strings":["Bosch Engineering GmbH, Abstatt, Germany","Bosch Eng. GmbH, Abstatt, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bosch Engineering GmbH, Abstatt, Germany","institution_ids":["https://openalex.org/I889804353"]},{"raw_affiliation_string":"Bosch Eng. GmbH, Abstatt, Germany","institution_ids":["https://openalex.org/I889804353"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087076980","display_name":"Wolfgang Rosenstiel","orcid":null},"institutions":[{"id":"https://openalex.org/I8087733","display_name":"University of T\u00fcbingen","ror":"https://ror.org/03a1kwz48","country_code":"DE","type":"education","lineage":["https://openalex.org/I8087733"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Wolfgang Rosenstiel","raw_affiliation_strings":["Computer Engineering Department, Wilhelm-Schickard-Institute for Computer Science, University of T\u00fcbingen, Tubingen, Germany","Computer Engineering Department, University of T\u00fcbingen, T\u00fcbingen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, Wilhelm-Schickard-Institute for Computer Science, University of T\u00fcbingen, Tubingen, Germany","institution_ids":["https://openalex.org/I8087733"]},{"raw_affiliation_string":"Computer Engineering Department, University of T\u00fcbingen, T\u00fcbingen, Germany","institution_ids":["https://openalex.org/I8087733"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.3515,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.83414931,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"60","issue":"4","first_page":"742","last_page":"747"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9941999912261963,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.8388534784317017},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.8279222249984741},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6409328579902649},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6165744662284851},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.6073977947235107},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5343809127807617},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.515972912311554},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.5145477652549744},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4848572015762329},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4034830927848816},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.3013460040092468},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24951350688934326},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.16864851117134094},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.07477521896362305}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.8388534784317017},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.8279222249984741},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6409328579902649},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6165744662284851},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.6073977947235107},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5343809127807617},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.515972912311554},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.5145477652549744},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4848572015762329},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4034830927848816},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.3013460040092468},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24951350688934326},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16864851117134094},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.07477521896362305}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2011.2161700","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2011.2161700","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/15","display_name":"Life in Land","score":0.46000000834465027}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1548975601","https://openalex.org/W1600330381","https://openalex.org/W1604782092","https://openalex.org/W1965475108","https://openalex.org/W1981764994","https://openalex.org/W2096927458","https://openalex.org/W2111465388","https://openalex.org/W2117391934","https://openalex.org/W2121942050","https://openalex.org/W2123662866","https://openalex.org/W2142358791","https://openalex.org/W2149586090","https://openalex.org/W2163671548","https://openalex.org/W2167002145","https://openalex.org/W2171825402","https://openalex.org/W2180580882"],"related_works":["https://openalex.org/W2171347834","https://openalex.org/W1608692246","https://openalex.org/W2098959356","https://openalex.org/W2062980181","https://openalex.org/W2106996997","https://openalex.org/W2121052741","https://openalex.org/W2019979363","https://openalex.org/W2103155304","https://openalex.org/W2770172062","https://openalex.org/W3199959849"],"abstract_inverted_index":{"Nanometer":[0],"CMOS":[1,127],"VLSI":[2],"circuits":[3],"are":[4],"highly":[5],"sensitive":[6],"to":[7,11,112],"soft":[8,49],"errors":[9],"due":[10],"environmental":[12],"causes":[13],"such":[14],"as":[15,25],"cosmic":[16],"radiation,":[17],"and":[18,35,106],"charged":[19],"particles.":[20],"These":[21],"phenomena,":[22],"also":[23],"known":[24,65],"single-event":[26],"upsets":[27],"(SEU),":[28],"induce":[29],"current":[30],"pulses":[31],"at":[32],"random":[33,36],"times":[34],"locations":[37],"in":[38,96],"a":[39,47,78],"digital":[40],"circuit.":[41],"In":[42],"this":[43],"article,":[44],"we":[45,100,116],"present":[46,87,117],"new":[48],"error":[50,83],"rate":[51],"(SER)":[52],"estimation":[53,123],"method":[54,59,124],"for":[55,90,125],"combinational":[56,97],"circuits.":[57,98],"This":[58],"is":[60],"more":[61],"efficient":[62],"than":[63],"other":[64],"methods":[66],"because":[67],"it":[68],"takes":[69],"into":[70],"account":[71],"only":[72],"those":[73],"physical":[74],"factors":[75],"which":[76],"have":[77],"significant":[79],"impact":[80],"on":[81],"the":[82,102,108,118],"rate.":[84],"We":[85],"first":[86],"an":[88],"equation":[89,110],"SER":[91,109,122],"irrespective":[92],"of":[93,120],"masking":[94,104],"effects":[95],"Then":[99],"describe":[101],"three":[103],"effects,":[105],"augment":[107],"according":[111],"these":[113],"effects.":[114],"Finally,":[115],"results":[119],"our":[121],"several":[126],"technologies.":[128]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}