{"id":"https://openalex.org/W2159941357","doi":"https://doi.org/10.1109/tr.2011.2161699","title":"Hardware Error Likelihood Induced by the Operation of Software","display_name":"Hardware Error Likelihood Induced by the Operation of Software","publication_year":2011,"publication_date":"2011-07-26","ids":{"openalex":"https://openalex.org/W2159941357","doi":"https://doi.org/10.1109/tr.2011.2161699","mag":"2159941357"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2011.2161699","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2011.2161699","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034583103","display_name":"Bing Huang","orcid":"https://orcid.org/0000-0002-2486-1396"},"institutions":[{"id":"https://openalex.org/I4210093483","display_name":"Everspin Technologies (United States)","ror":"https://ror.org/00hn06s81","country_code":"US","type":"company","lineage":["https://openalex.org/I4210093483"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bing Huang","raw_affiliation_strings":["Everspin Technologies, Inc., Chandler, AZ, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Everspin Technologies, Inc., Chandler, AZ, USA","institution_ids":["https://openalex.org/I4210093483"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077197260","display_name":"M Rodriguez","orcid":"https://orcid.org/0000-0002-1370-7836"},"institutions":[{"id":"https://openalex.org/I52357470","display_name":"The Ohio State University","ror":"https://ror.org/00rs6vg23","country_code":"US","type":"education","lineage":["https://openalex.org/I52357470"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Manuel Rodriguez","raw_affiliation_strings":["Ohio State Uinversity, Columbus, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ohio State Uinversity, Columbus, OH, USA","institution_ids":["https://openalex.org/I52357470"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100351331","display_name":"Ming Li","orcid":"https://orcid.org/0000-0001-7450-6205"},"institutions":[{"id":"https://openalex.org/I1306266525","display_name":"Goddard Space Flight Center","ror":"https://ror.org/0171mag52","country_code":"US","type":"facility","lineage":["https://openalex.org/I1306266525","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ming Li","raw_affiliation_strings":["NASA Goddard Space Flight Center, Mantech International Corporation, Greenbelt, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NASA Goddard Space Flight Center, Mantech International Corporation, Greenbelt, MD, USA","institution_ids":["https://openalex.org/I1306266525"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062729225","display_name":"J.B. Bernstein","orcid":"https://orcid.org/0000-0002-1878-5921"},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Joseph B. Bernstein","raw_affiliation_strings":["Bar-llan University, Israel"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bar-llan University, Israel","institution_ids":["https://openalex.org/I13955877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085970288","display_name":"Carol Smidts","orcid":"https://orcid.org/0000-0001-7867-023X"},"institutions":[{"id":"https://openalex.org/I52357470","display_name":"The Ohio State University","ror":"https://ror.org/00rs6vg23","country_code":"US","type":"education","lineage":["https://openalex.org/I52357470"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Carol S. Smidts","raw_affiliation_strings":["Ohio State Uinversity, Columbus, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ohio State Uinversity, Columbus, OH, USA","institution_ids":["https://openalex.org/I52357470"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.3515,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.83768523,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"60","issue":"3","first_page":"622","last_page":"639"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6458946466445923},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6348311901092529},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6071869730949402},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5988247990608215},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5623980760574341},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4784160256385803},{"id":"https://openalex.org/keywords/embedded-software","display_name":"Embedded software","score":0.4636140465736389},{"id":"https://openalex.org/keywords/semiconductor-device","display_name":"Semiconductor device","score":0.46132296323776245},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.43315213918685913},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3573756515979767},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18164849281311035}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6458946466445923},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6348311901092529},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6071869730949402},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5988247990608215},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5623980760574341},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4784160256385803},{"id":"https://openalex.org/C154488198","wikidata":"https://www.wikidata.org/wiki/Q1335007","display_name":"Embedded software","level":3,"score":0.4636140465736389},{"id":"https://openalex.org/C79635011","wikidata":"https://www.wikidata.org/wiki/Q175805","display_name":"Semiconductor device","level":3,"score":0.46132296323776245},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.43315213918685913},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3573756515979767},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18164849281311035},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2011.2161699","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2011.2161699","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":46,"referenced_works":["https://openalex.org/W59796802","https://openalex.org/W164528542","https://openalex.org/W1641755856","https://openalex.org/W1712958038","https://openalex.org/W1916725135","https://openalex.org/W1925913808","https://openalex.org/W1969775801","https://openalex.org/W1970249062","https://openalex.org/W1971824531","https://openalex.org/W1973659025","https://openalex.org/W1985233096","https://openalex.org/W2007639067","https://openalex.org/W2013412796","https://openalex.org/W2031683742","https://openalex.org/W2032069904","https://openalex.org/W2041424982","https://openalex.org/W2073240183","https://openalex.org/W2096927458","https://openalex.org/W2098284075","https://openalex.org/W2105900842","https://openalex.org/W2108970005","https://openalex.org/W2118212189","https://openalex.org/W2120860555","https://openalex.org/W2122349997","https://openalex.org/W2126259598","https://openalex.org/W2136588288","https://openalex.org/W2142381056","https://openalex.org/W2143039561","https://openalex.org/W2146091063","https://openalex.org/W2156691787","https://openalex.org/W2162161729","https://openalex.org/W2164473458","https://openalex.org/W2169040982","https://openalex.org/W2169978593","https://openalex.org/W2170424585","https://openalex.org/W2313276718","https://openalex.org/W2318612104","https://openalex.org/W2731436268","https://openalex.org/W4234217119","https://openalex.org/W4240677499","https://openalex.org/W4285018543","https://openalex.org/W4285719527","https://openalex.org/W6637529790","https://openalex.org/W6640167303","https://openalex.org/W6681128095","https://openalex.org/W6685133794"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W4306968100","https://openalex.org/W2171986175","https://openalex.org/W2089791793","https://openalex.org/W2038858740","https://openalex.org/W1491218245","https://openalex.org/W2040773997","https://openalex.org/W2543864226"],"abstract_inverted_index":{"The":[0,31,163],"influence":[1],"of":[2,18,27,39,49,60,106,144,148,159],"the":[3,11,14,37,43,58,64,69,79,102,141,153,157],"software,":[4],"and":[5,8,16,52,68,122],"its":[6,75],"interaction":[7],"interdependency":[9],"with":[10,167],"hardware":[12,19,116,149],"in":[13,24,98,132],"creation":[15],"propagation":[17],"failures,":[20],"are":[21,96,118],"usually":[22],"neglected":[23,127],"reliability":[25,142],"analyses":[26],"safety":[28,174],"critical":[29,175],"systems.":[30],"software":[32,161],"operation":[33],"is":[34,165],"responsible":[35],"for":[36,140],"usage":[38,47,154],"semiconductor":[40],"devices":[41,62,150],"along":[42],"system":[44],"lifetime.":[45],"This":[46],"consists":[48],"voltage":[50],"changes":[51],"current":[53],"flows":[54],"that":[55],"steadily":[56],"degrade":[57],"materials":[59],"circuit":[61,80,91],"until":[63],"degradation":[65],"becomes":[66],"permanent,":[67],"device":[70],"can":[71,123],"no":[72,124],"longer":[73,125],"perform":[74],"intended":[76],"function.":[77],"At":[78],"level,":[81],"these":[82],"failures":[83,95,117,131],"manifest":[84],"as":[85],"stuck-at":[86],"values,":[87],"signal":[88],"delays,":[89],"or":[90],"functional":[92],"changes.":[93],"These":[94],"permanent":[97,115,145],"nature.":[99],"Due":[100],"to":[101,129,152],"extremely":[103],"high":[104],"scaling":[105],"complementary":[107],"metal-oxide-semiconductor":[108],"(CMOS)":[109],"technology":[110],"into":[111],"deep":[112],"submicron":[113],"regimes,":[114],"a":[119,138,168,173],"key":[120],"concern,":[121],"be":[126],"compared":[128],"transient":[130],"radiation-intense":[133],"applications.":[134,162],"Our":[135],"work":[136],"proposes":[137],"methodology":[139,164],"analysis":[143],"failure":[146],"manifestations":[147],"due":[151],"induced":[155],"by":[156],"execution":[158],"embedded":[160],"illustrated":[166],"case":[169],"study":[170],"based":[171],"on":[172],"application.":[176]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}