{"id":"https://openalex.org/W2132147483","doi":"https://doi.org/10.1109/tr.2011.2161051","title":"Accelerated Destructive Degradation Tests Robust to Distribution Misspecification","display_name":"Accelerated Destructive Degradation Tests Robust to Distribution Misspecification","publication_year":2011,"publication_date":"2011-07-20","ids":{"openalex":"https://openalex.org/W2132147483","doi":"https://doi.org/10.1109/tr.2011.2161051","mag":"2132147483"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2011.2161051","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2011.2161051","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047443382","display_name":"Shuen\u2010Lin Jeng","orcid":"https://orcid.org/0000-0003-2803-5881"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shuen-Lin Jeng","raw_affiliation_strings":["Department of Statistics, National Cheng Kung University, Tainan, Taiwan","Dept. of Stat., Nat. Cheng-Kung Univ., Tainan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Statistics, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"Dept. of Stat., Nat. Cheng-Kung Univ., Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063343769","display_name":"Bei-Ying Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210129488","display_name":"Cathay General Hospital","ror":"https://ror.org/03c8c9n80","country_code":"TW","type":"healthcare","lineage":["https://openalex.org/I4210129488"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Bei-Ying Huang","raw_affiliation_strings":["Cathay Life Insurance Company, Taipei, Taiwan","Cathay Life Insurance Co., Taipei, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Cathay Life Insurance Company, Taipei, Taiwan","institution_ids":["https://openalex.org/I4210129488"]},{"raw_affiliation_string":"Cathay Life Insurance Co., Taipei, Taiwan","institution_ids":["https://openalex.org/I4210129488"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086128963","display_name":"William Q. Meeker","orcid":"https://orcid.org/0000-0002-5366-0294"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"William Q. Meeker","raw_affiliation_strings":["Department of Statistics, Iowa State University, Ames, IA, USA","Dept. of Stat., Iowa State Univ., Ames, IA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Statistics, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"Dept. of Stat., Iowa State Univ., Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.4928,"has_fulltext":false,"cited_by_count":28,"citation_normalized_percentile":{"value":0.93593638,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"60","issue":"4","first_page":"701","last_page":"711"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10396","display_name":"Fatigue and fracture mechanics","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/weibull-distribution","display_name":"Weibull distribution","score":0.7982571125030518},{"id":"https://openalex.org/keywords/quantile","display_name":"Quantile","score":0.7298940420150757},{"id":"https://openalex.org/keywords/log-normal-distribution","display_name":"Log-normal distribution","score":0.6821022033691406},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5559174418449402},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.5539355874061584},{"id":"https://openalex.org/keywords/econometrics","display_name":"Econometrics","score":0.37381020188331604},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3664889931678772},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3641992211341858},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.29190725088119507},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15759029984474182}],"concepts":[{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.7982571125030518},{"id":"https://openalex.org/C118671147","wikidata":"https://www.wikidata.org/wiki/Q578714","display_name":"Quantile","level":2,"score":0.7298940420150757},{"id":"https://openalex.org/C151620405","wikidata":"https://www.wikidata.org/wiki/Q826116","display_name":"Log-normal distribution","level":2,"score":0.6821022033691406},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5559174418449402},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.5539355874061584},{"id":"https://openalex.org/C149782125","wikidata":"https://www.wikidata.org/wiki/Q160039","display_name":"Econometrics","level":1,"score":0.37381020188331604},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3664889931678772},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3641992211341858},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.29190725088119507},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15759029984474182},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tr.2011.2161051","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2011.2161051","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},{"id":"pmh:oai:lib.dr.iastate.edu:stat_las_preprints-1074","is_oa":false,"landing_page_url":"https://lib.dr.iastate.edu/cgi/viewcontent.cgi?article=1074&context=stat_las_preprints","pdf_url":null,"source":{"id":"https://openalex.org/S4377196104","display_name":"Iowa State University Digital Repository (Iowa State University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I173911158","host_organization_name":"Iowa State University","host_organization_lineage":["https://openalex.org/I173911158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Statistics Preprints","raw_type":"text"},{"id":"pmh:oai:dr.lib.iastate.edu:20.500.12876/90370","is_oa":false,"landing_page_url":"https://dr.lib.iastate.edu/handle/20.500.12876/90370","pdf_url":null,"source":{"id":"https://openalex.org/S4377196104","display_name":"Iowa State University Digital Repository (Iowa State University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I173911158","host_organization_name":"Iowa State University","host_organization_lineage":["https://openalex.org/I173911158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"archive/lib.dr.iastate.edu/stat_las_preprints/74/2011_MeekerWQ_AcceleratedDestructiveDegradation.pdf|||Sat Jan 15 01:47:25 UTC 2022","raw_type":"Text"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5899999737739563,"id":"https://metadata.un.org/sdg/12","display_name":"Responsible consumption and production"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W601736092","https://openalex.org/W2006266687","https://openalex.org/W2008504746","https://openalex.org/W2017137572","https://openalex.org/W2048344442","https://openalex.org/W2048561410","https://openalex.org/W2090749763","https://openalex.org/W2099391752","https://openalex.org/W2163871723","https://openalex.org/W2172145668","https://openalex.org/W2482776782","https://openalex.org/W4212767417","https://openalex.org/W4233921518","https://openalex.org/W4239218596","https://openalex.org/W4246784033","https://openalex.org/W4247181804","https://openalex.org/W4285719527","https://openalex.org/W6722053746"],"related_works":["https://openalex.org/W2033000862","https://openalex.org/W2942032531","https://openalex.org/W2091694095","https://openalex.org/W2378425227","https://openalex.org/W2790308683","https://openalex.org/W2003526896","https://openalex.org/W2001825669","https://openalex.org/W2228552724","https://openalex.org/W2394406570","https://openalex.org/W4235165699"],"abstract_inverted_index":{"Accelerated":[0],"repeated-measures":[1],"degradation":[2,8,28,70],"tests":[3],"(ARMDTs)":[4],"take":[5],"measurements":[6,21],"of":[7,14,36,50,64,81,118],"or":[9],"performance":[10],"on":[11],"a":[12,97],"sample":[13],"units":[15],"over":[16],"time.":[17],"In":[18,93],"certain":[19],"products,":[20],"are":[22,57],"destructive,":[23],"leading":[24],"to":[25,41,46,60,83,107],"accelerated":[26],"destructive":[27],"test":[29,35,44,113],"(ADDT)":[30],"data.":[31],"For":[32],"example,":[33],"the":[34,43,48,51,62,73,77,84,102,116,120],"an":[37],"adhesive":[38],"bond":[39],"needs":[40],"break":[42],"specimen":[45],"measure":[47],"strength":[49],"bond.":[52],"Lognormal":[53],"and":[54,69,104],"Weibull":[55],"distributions":[56],"often":[58,80],"used":[59],"describe":[61],"distribution":[63,74,108],"product":[65],"characteristics":[66],"in":[67],"life":[68],"tests.":[71],"When":[72],"is":[75],"misspecified,":[76],"lifetime":[78],"quantile,":[79],"interest":[82],"practitioner,":[85],"may":[86],"differ":[87],"significantly":[88],"between":[89],"these":[90],"two":[91],"distributions.":[92],"this":[94],"study,":[95],"under":[96,115],"specific":[98],"ADDT,":[99],"we":[100],"investigate":[101],"bias":[103],"variance":[105],"due":[106],"misspecification.":[109],"We":[110],"suggest":[111],"robust":[112],"plans":[114],"criteria":[117],"minimizing":[119],"approximate":[121],"mean":[122],"square":[123],"error.":[124]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":3}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}