{"id":"https://openalex.org/W2155802177","doi":"https://doi.org/10.1109/tr.2011.2135710","title":"Efficient Reliability Approximation Method for Traffic-Path-Based Network","display_name":"Efficient Reliability Approximation Method for Traffic-Path-Based Network","publication_year":2011,"publication_date":"2011-04-26","ids":{"openalex":"https://openalex.org/W2155802177","doi":"https://doi.org/10.1109/tr.2011.2135710","mag":"2155802177"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2011.2135710","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2011.2135710","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051956583","display_name":"Masahiro Hayashi","orcid":"https://orcid.org/0000-0002-1674-4093"},"institutions":[{"id":"https://openalex.org/I2251713219","display_name":"NTT (Japan)","ror":"https://ror.org/00berct97","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masahiro Hayashi","raw_affiliation_strings":["NTT Service Integration Laboratories, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NTT Service Integration Laboratories, Tokyo, Japan","institution_ids":["https://openalex.org/I2251713219"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5114248502","display_name":"Takeo Abe","orcid":null},"institutions":[{"id":"https://openalex.org/I2251713219","display_name":"NTT (Japan)","ror":"https://ror.org/00berct97","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takeo Abe","raw_affiliation_strings":["NTT Telecommunication Networks Laboratories, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NTT Telecommunication Networks Laboratories, Tokyo, Japan","institution_ids":["https://openalex.org/I2251713219"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I2251713219"],"apc_list":null,"apc_paid":null,"fwci":1.1046,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.83463352,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"60","issue":"2","first_page":"460","last_page":"469"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9805999994277954,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9771999716758728,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7543811798095703},{"id":"https://openalex.org/keywords/factoring","display_name":"Factoring","score":0.6725873351097107},{"id":"https://openalex.org/keywords/bounding-overwatch","display_name":"Bounding overwatch","score":0.6145421862602234},{"id":"https://openalex.org/keywords/approximation-algorithm","display_name":"Approximation algorithm","score":0.6023064851760864},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5940237641334534},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.5254872441291809},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.5245043039321899},{"id":"https://openalex.org/keywords/approximation-error","display_name":"Approximation error","score":0.49695518612861633},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4916444420814514},{"id":"https://openalex.org/keywords/approximation-theory","display_name":"Approximation theory","score":0.44073110818862915},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4358004629611969},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.27431362867355347},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07581034302711487}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7543811798095703},{"id":"https://openalex.org/C177225278","wikidata":"https://www.wikidata.org/wiki/Q192674","display_name":"Factoring","level":2,"score":0.6725873351097107},{"id":"https://openalex.org/C63584917","wikidata":"https://www.wikidata.org/wiki/Q333286","display_name":"Bounding overwatch","level":2,"score":0.6145421862602234},{"id":"https://openalex.org/C148764684","wikidata":"https://www.wikidata.org/wiki/Q621751","display_name":"Approximation algorithm","level":2,"score":0.6023064851760864},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5940237641334534},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.5254872441291809},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.5245043039321899},{"id":"https://openalex.org/C122383733","wikidata":"https://www.wikidata.org/wiki/Q865920","display_name":"Approximation error","level":2,"score":0.49695518612861633},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4916444420814514},{"id":"https://openalex.org/C145242015","wikidata":"https://www.wikidata.org/wiki/Q774123","display_name":"Approximation theory","level":2,"score":0.44073110818862915},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4358004629611969},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.27431362867355347},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07581034302711487},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2011.2135710","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2011.2135710","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1515510407","https://openalex.org/W1537664757","https://openalex.org/W1989512626","https://openalex.org/W1993211015","https://openalex.org/W1995695049","https://openalex.org/W2011039300","https://openalex.org/W2085961406","https://openalex.org/W2091608876","https://openalex.org/W2093590287","https://openalex.org/W2106337575","https://openalex.org/W2107932240","https://openalex.org/W2123627392","https://openalex.org/W2127039374","https://openalex.org/W2128305242","https://openalex.org/W2149456187","https://openalex.org/W2152020486","https://openalex.org/W2161228256","https://openalex.org/W2170827956","https://openalex.org/W4239418027","https://openalex.org/W4245681882"],"related_works":["https://openalex.org/W2044115164","https://openalex.org/W2110817230","https://openalex.org/W4308701628","https://openalex.org/W1606488336","https://openalex.org/W2014137052","https://openalex.org/W2165420145","https://openalex.org/W2171221472","https://openalex.org/W1988569331","https://openalex.org/W189995875","https://openalex.org/W3091355678"],"abstract_inverted_index":{"We":[0,70,96],"propose":[1],"a":[2,12],"new":[3],"efficient":[4],"approximation":[5,55,115,124],"algorithm":[6,17,47,109],"for":[7],"evaluating":[8],"the":[9,20,41,49,59,83,102,122],"reliability":[10,63],"of":[11,22,62,121],"traffic-path-based":[13,42],"network":[14,43,87],"model.":[15,44],"This":[16,45],"effectively":[18],"combines":[19],"methods":[21],"`reduction,'":[23],"`partial":[24,27],"factoring,'":[25],"and":[26,34,66,89,113],"enumeration'":[28],"to":[29,40,79],"evaluate":[30],"reliability,":[31,56],"where":[32],"reduction":[33],"partial":[35],"factoring":[36],"are":[37,76,91,117],"first":[38],"applied":[39],"proposed":[46],"reduces":[48],"complications":[50],"in":[51,94],"achieving":[52],"high-speed":[53],"computing":[54,103],"while":[57],"guaranteeing":[58],"exact":[60],"value":[61],"between":[64],"upper":[65],"lower":[67],"bounding":[68],"values.":[69],"emphasize":[71],"that":[72,86,101,107],"these":[73],"two":[74],"values":[75],"very":[77],"close":[78],"each":[80],"other,":[81],"under":[82],"reasonable":[84],"assumption":[85],"equipment":[88],"cables":[90],"highly":[92],"reliable":[93],"practice.":[95],"present":[97],"numerical":[98],"examples":[99],"showing":[100],"time":[104],"is":[105,110],"short,":[106],"this":[108],"more":[111],"practical,":[112],"its":[114],"errors":[116],"smaller":[118],"than":[119],"those":[120],"existing":[123],"method.":[125]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}