{"id":"https://openalex.org/W2171365244","doi":"https://doi.org/10.1109/tr.2011.2134270","title":"Accelerated Life Tests for Weibull Series Systems With Masked Data","display_name":"Accelerated Life Tests for Weibull Series Systems With Masked Data","publication_year":2011,"publication_date":"2011-04-26","ids":{"openalex":"https://openalex.org/W2171365244","doi":"https://doi.org/10.1109/tr.2011.2134270","mag":"2171365244"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2011.2134270","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2011.2134270","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5031926450","display_name":"Tsai\u2010Hung Fan","orcid":"https://orcid.org/0000-0003-0361-2267"},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tsai-Hung Fan","raw_affiliation_strings":["Graduate Institute of Statistics, National Central University, Jhong Li, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate Institute of Statistics, National Central University, Jhong Li, Taiwan","institution_ids":["https://openalex.org/I22265921"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079871884","display_name":"Wan\u2010Lun Wang","orcid":"https://orcid.org/0000-0002-0344-7954"},"institutions":[{"id":"https://openalex.org/I4880106","display_name":"Feng Chia University","ror":"https://ror.org/05vhczg54","country_code":"TW","type":"education","lineage":["https://openalex.org/I4880106"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Wan-Lun Wang","raw_affiliation_strings":["Department of Statistics, Graduate Institute of Statistics and Actuarial Science, Feng Chia University FCU, Taichung, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Statistics, Graduate Institute of Statistics and Actuarial Science, Feng Chia University FCU, Taichung, Taiwan","institution_ids":["https://openalex.org/I4880106"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.7467,"has_fulltext":false,"cited_by_count":43,"citation_normalized_percentile":{"value":0.95792162,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"60","issue":"3","first_page":"557","last_page":"569"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/weibull-distribution","display_name":"Weibull distribution","score":0.908395528793335},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7385162115097046},{"id":"https://openalex.org/keywords/masking","display_name":"Masking (illustration)","score":0.677055835723877},{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.6538745164871216},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.6448403596878052},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6153014302253723},{"id":"https://openalex.org/keywords/maximum-likelihood","display_name":"Maximum likelihood","score":0.5735300779342651},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.487004816532135},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.4804189205169678},{"id":"https://openalex.org/keywords/accelerated-life-testing","display_name":"Accelerated life testing","score":0.4592430889606476},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4371872544288635},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.41952115297317505},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.38051140308380127},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.30480098724365234},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2559639811515808}],"concepts":[{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.908395528793335},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7385162115097046},{"id":"https://openalex.org/C2777402240","wikidata":"https://www.wikidata.org/wiki/Q6783436","display_name":"Masking (illustration)","level":2,"score":0.677055835723877},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.6538745164871216},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.6448403596878052},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6153014302253723},{"id":"https://openalex.org/C49781872","wikidata":"https://www.wikidata.org/wiki/Q1045555","display_name":"Maximum likelihood","level":2,"score":0.5735300779342651},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.487004816532135},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.4804189205169678},{"id":"https://openalex.org/C158379689","wikidata":"https://www.wikidata.org/wiki/Q3533504","display_name":"Accelerated life testing","level":3,"score":0.4592430889606476},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4371872544288635},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.41952115297317505},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.38051140308380127},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.30480098724365234},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2559639811515808},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2011.2134270","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2011.2134270","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5899999737739563,"display_name":"Responsible consumption and production","id":"https://metadata.un.org/sdg/12"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W571112424","https://openalex.org/W1524403460","https://openalex.org/W1964743237","https://openalex.org/W1967220302","https://openalex.org/W1978778777","https://openalex.org/W1981754351","https://openalex.org/W1997101385","https://openalex.org/W2007588469","https://openalex.org/W2013981617","https://openalex.org/W2015985785","https://openalex.org/W2017188690","https://openalex.org/W2033137855","https://openalex.org/W2041535943","https://openalex.org/W2049633694","https://openalex.org/W2054752282","https://openalex.org/W2065691010","https://openalex.org/W2066586506","https://openalex.org/W2067788197","https://openalex.org/W2093953385","https://openalex.org/W2112491126","https://openalex.org/W2116913389","https://openalex.org/W2118245659","https://openalex.org/W2124687376","https://openalex.org/W2127968325","https://openalex.org/W2128246140","https://openalex.org/W2130504762","https://openalex.org/W2135157657","https://openalex.org/W2144249794","https://openalex.org/W2147618942","https://openalex.org/W2148485389","https://openalex.org/W2150786290","https://openalex.org/W2151038992","https://openalex.org/W2152185056","https://openalex.org/W2165024200","https://openalex.org/W2167352409","https://openalex.org/W2406230580","https://openalex.org/W2795854098","https://openalex.org/W4233921518","https://openalex.org/W4299419703"],"related_works":["https://openalex.org/W2612366884","https://openalex.org/W1550332805","https://openalex.org/W2028776640","https://openalex.org/W818846059","https://openalex.org/W2377206442","https://openalex.org/W3130536972","https://openalex.org/W2073570371","https://openalex.org/W1993222773","https://openalex.org/W1931687159","https://openalex.org/W2392590245"],"abstract_inverted_index":{"This":[0],"article":[1],"introduces":[2],"a":[3,63,70,105,118,122],"p-stage":[4],"step-stress":[5],"accelerated":[6],"life":[7],"test":[8],"on":[9,80],"n":[10],"system":[11,15,46,99],"products,":[12],"where":[13],"each":[14],"contains":[16],"m":[17],"<sub":[18],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[19],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">s</sub>":[20],"-independent":[21],"non-identical":[22],"components":[23,101],"connected":[24],"in":[25,54],"series,":[26],"and":[27,48,100,121],"it":[28],"fails":[29],"if":[30],"any":[31],"component":[32],"has":[33],"broken":[34],"down.":[35],"Due":[36],"to":[37,60],"cost":[38],"considerations":[39],"or":[40],"environmental":[41],"restrictions,":[42],"masked":[43],"causes":[44],"of":[45,91,97],"failures":[47],"type-I":[49],"censored":[50],"observations":[51],"might":[52],"occur":[53],"the":[55,81,92,95,98],"collected":[56],"data.":[57],"The":[58,112],"time":[59,107],"failure":[61],"under":[62,108,125],"pre-specified":[64],"stress":[65],"environment":[66],"is":[67,85,115],"described":[68],"by":[69],"Weibull-distributed":[71],"cumulative":[72],"exposure":[73],"model.":[74,93],"A":[75],"computationally":[76],"feasible":[77],"procedure":[78],"based":[79],"hybrid":[82],"EM-NR":[83],"algorithm":[84],"developed":[86],"for":[87],"maximum":[88],"likelihood":[89],"estimation":[90],"Further,":[94],"reliability":[96],"are":[102],"estimated":[103],"at":[104],"specified":[106],"usual":[109],"operating":[110],"conditions.":[111],"proposed":[113],"method":[114],"illustrated":[116],"through":[117],"numerical":[119],"example":[120],"simulation":[123],"study":[124],"various":[126],"masking":[127],"levels.":[128]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":7},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":7}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}