{"id":"https://openalex.org/W2003262075","doi":"https://doi.org/10.1109/tr.2011.2110190","title":"Special Section on Prognostics and Systems Health Management (PHM), Extended Papers From the PHM Macau 2010 Conference","display_name":"Special Section on Prognostics and Systems Health Management (PHM), Extended Papers From the PHM Macau 2010 Conference","publication_year":2011,"publication_date":"2011-03-01","ids":{"openalex":"https://openalex.org/W2003262075","doi":"https://doi.org/10.1109/tr.2011.2110190","mag":"2003262075"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2011.2110190","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2011.2110190","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100329735","display_name":"Wenbin Wang","orcid":"https://orcid.org/0000-0003-4950-005X"},"institutions":[{"id":"https://openalex.org/I39470171","display_name":"University of Ontario Institute of Technology","ror":"https://ror.org/016zre027","country_code":"CA","type":"education","lineage":["https://openalex.org/I39470171"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Wenbin Wang","raw_affiliation_strings":["University of Ontario Inst. of Tech"],"affiliations":[{"raw_affiliation_string":"University of Ontario Inst. of Tech","institution_ids":["https://openalex.org/I39470171"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5100329735"],"corresponding_institution_ids":["https://openalex.org/I39470171"],"apc_list":null,"apc_paid":null,"fwci":1.305,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.837183,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"60","issue":"1","first_page":"2","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.6949999928474426,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.6949999928474426,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13690","display_name":"Quality and Safety in Healthcare","score":0.5995000004768372,"subfield":{"id":"https://openalex.org/subfields/3607","display_name":"Medical Laboratory Technology"},"field":{"id":"https://openalex.org/fields/36","display_name":"Health Professions"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/prognostics","display_name":"Prognostics","score":0.9342589378356934},{"id":"https://openalex.org/keywords/section","display_name":"Section (typography)","score":0.5621556043624878},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5163613557815552},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.4232703745365143},{"id":"https://openalex.org/keywords/special-section","display_name":"Special section","score":0.41367238759994507},{"id":"https://openalex.org/keywords/library-science","display_name":"Library science","score":0.3985061049461365},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.37585681676864624},{"id":"https://openalex.org/keywords/aeronautics","display_name":"Aeronautics","score":0.32565605640411377},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3236500024795532},{"id":"https://openalex.org/keywords/operations-research","display_name":"Operations research","score":0.32145941257476807},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.1527908742427826},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.11117151379585266}],"concepts":[{"id":"https://openalex.org/C129364497","wikidata":"https://www.wikidata.org/wiki/Q3042561","display_name":"Prognostics","level":2,"score":0.9342589378356934},{"id":"https://openalex.org/C2780129039","wikidata":"https://www.wikidata.org/wiki/Q1931107","display_name":"Section (typography)","level":2,"score":0.5621556043624878},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5163613557815552},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.4232703745365143},{"id":"https://openalex.org/C2993458768","wikidata":"https://www.wikidata.org/wiki/Q3477549","display_name":"Special section","level":2,"score":0.41367238759994507},{"id":"https://openalex.org/C161191863","wikidata":"https://www.wikidata.org/wiki/Q199655","display_name":"Library science","level":1,"score":0.3985061049461365},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37585681676864624},{"id":"https://openalex.org/C178802073","wikidata":"https://www.wikidata.org/wiki/Q8421","display_name":"Aeronautics","level":1,"score":0.32565605640411377},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3236500024795532},{"id":"https://openalex.org/C42475967","wikidata":"https://www.wikidata.org/wiki/Q194292","display_name":"Operations research","level":1,"score":0.32145941257476807},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.1527908742427826},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.11117151379585266},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2011.2110190","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2011.2110190","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2310476526","https://openalex.org/W3213192587","https://openalex.org/W2144291498","https://openalex.org/W2535730979","https://openalex.org/W2030958945","https://openalex.org/W2370073012","https://openalex.org/W4386567722","https://openalex.org/W2557573737","https://openalex.org/W2383842997","https://openalex.org/W2143585755"],"abstract_inverted_index":{"The":[0,20],"six":[1],"papers":[2,12,21],"in":[3,14],"this":[4],"special":[5],"section":[6],"were":[7,22],"selected":[8],"from":[9,25],"the":[10,15,26],"best":[11],"presented":[13],"PHM":[16],"Macau":[17],"2010":[18],"conference.":[19],"significantly":[23],"extended":[24],"conference":[27],"papers,":[28],"so":[29],"are":[30],"unique":[31],"and":[32],"significant":[33],"work":[34],"vetted":[35],"through":[36],"peer":[37],"review.":[38]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}