{"id":"https://openalex.org/W2168005968","doi":"https://doi.org/10.1109/tr.2011.2104472","title":"Contract Specification for Hardware Interoperability Testing and Fault Analysis","display_name":"Contract Specification for Hardware Interoperability Testing and Fault Analysis","publication_year":2011,"publication_date":"2011-01-24","ids":{"openalex":"https://openalex.org/W2168005968","doi":"https://doi.org/10.1109/tr.2011.2104472","mag":"2168005968"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2011.2104472","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2011.2104472","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5031957864","display_name":"Raul Schmidlin Fajardo Silva","orcid":null},"institutions":[{"id":"https://openalex.org/I223822909","display_name":"Heidelberg University","ror":"https://ror.org/038t36y30","country_code":"DE","type":"education","lineage":["https://openalex.org/I223822909"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Raul Schmidlin Fajardo Silva","raw_affiliation_strings":["Department for Application Specific Computing, University of Heidelberg, Mannheim, DE, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department for Application Specific Computing, University of Heidelberg, Mannheim, DE, Germany","institution_ids":["https://openalex.org/I223822909"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083522280","display_name":"J\u00fcrgen Hesser","orcid":"https://orcid.org/0000-0002-4001-1164"},"institutions":[{"id":"https://openalex.org/I223822909","display_name":"Heidelberg University","ror":"https://ror.org/038t36y30","country_code":"DE","type":"education","lineage":["https://openalex.org/I223822909"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"J\u00fcrgen Hesser","raw_affiliation_strings":["Institute of Experimental Radiotherapy, University of Heidelberg, Mannheim, DE, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Experimental Radiotherapy, University of Heidelberg, Mannheim, DE, Germany","institution_ids":["https://openalex.org/I223822909"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109312690","display_name":"Reinhard M\u00e4nner","orcid":null},"institutions":[{"id":"https://openalex.org/I223822909","display_name":"Heidelberg University","ror":"https://ror.org/038t36y30","country_code":"DE","type":"education","lineage":["https://openalex.org/I223822909"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Reinhard Manner","raw_affiliation_strings":["Department for Application Specific Computing, University of Heidelberg, Mannheim, DE, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department for Application Specific Computing, University of Heidelberg, Mannheim, DE, Germany","institution_ids":["https://openalex.org/I223822909"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.18344993,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"60","issue":"1","first_page":"351","last_page":"362"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interoperability","display_name":"Interoperability","score":0.6396991014480591},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6206398010253906},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5368533730506897},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4580612778663635},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.45112648606300354},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.44719764590263367},{"id":"https://openalex.org/keywords/system-testing","display_name":"System testing","score":0.4256889224052429},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.37056857347488403},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.3245875835418701},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2556830644607544},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.22983741760253906},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08796605467796326}],"concepts":[{"id":"https://openalex.org/C20136886","wikidata":"https://www.wikidata.org/wiki/Q749647","display_name":"Interoperability","level":2,"score":0.6396991014480591},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6206398010253906},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5368533730506897},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4580612778663635},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.45112648606300354},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.44719764590263367},{"id":"https://openalex.org/C7166840","wikidata":"https://www.wikidata.org/wiki/Q1199682","display_name":"System testing","level":2,"score":0.4256889224052429},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.37056857347488403},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.3245875835418701},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2556830644607544},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.22983741760253906},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08796605467796326},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2011.2104472","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2011.2104472","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1508803109","https://openalex.org/W1583047567","https://openalex.org/W1594445969","https://openalex.org/W1647762017","https://openalex.org/W1944992649","https://openalex.org/W2022219508","https://openalex.org/W2052363833","https://openalex.org/W2065555358","https://openalex.org/W2106952242","https://openalex.org/W2110791027","https://openalex.org/W2118542338","https://openalex.org/W2128951853","https://openalex.org/W2135687076","https://openalex.org/W2140248153","https://openalex.org/W2143507441","https://openalex.org/W2152354161","https://openalex.org/W2154500705","https://openalex.org/W2157393168","https://openalex.org/W2162314935","https://openalex.org/W2319095408","https://openalex.org/W3147725805"],"related_works":["https://openalex.org/W2093262417","https://openalex.org/W2123131699","https://openalex.org/W650116260","https://openalex.org/W2378329187","https://openalex.org/W4390790060","https://openalex.org/W2134191509","https://openalex.org/W3209454962","https://openalex.org/W79697243","https://openalex.org/W2314257840","https://openalex.org/W2383699822"],"abstract_inverted_index":{"Hardware":[0],"failures":[1],"occur":[2],"especially":[3],"due":[4],"to":[5,51,62,88,119,129,133],"external":[6,92],"influences,":[7],"component":[8,33,54,72],"aging,":[9],"or":[10,24],"faulty":[11,15],"interoperability.":[12],"By":[13],"testing,":[14],"components":[16],"can":[17,149],"be":[18,63,150],"localized,":[19],"allowing":[20],"for":[21],"fault":[22,124],"isolation":[23],"repair.":[25],"The":[26],"contract":[27,49,85,113,121],"testing":[28,50,76,122],"strategy":[29],"from":[30],"software":[31],"specifies":[32],"interoperability":[34],"conditions,":[35],"and":[36,56,71,116,123,132],"systematically":[37],"creates":[38],"correspondent":[39],"tests":[40],"ensuring":[41],"the":[42,45,68,81,84,91,140,155],"operability":[43],"of":[44,83,94],"system.":[46,108,142],"We":[47],"adapt":[48],"hardware,":[52],"providing":[53],"specification,":[55],"monitoring":[57,82,156],"thereof.":[58],"Contract":[59,75],"specification":[60],"has":[61],"specialized":[64],"with":[65],"requirements":[66],"on":[67],"physical":[69],"environment":[70,135],"input":[73],"signals.":[74],"is":[77,114],"then":[78],"executed":[79],"through":[80],"parameters.":[86],"Furthermore,":[87],"reason":[89],"about":[90],"cause":[93],"errors,":[95],"signal":[96],"faults":[97,144],"are":[98,137,145],"categorized.":[99],"As":[100],"a":[101,112],"case":[102],"study,":[103],"we":[104],"present":[105],"an":[106],"communication":[107],"For":[109],"this":[110],"system,":[111],"defined,":[115],"circuits":[117],"implemented":[118],"perform":[120],"categorization.":[125],"Communication":[126],"faults,":[127],"related":[128],"hardware":[130],"errors":[131],"sporadic":[134],"disturbance,":[136],"injected":[138],"in":[139],"developed":[141],"These":[143],"completely":[146],"detected,":[147],"but":[148],"only":[151],"partially":[152],"categorized":[153],"by":[154],"approach.":[157]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2021,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}