{"id":"https://openalex.org/W2096344948","doi":"https://doi.org/10.1109/tr.2010.2104210","title":"Multi-State Reliability Systems Under Discrete Time Semi-Markovian Hypothesis","display_name":"Multi-State Reliability Systems Under Discrete Time Semi-Markovian Hypothesis","publication_year":2011,"publication_date":"2011-01-21","ids":{"openalex":"https://openalex.org/W2096344948","doi":"https://doi.org/10.1109/tr.2010.2104210","mag":"2096344948"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2010.2104210","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2010.2104210","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004139792","display_name":"Ourania Chryssaphinou","orcid":null},"institutions":[{"id":"https://openalex.org/I200777214","display_name":"National and Kapodistrian University of Athens","ror":"https://ror.org/04gnjpq42","country_code":"GR","type":"education","lineage":["https://openalex.org/I200777214"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Ourania Chryssaphinou","raw_affiliation_strings":["Department of Mathematics, University of Athens (NKUA), Athens, Greece","Dept. of Math., University of Athens, Athens, Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mathematics, University of Athens (NKUA), Athens, Greece","institution_ids":["https://openalex.org/I200777214"]},{"raw_affiliation_string":"Dept. of Math., University of Athens, Athens, Greece","institution_ids":["https://openalex.org/I200777214"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103145209","display_name":"Nikolaos Limnios","orcid":"https://orcid.org/0000-0002-6258-2304"},"institutions":[{"id":"https://openalex.org/I102516824","display_name":"Universit\u00e9 de Technologie de Compi\u00e8gne","ror":"https://ror.org/04y5kwa70","country_code":"FR","type":"education","lineage":["https://openalex.org/I102516824"]},{"id":"https://openalex.org/I4210155549","display_name":"Laboratoire de Math\u00e9matiques Blaise Pascal","ror":"https://ror.org/05sd5r855","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I198244214","https://openalex.org/I4210141950","https://openalex.org/I4210155549"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Nikolaos Limnios","raw_affiliation_strings":["Laboratoire de Math\u00e9matiques Appliqu\u00e9es de Compi\u00e8gne, Universit\u00e9 de Technologie de Compiegne, Compiegne, France","Lab. de Math. Appl. de Compiegne, Univ. de Technol. de Compiegne, Compiegne, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire de Math\u00e9matiques Appliqu\u00e9es de Compi\u00e8gne, Universit\u00e9 de Technologie de Compiegne, Compiegne, France","institution_ids":["https://openalex.org/I102516824","https://openalex.org/I4210155549"]},{"raw_affiliation_string":"Lab. de Math. Appl. de Compiegne, Univ. de Technol. de Compiegne, Compiegne, France","institution_ids":["https://openalex.org/I102516824"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038008325","display_name":"Sonia Malefaki","orcid":"https://orcid.org/0000-0002-0756-3557"},"institutions":[{"id":"https://openalex.org/I174878644","display_name":"University of Patras","ror":"https://ror.org/017wvtq80","country_code":"GR","type":"education","lineage":["https://openalex.org/I174878644"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Sonia Malefaki","raw_affiliation_strings":["Department of Engineering Sciences, University of Patras, Rio-Patras, Greece","Dept. of Eng. Sci., Univ. of Patras, Rio Patras, Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Engineering Sciences, University of Patras, Rio-Patras, Greece","institution_ids":["https://openalex.org/I174878644"]},{"raw_affiliation_string":"Dept. of Eng. Sci., Univ. of Patras, Rio Patras, Greece","institution_ids":["https://openalex.org/I174878644"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":24.3009,"has_fulltext":false,"cited_by_count":70,"citation_normalized_percentile":{"value":0.9953277,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"60","issue":"1","first_page":"80","last_page":"87"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/markov-chain","display_name":"Markov chain","score":0.7991383075714111},{"id":"https://openalex.org/keywords/markov-process","display_name":"Markov process","score":0.7265400290489197},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6448113322257996},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.6379352807998657},{"id":"https://openalex.org/keywords/discrete-time-and-continuous-time","display_name":"Discrete time and continuous time","score":0.5945199728012085},{"id":"https://openalex.org/keywords/random-variable","display_name":"Random variable","score":0.5638257265090942},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.5606623888015747},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.4956873655319214},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.48184406757354736},{"id":"https://openalex.org/keywords/discrete-phase-type-distribution","display_name":"Discrete phase-type distribution","score":0.4753941297531128},{"id":"https://openalex.org/keywords/markov-model","display_name":"Markov model","score":0.4731517732143402},{"id":"https://openalex.org/keywords/applied-mathematics","display_name":"Applied mathematics","score":0.46453648805618286},{"id":"https://openalex.org/keywords/continuous-time-markov-chain","display_name":"Continuous-time Markov chain","score":0.45423999428749084},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41699928045272827},{"id":"https://openalex.org/keywords/markov-renewal-process","display_name":"Markov renewal process","score":0.4144241213798523},{"id":"https://openalex.org/keywords/stochastic-process","display_name":"Stochastic process","score":0.41131266951560974},{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.4105619490146637},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.36538970470428467},{"id":"https://openalex.org/keywords/variable-order-markov-model","display_name":"Variable-order Markov model","score":0.32918593287467957},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.24594107270240784},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.177361398935318},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07903826236724854},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.06666329503059387}],"concepts":[{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.7991383075714111},{"id":"https://openalex.org/C159886148","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov process","level":2,"score":0.7265400290489197},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6448113322257996},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.6379352807998657},{"id":"https://openalex.org/C55689738","wikidata":"https://www.wikidata.org/wiki/Q15963867","display_name":"Discrete time and continuous time","level":2,"score":0.5945199728012085},{"id":"https://openalex.org/C122123141","wikidata":"https://www.wikidata.org/wiki/Q176623","display_name":"Random variable","level":2,"score":0.5638257265090942},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.5606623888015747},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.4956873655319214},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.48184406757354736},{"id":"https://openalex.org/C130359071","wikidata":"https://www.wikidata.org/wiki/Q5282057","display_name":"Discrete phase-type distribution","level":5,"score":0.4753941297531128},{"id":"https://openalex.org/C163836022","wikidata":"https://www.wikidata.org/wiki/Q6771326","display_name":"Markov model","level":3,"score":0.4731517732143402},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.46453648805618286},{"id":"https://openalex.org/C147080032","wikidata":"https://www.wikidata.org/wiki/Q176720","display_name":"Continuous-time Markov chain","level":5,"score":0.45423999428749084},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41699928045272827},{"id":"https://openalex.org/C163540672","wikidata":"https://www.wikidata.org/wiki/Q1115431","display_name":"Markov renewal process","level":5,"score":0.4144241213798523},{"id":"https://openalex.org/C8272713","wikidata":"https://www.wikidata.org/wiki/Q176737","display_name":"Stochastic process","level":2,"score":0.41131266951560974},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.4105619490146637},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.36538970470428467},{"id":"https://openalex.org/C54907487","wikidata":"https://www.wikidata.org/wiki/Q7915688","display_name":"Variable-order Markov model","level":4,"score":0.32918593287467957},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.24594107270240784},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.177361398935318},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07903826236724854},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.06666329503059387},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/tr.2010.2104210","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2010.2104210","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.908.3784","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.908.3784","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://mmr.gubkin.ru/uploads/submitted_papers/Chryssaphinou_Limnios_Malefaki.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.923.3173","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.923.3173","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"https://www.researchgate.net/profile/Nikolaos_Limnios/publication/224213602_Multi-State_Reliability_Systems_Under_Discrete_Time_Semi-Markovian_Hypothesis/links/00b4952559dc556f96000000.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.923.7296","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.923.7296","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"https://www.researchgate.net/profile/Nikolaos_Limnios/publication/224213602_Multi-State_Reliability_Systems_Under_Discrete_Time_Semi-Markovian_Hypothesis/links/00b7d52b0d61a0b4bb000000.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W65128720","https://openalex.org/W76658858","https://openalex.org/W436503306","https://openalex.org/W594959255","https://openalex.org/W626418592","https://openalex.org/W1608325120","https://openalex.org/W1992045509","https://openalex.org/W1993030408","https://openalex.org/W1993199510","https://openalex.org/W1993287870","https://openalex.org/W1994012457","https://openalex.org/W1994460880","https://openalex.org/W2000350440","https://openalex.org/W2006273319","https://openalex.org/W2018625634","https://openalex.org/W2021374909","https://openalex.org/W2028335380","https://openalex.org/W2028888999","https://openalex.org/W2064392392","https://openalex.org/W2109077599","https://openalex.org/W2125697860","https://openalex.org/W2133416481","https://openalex.org/W2199220290","https://openalex.org/W2316039394","https://openalex.org/W2482808484","https://openalex.org/W3087788150","https://openalex.org/W4229663176","https://openalex.org/W6602647045"],"related_works":["https://openalex.org/W4379794419","https://openalex.org/W3173774827","https://openalex.org/W3022658609","https://openalex.org/W2319591558","https://openalex.org/W4244907444","https://openalex.org/W4256241332","https://openalex.org/W2987631717","https://openalex.org/W2159877461","https://openalex.org/W1560931929","https://openalex.org/W1607121877"],"abstract_inverted_index":{"We":[0],"consider":[1],"repairable":[2],"Multi-state":[3],"reliability":[4,112,126],"systems":[5],"with":[6],"components,":[7],"the":[8,11,25,31,39,60,74,78,84,90,94,105],"lifetimes":[9],"and":[10,73,93,132],"repair":[12],"times":[13],"of":[14,38,48,63,77,86,89,120],"which":[15],"are":[16],"-independent.":[17],"The":[18,43],"-th":[19],"component":[20,65],"can":[21],"be":[22],"either":[23],"in":[24,30,36,46,124],"complete":[26],"failure":[27],"state":[28,33],"0,":[29],"perfect":[32],",":[34],"or":[35],"one":[37],"degradation":[40],"states":[41,50],".":[42],"sojourn":[44],"time":[45,61,75,98],"any":[47],"these":[49],"is":[51,66,81],"a":[52,56,69],"random":[53],"variable":[54],"following":[55],"discrete":[57],"distribution.":[58],"Thus,":[59],"behavior":[62,76],"each":[64],"described":[67,82],"by":[68,83],"discrete-time":[70,106],"semi-Markov":[71,91,107],"chain,":[72],"whole":[79],"system":[80],"vector":[85],"paired":[87],"processes":[88],"chain":[92],"corresponding":[95],"backward":[96],"recurrence":[97],"process.":[99],"Using":[100],"recently":[101],"obtained":[102],"results":[103,119],"concerning":[104],"chains,":[108],"we":[109,115],"derive":[110],"basic":[111],"measures.":[113],"Finally,":[114],"present":[116],"some":[117],"numerical":[118],"our":[121],"proposed":[122],"approach":[123],"specific":[125],"systems,":[127],"namely":[128],"series,":[129],"parallel,":[130],"k-out-of-n:F,":[131],"consecutive-k-out-of-n:F":[133],"systems.":[134]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":8},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":5},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":9},{"year":2012,"cited_by_count":4}],"updated_date":"2026-06-27T08:28:00.272161","created_date":"2025-10-10T00:00:00"}