{"id":"https://openalex.org/W2154526113","doi":"https://doi.org/10.1109/tr.2010.2103672","title":"Criticality Assessment Models for Failure Mode Effects and Criticality Analysis Using Fuzzy Logic","display_name":"Criticality Assessment Models for Failure Mode Effects and Criticality Analysis Using Fuzzy Logic","publication_year":2011,"publication_date":"2011-01-13","ids":{"openalex":"https://openalex.org/W2154526113","doi":"https://doi.org/10.1109/tr.2010.2103672","mag":"2154526113"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2010.2103672","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2010.2103672","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047397581","display_name":"Heeralal Gargama","orcid":null},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Heeralal Gargama","raw_affiliation_strings":["Reliability Engineering Centre, Indian Institute of Technology, Kharagpur, Kharagpur, West Bengal, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Reliability Engineering Centre, Indian Institute of Technology, Kharagpur, Kharagpur, West Bengal, India","institution_ids":["https://openalex.org/I145894827"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025537247","display_name":"Sanjay K. Chaturvedi","orcid":"https://orcid.org/0000-0003-0764-1559"},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sanjay Kumar Chaturvedi","raw_affiliation_strings":["Reliability Engineering Centre, Indian Institute of Technology, Kharagpur, Kharagpur, West Bengal, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Reliability Engineering Centre, Indian Institute of Technology, Kharagpur, Kharagpur, West Bengal, India","institution_ids":["https://openalex.org/I145894827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I145894827"],"apc_list":null,"apc_paid":null,"fwci":12.5101,"has_fulltext":false,"cited_by_count":217,"citation_normalized_percentile":{"value":0.98868638,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"60","issue":"1","first_page":"102","last_page":"110"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10050","display_name":"Multi-Criteria Decision Making","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T10050","display_name":"Multi-Criteria Decision Making","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/failure-mode-and-effects-analysis","display_name":"Failure mode and effects analysis","score":0.7504289746284485},{"id":"https://openalex.org/keywords/fuzzy-logic","display_name":"Fuzzy logic","score":0.7018657326698303},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.630174994468689},{"id":"https://openalex.org/keywords/criticality","display_name":"Criticality","score":0.6103768348693848},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6027963757514954},{"id":"https://openalex.org/keywords/failure-mode-effects-and-criticality-analysis","display_name":"Failure mode, effects, and criticality analysis","score":0.5626287460327148},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5205436944961548},{"id":"https://openalex.org/keywords/fuzzy-set","display_name":"Fuzzy set","score":0.5117170810699463},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.4965525269508362},{"id":"https://openalex.org/keywords/fuzzy-number","display_name":"Fuzzy number","score":0.4565865397453308},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.41904953122138977},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.346718430519104},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28028398752212524},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2214820384979248},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.17431142926216125}],"concepts":[{"id":"https://openalex.org/C66283442","wikidata":"https://www.wikidata.org/wiki/Q1389268","display_name":"Failure mode and effects analysis","level":2,"score":0.7504289746284485},{"id":"https://openalex.org/C58166","wikidata":"https://www.wikidata.org/wiki/Q224821","display_name":"Fuzzy logic","level":2,"score":0.7018657326698303},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.630174994468689},{"id":"https://openalex.org/C125611927","wikidata":"https://www.wikidata.org/wiki/Q17008131","display_name":"Criticality","level":2,"score":0.6103768348693848},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6027963757514954},{"id":"https://openalex.org/C30098461","wikidata":"https://www.wikidata.org/wiki/Q909342","display_name":"Failure mode, effects, and criticality analysis","level":3,"score":0.5626287460327148},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5205436944961548},{"id":"https://openalex.org/C42011625","wikidata":"https://www.wikidata.org/wiki/Q1055058","display_name":"Fuzzy set","level":3,"score":0.5117170810699463},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.4965525269508362},{"id":"https://openalex.org/C1883856","wikidata":"https://www.wikidata.org/wiki/Q3407463","display_name":"Fuzzy number","level":4,"score":0.4565865397453308},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.41904953122138977},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.346718430519104},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28028398752212524},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2214820384979248},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.17431142926216125},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2010.2103672","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2010.2103672","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1485268022","https://openalex.org/W1550917020","https://openalex.org/W1589945262","https://openalex.org/W1605262337","https://openalex.org/W1963848153","https://openalex.org/W1973532150","https://openalex.org/W1977644526","https://openalex.org/W1979768108","https://openalex.org/W1983686086","https://openalex.org/W1995423287","https://openalex.org/W1998184794","https://openalex.org/W1999421534","https://openalex.org/W2009568361","https://openalex.org/W2046835320","https://openalex.org/W2054524765","https://openalex.org/W2055749938","https://openalex.org/W2055945297","https://openalex.org/W2079658287","https://openalex.org/W2087745828","https://openalex.org/W2090015314","https://openalex.org/W2130457621","https://openalex.org/W2912565176","https://openalex.org/W4211007335","https://openalex.org/W4299491078","https://openalex.org/W6636334919"],"related_works":["https://openalex.org/W2220324042","https://openalex.org/W3138570190","https://openalex.org/W2782257358","https://openalex.org/W4362495947","https://openalex.org/W2059800017","https://openalex.org/W2361355225","https://openalex.org/W2117718616","https://openalex.org/W3146179449","https://openalex.org/W2013435365","https://openalex.org/W1966223403"],"abstract_inverted_index":{"Traditional":[0],"Failure":[1],"Mode":[2],"and":[3,14,26,33,93,115,124,133,160],"Effects":[4],"Analysis":[5],"(FMEA)":[6],"has":[7,58],"shown":[8],"its":[9,45],"effectiveness":[10],"in":[11,22,38,126],"defining,":[12],"identifying,":[13],"eliminating":[15],"known":[16],"and/or":[17],"potential":[18],"failures":[19,69],"or":[20],"problems":[21],"products,":[23],"process,":[24],"designs,":[25],"services":[27],"to":[28,47,73,98,152],"help":[29],"ensure":[30],"the":[31,85,111,122,127,135,154,157,161,165],"safety":[32],"reliability":[34],"of":[35,42,77,113,129,146],"systems":[36],"applied":[37],"a":[39,52,100,139],"wide":[40],"range":[41],"industries.":[43],"However,":[44],"approach":[46,108],"prioritize":[48],"failure":[49],"modes":[50],"through":[51],"crisp":[53],"risk":[54,87],"priority":[55],"number":[56,163],"(RPN)":[57],"been":[59],"highly":[60],"controversial.":[61],"This":[62,118],"paper":[63],"proposes":[64],"two":[65],"models":[66,170],"for":[67],"prioritizing":[68],"modes,":[70],"specifically":[71],"intended":[72],"overcome":[74],"such":[75],"limitations":[76],"traditional":[78],"FMEA.":[79],"The":[80,103,144,168],"first":[81],"proposed":[82,169],"model":[83,105,120],"treats":[84],"three":[86],"factors":[88],"as":[89],"fuzzy":[90,101,116,142,162],"linguistic":[91,166],"variables,":[92],"employs":[94,106],"alpha":[95],"level":[96],"sets":[97],"provide":[99],"RPN.":[102],"second":[104,119],"an":[107],"based":[109],"on":[110],"degree":[112,145],"match":[114,147],"rule-base.":[117],"considers":[121],"diversity":[123],"uncertainty":[125],"opinions":[128],"FMEA":[130],"team":[131],"members,":[132],"converts":[134],"assessed":[136,158],"information":[137,159],"into":[138],"convex":[140],"normalized":[141],"number.":[143],"(DM)":[148],"is":[149],"used":[150],"thereafter":[151],"estimate":[153],"matching":[155],"between":[156],"characterizing":[164],"terms.":[167],"are":[171],"suitably":[172],"supplemented":[173],"by":[174],"illustrative":[175],"examples.":[176]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":9},{"year":2023,"cited_by_count":15},{"year":2022,"cited_by_count":23},{"year":2021,"cited_by_count":23},{"year":2020,"cited_by_count":23},{"year":2019,"cited_by_count":26},{"year":2018,"cited_by_count":13},{"year":2017,"cited_by_count":21},{"year":2016,"cited_by_count":16},{"year":2015,"cited_by_count":9},{"year":2014,"cited_by_count":14},{"year":2013,"cited_by_count":9},{"year":2012,"cited_by_count":7}],"updated_date":"2026-07-04T07:58:01.006859","created_date":"2025-10-10T00:00:00"}