{"id":"https://openalex.org/W2155533555","doi":"https://doi.org/10.1109/tr.2010.2055931","title":"A New Universal Generating Function Method for Estimating the Novel Multiresource Multistate Information Network Reliability","display_name":"A New Universal Generating Function Method for Estimating the Novel Multiresource Multistate Information Network Reliability","publication_year":2010,"publication_date":"2010-08-03","ids":{"openalex":"https://openalex.org/W2155533555","doi":"https://doi.org/10.1109/tr.2010.2055931","mag":"2155533555"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2010.2055931","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2010.2055931","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012456515","display_name":"Wei\u2010Chang Yeh","orcid":"https://orcid.org/0000-0001-7393-0768"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Wei-Chang Yeh","raw_affiliation_strings":["Integration and Collaboration Laboratory, Department of Industrial Engineering and Engineering Management, National Tsing Hua University, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"Integration and Collaboration Laboratory, Department of Industrial Engineering and Engineering Management, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006921134","display_name":"Xiangjian He","orcid":"https://orcid.org/0000-0001-8962-540X"},"institutions":[{"id":"https://openalex.org/I114017466","display_name":"University of Technology Sydney","ror":"https://ror.org/03f0f6041","country_code":"AU","type":"education","lineage":["https://openalex.org/I114017466"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Xiangjian He","raw_affiliation_strings":["Centre for Innovation in IT Services and Applications (iNext), University of Technology, Sydney, NSW, Australia"],"affiliations":[{"raw_affiliation_string":"Centre for Innovation in IT Services and Applications (iNext), University of Technology, Sydney, NSW, Australia","institution_ids":["https://openalex.org/I114017466"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5012456515"],"corresponding_institution_ids":["https://openalex.org/I25846049"],"apc_list":null,"apc_paid":null,"fwci":3.4087,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.92811072,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"59","issue":"3","first_page":"528","last_page":"538"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/correctness","display_name":"Correctness","score":0.8240783214569092},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.708314836025238},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6133625507354736},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.5851131677627563},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.554130494594574},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.5124476552009583},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.4396665394306183},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.34293419122695923},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.34163331985473633},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.25781869888305664},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.2390865981578827},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1380268633365631},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.10228180885314941}],"concepts":[{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.8240783214569092},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.708314836025238},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6133625507354736},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.5851131677627563},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.554130494594574},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.5124476552009583},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.4396665394306183},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.34293419122695923},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.34163331985473633},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.25781869888305664},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2390865981578827},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1380268633365631},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.10228180885314941},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tr.2010.2055931","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2010.2055931","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},{"id":"pmh:oai:opus.lib.uts.edu.au:10453/13476","is_oa":false,"landing_page_url":"http://hdl.handle.net/10453/34153","pdf_url":null,"source":{"id":"https://openalex.org/S4306401357","display_name":"UTS ePRESS (University of Technology Sydney)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I114017466","host_organization_name":"University of Technology Sydney","host_organization_lineage":["https://openalex.org/I114017466"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Journal Article"},{"id":"pmh:oai:opus.lib.uts.edu.au:10453/34153","is_oa":false,"landing_page_url":"http://hdl.handle.net/10453/13476","pdf_url":null,"source":{"id":"https://openalex.org/S4306401357","display_name":"UTS ePRESS (University of Technology Sydney)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I114017466","host_organization_name":"University of Technology Sydney","host_organization_lineage":["https://openalex.org/I114017466"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Journal Article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/15","display_name":"Life in Land","score":0.7099999785423279}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W642414339","https://openalex.org/W651391931","https://openalex.org/W1481156553","https://openalex.org/W1524804355","https://openalex.org/W1985342141","https://openalex.org/W1995596738","https://openalex.org/W1996230975","https://openalex.org/W1999896306","https://openalex.org/W2002936763","https://openalex.org/W2008525610","https://openalex.org/W2026110408","https://openalex.org/W2027165440","https://openalex.org/W2027388513","https://openalex.org/W2029161419","https://openalex.org/W2043264322","https://openalex.org/W2046682436","https://openalex.org/W2061170302","https://openalex.org/W2096391914","https://openalex.org/W2097127372","https://openalex.org/W2106337575","https://openalex.org/W2114572907","https://openalex.org/W2117889403","https://openalex.org/W2121958403","https://openalex.org/W2126437506","https://openalex.org/W2150815458","https://openalex.org/W2152803417","https://openalex.org/W2164351502","https://openalex.org/W2168057190","https://openalex.org/W2498515531","https://openalex.org/W3087243477","https://openalex.org/W4229663176","https://openalex.org/W4285719527","https://openalex.org/W6784064501"],"related_works":["https://openalex.org/W1604988569","https://openalex.org/W2169485462","https://openalex.org/W4234640806","https://openalex.org/W2322306178","https://openalex.org/W2803158971","https://openalex.org/W2418268462","https://openalex.org/W4311657253","https://openalex.org/W4386007221","https://openalex.org/W2374141191","https://openalex.org/W4251848739"],"abstract_inverted_index":{"In":[0],"this":[1,73],"article,":[2],"we":[3],"introduce":[4],"a":[5],"special":[6],"novel":[7],"multistate":[8,36],"network":[9,31,38],"that":[10],"permits":[11],"multiresource":[12,35],"to":[13,20,94],"be":[14,86],"transmitted":[15],"from":[16,63],"the":[17,26,34,47,64,82,102],"source":[18],"node":[19],"multiple":[21],"targets":[22],"simultaneously":[23],"without":[24],"satisfying":[25],"flow":[27],"conservation":[28],"law.":[29],"This":[30],"is":[32,49,70,92,99],"called":[33],"information":[37],"(MMIN).":[39],"The":[40,76],"one-to-many-targets":[41],"(i.e.":[42],"one-to-all-target-subset)":[43],"reliability":[44,98],"problem":[45],"of":[46,81],"MMIN":[48,97],"considered":[50],"next":[51],"under":[52],"limited":[53],"cost":[54],"and":[55,78,88],"capacity":[56],"constraints.":[57],"A":[58],"straightforward,":[59],"exact":[60],"algorithm":[61],"derived":[62],"universal":[65],"generating":[66],"function":[67],"method":[68],"(UGFM)":[69],"developed":[71],"for":[72],"new":[74],"problem.":[75],"correctness":[77],"computational":[79],"complexity":[80],"proposed":[83,103],"UGFM":[84],"will":[85],"analysed":[87],"proven.":[89],"One":[90],"example":[91],"given":[93],"illustrate":[95],"how":[96],"evaluated":[100],"using":[101],"UGFM.":[104]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}