{"id":"https://openalex.org/W2149044304","doi":"https://doi.org/10.1109/tr.2010.2048659","title":"A Framework for Reliability Approximation of Multi-State Weighted $k$-out-of-$n$ Systems","display_name":"A Framework for Reliability Approximation of Multi-State Weighted $k$-out-of-$n$ Systems","publication_year":2010,"publication_date":"2010-06-01","ids":{"openalex":"https://openalex.org/W2149044304","doi":"https://doi.org/10.1109/tr.2010.2048659","mag":"2149044304"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2010.2048659","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2010.2048659","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081538711","display_name":"Yi Ding","orcid":"https://orcid.org/0000-0003-4389-5636"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"Yi Ding","raw_affiliation_strings":["School of EEE, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of EEE, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043676611","display_name":"Ming J. Zuo","orcid":"https://orcid.org/0000-0002-8607-2923"},"institutions":[{"id":"https://openalex.org/I154425047","display_name":"University of Alberta","ror":"https://ror.org/0160cpw27","country_code":"CA","type":"education","lineage":["https://openalex.org/I154425047"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Ming J. Zuo","raw_affiliation_strings":["Department of Mechanical Engineering, University of Alberta Edmonton, AB, Canada"],"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, University of Alberta Edmonton, AB, Canada","institution_ids":["https://openalex.org/I154425047"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013228152","display_name":"Anatoly Lisnianski","orcid":"https://orcid.org/0000-0002-5451-4707"},"institutions":[{"id":"https://openalex.org/I80687555","display_name":"Israel Electric (Israel)","ror":"https://ror.org/01p8dnv11","country_code":"IL","type":"company","lineage":["https://openalex.org/I80687555"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Anatoly Lisnianski","raw_affiliation_strings":["Israel Electric Corporation Limited, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Israel Electric Corporation Limited, Haifa, Israel","institution_ids":["https://openalex.org/I80687555"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100318227","display_name":"Wei Li","orcid":"https://orcid.org/0000-0002-5942-4591"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Wei Li","raw_affiliation_strings":["Citigroup Center, London, UK"],"affiliations":[{"raw_affiliation_string":"Citigroup Center, London, UK","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5081538711"],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":null,"apc_paid":null,"fwci":19.316,"has_fulltext":false,"cited_by_count":85,"citation_normalized_percentile":{"value":0.99243035,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"59","issue":"2","first_page":"297","last_page":"308"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/notation","display_name":"Notation","score":0.831612229347229},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.5413709282875061},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.4550739824771881},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.44838523864746094},{"id":"https://openalex.org/keywords/dimension","display_name":"Dimension (graph theory)","score":0.41701388359069824},{"id":"https://openalex.org/keywords/discrete-mathematics","display_name":"Discrete mathematics","score":0.385581374168396},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3353317379951477},{"id":"https://openalex.org/keywords/algebra-over-a-field","display_name":"Algebra over a field","score":0.32809978723526},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.32241496443748474},{"id":"https://openalex.org/keywords/pure-mathematics","display_name":"Pure mathematics","score":0.2183363437652588},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.15250423550605774}],"concepts":[{"id":"https://openalex.org/C45357846","wikidata":"https://www.wikidata.org/wiki/Q2001982","display_name":"Notation","level":2,"score":0.831612229347229},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.5413709282875061},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.4550739824771881},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.44838523864746094},{"id":"https://openalex.org/C33676613","wikidata":"https://www.wikidata.org/wiki/Q13415176","display_name":"Dimension (graph theory)","level":2,"score":0.41701388359069824},{"id":"https://openalex.org/C118615104","wikidata":"https://www.wikidata.org/wiki/Q121416","display_name":"Discrete mathematics","level":1,"score":0.385581374168396},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3353317379951477},{"id":"https://openalex.org/C136119220","wikidata":"https://www.wikidata.org/wiki/Q1000660","display_name":"Algebra over a field","level":2,"score":0.32809978723526},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.32241496443748474},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.2183363437652588},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.15250423550605774},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2010.2048659","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2010.2048659","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W642414339","https://openalex.org/W1502876580","https://openalex.org/W1542883383","https://openalex.org/W1569468020","https://openalex.org/W1570834090","https://openalex.org/W1574146411","https://openalex.org/W1967438615","https://openalex.org/W1984987698","https://openalex.org/W1992957376","https://openalex.org/W1993030408","https://openalex.org/W1995450389","https://openalex.org/W1999203685","https://openalex.org/W2027165440","https://openalex.org/W2043264322","https://openalex.org/W2044960217","https://openalex.org/W2057108710","https://openalex.org/W2059795097","https://openalex.org/W2102828897","https://openalex.org/W2105842703","https://openalex.org/W2118872830","https://openalex.org/W2124384532","https://openalex.org/W2128602647","https://openalex.org/W2131562456","https://openalex.org/W2135330303","https://openalex.org/W2136305032","https://openalex.org/W2154386519","https://openalex.org/W2159854031","https://openalex.org/W2165716025","https://openalex.org/W2170157156","https://openalex.org/W2399695943","https://openalex.org/W2480422823","https://openalex.org/W3140621671","https://openalex.org/W3149830556","https://openalex.org/W4240337375","https://openalex.org/W4285719527","https://openalex.org/W4293860495","https://openalex.org/W6713205166"],"related_works":["https://openalex.org/W2504004674","https://openalex.org/W1595229445","https://openalex.org/W2498744856","https://openalex.org/W4390482104","https://openalex.org/W322408318","https://openalex.org/W149041114","https://openalex.org/W2963177394","https://openalex.org/W1965815883","https://openalex.org/W763418848","https://openalex.org/W2024638892"],"abstract_inverted_index":{"<para":[0],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[1],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[2],"The":[3,179,193],"multi-state":[4,35,62,140,153],"<formula":[5,37,63,142,155],"formulatype=\"inline\"><tex":[6,9,38,41,64,66,143,146],"Notation=\"TeX\">$k$</tex>":[7,39,144],"</formula>-out-of-<formula":[8,40,145],"Notation=\"TeX\">$n$</tex>":[10,42,147],"</formula>":[11,43,148],"system":[12,44,113,126,162],"model":[13,28],"finds":[14],"wide":[15],"applications":[16],"in":[17,24,88,93,211],"industry,":[18],"and":[19,48,96,183,196,207],"has":[20,29],"been":[21,31],"extensively":[22],"studied":[23],"recent":[25],"years.":[26],"This":[27],"also":[30,177],"generalized":[32],"to":[33,124,189,202],"the":[34,70,74,86,89,94,97,173,204,212],"weighted":[36,141,154],"model.":[45],"Recursive":[46],"methods,":[47,182],"universal":[49],"generating":[50],"functions":[51],"(UGF)":[52],"are":[53,115,164,176,187,200],"two":[54,170],"primary":[55],"algorithms":[56,123],"for":[57,136,167],"exact":[58,110],"performance":[59],"evaluation":[60],"of":[61,91,99,112,139,209],"Notation=\"TeX\">$k$</tex></formula>-out-of-<formula":[65,158],"Notation=\"TeX\">$n$</tex></formula>":[67,161],"systems.":[68,149,192],"However":[69],"computational":[71],"burden":[72],"becomes":[73],"crucial":[75],"factor":[76],"when":[77],"there":[78],"is":[79],"a":[80,102,133],"\u201cdimension":[81],"damnation\u201d":[82],"problem":[83],"caused":[84],"by":[85],"increase":[87],"number":[90,98],"components":[92],"system,":[95],"possible":[100],"states":[101,210],"component":[103],"may":[104,119],"be":[105],"in.":[106],"In":[107,128],"situations":[108],"wherein":[109],"values":[111],"reliability":[114,137],"not":[116],"necessary,":[117],"we":[118,131],"use":[120],"more":[121],"efficient":[122],"approximate":[125],"reliability.":[127],"this":[129],"paper,":[130],"develop":[132],"comprehensive":[134],"framework":[135],"approximation":[138],"Two":[150],"fuzzy":[151,180,184,205],"based":[152],"formulatype=\"inline\">":[156,159],"<tex":[157,160],"models":[163,171,175],"defined.":[165],"Procedures":[166],"building":[168],"these":[169],"from":[172],"conventional":[174],"introduced.":[178],"recursive":[181],"UGF":[185],"techniques":[186],"developed":[188],"evaluate":[190],"such":[191],"clustering":[194],"technique,":[195],"curve":[197],"fitting":[198],"method":[199],"used":[201],"determine":[203],"weights,":[206],"probabilities":[208],"models.":[213],"</para>":[214]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":8},{"year":2020,"cited_by_count":12},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":8},{"year":2013,"cited_by_count":8},{"year":2012,"cited_by_count":7}],"updated_date":"2026-04-15T08:11:43.952461","created_date":"2025-10-10T00:00:00"}