{"id":"https://openalex.org/W2124258383","doi":"https://doi.org/10.1109/tr.2008.2011673","title":"Variable Ordering to Improve BDD Analysis of Phased-Mission Systems With Multimode Failures","display_name":"Variable Ordering to Improve BDD Analysis of Phased-Mission Systems With Multimode Failures","publication_year":2009,"publication_date":"2009-02-13","ids":{"openalex":"https://openalex.org/W2124258383","doi":"https://doi.org/10.1109/tr.2008.2011673","mag":"2124258383"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2008.2011673","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2008.2011673","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018347033","display_name":"Yuchang Mo","orcid":"https://orcid.org/0000-0002-1976-5412"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]},{"id":"https://openalex.org/I4210090971","display_name":"Southeast University","ror":"https://ror.org/00cf0ab87","country_code":"BD","type":"education","lineage":["https://openalex.org/I4210090971"]}],"countries":["BD","CN"],"is_corresponding":true,"raw_author_name":"Yuchang Mo","raw_affiliation_strings":["School of Computer Science and Engineering, South-East University, Nanjing, China","School of Computer Science and Engineering, Southeast University, Nanjing"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Computer Science and Engineering, South-East University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]},{"raw_affiliation_string":"School of Computer Science and Engineering, Southeast University, Nanjing","institution_ids":["https://openalex.org/I4210090971"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5018347033"],"corresponding_institution_ids":["https://openalex.org/I4210090971","https://openalex.org/I76569877"],"apc_list":null,"apc_paid":null,"fwci":4.7365,"has_fulltext":false,"cited_by_count":37,"citation_normalized_percentile":{"value":0.94801103,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"58","issue":"1","first_page":"53","last_page":"57"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/heuristics","display_name":"Heuristics","score":0.8333182334899902},{"id":"https://openalex.org/keywords/binary-decision-diagram","display_name":"Binary decision diagram","score":0.7777647376060486},{"id":"https://openalex.org/keywords/heuristic","display_name":"Heuristic","score":0.5667640566825867},{"id":"https://openalex.org/keywords/variable","display_name":"Variable (mathematics)","score":0.5649694204330444},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5522451996803284},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5464500188827515},{"id":"https://openalex.org/keywords/binary-number","display_name":"Binary number","score":0.48741868138313293},{"id":"https://openalex.org/keywords/fault-tree-analysis","display_name":"Fault tree analysis","score":0.4719589948654175},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4670160412788391},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4597194194793701},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.43502283096313477},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.4007846415042877},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.32305780053138733},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2893322706222534},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1819472312927246},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.10858607292175293}],"concepts":[{"id":"https://openalex.org/C127705205","wikidata":"https://www.wikidata.org/wiki/Q5748245","display_name":"Heuristics","level":2,"score":0.8333182334899902},{"id":"https://openalex.org/C3309909","wikidata":"https://www.wikidata.org/wiki/Q864155","display_name":"Binary decision diagram","level":2,"score":0.7777647376060486},{"id":"https://openalex.org/C173801870","wikidata":"https://www.wikidata.org/wiki/Q201413","display_name":"Heuristic","level":2,"score":0.5667640566825867},{"id":"https://openalex.org/C182365436","wikidata":"https://www.wikidata.org/wiki/Q50701","display_name":"Variable (mathematics)","level":2,"score":0.5649694204330444},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5522451996803284},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5464500188827515},{"id":"https://openalex.org/C48372109","wikidata":"https://www.wikidata.org/wiki/Q3913","display_name":"Binary number","level":2,"score":0.48741868138313293},{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.4719589948654175},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4670160412788391},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4597194194793701},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.43502283096313477},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.4007846415042877},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.32305780053138733},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2893322706222534},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1819472312927246},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.10858607292175293},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2008.2011673","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2008.2011673","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","score":0.49000000953674316,"display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1965047962","https://openalex.org/W2115105639","https://openalex.org/W2133491672","https://openalex.org/W2161163536","https://openalex.org/W3142504807"],"related_works":["https://openalex.org/W3177062893","https://openalex.org/W3125143773","https://openalex.org/W2007032764","https://openalex.org/W803550684","https://openalex.org/W2483226803","https://openalex.org/W4352977312","https://openalex.org/W2013926333","https://openalex.org/W2140425425","https://openalex.org/W2067280619","https://openalex.org/W2041180560"],"abstract_inverted_index":{"Recently,":[0],"Z.":[1],"Tang,":[2],"and":[3,60,76],"J.":[4],"B.":[5],"Dugan":[6],"proposed":[7],"a":[8,36,80,89],"new":[9],"algorithm":[10],"(DEP-BDD)":[11],"based":[12,55],"on":[13,56],"binary":[14],"decision":[15],"diagrams":[16],"(BDD)":[17],"for":[18,53],"reliability":[19],"analysis":[20],"of":[21,39,68,82],"phased-mission":[22],"systems":[23],"(PMS)":[24],"with":[25,66],"multimode":[26],"failures.":[27],"Although":[28],"the":[29,83],"variable":[30],"ordering":[31,51],"is":[32],"very":[33],"important":[34],"from":[35],"practical":[37],"point":[38],"view,":[40],"it":[41],"has":[42],"not":[43],"been":[44],"treated":[45],"directly.":[46],"This":[47],"paper":[48],"develops":[49],"four":[50],"heuristics":[52,65],"DEP-BDD":[54],"two":[57],"ordinary":[58],"schemes,":[59],"evaluates":[61],"these":[62],"schemes":[63],"&":[64],"hundreds":[67],"randomly":[69],"generated":[70],"fault":[71],"trees":[72],"having":[73],"different":[74],"sizes":[75],"structure":[77],"properties.":[78],"As":[79],"synthesis":[81],"obtained":[84],"performance":[85],"results,":[86],"we":[87],"propose":[88],"heuristic":[90],"selection":[91],"strategy.":[92]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":5}],"updated_date":"2026-04-29T09:16:38.111599","created_date":"2025-10-10T00:00:00"}