{"id":"https://openalex.org/W2112333201","doi":"https://doi.org/10.1109/tr.2008.2006470","title":"Reliability of Single-Error Correction Protected Memories","display_name":"Reliability of Single-Error Correction Protected Memories","publication_year":2008,"publication_date":"2008-11-12","ids":{"openalex":"https://openalex.org/W2112333201","doi":"https://doi.org/10.1109/tr.2008.2006470","mag":"2112333201"},"language":"en","primary_location":{"id":"doi:10.1109/tr.2008.2006470","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2008.2006470","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044495372","display_name":"Juan Antonio Maestro","orcid":"https://orcid.org/0000-0001-7133-9026"},"institutions":[{"id":"https://openalex.org/I3020445194","display_name":"Universidad Nebrija","ror":"https://ror.org/03tzyrt94","country_code":"ES","type":"education","lineage":["https://openalex.org/I3020445194"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"J.A. Maestro","raw_affiliation_strings":["Universidad Antonio de Nebrija, Madrid, Spain","Univ. Antonio de Nebrija, Madrid"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidad Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]},{"raw_affiliation_string":"Univ. Antonio de Nebrija, Madrid","institution_ids":["https://openalex.org/I3020445194"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080322790","display_name":"Pedro Reviriego","orcid":"https://orcid.org/0000-0003-2540-5234"},"institutions":[{"id":"https://openalex.org/I3020445194","display_name":"Universidad Nebrija","ror":"https://ror.org/03tzyrt94","country_code":"ES","type":"education","lineage":["https://openalex.org/I3020445194"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"P. Reviriego","raw_affiliation_strings":["Universidad Antonio de Nebrija, Madrid, Spain","Univ. Antonio de Nebrija, Madrid"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidad Antonio de Nebrija, Madrid, Spain","institution_ids":["https://openalex.org/I3020445194"]},{"raw_affiliation_string":"Univ. Antonio de Nebrija, Madrid","institution_ids":["https://openalex.org/I3020445194"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I3020445194"],"apc_list":null,"apc_paid":null,"fwci":2.0153,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.8699735,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"58","issue":"1","first_page":"193","last_page":"201"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.770877480506897},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7073661684989929},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6801790595054626},{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.6183412075042725},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.608409583568573},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.6052705645561218},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.5441088080406189},{"id":"https://openalex.org/keywords/memory-errors","display_name":"Memory errors","score":0.5134221315383911},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.510223388671875},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4880324900150299},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.43190521001815796},{"id":"https://openalex.org/keywords/hamming-code","display_name":"Hamming code","score":0.4305899441242218},{"id":"https://openalex.org/keywords/mean-time-between-failures","display_name":"Mean time between failures","score":0.42451661825180054},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.21230152249336243},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.19024169445037842},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11284142732620239},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10380211472511292},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.09729951620101929}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.770877480506897},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7073661684989929},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6801790595054626},{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.6183412075042725},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.608409583568573},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.6052705645561218},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.5441088080406189},{"id":"https://openalex.org/C119907115","wikidata":"https://www.wikidata.org/wiki/Q6815725","display_name":"Memory errors","level":3,"score":0.5134221315383911},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.510223388671875},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4880324900150299},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.43190521001815796},{"id":"https://openalex.org/C73150493","wikidata":"https://www.wikidata.org/wiki/Q853922","display_name":"Hamming code","level":4,"score":0.4305899441242218},{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.42451661825180054},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.21230152249336243},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.19024169445037842},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11284142732620239},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10380211472511292},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.09729951620101929},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C157125643","wikidata":"https://www.wikidata.org/wiki/Q884707","display_name":"Block code","level":3,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C100660578","wikidata":"https://www.wikidata.org/wiki/Q18733","display_name":"Recall","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tr.2008.2006470","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tr.2008.2006470","pdf_url":null,"source":{"id":"https://openalex.org/S87725633","display_name":"IEEE Transactions on Reliability","issn_l":"0018-9529","issn":["0018-9529","1558-1721"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W159582540","https://openalex.org/W259115443","https://openalex.org/W934537791","https://openalex.org/W1515565614","https://openalex.org/W1970904267","https://openalex.org/W1980073965","https://openalex.org/W1981194937","https://openalex.org/W2029692888","https://openalex.org/W2033816298","https://openalex.org/W2036109373","https://openalex.org/W2071118345","https://openalex.org/W2116097016","https://openalex.org/W2116556855","https://openalex.org/W2117485913","https://openalex.org/W2123596317","https://openalex.org/W2124241199","https://openalex.org/W2127178251","https://openalex.org/W2136292465","https://openalex.org/W2136476145","https://openalex.org/W2141068710","https://openalex.org/W2143557070","https://openalex.org/W2152652532","https://openalex.org/W2153534591","https://openalex.org/W2159448301","https://openalex.org/W2160451204","https://openalex.org/W2163493261","https://openalex.org/W2165023673","https://openalex.org/W2167002145","https://openalex.org/W2342204193","https://openalex.org/W2541764946","https://openalex.org/W2751862591","https://openalex.org/W3217008510","https://openalex.org/W4230392938","https://openalex.org/W4299432846"],"related_works":["https://openalex.org/W2045622931","https://openalex.org/W1749592617","https://openalex.org/W2537369590","https://openalex.org/W2116473596","https://openalex.org/W2007710086","https://openalex.org/W1968446004","https://openalex.org/W2027024701","https://openalex.org/W2126481660","https://openalex.org/W79276452","https://openalex.org/W2006898677"],"abstract_inverted_index":{"Reliability":[0],"is":[1,55,153],"a":[2,16,102,160,171,201,216,221,245],"critical":[3],"factor":[4],"for":[5,73,257],"systems":[6],"operating":[7],"in":[8,15,165,249],"radiation":[9],"environments.":[10],"Among":[11],"the":[12,22,95,120,126,144,166,182,188,192,196,210,225,228,240,250],"different":[13],"components":[14],"system,":[17],"memories":[18,123],"are":[19,46,88,98,133,137,157,236],"one":[20,194,198],"of":[21,71,83,122,146,150,227,252],"parts":[23],"most":[24],"sensitive":[25],"to":[26,30,36,49,56,61,129,143,238,255],"soft":[27],"errors":[28,87,156,164,176,186],"due":[29],"their":[31,37],"relatively":[32],"large":[33,38],"area.":[34],"Due":[35],"cost,":[39],"traditional":[40,112,161,233],"techniques":[41],"like":[42],"triple":[43],"modular":[44],"redundancy":[45],"not":[47,138,214],"used":[48],"protect":[50],"memories.":[51],"A":[52],"typical":[53],"approach":[54],"apply":[57],"error":[58],"correction":[59],"codes":[60],"correct":[62],"single":[63,86,175,202],"errors,":[64],"and":[65],"detect":[66],"double":[67,155],"errors.":[68],"This":[69],"type":[70],"codes,":[72],"example":[74],"those":[75],"based":[76],"on":[77,224],"Hamming,":[78],"provides":[79],"an":[80],"initial":[81],"level":[82],"protection.":[84],"Detected":[85],"usually":[89,114],"corrected":[90],"using":[91],"scrubbing,":[92],"by":[93],"which":[94,219,243],"memory":[96,258],"positions":[97],"periodically":[99],"re-written":[100],"after":[101],"fixed":[103],"(deterministic":[104],"scrubbing),":[105],"or":[106,204],"variable":[107],"period":[108],"(probabilistic":[109],"scrubbing).":[110],"These":[111],"models":[113,235],"offer":[115],"good":[116],"results":[117],"when":[118],"calculating":[119],"reliability":[121,226,234],"(e.g.":[124],"through":[125,140],"mean":[127,253],"time":[128,254],"failure).":[130],"However,":[131,180],"there":[132],"some":[134],"particularities":[135,152],"that":[136],"modeled":[139],"these":[141,151],"approaches,":[142],"best":[145],"our":[147],"knowledge.":[148],"One":[149],"how":[154],"handled.":[158],"In":[159,207,230],"approach,":[162],"two":[163,183],"same":[167,189],"word":[168],"produce":[169],"always":[170],"system":[172,217],"failure":[173,256],"(only":[174],"can":[177],"be":[178],"corrected).":[179],"if":[181],"(or":[184],"more)":[185],"affect":[187],"bit,":[190],"either":[191],"second":[193],"reinforces":[195],"first":[197],"(keeping":[199],"just":[200],"error),":[203],"corrects":[205],"it.":[206],"both":[208],"scenarios,":[209,242],"resulting":[211],"situation":[212],"does":[213],"trigger":[215],"failure,":[218],"has":[220],"direct":[222],"impact":[223],"memory.":[229],"this":[231],"paper,":[232],"refined":[237],"handle":[239],"mentioned":[241],"produces":[244],"more":[246],"precise":[247],"analysis":[248],"calculation":[251],"systems.":[259]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":3},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}