{"id":"https://openalex.org/W4308421866","doi":"https://doi.org/10.1109/tpami.2022.3201636","title":"Introduction to the Special Section of CVPR 2017","display_name":"Introduction to the Special Section of CVPR 2017","publication_year":2022,"publication_date":"2022-11-07","ids":{"openalex":"https://openalex.org/W4308421866","doi":"https://doi.org/10.1109/tpami.2022.3201636"},"language":"en","primary_location":{"id":"doi:10.1109/tpami.2022.3201636","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tpami.2022.3201636","pdf_url":"https://ieeexplore.ieee.org/ielx7/34/9940447/09940449.pdf","source":{"id":"https://openalex.org/S199944782","display_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","issn_l":"0162-8828","issn":["0162-8828","1939-3539","2160-9292"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://ieeexplore.ieee.org/ielx7/34/9940447/09940449.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101846182","display_name":"Yanxi Liu","orcid":"https://orcid.org/0000-0002-6809-5945"},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Yanxi Liu","raw_affiliation_strings":["School of EECS, Pennsylvania State University, State College, PA, USA"],"raw_orcid":"https://orcid.org/0000-0002-6809-5945","affiliations":[{"raw_affiliation_string":"School of EECS, Pennsylvania State University, State College, PA, USA","institution_ids":["https://openalex.org/I130769515"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002228469","display_name":"James M. Rehg","orcid":"https://orcid.org/0000-0003-1793-5462"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James M. Rehg","raw_affiliation_strings":["School of Interactive Computing, Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":"https://orcid.org/0000-0003-1793-5462","affiliations":[{"raw_affiliation_string":"School of Interactive Computing, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036660535","display_name":"Camillo J. Taylor","orcid":"https://orcid.org/0000-0002-9332-5087"},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]},{"id":"https://openalex.org/I79576946","display_name":"University of Pennsylvania","ror":"https://ror.org/00b30xv10","country_code":"US","type":"education","lineage":["https://openalex.org/I79576946"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Camillo J. Taylor","raw_affiliation_strings":["Computer and Information Science Department, University of Pennsylvania, State College, PA, USA"],"raw_orcid":"https://orcid.org/0000-0002-9332-5087","affiliations":[{"raw_affiliation_string":"Computer and Information Science Department, University of Pennsylvania, State College, PA, USA","institution_ids":["https://openalex.org/I130769515","https://openalex.org/I79576946"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054640772","display_name":"Ying Wu","orcid":"https://orcid.org/0000-0002-3523-7054"},"institutions":[{"id":"https://openalex.org/I111979921","display_name":"Northwestern University","ror":"https://ror.org/000e0be47","country_code":"US","type":"education","lineage":["https://openalex.org/I111979921"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ying Wu","raw_affiliation_strings":["Electrical Engineering and Computer Science Department, Northwestern University, Evanston, IL, USA"],"raw_orcid":"https://orcid.org/0000-0002-3523-7054","affiliations":[{"raw_affiliation_string":"Electrical Engineering and Computer Science Department, Northwestern University, Evanston, IL, USA","institution_ids":["https://openalex.org/I111979921"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5101846182"],"corresponding_institution_ids":["https://openalex.org/I130769515"],"apc_list":null,"apc_paid":null,"fwci":0.1355,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.54739569,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"44","issue":"12","first_page":"8702","last_page":"8703"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.746399998664856,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.746399998664856,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/section","display_name":"Section (typography)","score":0.7316862344741821},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.714748203754425},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6309491991996765},{"id":"https://openalex.org/keywords/special-section","display_name":"Special section","score":0.6292570233345032},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.488102525472641},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.36501890420913696},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.06896373629570007}],"concepts":[{"id":"https://openalex.org/C2780129039","wikidata":"https://www.wikidata.org/wiki/Q1931107","display_name":"Section (typography)","level":2,"score":0.7316862344741821},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.714748203754425},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6309491991996765},{"id":"https://openalex.org/C2993458768","wikidata":"https://www.wikidata.org/wiki/Q3477549","display_name":"Special section","level":2,"score":0.6292570233345032},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.488102525472641},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.36501890420913696},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.06896373629570007},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tpami.2022.3201636","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tpami.2022.3201636","pdf_url":"https://ieeexplore.ieee.org/ielx7/34/9940447/09940449.pdf","source":{"id":"https://openalex.org/S199944782","display_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","issn_l":"0162-8828","issn":["0162-8828","1939-3539","2160-9292"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tpami.2022.3201636","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tpami.2022.3201636","pdf_url":"https://ieeexplore.ieee.org/ielx7/34/9940447/09940449.pdf","source":{"id":"https://openalex.org/S199944782","display_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","issn_l":"0162-8828","issn":["0162-8828","1939-3539","2160-9292"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4308421866.pdf","grobid_xml":"https://content.openalex.org/works/W4308421866.grobid-xml"},"referenced_works_count":1,"referenced_works":["https://openalex.org/W4308421866"],"related_works":["https://openalex.org/W1891287906","https://openalex.org/W2772917594","https://openalex.org/W2036807459","https://openalex.org/W1969923398","https://openalex.org/W2166024367","https://openalex.org/W2755342338","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2058170566","https://openalex.org/W258625772"],"abstract_inverted_index":{"The":[0],"papers":[1],"in":[2],"this":[3],"special":[4],"section":[5],"were":[6],"presented":[7],"at":[8],"the":[9],"Computer":[10],"Vision":[11],"and":[12],"Pattern":[13],"Recognition":[14],"conference.":[15]},"counts_by_year":[{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}