{"id":"https://openalex.org/W2970422956","doi":"https://doi.org/10.1109/tpami.2019.2937515","title":"Reconstruction of Geometric and Optical Parameters of Non-Planar Objects with Thin Film","display_name":"Reconstruction of Geometric and Optical Parameters of Non-Planar Objects with Thin Film","publication_year":2019,"publication_date":"2019-08-27","ids":{"openalex":"https://openalex.org/W2970422956","doi":"https://doi.org/10.1109/tpami.2019.2937515","mag":"2970422956","pmid":"https://pubmed.ncbi.nlm.nih.gov/31449008"},"language":"en","primary_location":{"id":"doi:10.1109/tpami.2019.2937515","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tpami.2019.2937515","pdf_url":null,"source":{"id":"https://openalex.org/S199944782","display_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","issn_l":"0162-8828","issn":["0162-8828","1939-3539","2160-9292"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028527023","display_name":"Yoshie Kobayashi","orcid":"https://orcid.org/0000-0002-4872-3545"},"institutions":[{"id":"https://openalex.org/I153327471","display_name":"Bunkyo University","ror":"https://ror.org/053h75930","country_code":"JP","type":"education","lineage":["https://openalex.org/I153327471"]},{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshie Kobayashi","raw_affiliation_strings":["Fujitsu Laboratories Ltd","University of Tokyo, Bunkyoku, Tokyo, Japan"],"raw_orcid":"https://orcid.org/0000-0002-4872-3545","affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Ltd","institution_ids":["https://openalex.org/I2252096349"]},{"raw_affiliation_string":"University of Tokyo, Bunkyoku, Tokyo, Japan","institution_ids":["https://openalex.org/I153327471","https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109840976","display_name":"Tetsuro Morimoto","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110394","display_name":"Toppan (Japan)","ror":"https://ror.org/01kz55g98","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210110394"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tetsuro Morimoto","raw_affiliation_strings":["Toppan Printing Co. Ltd., Chiyoda-ku, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Toppan Printing Co. Ltd., Chiyoda-ku, Tokyo, Japan","institution_ids":["https://openalex.org/I4210110394"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101052713","display_name":"Imari Sato","orcid":null},"institutions":[{"id":"https://openalex.org/I184597095","display_name":"National Institute of Informatics","ror":"https://ror.org/04ksd4g47","country_code":"JP","type":"facility","lineage":["https://openalex.org/I1319490839","https://openalex.org/I184597095","https://openalex.org/I4210158934"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Imari Sato","raw_affiliation_strings":["National Insititute of Informatics, Chiyoda-ku, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Insititute of Informatics, Chiyoda-ku, Tokyo, Japan","institution_ids":["https://openalex.org/I184597095"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045819127","display_name":"Yasuhiro Mukaigawa","orcid":"https://orcid.org/0000-0001-8689-3724"},"institutions":[{"id":"https://openalex.org/I75917431","display_name":"Nara Institute of Science and Technology","ror":"https://ror.org/05bhada84","country_code":"JP","type":"education","lineage":["https://openalex.org/I75917431"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yasuhiro Mukaigawa","raw_affiliation_strings":["Nara Institute of Science and Technology, Ikoma-shi, Nara, Japan"],"raw_orcid":"https://orcid.org/0000-0001-8689-3724","affiliations":[{"raw_affiliation_string":"Nara Institute of Science and Technology, Ikoma-shi, Nara, Japan","institution_ids":["https://openalex.org/I75917431"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044730054","display_name":"Takao Tomono","orcid":"https://orcid.org/0000-0003-4984-4063"},"institutions":[{"id":"https://openalex.org/I4210110394","display_name":"Toppan (Japan)","ror":"https://ror.org/01kz55g98","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210110394"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takao Tomono","raw_affiliation_strings":["Toppan Printing Co. Ltd., Chiyoda-ku, Tokyo, Japan"],"raw_orcid":"https://orcid.org/0000-0003-4984-4063","affiliations":[{"raw_affiliation_string":"Toppan Printing Co. Ltd., Chiyoda-ku, Tokyo, Japan","institution_ids":["https://openalex.org/I4210110394"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016258462","display_name":"Katsushi Ikeuchi","orcid":"https://orcid.org/0000-0001-9758-9357"},"institutions":[{"id":"https://openalex.org/I1290206253","display_name":"Microsoft (United States)","ror":"https://ror.org/00d0nc645","country_code":"US","type":"company","lineage":["https://openalex.org/I1290206253"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP","US"],"is_corresponding":false,"raw_author_name":"Katsushi Ikeuchi","raw_affiliation_strings":["Microsoft Research Redmond, USA","University of Tokyo, Tokyo, Japan"],"raw_orcid":"https://orcid.org/0000-0001-9758-9357","affiliations":[{"raw_affiliation_string":"Microsoft Research Redmond, USA","institution_ids":["https://openalex.org/I1290206253"]},{"raw_affiliation_string":"University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1869,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.49970103,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"43","issue":"2","first_page":"638","last_page":"651"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/planar","display_name":"Planar","score":0.8242966532707214},{"id":"https://openalex.org/keywords/thin-film","display_name":"Thin film","score":0.6293842792510986},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.5936343669891357},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5774970054626465},{"id":"https://openalex.org/keywords/refractive-index","display_name":"Refractive index","score":0.5748852491378784},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5102024078369141},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.4749733805656433},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.45008933544158936},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.43426284193992615},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4335326850414276},{"id":"https://openalex.org/keywords/orientation","display_name":"Orientation (vector space)","score":0.41165101528167725},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.32525739073753357},{"id":"https://openalex.org/keywords/computer-graphics","display_name":"Computer graphics (images)","score":0.2398824691772461},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.12789994478225708},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12785351276397705},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.09593632817268372}],"concepts":[{"id":"https://openalex.org/C134786449","wikidata":"https://www.wikidata.org/wiki/Q3391255","display_name":"Planar","level":2,"score":0.8242966532707214},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.6293842792510986},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5936343669891357},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5774970054626465},{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.5748852491378784},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5102024078369141},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.4749733805656433},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.45008933544158936},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.43426284193992615},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4335326850414276},{"id":"https://openalex.org/C16345878","wikidata":"https://www.wikidata.org/wiki/Q107472979","display_name":"Orientation (vector space)","level":2,"score":0.41165101528167725},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.32525739073753357},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.2398824691772461},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.12789994478225708},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12785351276397705},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.09593632817268372},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tpami.2019.2937515","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tpami.2019.2937515","pdf_url":null,"source":{"id":"https://openalex.org/S199944782","display_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","issn_l":"0162-8828","issn":["0162-8828","1939-3539","2160-9292"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","raw_type":"journal-article"},{"id":"pmid:31449008","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/31449008","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE transactions on pattern analysis and machine intelligence","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1575332639","https://openalex.org/W1589097922","https://openalex.org/W1658935526","https://openalex.org/W1673146123","https://openalex.org/W1789656864","https://openalex.org/W1913343147","https://openalex.org/W1992762475","https://openalex.org/W1993435299","https://openalex.org/W2021854369","https://openalex.org/W2024102412","https://openalex.org/W2026927519","https://openalex.org/W2050648167","https://openalex.org/W2080638042","https://openalex.org/W2112119146","https://openalex.org/W2121331303","https://openalex.org/W2123319667","https://openalex.org/W2154143283","https://openalex.org/W2160062962","https://openalex.org/W2407391491","https://openalex.org/W2468634027","https://openalex.org/W2489652544","https://openalex.org/W2540093521","https://openalex.org/W2616500594","https://openalex.org/W3144182605","https://openalex.org/W4254811355","https://openalex.org/W6714354967"],"related_works":["https://openalex.org/W4206327962","https://openalex.org/W2010009304","https://openalex.org/W1996851061","https://openalex.org/W3021694725","https://openalex.org/W2025195393","https://openalex.org/W2061199333","https://openalex.org/W2940695648","https://openalex.org/W2096304864","https://openalex.org/W2022959950","https://openalex.org/W2179405771"],"abstract_inverted_index":{"Here,":[0],"we":[1,84,98,118,147],"propose":[2],"a":[3,31,120,136,170],"novel":[4],"method":[5,144],"to":[6,19,39,52,55,122],"estimate":[7,20],"the":[8,21,69,77,87,124,140,149,153,158,161],"parameters":[9,23,74,89,128,164],"of":[10,24,34,61,90,129,142],"non-planar":[11,91],"objects":[12,25,64,92,112,130],"with":[13,26,93,113,131],"thin":[14,27,62,94,114,132],"film":[15,28,63,81,95,115,133],"surfaces.":[16,96,116],"Being":[17],"able":[18],"optical":[22,73,88,127],"surfaces":[29,134],"has":[30],"wide":[32],"range":[33],"applications":[35],"from":[36],"industrial":[37],"inspections":[38],"biological":[40],"and":[41,72,80,100,105,126,138,165],"archaeology":[42],"research.":[43],"However,":[44],"there":[45],"are":[46],"many":[47],"challenging":[48],"issues":[49],"that":[50],"need":[51],"be":[53],"overcome":[54],"model":[56],"such":[57,75],"parameters.":[58],"The":[59],"appearance":[60],"is":[65],"highly":[66],"dependent":[67],"on":[68],"surface":[70],"orientation":[71],"as":[76],"refractive":[78],"index":[79],"thickness.":[82],"First,":[83],"therefore":[85],"analyzed":[86],"Next,":[97],"proposed":[99],"implemented":[101],"an":[102],"analysis":[103],"procedure":[104],"demonstrated":[106,139],"its":[107],"effectiveness":[108,141],"for":[109],"studying":[110],"planar":[111],"Finally,":[117],"developed":[119],"device":[121],"acquire":[123],"shapes":[125],"using":[135,169],"camera":[137],"our":[143],"experimentally.":[145],"Then,":[146],"surveyed":[148],"errors":[150],"caused":[151],"by":[152],"light":[154],"source.":[155],"We":[156],"discussed":[157],"difference":[159],"between":[160],"theoretically":[162],"obtained":[163,168],"experimental":[166],"data":[167],"hyper":[171],"spectral":[172],"camera.":[173]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}