{"id":"https://openalex.org/W1984241286","doi":"https://doi.org/10.1109/tpami.2014.2363827","title":"Time-of-Flight Sensor Calibration for a Color and Depth Camera Pair","display_name":"Time-of-Flight Sensor Calibration for a Color and Depth Camera Pair","publication_year":2014,"publication_date":"2014-10-17","ids":{"openalex":"https://openalex.org/W1984241286","doi":"https://doi.org/10.1109/tpami.2014.2363827","mag":"1984241286","pmid":"https://pubmed.ncbi.nlm.nih.gov/26352455"},"language":"en","primary_location":{"id":"doi:10.1109/tpami.2014.2363827","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tpami.2014.2363827","pdf_url":null,"source":{"id":"https://openalex.org/S199944782","display_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","issn_l":"0162-8828","issn":["0162-8828","1939-3539","2160-9292"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021834877","display_name":"Jiyoung Jung","orcid":"https://orcid.org/0000-0001-9316-9750"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jiyoung Jung","raw_affiliation_strings":["Department of Electrical Engineering, KAIST, 291 Daehak-ro, Yuseong-gu, Daejeon, South Korea","Dept. of Electrical Engineering, KAIST, 291 Daehak-ro, Yuseong-gu, Daejeon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, 291 Daehak-ro, Yuseong-gu, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Dept. of Electrical Engineering, KAIST, 291 Daehak-ro, Yuseong-gu, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044267273","display_name":"Joon\u2010Young Lee","orcid":"https://orcid.org/0000-0003-4822-855X"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Joon-Young Lee","raw_affiliation_strings":["Department of Electrical Engineering, KAIST, 291 Daehak-ro, Yuseong-gu, Daejeon, South Korea","Dept. of Electrical Engineering, KAIST, 291 Daehak-ro, Yuseong-gu, Daejeon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, 291 Daehak-ro, Yuseong-gu, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Dept. of Electrical Engineering, KAIST, 291 Daehak-ro, Yuseong-gu, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052108818","display_name":"Yekeun Jeong","orcid":null},"institutions":[{"id":"https://openalex.org/I1290206253","display_name":"Microsoft (United States)","ror":"https://ror.org/00d0nc645","country_code":"US","type":"company","lineage":["https://openalex.org/I1290206253"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yekeun Jeong","raw_affiliation_strings":["Microsoft Corporation, One Microsoft Way, Redmond, WA","Microsoft Corporation (One Microsoft Way, Redmond, WA)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microsoft Corporation, One Microsoft Way, Redmond, WA","institution_ids":["https://openalex.org/I1290206253"]},{"raw_affiliation_string":"Microsoft Corporation (One Microsoft Way, Redmond, WA)","institution_ids":["https://openalex.org/I1290206253"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012455275","display_name":"In So Kweon","orcid":"https://orcid.org/0000-0001-9626-5983"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"In So Kweon","raw_affiliation_strings":["Department of Electrical Engineering, KAIST, 291 Daehak-ro, Yuseong-gu, Daejeon, South Korea","Dept. of Electrical Engineering, KAIST, 291 Daehak-ro, Yuseong-gu, Daejeon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, 291 Daehak-ro, Yuseong-gu, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Dept. of Electrical Engineering, KAIST, 291 Daehak-ro, Yuseong-gu, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":12.176,"has_fulltext":false,"cited_by_count":69,"citation_normalized_percentile":{"value":0.98189775,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"37","issue":"7","first_page":"1501","last_page":"1513"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7661575078964233},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.7059655785560608},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.6152982711791992},{"id":"https://openalex.org/keywords/rgb-color-model","display_name":"RGB color model","score":0.6120730638504028},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5753748416900635},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5666370987892151},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.4960688054561615},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.4616718292236328},{"id":"https://openalex.org/keywords/image-resolution","display_name":"Image resolution","score":0.41614052653312683},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.26984521746635437}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7661575078964233},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.7059655785560608},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.6152982711791992},{"id":"https://openalex.org/C82990744","wikidata":"https://www.wikidata.org/wiki/Q166194","display_name":"RGB color model","level":2,"score":0.6120730638504028},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5753748416900635},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5666370987892151},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.4960688054561615},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.4616718292236328},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.41614052653312683},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.26984521746635437},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tpami.2014.2363827","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tpami.2014.2363827","pdf_url":null,"source":{"id":"https://openalex.org/S199944782","display_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","issn_l":"0162-8828","issn":["0162-8828","1939-3539","2160-9292"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","raw_type":"journal-article"},{"id":"pmid:26352455","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/26352455","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE transactions on pattern analysis and machine intelligence","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2385568365","display_name":null,"funder_award_id":"2010-0028680","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W18838560","https://openalex.org/W1606907548","https://openalex.org/W1699425237","https://openalex.org/W1965386961","https://openalex.org/W1986049249","https://openalex.org/W1988544952","https://openalex.org/W2016620160","https://openalex.org/W2021851106","https://openalex.org/W2026672030","https://openalex.org/W2041362444","https://openalex.org/W2049981393","https://openalex.org/W2053502066","https://openalex.org/W2060275078","https://openalex.org/W2089079585","https://openalex.org/W2095569354","https://openalex.org/W2099940712","https://openalex.org/W2102515519","https://openalex.org/W2104620097","https://openalex.org/W2104930183","https://openalex.org/W2105095838","https://openalex.org/W2106816388","https://openalex.org/W2107515459","https://openalex.org/W2108124886","https://openalex.org/W2109508414","https://openalex.org/W2131653896","https://openalex.org/W2133505209","https://openalex.org/W2137504719","https://openalex.org/W2155479981","https://openalex.org/W2159936575","https://openalex.org/W2167667767","https://openalex.org/W2172156083","https://openalex.org/W2182527491","https://openalex.org/W4285719527","https://openalex.org/W6647526354","https://openalex.org/W6660814036","https://openalex.org/W6665910579","https://openalex.org/W6680028861"],"related_works":["https://openalex.org/W2044092692","https://openalex.org/W2614621130","https://openalex.org/W4289655544","https://openalex.org/W2944239605","https://openalex.org/W2547665164","https://openalex.org/W3103111272","https://openalex.org/W1873415836","https://openalex.org/W2139783875","https://openalex.org/W4200290804","https://openalex.org/W4312469487"],"abstract_inverted_index":{"We":[0,25,81,182],"present":[1],"a":[2,6,11,28,46,68,107,162],"calibration":[3,188],"method":[4,189,202],"of":[5,45,63,67,85,153,168,179,186,200],"time-of-flight":[7],"(ToF)":[8],"sensor":[9,88],"and":[10,77,150,191,196],"color":[12,22,55],"camera":[13,48],"pair":[14],"to":[15,36,59,73,113,121,146],"align":[16],"the":[17,21,61,64,83,86,91,95,115,127,132,140,169,184,198],"3D":[18,65],"measurements":[19,66],"with":[20,32,155],"image":[23],"correctly.":[24],"have":[26],"designed":[27],"2.5D":[29],"pattern":[30],"board":[31],"irregularly":[33],"placed":[34],"holes":[35],"be":[37,122],"accurately":[38],"detected":[39],"from":[40,52,110],"low":[41],"resolution":[42,54],"depth":[43,97],"images":[44],"ToF":[47,69,87],"as":[49,51,175],"well":[50],"high":[53],"images.":[56],"In":[57],"order":[58],"improve":[60],"accuracy":[62],"camera,":[70],"we":[71,105],"propose":[72],"perform":[74],"ray":[75,102],"correction":[76],"range":[78,136],"bias":[79],"correction.":[80,103],"reset":[82],"transformation":[84],"which":[89],"transforms":[90],"radial":[92],"distance":[93,116,128,142,180],"into":[94],"scene":[96,109],"in":[98],"Cartesian":[99],"coordinate":[100],"through":[101],"Then":[104],"capture":[106],"planar":[108],"different":[111],"depths":[112],"correct":[114],"error":[117,137],"that":[118],"is":[119,173],"shown":[120],"dependent":[123],"not":[124],"only":[125],"on":[126,131,193],"but":[129],"also":[130],"pixel":[133],"location.":[134],"The":[135,165],"profiles":[138,154],"along":[139],"calibrated":[141],"are":[143,158],"classified":[144],"according":[145],"their":[147],"wiggling":[148],"shapes":[149],"each":[151],"cluster":[152],"similar":[156],"shape":[157,207],"separately":[159],"estimated":[160],"using":[161],"B-spline":[163],"function.":[164],"standard":[166],"deviation":[167],"remaining":[170],"random":[171],"noise":[172],"recorded":[174],"an":[176,205],"uncertainty":[177],"information":[178],"measurements.":[181],"show":[183],"performance":[185],"our":[187,201],"quantitatively":[190],"qualitatively":[192],"various":[194],"datasets,":[195],"validate":[197],"impact":[199],"by":[203],"demonstrating":[204],"RGB-D":[206],"refinement":[208],"application.":[209]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":12},{"year":2019,"cited_by_count":10},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":8},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}