{"id":"https://openalex.org/W2094682124","doi":"https://doi.org/10.1109/tpami.1986.4767825","title":"Correction to \"An Autoregressive Model Approach to Two-Dimensional Shape Classification''","display_name":"Correction to \"An Autoregressive Model Approach to Two-Dimensional Shape Classification''","publication_year":1986,"publication_date":"1986-07-01","ids":{"openalex":"https://openalex.org/W2094682124","doi":"https://doi.org/10.1109/tpami.1986.4767825","mag":"2094682124"},"language":"en","primary_location":{"id":"doi:10.1109/tpami.1986.4767825","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tpami.1986.4767825","pdf_url":null,"source":{"id":"https://openalex.org/S199944782","display_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","issn_l":"0162-8828","issn":["0162-8828","1939-3539","2160-9292"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091597276","display_name":"Susan Dubois","orcid":null},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Susan R. Dubois","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA 02139","[Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA 02139]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA 02139","institution_ids":["https://openalex.org/I63966007"]},{"raw_affiliation_string":"[Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA 02139]","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065696374","display_name":"Filson H. Glanz","orcid":null},"institutions":[{"id":"https://openalex.org/I161057412","display_name":"University of New Hampshire","ror":"https://ror.org/01rmh9n78","country_code":"US","type":"education","lineage":["https://openalex.org/I161057412"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Filson H. Glanz","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of New Hampshire, Durham, NH 03824"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of New Hampshire, Durham, NH 03824","institution_ids":["https://openalex.org/I161057412"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5091597276"],"corresponding_institution_ids":["https://openalex.org/I63966007"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.23103154,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"PAMI-8","issue":"4","first_page":"561","last_page":"561"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10057","display_name":"Face and Expression Recognition","score":0.620199978351593,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10057","display_name":"Face and Expression Recognition","score":0.620199978351593,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10824","display_name":"Image Retrieval and Classification Techniques","score":0.6104999780654907,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.558899998664856,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/autoregressive-model","display_name":"Autoregressive model","score":0.7381508946418762},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6378082036972046},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6032178401947021},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4649679958820343},{"id":"https://openalex.org/keywords/star-model","display_name":"STAR model","score":0.4624384343624115},{"id":"https://openalex.org/keywords/speech-recognition","display_name":"Speech recognition","score":0.32241785526275635},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.290250301361084},{"id":"https://openalex.org/keywords/autoregressive-integrated-moving-average","display_name":"Autoregressive integrated moving average","score":0.21739575266838074},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1962602734565735},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.18577590584754944},{"id":"https://openalex.org/keywords/time-series","display_name":"Time series","score":0.17902594804763794}],"concepts":[{"id":"https://openalex.org/C159877910","wikidata":"https://www.wikidata.org/wiki/Q2202883","display_name":"Autoregressive model","level":2,"score":0.7381508946418762},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6378082036972046},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6032178401947021},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4649679958820343},{"id":"https://openalex.org/C194657046","wikidata":"https://www.wikidata.org/wiki/Q7394685","display_name":"STAR model","level":4,"score":0.4624384343624115},{"id":"https://openalex.org/C28490314","wikidata":"https://www.wikidata.org/wiki/Q189436","display_name":"Speech recognition","level":1,"score":0.32241785526275635},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.290250301361084},{"id":"https://openalex.org/C24338571","wikidata":"https://www.wikidata.org/wiki/Q2566298","display_name":"Autoregressive integrated moving average","level":3,"score":0.21739575266838074},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1962602734565735},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.18577590584754944},{"id":"https://openalex.org/C151406439","wikidata":"https://www.wikidata.org/wiki/Q186588","display_name":"Time series","level":2,"score":0.17902594804763794}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tpami.1986.4767825","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tpami.1986.4767825","pdf_url":null,"source":{"id":"https://openalex.org/S199944782","display_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","issn_l":"0162-8828","issn":["0162-8828","1939-3539","2160-9292"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10","score":0.4699999988079071}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2439807930","https://openalex.org/W2009692134","https://openalex.org/W2019155478","https://openalex.org/W1972271943","https://openalex.org/W2024529895","https://openalex.org/W2168175994","https://openalex.org/W1902630399","https://openalex.org/W2120434453","https://openalex.org/W3120578569","https://openalex.org/W1487412319"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}