{"id":"https://openalex.org/W1973359967","doi":"https://doi.org/10.1109/tpami.1982.4767197","title":"A Maximum Likelihood Approach to Texture Classification","display_name":"A Maximum Likelihood Approach to Texture Classification","publication_year":1982,"publication_date":"1982-01-01","ids":{"openalex":"https://openalex.org/W1973359967","doi":"https://doi.org/10.1109/tpami.1982.4767197","mag":"1973359967","pmid":"https://pubmed.ncbi.nlm.nih.gov/21869005"},"language":"en","primary_location":{"id":"doi:10.1109/tpami.1982.4767197","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tpami.1982.4767197","pdf_url":null,"source":{"id":"https://openalex.org/S199944782","display_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","issn_l":"0162-8828","issn":["0162-8828","1939-3539","2160-9292"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008044703","display_name":"Acie L. Vickers","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"A. L. Vickers","raw_affiliation_strings":["Department of Electrical, Computer and Systems Engineering, Rensselaer Polytechnic Institute, Troy, NY 12181","Department of Electrical, Computer, and Systems Engineering, Rensselaer Polytechnic Institute, Troy, NY 12181"],"affiliations":[{"raw_affiliation_string":"Department of Electrical, Computer and Systems Engineering, Rensselaer Polytechnic Institute, Troy, NY 12181","institution_ids":[]},{"raw_affiliation_string":"Department of Electrical, Computer, and Systems Engineering, Rensselaer Polytechnic Institute, Troy, NY 12181","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109079087","display_name":"J.W. Modestino","orcid":null},"institutions":[{"id":"https://openalex.org/I165799507","display_name":"Rensselaer Polytechnic Institute","ror":"https://ror.org/01rtyzb94","country_code":"US","type":"education","lineage":["https://openalex.org/I165799507"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. W. Modestino","raw_affiliation_strings":["Department of Electrical, Computer and,Systems Engineering, Rensselaer Polytechnic Institute RPI, Troy, NY, USA","Department of Electrical, Computer, and Systems Engineering, Rensselaer Polytechnic Institute, Troy, NY 12181"],"affiliations":[{"raw_affiliation_string":"Department of Electrical, Computer and,Systems Engineering, Rensselaer Polytechnic Institute RPI, Troy, NY, USA","institution_ids":["https://openalex.org/I165799507"]},{"raw_affiliation_string":"Department of Electrical, Computer, and Systems Engineering, Rensselaer Polytechnic Institute, Troy, NY 12181","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5008044703"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.0791,"has_fulltext":false,"cited_by_count":64,"citation_normalized_percentile":{"value":0.86769231,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"PAMI-4","issue":"1","first_page":"61","last_page":"68"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10052","display_name":"Medical Image Segmentation Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10052","display_name":"Medical Image Segmentation Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10824","display_name":"Image Retrieval and Classification Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12923","display_name":"Digital Image Processing Techniques","score":0.9753000140190125,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.720287024974823},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.6937448978424072},{"id":"https://openalex.org/keywords/maximum-likelihood","display_name":"Maximum likelihood","score":0.6764510273933411},{"id":"https://openalex.org/keywords/image-texture","display_name":"Image texture","score":0.6208198666572571},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.6014900207519531},{"id":"https://openalex.org/keywords/texture","display_name":"Texture (cosmology)","score":0.5845000147819519},{"id":"https://openalex.org/keywords/contextual-image-classification","display_name":"Contextual image classification","score":0.5755518674850464},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5317234992980957},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.35690510272979736},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.2888853847980499},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.27645143866539},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.24733051657676697}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.720287024974823},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.6937448978424072},{"id":"https://openalex.org/C49781872","wikidata":"https://www.wikidata.org/wiki/Q1045555","display_name":"Maximum likelihood","level":2,"score":0.6764510273933411},{"id":"https://openalex.org/C63099799","wikidata":"https://www.wikidata.org/wiki/Q17147001","display_name":"Image texture","level":4,"score":0.6208198666572571},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.6014900207519531},{"id":"https://openalex.org/C2781195486","wikidata":"https://www.wikidata.org/wiki/Q289436","display_name":"Texture (cosmology)","level":3,"score":0.5845000147819519},{"id":"https://openalex.org/C75294576","wikidata":"https://www.wikidata.org/wiki/Q5165192","display_name":"Contextual image classification","level":3,"score":0.5755518674850464},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5317234992980957},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.35690510272979736},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.2888853847980499},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.27645143866539},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.24733051657676697}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tpami.1982.4767197","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tpami.1982.4767197","pdf_url":null,"source":{"id":"https://openalex.org/S199944782","display_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","issn_l":"0162-8828","issn":["0162-8828","1939-3539","2160-9292"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Pattern Analysis and Machine Intelligence","raw_type":"journal-article"},{"id":"pmid:21869005","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/21869005","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE transactions on pattern analysis and machine intelligence","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1536252645","https://openalex.org/W2014458913","https://openalex.org/W2044465660","https://openalex.org/W2059432853","https://openalex.org/W2091696547","https://openalex.org/W4254563424"],"related_works":["https://openalex.org/W2044270176","https://openalex.org/W2345732485","https://openalex.org/W2374828682","https://openalex.org/W2153116791","https://openalex.org/W2388733570","https://openalex.org/W2005234362","https://openalex.org/W1980033651","https://openalex.org/W4230530180","https://openalex.org/W2162970382","https://openalex.org/W1997235926"],"abstract_inverted_index":{"A":[0],"new":[1],"approach":[2,21,48],"to":[3,37],"texture":[4,30,57],"classification":[5],"is":[6,9,34,49],"described":[7],"which":[8],"based":[10],"on":[11],"measurements":[12],"of":[13,25,46],"the":[14,38,47],"spatial":[15],"gray-level":[16],"co-occurrence":[17],"probability":[18],"matrix.":[19],"This":[20],"can":[22],"make":[23],"use":[24],"assumed":[26],"stochastic":[27],"models":[28],"for":[29],"in":[31],"imagery":[32],"and":[33],"an":[35],"approximation":[36],"statistically":[39],"optimum":[40],"maximum":[41],"likelihood":[42],"classifier.":[43],"The":[44],"efficacy":[45],"demonstrated":[50],"through":[51],"experimental":[52],"results":[53],"obtained":[54],"with":[55],"real-world":[56],"data.":[58]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-01-13T01:12:25.745995","created_date":"2025-10-10T00:00:00"}