{"id":"https://openalex.org/W1964933157","doi":"https://doi.org/10.1109/tmi.2012.2204438","title":"Shape Deformation in Two-Dimensional Electrical Impedance Tomography","display_name":"Shape Deformation in Two-Dimensional Electrical Impedance Tomography","publication_year":2012,"publication_date":"2012-06-12","ids":{"openalex":"https://openalex.org/W1964933157","doi":"https://doi.org/10.1109/tmi.2012.2204438","mag":"1964933157","pmid":"https://pubmed.ncbi.nlm.nih.gov/22711769"},"language":"en","primary_location":{"id":"doi:10.1109/tmi.2012.2204438","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tmi.2012.2204438","pdf_url":null,"source":{"id":"https://openalex.org/S58069681","display_name":"IEEE Transactions on Medical Imaging","issn_l":"0278-0062","issn":["0278-0062","1558-254X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Medical Imaging","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021401409","display_name":"Alistair Boyle","orcid":"https://orcid.org/0000-0002-4453-1511"},"institutions":[{"id":"https://openalex.org/I67031392","display_name":"Carleton University","ror":"https://ror.org/02qtvee93","country_code":"CA","type":"education","lineage":["https://openalex.org/I67031392"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Alistair Boyle","raw_affiliation_strings":["Department of Systems and Computer Engineering, Carleton University, Ottawa, ON, K1S 5B6 Canada. boyle@sce.carleton.ca","Department of Systems and Computer Engineering, Carleton University Ottawa, ON, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Systems and Computer Engineering, Carleton University, Ottawa, ON, K1S 5B6 Canada. boyle@sce.carleton.ca","institution_ids":["https://openalex.org/I67031392"]},{"raw_affiliation_string":"Department of Systems and Computer Engineering, Carleton University Ottawa, ON, Canada","institution_ids":["https://openalex.org/I67031392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045871735","display_name":"Andy Adler","orcid":"https://orcid.org/0000-0002-2312-5346"},"institutions":[{"id":"https://openalex.org/I67031392","display_name":"Carleton University","ror":"https://ror.org/02qtvee93","country_code":"CA","type":"education","lineage":["https://openalex.org/I67031392"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Andy Adler","raw_affiliation_strings":["Department of Systems and Computer Engineering, Carleton University, Ottawa, ONT, Canada","Department of Systems and Computer Engineering, Carleton University Ottawa, ON, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Systems and Computer Engineering, Carleton University, Ottawa, ONT, Canada","institution_ids":["https://openalex.org/I67031392"]},{"raw_affiliation_string":"Department of Systems and Computer Engineering, Carleton University Ottawa, ON, Canada","institution_ids":["https://openalex.org/I67031392"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058599589","display_name":"William Lionheart","orcid":"https://orcid.org/0000-0003-0971-4678"},"institutions":[{"id":"https://openalex.org/I28407311","display_name":"University of Manchester","ror":"https://ror.org/027m9bs27","country_code":"GB","type":"education","lineage":["https://openalex.org/I28407311"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"William R. B. Lionheart","raw_affiliation_strings":["School of Mathematics, University of Manchester, Manchester, UK","Sch. of Math., Univ. of Manchester, Manchester, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mathematics, University of Manchester, Manchester, UK","institution_ids":["https://openalex.org/I28407311"]},{"raw_affiliation_string":"Sch. of Math., Univ. of Manchester, Manchester, UK","institution_ids":["https://openalex.org/I28407311"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.1919,"has_fulltext":false,"cited_by_count":38,"citation_normalized_percentile":{"value":0.91906374,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"31","issue":"12","first_page":"2185","last_page":"2193"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9810000061988831,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","score":0.9782000184059143,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.9279863834381104},{"id":"https://openalex.org/keywords/conformal-map","display_name":"Conformal map","score":0.7625190615653992},{"id":"https://openalex.org/keywords/imaging-phantom","display_name":"Imaging phantom","score":0.6760827898979187},{"id":"https://openalex.org/keywords/boundary","display_name":"Boundary (topology)","score":0.639499306678772},{"id":"https://openalex.org/keywords/isotropy","display_name":"Isotropy","score":0.6189135909080505},{"id":"https://openalex.org/keywords/deformation","display_name":"Deformation (meteorology)","score":0.5750730633735657},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.5186490416526794},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.5032748579978943},{"id":"https://openalex.org/keywords/boundary-element-method","display_name":"Boundary element method","score":0.4951077997684479},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.4815997779369354},{"id":"https://openalex.org/keywords/conductivity","display_name":"Conductivity","score":0.4445880949497223},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.43755078315734863},{"id":"https://openalex.org/keywords/boundary-value-problem","display_name":"Boundary value problem","score":0.4146856367588043},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.41161638498306274},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.408980131149292},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.39647340774536133},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.39646539092063904},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.387246698141098},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.33188843727111816},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.29844045639038086},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.24303719401359558},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.1901187300682068},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1788051724433899}],"concepts":[{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.9279863834381104},{"id":"https://openalex.org/C98214594","wikidata":"https://www.wikidata.org/wiki/Q850275","display_name":"Conformal map","level":2,"score":0.7625190615653992},{"id":"https://openalex.org/C104293457","wikidata":"https://www.wikidata.org/wiki/Q28324852","display_name":"Imaging phantom","level":2,"score":0.6760827898979187},{"id":"https://openalex.org/C62354387","wikidata":"https://www.wikidata.org/wiki/Q875399","display_name":"Boundary (topology)","level":2,"score":0.639499306678772},{"id":"https://openalex.org/C184050105","wikidata":"https://www.wikidata.org/wiki/Q273163","display_name":"Isotropy","level":2,"score":0.6189135909080505},{"id":"https://openalex.org/C204366326","wikidata":"https://www.wikidata.org/wiki/Q3027650","display_name":"Deformation (meteorology)","level":2,"score":0.5750730633735657},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.5186490416526794},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.5032748579978943},{"id":"https://openalex.org/C63632240","wikidata":"https://www.wikidata.org/wiki/Q1935004","display_name":"Boundary element method","level":3,"score":0.4951077997684479},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.4815997779369354},{"id":"https://openalex.org/C131540310","wikidata":"https://www.wikidata.org/wiki/Q907564","display_name":"Conductivity","level":2,"score":0.4445880949497223},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.43755078315734863},{"id":"https://openalex.org/C182310444","wikidata":"https://www.wikidata.org/wiki/Q1332643","display_name":"Boundary value problem","level":2,"score":0.4146856367588043},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.41161638498306274},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.408980131149292},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39647340774536133},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.39646539092063904},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.387246698141098},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.33188843727111816},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.29844045639038086},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.24303719401359558},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.1901187300682068},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1788051724433899},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[{"descriptor_ui":"D000465","descriptor_name":"Algorithms","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D000465","descriptor_name":"Algorithms","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D000465","descriptor_name":"Algorithms","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D003198","descriptor_name":"Computer Simulation","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D003198","descriptor_name":"Computer Simulation","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D003198","descriptor_name":"Computer Simulation","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004553","descriptor_name":"Electric Conductivity","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004553","descriptor_name":"Electric Conductivity","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004553","descriptor_name":"Electric Conductivity","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D007091","descriptor_name":"Image Processing, Computer-Assisted","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D007091","descriptor_name":"Image Processing, Computer-Assisted","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D007091","descriptor_name":"Image Processing, Computer-Assisted","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D008962","descriptor_name":"Models, Theoretical","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D008962","descriptor_name":"Models, Theoretical","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D008962","descriptor_name":"Models, Theoretical","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D014054","descriptor_name":"Tomography","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D019047","descriptor_name":"Phantoms, Imaging","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D019047","descriptor_name":"Phantoms, Imaging","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D019047","descriptor_name":"Phantoms, Imaging","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D020342","descriptor_name":"Finite Element Analysis","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D020342","descriptor_name":"Finite Element Analysis","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D020342","descriptor_name":"Finite Element Analysis","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false}],"locations_count":5,"locations":[{"id":"doi:10.1109/tmi.2012.2204438","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tmi.2012.2204438","pdf_url":null,"source":{"id":"https://openalex.org/S58069681","display_name":"IEEE Transactions on Medical Imaging","issn_l":"0278-0062","issn":["0278-0062","1558-254X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Medical Imaging","raw_type":"journal-article"},{"id":"pmid:22711769","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/22711769","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE transactions on medical imaging","raw_type":null},{"id":"pmh:oai:pure.atira.dk:openaire_cris_publications/f8194e0e-f793-4483-8189-ce4449487883","is_oa":false,"landing_page_url":"https://research.manchester.ac.uk/en/publications/f8194e0e-f793-4483-8189-ce4449487883","pdf_url":null,"source":{"id":"https://openalex.org/S4306400662","display_name":"Research Explorer (The University of Manchester)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I28407311","host_organization_name":"University of Manchester","host_organization_lineage":["https://openalex.org/I28407311"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Boyle, A, Adler, A & Lionheart, W R B 2012, 'Shape deformation in two-dimensional electrical impedance tomography.', IEEE Transactions on Medical Imaging, vol. 31, no. 12. https://doi.org/10.1109/TMI.2012.2204438","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:eprints.maths.manchester.ac.uk.MIMS.EPrints:1698","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306400452","display_name":"MIMS EPrints (University of Southampton)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I43439940","host_organization_name":"University of Southampton","host_organization_lineage":["https://openalex.org/I43439940"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"MIMS Preprint"},{"id":"pmh:oai:pure.atira.dk:publications/f8194e0e-f793-4483-8189-ce4449487883","is_oa":false,"landing_page_url":"https://www.research.manchester.ac.uk/portal/en/publications/shape-deformation-in-twodimensional-electrical-impedance-tomography(f8194e0e-f793-4483-8189-ce4449487883).html","pdf_url":null,"source":{"id":"https://openalex.org/S4306400662","display_name":"Research Explorer (The University of Manchester)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I28407311","host_organization_name":"University of Manchester","host_organization_lineage":["https://openalex.org/I28407311"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Boyle, A, Adler, A & Lionheart, W R B 2012, 'Shape deformation in two-dimensional electrical impedance tomography.', IEEE Transactions on Medical Imaging, vol. 31, no. 12. https://doi.org/10.1109/TMI.2012.2204438","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320310573","display_name":"Consortia for Improving Medicine with Innovation and Technology","ror":"https://ror.org/002pd6e78"},{"id":"https://openalex.org/F4320334593","display_name":"Natural Sciences and Engineering Research Council of Canada","ror":"https://ror.org/01h531d29"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1487310974","https://openalex.org/W1497175931","https://openalex.org/W1521182902","https://openalex.org/W1564239959","https://openalex.org/W1973264506","https://openalex.org/W1975831153","https://openalex.org/W1984981328","https://openalex.org/W1990120195","https://openalex.org/W1993028754","https://openalex.org/W1995325863","https://openalex.org/W2012437014","https://openalex.org/W2017349683","https://openalex.org/W2021768572","https://openalex.org/W2025977958","https://openalex.org/W2027447854","https://openalex.org/W2040795621","https://openalex.org/W2041556066","https://openalex.org/W2061026956","https://openalex.org/W2072178528","https://openalex.org/W2072406906","https://openalex.org/W2077485693","https://openalex.org/W2082201463","https://openalex.org/W2084283074","https://openalex.org/W2103017125","https://openalex.org/W2143178617","https://openalex.org/W2143897237","https://openalex.org/W2490126082","https://openalex.org/W2593241161","https://openalex.org/W4241632604"],"related_works":["https://openalex.org/W4282829188","https://openalex.org/W3211685995","https://openalex.org/W2532315310","https://openalex.org/W2000128178","https://openalex.org/W2902419700","https://openalex.org/W3160616384","https://openalex.org/W2905540725","https://openalex.org/W4376629886","https://openalex.org/W2101428392","https://openalex.org/W2537891456"],"abstract_inverted_index":{"Electrical":[0],"impedance":[1],"tomography":[2],"(EIT)":[3],"uses":[4],"measurements":[5,23,158,177],"from":[6,25,141,159,173],"surface":[7],"electrodes":[8],"to":[9,40,45,60,130,155],"reconstruct":[10],"an":[11,168],"image":[12,54,206],"of":[13,16,36,114],"the":[14,17,34,37,41,99,112,143,209],"conductivity":[15,30,53,201],"contained":[18],"medium.":[19],"However,":[20],"changes":[21,27,32,49,63,202],"in":[22,28,33,51,64,69,119,182,208],"result":[24],"both":[26,181],"internal":[29],"and":[31,74,138,184,193],"shape":[35,48,62,73,100],"medium":[38],"relative":[39],"electrode":[42,75,191],"positions.":[43],"Failure":[44],"account":[46],"for":[47,81,85,116],"results":[50],"a":[52,125,132,160],"with":[55,185],"significant":[56],"artifacts.":[57],"Previous":[58],"work":[59,95],"address":[61],"EIT":[65,120,157],"has":[66,96,164],"shown":[67,97],"that":[68,98,189],"some":[70,190],"cases":[71],"boundary":[72,117,163,175,194],"location":[76],"can":[77,103,196],"be":[78,104,147,197],"uniquely":[79],"determined":[80],"isotropic":[82],"conductivities;":[83],"however,":[84],"geometrically":[86],"conformal":[87,137],"changes,":[88],"this":[89,108],"is":[90],"not":[91],"possible.":[92],"This":[93],"prior":[94],"change":[101],"problem":[102],"partially":[105],"addressed.":[106],"In":[107],"paper,":[109],"we":[110],"explore":[111],"limits":[113,145],"compensation":[115],"movement":[118,192],"using":[121],"three":[122],"approaches.":[123],"First,":[124],"theoretical":[126],"model":[127],"was":[128,171],"developed":[129],"separate":[131],"deformation":[133,176],"vector":[134],"field":[135],"into":[136],"nonconformal":[139],"components,":[140],"which":[142,174],"reconstruction":[144],"may":[146],"determined.":[148],"Next,":[149],"finite":[150],"element":[151],"models":[152],"were":[153,178],"used":[154],"simulate":[156],"domain":[161],"whose":[162],"been":[165],"deformed.":[166],"Finally,":[167],"experimental":[169,186],"phantom":[170],"constructed":[172],"acquired.":[179],"Results,":[180],"simulation":[183],"data,":[187],"suggest":[188],"distortions":[195],"reconstructed":[198],"based":[199],"on":[200],"alone":[203],"while":[204],"reducing":[205],"artifacts":[207],"process.":[210]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":8},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":2}],"updated_date":"2026-01-13T01:12:25.745995","created_date":"2025-10-10T00:00:00"}