{"id":"https://openalex.org/W2098669030","doi":"https://doi.org/10.1109/tmc.2003.1217237","title":"S-parameters characterization of through, blind, and buried via holes","display_name":"S-parameters characterization of through, blind, and buried via holes","publication_year":2003,"publication_date":"2003-04-01","ids":{"openalex":"https://openalex.org/W2098669030","doi":"https://doi.org/10.1109/tmc.2003.1217237","mag":"2098669030"},"language":"en","primary_location":{"id":"doi:10.1109/tmc.2003.1217237","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tmc.2003.1217237","pdf_url":null,"source":{"id":"https://openalex.org/S69141925","display_name":"IEEE Transactions on Mobile Computing","issn_l":"1536-1233","issn":["1536-1233","1558-0660","2161-9875"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Mobile Computing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002230752","display_name":"Giulio Antonini","orcid":"https://orcid.org/0000-0001-5433-6173"},"institutions":[{"id":"https://openalex.org/I26415053","display_name":"University of L'Aquila","ror":"https://ror.org/01j9p1r26","country_code":"IT","type":"education","lineage":["https://openalex.org/I26415053"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"G. Antonini","raw_affiliation_strings":["The UAq EMC Laboratory, Department of Electrical Engineering, University of L'' Aquila, L'Aquila, Italy","Dept. of Electr. Eng., L'Aquila Univ., Italy"],"affiliations":[{"raw_affiliation_string":"The UAq EMC Laboratory, Department of Electrical Engineering, University of L'' Aquila, L'Aquila, Italy","institution_ids":["https://openalex.org/I26415053"]},{"raw_affiliation_string":"Dept. of Electr. Eng., L'Aquila Univ., Italy","institution_ids":["https://openalex.org/I26415053"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043572469","display_name":"Antonio Ciccomancini Scogna","orcid":"https://orcid.org/0000-0001-6648-6697"},"institutions":[{"id":"https://openalex.org/I26415053","display_name":"University of L'Aquila","ror":"https://ror.org/01j9p1r26","country_code":"IT","type":"education","lineage":["https://openalex.org/I26415053"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A.C. Scogna","raw_affiliation_strings":["The UAq EMC Laboratory, Department of Electrical Engineering, University of L'' Aquila, L'Aquila, Italy","Dept. of Electr. Eng., L'Aquila Univ., Italy"],"affiliations":[{"raw_affiliation_string":"The UAq EMC Laboratory, Department of Electrical Engineering, University of L'' Aquila, L'Aquila, Italy","institution_ids":["https://openalex.org/I26415053"]},{"raw_affiliation_string":"Dept. of Electr. Eng., L'Aquila Univ., Italy","institution_ids":["https://openalex.org/I26415053"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049774878","display_name":"Antonio Orlandi","orcid":"https://orcid.org/0000-0001-5301-2820"},"institutions":[{"id":"https://openalex.org/I26415053","display_name":"University of L'Aquila","ror":"https://ror.org/01j9p1r26","country_code":"IT","type":"education","lineage":["https://openalex.org/I26415053"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Orlandi","raw_affiliation_strings":["The UAq EMC Laboratory, Department of Electrical Engineering, University of L'' Aquila, L'Aquila, Italy","Dept. of Electr. Eng., L'Aquila Univ., Italy"],"affiliations":[{"raw_affiliation_string":"The UAq EMC Laboratory, Department of Electrical Engineering, University of L'' Aquila, L'Aquila, Italy","institution_ids":["https://openalex.org/I26415053"]},{"raw_affiliation_string":"Dept. of Electr. Eng., L'Aquila Univ., Italy","institution_ids":["https://openalex.org/I26415053"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5002230752"],"corresponding_institution_ids":["https://openalex.org/I26415053"],"apc_list":null,"apc_paid":null,"fwci":2.4342,"has_fulltext":false,"cited_by_count":64,"citation_normalized_percentile":{"value":0.89032144,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"2","issue":"2","first_page":"174","last_page":"184"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11263","display_name":"Electromagnetic Simulation and Numerical Methods","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/classification-of-discontinuities","display_name":"Classification of discontinuities","score":0.7973288297653198},{"id":"https://openalex.org/keywords/discontinuity","display_name":"Discontinuity (linguistics)","score":0.7740786075592041},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7434178590774536},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.6900348663330078},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.5859634876251221},{"id":"https://openalex.org/keywords/scattering","display_name":"Scattering","score":0.5837797522544861},{"id":"https://openalex.org/keywords/embedding","display_name":"Embedding","score":0.5072614550590515},{"id":"https://openalex.org/keywords/differential","display_name":"Differential (mechanical device)","score":0.49674421548843384},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44267863035202026},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.38160139322280884},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.1959328055381775},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11579862236976624},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11358252167701721},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10223338007926941},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09348544478416443}],"concepts":[{"id":"https://openalex.org/C15627037","wikidata":"https://www.wikidata.org/wiki/Q541961","display_name":"Classification of discontinuities","level":2,"score":0.7973288297653198},{"id":"https://openalex.org/C2777042112","wikidata":"https://www.wikidata.org/wiki/Q5281658","display_name":"Discontinuity (linguistics)","level":2,"score":0.7740786075592041},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7434178590774536},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.6900348663330078},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.5859634876251221},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.5837797522544861},{"id":"https://openalex.org/C41608201","wikidata":"https://www.wikidata.org/wiki/Q980509","display_name":"Embedding","level":2,"score":0.5072614550590515},{"id":"https://openalex.org/C93226319","wikidata":"https://www.wikidata.org/wiki/Q193137","display_name":"Differential (mechanical device)","level":2,"score":0.49674421548843384},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44267863035202026},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.38160139322280884},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1959328055381775},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11579862236976624},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11358252167701721},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10223338007926941},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09348544478416443},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tmc.2003.1217237","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tmc.2003.1217237","pdf_url":null,"source":{"id":"https://openalex.org/S69141925","display_name":"IEEE Transactions on Mobile Computing","issn_l":"1536-1233","issn":["1536-1233","1558-0660","2161-9875"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Mobile Computing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/11","score":0.550000011920929,"display_name":"Sustainable cities and communities"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320309568","display_name":"University of Missouri","ror":"https://ror.org/02ymw8z06"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W567126708","https://openalex.org/W1546460110","https://openalex.org/W1788846032","https://openalex.org/W1991680123","https://openalex.org/W2052834469","https://openalex.org/W2084130709","https://openalex.org/W2096794265","https://openalex.org/W2103680361","https://openalex.org/W2115249085","https://openalex.org/W2122584909","https://openalex.org/W2135251778","https://openalex.org/W2144940526","https://openalex.org/W2152948533","https://openalex.org/W2155778569","https://openalex.org/W2161633984","https://openalex.org/W2162149378","https://openalex.org/W2164543115","https://openalex.org/W2165831075","https://openalex.org/W2170587459","https://openalex.org/W2171109331","https://openalex.org/W4248266115","https://openalex.org/W4407377614"],"related_works":["https://openalex.org/W2323190011","https://openalex.org/W3039499377","https://openalex.org/W162062087","https://openalex.org/W2085032340","https://openalex.org/W2026226327","https://openalex.org/W1989965977","https://openalex.org/W4241629433","https://openalex.org/W2056095867","https://openalex.org/W2232767080","https://openalex.org/W1756153455"],"abstract_inverted_index":{"A":[0],"method":[1],"for":[2,8,23,99,117],"de-embedding":[3],"the":[4,39,42,46,50,54,83,94,104,108,118],"scattering":[5,51],"parameters":[6,52],"matrix":[7],"single-end":[9],"or":[10,36],"differential":[11,67],"through,":[12],"buried,":[13],"and":[14,66,70,112],"blind":[15],"via":[16,68,109],"holes":[17,69],"in":[18],"multilayer":[19],"printed":[20],"circuit":[21],"boards":[22],"high-speed":[24],"digital":[25],"applications":[26],"is":[27,59,71,79,97],"presented.":[28],"The":[29,57,75],"proposed":[30,95],"technique":[31,78],"starts":[32],"from":[33],"a":[34,100],"measurement":[35],"simulation":[37],"of":[38,53,64,107,120],"structure":[40],"containing":[41],"discontinuity":[43],"and,":[44],"after":[45],"structure's":[47],"partitioning,":[48],"extracts":[49],"required":[55],"discontinuity.":[56],"procedure":[58],"applied":[60],"to":[61,81,89],"different":[62],"kinds":[63],"single-ended":[65],"validated":[72],"by":[73],"measurements.":[74],"finite":[76],"integration":[77],"used":[80],"perform":[82],"needed":[84],"three-dimensional":[85],"electromagnetic":[86],"simulations.":[87],"Due":[88],"its":[90],"reduced":[91],"CPU":[92],"time,":[93],"methodology":[96],"suitable":[98],"parametric":[101],"analysis":[102],"on":[103],"electrical":[105],"performance":[106],"hole":[110],"discontinuities":[111],"it":[113],"gives":[114],"useful":[115],"results":[116],"extraction":[119],"accurate":[121],"computer-aided":[122],"design":[123],"models.":[124]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":31},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}