{"id":"https://openalex.org/W4399800461","doi":"https://doi.org/10.1109/tip.2024.3414145","title":"A Single-Frame Deflectometry Method for Online Inspection of Light-Transmitting Components","display_name":"A Single-Frame Deflectometry Method for Online Inspection of Light-Transmitting Components","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4399800461","doi":"https://doi.org/10.1109/tip.2024.3414145","pmid":"https://pubmed.ncbi.nlm.nih.gov/38896518"},"language":"en","primary_location":{"id":"doi:10.1109/tip.2024.3414145","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tip.2024.3414145","pdf_url":null,"source":{"id":"https://openalex.org/S4210173141","display_name":"IEEE Transactions on Image Processing","issn_l":"1057-7149","issn":["1057-7149","1941-0042"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Image Processing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5071951449","display_name":"Ning Yan","orcid":"https://orcid.org/0000-0002-1877-9206"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ning Yan","raw_affiliation_strings":["State Key Laboratory of Precision Measurement Technology and Instruments, Laboratory of Micro/Nano Manufacturing Technology, Tianjin University, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Precision Measurement Technology and Instruments, Laboratory of Micro/Nano Manufacturing Technology, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101405389","display_name":"Dongxue Wang","orcid":"https://orcid.org/0000-0002-4402-0690"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dongxue Wang","raw_affiliation_strings":["State Key Laboratory of Precision Measurement Technology and Instruments, Laboratory of Micro/Nano Manufacturing Technology, Tianjin University, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Precision Measurement Technology and Instruments, Laboratory of Micro/Nano Manufacturing Technology, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100349660","display_name":"Lei Liu","orcid":"https://orcid.org/0000-0003-4784-027X"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Liu","raw_affiliation_strings":["State Key Laboratory of Precision Measurement Technology and Instruments, Laboratory of Micro/Nano Manufacturing Technology, Tianjin University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0003-4784-027X","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Precision Measurement Technology and Instruments, Laboratory of Micro/Nano Manufacturing Technology, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058959735","display_name":"Zhuotong Li","orcid":"https://orcid.org/0000-0002-2971-5080"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhuotong Li","raw_affiliation_strings":["State Key Laboratory of Precision Measurement Technology and Instruments, Laboratory of Micro/Nano Manufacturing Technology, Tianjin University, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Precision Measurement Technology and Instruments, Laboratory of Micro/Nano Manufacturing Technology, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066859648","display_name":"Shuaipeng Yuan","orcid":null},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuaipeng Yuan","raw_affiliation_strings":["State Key Laboratory of Precision Measurement Technology and Instruments, Laboratory of Micro/Nano Manufacturing Technology, Tianjin University, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Precision Measurement Technology and Instruments, Laboratory of Micro/Nano Manufacturing Technology, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100376184","display_name":"Xiaodong Zhang","orcid":"https://orcid.org/0000-0001-8469-7113"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaodong Zhang","raw_affiliation_strings":["State Key Laboratory of Precision Measurement Technology and Instruments, Laboratory of Micro/Nano Manufacturing Technology, Tianjin University, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0001-8469-7113","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Precision Measurement Technology and Instruments, Laboratory of Micro/Nano Manufacturing Technology, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9155,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.76782407,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"33","issue":null,"first_page":"3871","last_page":"3879"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9876000285148621,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9584000110626221,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.621507465839386},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5978108048439026},{"id":"https://openalex.org/keywords/frame","display_name":"Frame (networking)","score":0.5952395796775818},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5142183303833008},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3669580817222595},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.15376845002174377},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11269590258598328}],"concepts":[{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.621507465839386},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5978108048439026},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.5952395796775818},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5142183303833008},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3669580817222595},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15376845002174377},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11269590258598328}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tip.2024.3414145","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tip.2024.3414145","pdf_url":null,"source":{"id":"https://openalex.org/S4210173141","display_name":"IEEE Transactions on Image Processing","issn_l":"1057-7149","issn":["1057-7149","1941-0042"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Image Processing","raw_type":"journal-article"},{"id":"pmid:38896518","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/38896518","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE transactions on image processing : a publication of the IEEE Signal Processing Society","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G6532210058","display_name":null,"funder_award_id":"62373274","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1670596404","https://openalex.org/W1857447036","https://openalex.org/W1964559235","https://openalex.org/W1970294808","https://openalex.org/W1971090610","https://openalex.org/W1978133968","https://openalex.org/W1991544872","https://openalex.org/W2003292041","https://openalex.org/W2006650073","https://openalex.org/W2009518030","https://openalex.org/W2018815291","https://openalex.org/W2031976247","https://openalex.org/W2032831684","https://openalex.org/W2038726407","https://openalex.org/W2049550935","https://openalex.org/W2077791767","https://openalex.org/W2090240652","https://openalex.org/W2102970312","https://openalex.org/W2106845999","https://openalex.org/W2111665821","https://openalex.org/W2117412942","https://openalex.org/W2139045541","https://openalex.org/W2167667767","https://openalex.org/W2169115848","https://openalex.org/W2795953499","https://openalex.org/W2805087904","https://openalex.org/W2886480556","https://openalex.org/W2894611255","https://openalex.org/W2896179631","https://openalex.org/W3034972056","https://openalex.org/W3207643506","https://openalex.org/W4212945890","https://openalex.org/W4226210813"],"related_works":["https://openalex.org/W2058170566","https://openalex.org/W2755342338","https://openalex.org/W2772917594","https://openalex.org/W2775347418","https://openalex.org/W2166024367","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2951359407","https://openalex.org/W2079911747","https://openalex.org/W1969923398"],"abstract_inverted_index":{"Transparent":[0],"materials":[1,21],"are":[2],"widely":[3],"used":[4,182],"in":[5,37,213],"industrial":[6,38,133,264],"applications,":[7,250],"such":[8,66],"as":[9],"construction,":[10],"transportation,":[11],"and":[12,142,170,190,225,230,255],"optics.":[13],"However,":[14],"the":[15,84,88,95,103,111,116,130,162,168,172,191,204,217,228],"complex":[16],"optical":[17],"properties":[18],"of":[19,59,65,87,94,121,132,167,206,219,232,253],"these":[20],"make":[22],"it":[23,92,114,165,195],"difficult":[24],"to":[25,160,183,198],"achieve":[26,199],"precise":[27],"surface":[28,34,118,176,220,235],"form":[29,35],"measurements,":[30],"especially":[31],"for":[32,62,78,151,174,248,263],"bulk":[33],"inspection":[36,64],"environments.":[39],"Traditional":[40],"structured":[41],"light-based":[42],"measurement":[43,73,201],"methods":[44],"often":[45],"struggle":[46],"with":[47,106],"suboptimal":[48],"signal-to-noise":[49,107],"ratios,":[50],"making":[51,91,164],"them":[52],"ineffective.":[53],"Currently,":[54],"there":[55],"is":[56,196],"a":[57,71,140,185,200,239],"lack":[58],"efficient":[60],"techniques":[61],"real-time":[63],"components.":[67],"This":[68,100],"paper":[69,215],"proposes":[70],"single-frame":[72,240],"technique":[74,137],"based":[75],"on":[76,203,222],"deflectometry":[77],"large-size":[79],"transparent":[80,122,125,223,234],"surfaces.":[81],"It":[82,154],"utilizes":[83],"reflective":[85],"characteristics":[86,120],"measured":[89],"surface,":[90],"independent":[93,166],"surface's":[96],"diffuse":[97],"reflection":[98,119,221],"properties.":[99],"fundamentally":[101],"solves":[102],"issues":[104],"associated":[105],"ratios.":[108],"By":[109],"discretizing":[110],"phase":[112,158],"map,":[113],"separates":[115],"multiple":[117],"devices,":[123],"enabling":[124],"device":[126],"measurement.":[127,177,242],"To":[128],"meet":[129],"requirements":[131],"dynamic":[134],"measurement,":[135,163],"this":[136,214,244],"only":[138],"needs":[139],"simple":[141],"low-cost":[143],"system":[144],"structure,":[145],"which":[146],"contains":[147],"just":[148],"two":[149],"cameras":[150],"image":[152,241],"capture.":[153],"does":[155],"not":[156],"require":[157],"shifting":[159],"complete":[161],"screen":[169],"having":[171],"potential":[173,262],"larger":[175],"The":[178,210],"proposed":[179,212],"method":[180,211,245],"was":[181],"measure":[184],"400mm":[186],"aperture":[187],"automobile":[188],"glass,":[189],"results":[192],"showed":[193],"that":[194],"able":[197],"accuracy":[202,231],"order":[205],"10":[207],"\u03bc":[208],"m.":[209],"overcomes":[216],"influence":[218],"objects":[224],"significantly":[226],"improves":[227],"efficiency":[229],"large-sized":[233],"measurements":[236,252],"by":[237],"using":[238],"Moreover,":[243],"shows":[246],"promise":[247],"broader":[249],"including":[251],"lenses":[254],"HUD":[256],"(Heads-Up":[257],"Display)":[258],"components,":[259],"showcasing":[260],"significant":[261],"applications.":[265]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}