{"id":"https://openalex.org/W2021724515","doi":"https://doi.org/10.1109/tip.2014.2374538","title":"Adjoint Active Surfaces for Localization and Imaging","display_name":"Adjoint Active Surfaces for Localization and Imaging","publication_year":2014,"publication_date":"2014-11-26","ids":{"openalex":"https://openalex.org/W2021724515","doi":"https://doi.org/10.1109/tip.2014.2374538","mag":"2021724515","pmid":"https://pubmed.ncbi.nlm.nih.gov/25438311"},"language":"en","primary_location":{"id":"doi:10.1109/tip.2014.2374538","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tip.2014.2374538","pdf_url":null,"source":{"id":"https://openalex.org/S4210173141","display_name":"IEEE Transactions on Image Processing","issn_l":"1057-7149","issn":["1057-7149","1941-0042"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Image Processing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042066498","display_name":"Daniel Cook","orcid":"https://orcid.org/0000-0002-9789-8616"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]},{"id":"https://openalex.org/I4210090800","display_name":"Sensors (United States)","ror":"https://ror.org/00b4mz884","country_code":"US","type":"company","lineage":["https://openalex.org/I4210090800"]},{"id":"https://openalex.org/I4388482740","display_name":"Georgia Tech Research Institute","ror":"https://ror.org/04qfrh333","country_code":null,"type":"facility","lineage":["https://openalex.org/I130701444","https://openalex.org/I4388482740"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Daniel A. Cook","raw_affiliation_strings":["Sensors and Electromagnetic Applications Laboratory, Georgia Tech Research Institute, Atlanta, GA, USA","[Sensors and Electromagnetic Applications Laboratory, Georgia Technology Research Institute, Atlanta, GA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sensors and Electromagnetic Applications Laboratory, Georgia Tech Research Institute, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444","https://openalex.org/I4210090800","https://openalex.org/I4388482740"]},{"raw_affiliation_string":"[Sensors and Electromagnetic Applications Laboratory, Georgia Technology Research Institute, Atlanta, GA, USA]","institution_ids":["https://openalex.org/I130701444","https://openalex.org/I4210090800","https://openalex.org/I4388482740"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033373990","display_name":"Martin Mueller","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Martin Fritz Mueller","raw_affiliation_strings":["Perception and Analytics Laboratory, Texas Instruments, Inc., Dallas, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Perception and Analytics Laboratory, Texas Instruments, Inc., Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024141265","display_name":"Francesco Fedele","orcid":"https://orcid.org/0000-0001-6403-4224"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Francesco Fedele","raw_affiliation_strings":["School of Civil and Environmental Engineering, Georgia Institute of Technology, Atlanta, GA, USA","School of Civil and environmental engineering, Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Civil and Environmental Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"School of Civil and environmental engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014124403","display_name":"Anthony Yezzi","orcid":"https://orcid.org/0000-0002-3771-4889"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Anthony J. Yezzi","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","[School of Electrical & Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[School of Electrical & Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA]","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.08795935,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"24","issue":"1","first_page":"316","last_page":"331"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11205","display_name":"Numerical methods in inverse problems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2610","display_name":"Mathematical Physics"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scalar","display_name":"Scalar (mathematics)","score":0.6363817453384399},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.613420844078064},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.5224491953849792},{"id":"https://openalex.org/keywords/electromagnetics","display_name":"Electromagnetics","score":0.5075818300247192},{"id":"https://openalex.org/keywords/minification","display_name":"Minification","score":0.49746254086494446},{"id":"https://openalex.org/keywords/helmholtz-equation","display_name":"Helmholtz equation","score":0.47233858704566956},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44082680344581604},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3706653118133545},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.35642850399017334},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3459551930427551},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.24491429328918457},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20562702417373657},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.16821345686912537},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0934428870677948}],"concepts":[{"id":"https://openalex.org/C57691317","wikidata":"https://www.wikidata.org/wiki/Q1289248","display_name":"Scalar (mathematics)","level":2,"score":0.6363817453384399},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.613420844078064},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.5224491953849792},{"id":"https://openalex.org/C2909720056","wikidata":"https://www.wikidata.org/wiki/Q11406","display_name":"Electromagnetics","level":2,"score":0.5075818300247192},{"id":"https://openalex.org/C147764199","wikidata":"https://www.wikidata.org/wiki/Q6865248","display_name":"Minification","level":2,"score":0.49746254086494446},{"id":"https://openalex.org/C18591234","wikidata":"https://www.wikidata.org/wiki/Q860615","display_name":"Helmholtz equation","level":3,"score":0.47233858704566956},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44082680344581604},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3706653118133545},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.35642850399017334},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3459551930427551},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.24491429328918457},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20562702417373657},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.16821345686912537},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0934428870677948},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0},{"id":"https://openalex.org/C182310444","wikidata":"https://www.wikidata.org/wiki/Q1332643","display_name":"Boundary value problem","level":2,"score":0.0},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tip.2014.2374538","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tip.2014.2374538","pdf_url":null,"source":{"id":"https://openalex.org/S4210173141","display_name":"IEEE Transactions on Image Processing","issn_l":"1057-7149","issn":["1057-7149","1941-0042"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Image Processing","raw_type":"journal-article"},{"id":"pmid:25438311","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/25438311","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE transactions on image processing : a publication of the IEEE Signal Processing Society","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/11","score":0.47999998927116394,"display_name":"Sustainable cities and communities"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":75,"referenced_works":["https://openalex.org/W69932122","https://openalex.org/W86549454","https://openalex.org/W130191466","https://openalex.org/W140544284","https://openalex.org/W165395710","https://openalex.org/W260767608","https://openalex.org/W338288148","https://openalex.org/W596928057","https://openalex.org/W612821643","https://openalex.org/W1496354108","https://openalex.org/W1500158105","https://openalex.org/W1506558619","https://openalex.org/W1510539975","https://openalex.org/W1512168000","https://openalex.org/W1527747735","https://openalex.org/W1540232275","https://openalex.org/W1553360396","https://openalex.org/W1569041160","https://openalex.org/W1581163326","https://openalex.org/W1613559169","https://openalex.org/W1973039295","https://openalex.org/W1979018848","https://openalex.org/W1985554756","https://openalex.org/W1989884953","https://openalex.org/W1991623636","https://openalex.org/W1993612275","https://openalex.org/W2001431479","https://openalex.org/W2005899919","https://openalex.org/W2025955517","https://openalex.org/W2026796804","https://openalex.org/W2037677143","https://openalex.org/W2038174079","https://openalex.org/W2041858018","https://openalex.org/W2046489591","https://openalex.org/W2049301064","https://openalex.org/W2077619889","https://openalex.org/W2079249879","https://openalex.org/W2087458881","https://openalex.org/W2093206746","https://openalex.org/W2100245965","https://openalex.org/W2104095591","https://openalex.org/W2104355613","https://openalex.org/W2109911863","https://openalex.org/W2115657970","https://openalex.org/W2120041222","https://openalex.org/W2120977599","https://openalex.org/W2121151171","https://openalex.org/W2128962323","https://openalex.org/W2135203421","https://openalex.org/W2141471272","https://openalex.org/W2148121821","https://openalex.org/W2150130619","https://openalex.org/W2159476166","https://openalex.org/W2173502753","https://openalex.org/W2183438047","https://openalex.org/W2212504651","https://openalex.org/W2321585011","https://openalex.org/W2325138623","https://openalex.org/W2472056608","https://openalex.org/W2495346723","https://openalex.org/W2513908457","https://openalex.org/W2565678641","https://openalex.org/W2576483540","https://openalex.org/W2915092065","https://openalex.org/W2998023265","https://openalex.org/W3021722416","https://openalex.org/W3039083618","https://openalex.org/W3149976863","https://openalex.org/W4285719527","https://openalex.org/W6629644246","https://openalex.org/W6675574535","https://openalex.org/W6688222574","https://openalex.org/W6720135729","https://openalex.org/W6726599518","https://openalex.org/W6731265646"],"related_works":["https://openalex.org/W3108522484","https://openalex.org/W2340830474","https://openalex.org/W2167569749","https://openalex.org/W4382990363","https://openalex.org/W2378757965","https://openalex.org/W4224903346","https://openalex.org/W2032794959","https://openalex.org/W1593262897","https://openalex.org/W4297802311","https://openalex.org/W2372869593"],"abstract_inverted_index":{"This":[0],"paper":[1],"addresses":[2],"the":[3,23,26,35,38,44,48,60,70,78,83,89,105,111,118],"problem":[4],"of":[5,25,37,40,62,69,113],"localizing":[6],"and":[7,85,130],"segmenting":[8],"regions":[9],"embedded":[10],"within":[11],"a":[12],"surrounding":[13],"medium":[14],"by":[15,117],"characterizing":[16],"their":[17],"boundaries,":[18],"as":[19,99],"opposed":[20],"to":[21,32,67,81],"imaging":[22],"entirety":[24],"volume.":[27],"Active":[28],"surfaces":[29],"are":[30],"used":[31],"directly":[33],"reconstruct":[34],"shape":[36],"region":[39],"interest.":[41],"We":[42],"describe":[43],"procedure":[45],"for":[46],"finding":[47],"optimal":[49,100],"surface,":[50],"which":[51],"is":[52],"computed":[53],"iteratively":[54],"via":[55],"gradient":[56],"descent":[57],"that":[58],"exploits":[59],"sensitivity":[61],"an":[63],"error":[64],"minimization":[65],"functional":[66],"changes":[68],"active":[71,107],"surface.":[72],"In":[73],"doing":[74],"so,":[75],"we":[76,103],"introduce":[77],"adjoint":[79],"model":[80],"compute":[82],"sensitivity,":[84],"in":[86,110],"this":[87],"respect,":[88],"method":[90],"shares":[91],"common":[92],"ground":[93],"with":[94],"several":[95],"other":[96],"disciplines,":[97],"such":[98],"control.":[101],"Finally,":[102],"illustrate":[104],"proposed":[106],"surface":[108],"technique":[109],"framework":[112],"wave":[114],"propagation":[115],"governed":[116],"scalar":[119],"Helmholtz":[120],"equation.":[121],"Potential":[122],"applications":[123],"include":[124],"electromagnetics,":[125],"acoustics,":[126],"geophysics,":[127],"nondestructive":[128],"testing,":[129],"medical":[131],"imaging.":[132]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}