{"id":"https://openalex.org/W2030300879","doi":"https://doi.org/10.1109/tip.2014.2361034","title":"High-Quality Depth Map Upsampling and Completion for RGB-D Cameras","display_name":"High-Quality Depth Map Upsampling and Completion for RGB-D Cameras","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W2030300879","doi":"https://doi.org/10.1109/tip.2014.2361034","mag":"2030300879"},"language":"en","primary_location":{"id":"doi:10.1109/tip.2014.2361034","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tip.2014.2361034","pdf_url":null,"source":{"id":"https://openalex.org/S4210173141","display_name":"IEEE Transactions on Image Processing","issn_l":"1057-7149","issn":["1057-7149","1941-0042"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Image Processing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100611457","display_name":"Jaesik Park","orcid":"https://orcid.org/0000-0001-5541-409X"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jaesik Park","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Korea","Department of Electrical Engineering, Korea Advanced Institute of Science and Technology Daejeon Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology Daejeon Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101717515","display_name":"Hyeongwoo Kim","orcid":"https://orcid.org/0000-0002-2509-8230"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyeongwoo Kim","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Korea","Department of Electrical Engineering, Korea Advanced Institute of Science and Technology Daejeon Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology Daejeon Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001987788","display_name":"Yu\u2010Wing Tai","orcid":"https://orcid.org/0000-0002-3148-0380"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yu-Wing Tai","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Korea","Department of Electrical Engineering, Korea Advanced Institute of Science and Technology Daejeon Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology Daejeon Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075135613","display_name":"Michael S. Brown","orcid":"https://orcid.org/0000-0002-6357-2562"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Michael S. Brown","raw_affiliation_strings":["School of Computing, National University of Singapore, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Computing, National University of Singapore, Singapore","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012455275","display_name":"In So Kweon","orcid":"https://orcid.org/0000-0001-9626-5983"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"In So Kweon","raw_affiliation_strings":["Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Korea","Department of Electrical Engineering, Korea Advanced Institute of Science and Technology Daejeon Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering, Korea Advanced Institute of Science and Technology Daejeon Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100611457"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":null,"apc_paid":null,"fwci":7.3163,"has_fulltext":false,"cited_by_count":117,"citation_normalized_percentile":{"value":0.97880459,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":"23","issue":"12","first_page":"5559","last_page":"5572"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/upsampling","display_name":"Upsampling","score":0.8584710359573364},{"id":"https://openalex.org/keywords/depth-map","display_name":"Depth map","score":0.7666771411895752},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7220028638839722},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.717928946018219},{"id":"https://openalex.org/keywords/rgb-color-model","display_name":"RGB color model","score":0.6330385804176331},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.631208062171936},{"id":"https://openalex.org/keywords/image-warping","display_name":"Image warping","score":0.5862987041473389},{"id":"https://openalex.org/keywords/classification-of-discontinuities","display_name":"Classification of discontinuities","score":0.4956732988357544},{"id":"https://openalex.org/keywords/weighting","display_name":"Weighting","score":0.4174097180366516},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2439042329788208},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.16252458095550537}],"concepts":[{"id":"https://openalex.org/C110384440","wikidata":"https://www.wikidata.org/wiki/Q1143270","display_name":"Upsampling","level":3,"score":0.8584710359573364},{"id":"https://openalex.org/C141268832","wikidata":"https://www.wikidata.org/wiki/Q2940499","display_name":"Depth map","level":3,"score":0.7666771411895752},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7220028638839722},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.717928946018219},{"id":"https://openalex.org/C82990744","wikidata":"https://www.wikidata.org/wiki/Q166194","display_name":"RGB color model","level":2,"score":0.6330385804176331},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.631208062171936},{"id":"https://openalex.org/C157202957","wikidata":"https://www.wikidata.org/wiki/Q1659609","display_name":"Image warping","level":2,"score":0.5862987041473389},{"id":"https://openalex.org/C15627037","wikidata":"https://www.wikidata.org/wiki/Q541961","display_name":"Classification of discontinuities","level":2,"score":0.4956732988357544},{"id":"https://openalex.org/C183115368","wikidata":"https://www.wikidata.org/wiki/Q856577","display_name":"Weighting","level":2,"score":0.4174097180366516},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2439042329788208},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.16252458095550537},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tip.2014.2361034","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tip.2014.2361034","pdf_url":null,"source":{"id":"https://openalex.org/S4210173141","display_name":"IEEE Transactions on Image Processing","issn_l":"1057-7149","issn":["1057-7149","1941-0042"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Image Processing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":41,"referenced_works":["https://openalex.org/W65124300","https://openalex.org/W125693051","https://openalex.org/W1491073809","https://openalex.org/W1762322375","https://openalex.org/W1984844207","https://openalex.org/W2010073476","https://openalex.org/W2011953641","https://openalex.org/W2026726159","https://openalex.org/W2030716039","https://openalex.org/W2041094000","https://openalex.org/W2073107947","https://openalex.org/W2073895861","https://openalex.org/W2098883970","https://openalex.org/W2099940712","https://openalex.org/W2102515519","https://openalex.org/W2104599718","https://openalex.org/W2104600947","https://openalex.org/W2104620097","https://openalex.org/W2104974755","https://openalex.org/W2109945199","https://openalex.org/W2111365302","https://openalex.org/W2116073066","https://openalex.org/W2119599674","https://openalex.org/W2124213377","https://openalex.org/W2136154655","https://openalex.org/W2137504719","https://openalex.org/W2152195021","https://openalex.org/W2160956336","https://openalex.org/W2161328579","https://openalex.org/W2559373280","https://openalex.org/W2587111463","https://openalex.org/W4212931420","https://openalex.org/W4241716071","https://openalex.org/W6605121731","https://openalex.org/W6629222711","https://openalex.org/W6674909603","https://openalex.org/W6676600194","https://openalex.org/W6677501092","https://openalex.org/W6678827375","https://openalex.org/W6729966228","https://openalex.org/W6884869577"],"related_works":["https://openalex.org/W2901949253","https://openalex.org/W2283162247","https://openalex.org/W2052518016","https://openalex.org/W4212983513","https://openalex.org/W2612057606","https://openalex.org/W3009786413","https://openalex.org/W2085956791","https://openalex.org/W2075263707","https://openalex.org/W3002219315","https://openalex.org/W2004118337"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"an":[3,31],"application":[4],"framework":[5,17,146],"to":[6,51,88],"perform":[7],"high-quality":[8],"upsampling":[9,69,123],"and":[10,55,100,110,124,142],"completion":[11,153],"on":[12],"noisy":[13],"depth":[14,27,47,72,94,121],"maps.":[15],"Our":[16,83],"targets":[18],"a":[19,26,36,41,70,76,93],"complementary":[20],"system":[21],"setup,":[22],"which":[23],"consists":[24],"of":[25,98,157],"camera":[28],"coupled":[29],"with":[30,75,96,154],"RGB":[32,66,107],"camera.":[33],"Inspired":[34],"by":[35,61],"recent":[37],"work":[38],"that":[39,79,114],"uses":[40],"nonlocal":[42],"structure":[43,81],"regularization,":[44],"we":[45],"regularize":[46],"maps":[48],"in":[49,92],"order":[50],"maintain":[52],"fine":[53],"details":[54],"structures.":[56],"We":[57,126],"extend":[58],"this":[59,132],"regularization":[60],"combining":[62],"the":[63,106,128,155],"additional":[64],"high-resolution":[65],"input":[67,140],"when":[68],"low-resolution":[71],"map":[73,95,122],"together":[74],"weighting":[77],"scheme":[78],"favors":[80],"details.":[82],"technique":[84],"is":[85],"also":[86],"able":[87],"repair":[89],"large":[90],"holes":[91],"consideration":[97,156],"structures":[99],"discontinuities":[101],"utilizing":[102],"edge":[103],"information":[104],"from":[105],"input.":[108],"Quantitative":[109],"qualitative":[111],"results":[112],"show":[113],"our":[115,145],"method":[116],"outperforms":[117],"existing":[118],"approaches":[119],"for":[120,131,139,150],"completion.":[125],"describe":[127],"complete":[129],"process":[130],"system,":[133],"including":[134],"device":[135],"calibration,":[136],"scene":[137],"warping":[138],"alignment,":[141],"even":[143],"how":[144],"can":[147],"be":[148],"extended":[149],"video":[151],"depth-map":[152],"temporal":[158],"coherence.":[159]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":14},{"year":2021,"cited_by_count":10},{"year":2020,"cited_by_count":12},{"year":2019,"cited_by_count":15},{"year":2018,"cited_by_count":16},{"year":2017,"cited_by_count":14},{"year":2016,"cited_by_count":13},{"year":2015,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}