{"id":"https://openalex.org/W7081950101","doi":"https://doi.org/10.1109/tim.2025.3609373","title":"Research on Quantitative Circuit Model and Detection of Crack Based on Microstrip Line Structure","display_name":"Research on Quantitative Circuit Model and Detection of Crack Based on Microstrip Line Structure","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W7081950101","doi":"https://doi.org/10.1109/tim.2025.3609373"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3609373","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3609373","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Jun Zhang","orcid":"https://orcid.org/0000-0002-6025-9909"},"institutions":[{"id":"https://openalex.org/I139024713","display_name":"Guangdong University of Technology","ror":"https://ror.org/04azbjn80","country_code":"CN","type":"education","lineage":["https://openalex.org/I139024713"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jun Zhang","raw_affiliation_strings":["School of Information Engineering, Guangdong University of Technology, Guangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-6025-9909","affiliations":[{"raw_affiliation_string":"School of Information Engineering, Guangdong University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I139024713"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Liu Tao","orcid":"https://orcid.org/0009-0005-7149-775X"},"institutions":[{"id":"https://openalex.org/I139024713","display_name":"Guangdong University of Technology","ror":"https://ror.org/04azbjn80","country_code":"CN","type":"education","lineage":["https://openalex.org/I139024713"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liu Tao","raw_affiliation_strings":["School of Information Engineering, Guangdong University of Technology, Guangzhou, China"],"raw_orcid":"https://orcid.org/0009-0005-7149-775X","affiliations":[{"raw_affiliation_string":"School of Information Engineering, Guangdong University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I139024713"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Xuan Xie","orcid":"https://orcid.org/0009-0001-4034-9667"},"institutions":[{"id":"https://openalex.org/I139024713","display_name":"Guangdong University of Technology","ror":"https://ror.org/04azbjn80","country_code":"CN","type":"education","lineage":["https://openalex.org/I139024713"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuan Xie","raw_affiliation_strings":["School of Information Engineering, Guangdong University of Technology, Guangzhou, China"],"raw_orcid":"https://orcid.org/0009-0001-4034-9667","affiliations":[{"raw_affiliation_string":"School of Information Engineering, Guangdong University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I139024713"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Bei Huang","orcid":"https://orcid.org/0000-0001-9161-2958"},"institutions":[{"id":"https://openalex.org/I4210122543","display_name":"Guangdong Polytechnic Normal University","ror":"https://ror.org/02pcb5m77","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210122543"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bei Huang","raw_affiliation_strings":["School of Electronic and Information, Guangdong Polytechnic Normal University, Guangzhou, China"],"raw_orcid":"https://orcid.org/0000-0001-9161-2958","affiliations":[{"raw_affiliation_string":"School of Electronic and Information, Guangdong Polytechnic Normal University, Guangzhou, China","institution_ids":["https://openalex.org/I4210122543"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Yaya Song","orcid":"https://orcid.org/0009-0006-6520-1614"},"institutions":[{"id":"https://openalex.org/I3125743391","display_name":"China University of Geosciences (Beijing)","ror":"https://ror.org/04q6c7p66","country_code":"CN","type":"education","lineage":["https://openalex.org/I3125743391"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yaya Song","raw_affiliation_strings":["School of Engineering and Technology, China University of Geosciences (Beijing), Beijing, China"],"raw_orcid":"https://orcid.org/0009-0006-6520-1614","affiliations":[{"raw_affiliation_string":"School of Engineering and Technology, China University of Geosciences (Beijing), Beijing, China","institution_ids":["https://openalex.org/I3125743391"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Lihong Dong","orcid":"https://orcid.org/0000-0002-9188-0589"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Lihong Dong","raw_affiliation_strings":["National Key Laboratory for Remanufacturing, Army Academy of Armored Forces, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-9188-0589","affiliations":[{"raw_affiliation_string":"National Key Laboratory for Remanufacturing, Army Academy of Armored Forces, Beijing, China","institution_ids":[]}]},{"author_position":"last","author":{"id":null,"display_name":"Haidou Wang","orcid":"https://orcid.org/0000-0001-5835-3165"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Haidou Wang","raw_affiliation_strings":["National Engineering Research Center for Remanufacturing of Mechanical Products, Army Academy of Armored Forces, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-5835-3165","affiliations":[{"raw_affiliation_string":"National Engineering Research Center for Remanufacturing of Mechanical Products, Army Academy of Armored Forces, Beijing, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I139024713"],"apc_list":null,"apc_paid":null,"fwci":6.5198,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.96719571,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":true,"primary_topic":{"id":"https://openalex.org/T12157","display_name":"Geochemistry and Geologic Mapping","score":0.6836000084877014,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12157","display_name":"Geochemistry and Geologic Mapping","score":0.6836000084877014,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13067","display_name":"Geological Modeling and Analysis","score":0.02810000069439411,"subfield":{"id":"https://openalex.org/subfields/1906","display_name":"Geochemistry and Petrology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10271","display_name":"Seismic Imaging and Inversion Techniques","score":0.017799999564886093,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microstrip","display_name":"Microstrip","score":0.6148999929428101},{"id":"https://openalex.org/keywords/structural-health-monitoring","display_name":"Structural health monitoring","score":0.6093999743461609},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6046000123023987},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.4912000000476837},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.48899999260902405},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.399399995803833},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.39879998564720154}],"concepts":[{"id":"https://openalex.org/C123657345","wikidata":"https://www.wikidata.org/wiki/Q639055","display_name":"Microstrip","level":2,"score":0.6148999929428101},{"id":"https://openalex.org/C2776247918","wikidata":"https://www.wikidata.org/wiki/Q1423713","display_name":"Structural health monitoring","level":2,"score":0.6093999743461609},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6046000123023987},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5403000116348267},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.4912000000476837},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.48899999260902405},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.399399995803833},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.39879998564720154},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.39559999108314514},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3662000000476837},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.35010001063346863},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34209999442100525},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.3407999873161316},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3319000005722046},{"id":"https://openalex.org/C2780586882","wikidata":"https://www.wikidata.org/wiki/Q7520643","display_name":"Simple (philosophy)","level":2,"score":0.30300000309944153},{"id":"https://openalex.org/C105339364","wikidata":"https://www.wikidata.org/wiki/Q2297740","display_name":"Software deployment","level":2,"score":0.2897999882698059},{"id":"https://openalex.org/C24590314","wikidata":"https://www.wikidata.org/wiki/Q336038","display_name":"Wireless sensor network","level":2,"score":0.2849999964237213},{"id":"https://openalex.org/C55000061","wikidata":"https://www.wikidata.org/wiki/Q24894777","display_name":"Current sensor","level":3,"score":0.2702000141143799},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.26829999685287476}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3609373","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3609373","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1473849113","display_name":null,"funder_award_id":"52130509","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5531120652","display_name":null,"funder_award_id":"52205187","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W2043796241","https://openalex.org/W2126583305","https://openalex.org/W2166207675","https://openalex.org/W2581602959","https://openalex.org/W2791002084","https://openalex.org/W2792679127","https://openalex.org/W2897964701","https://openalex.org/W2921988881","https://openalex.org/W2951918249","https://openalex.org/W2967842629","https://openalex.org/W3006846799","https://openalex.org/W3075502890","https://openalex.org/W3189385595","https://openalex.org/W4205759630","https://openalex.org/W4205910540","https://openalex.org/W4206366900","https://openalex.org/W4211130771","https://openalex.org/W4225918187","https://openalex.org/W4309235141","https://openalex.org/W4319878796"],"related_works":[],"abstract_inverted_index":{"Fatigue":[0],"cracks":[1],"and":[2,45,57,108,148,160],"other":[3],"forms":[4],"of":[5,16,22,32,47,59,84,138,151],"damage":[6],"can":[7,114,167],"have":[8],"a":[9,88,170],"significant":[10],"impact":[11],"on":[12],"the":[13,20,42,48,54,82,96,104,109,149,152,161,174],"normal":[14],"operation":[15],"metal":[17],"facilities,":[18],"necessitating":[19],"deployment":[21],"multiple":[23],"sensors":[24,34],"for":[25,64,73,135,173],"monitoring":[26,49,76],"within":[27],"large":[28],"structures.":[29],"The":[30,99,164],"arrangement":[31],"these":[33],"must":[35],"take":[36],"into":[37],"account":[38],"factors":[39],"such":[40],"as":[41,51,53,169],"shape,":[43],"size,":[44],"complexity":[46],"area,":[50],"well":[52],"optimal":[55],"positioning":[56],"spacing":[58],"sensor":[60,140,166,172],"nodes.":[61],"This":[62],"requirement":[63],"comprehensive":[65],"coverage":[66],"while":[67],"minimizing":[68],"costs":[69],"presents":[70],"considerable":[71],"challenges":[72],"structural":[74],"health":[75],"(SHM)":[77],"techniques.":[78],"In":[79],"this":[80,136],"article,":[81],"feasibility":[83],"crack":[85,111,121],"detection":[86,100],"with":[87,145],"simple":[89],"microstrip":[90],"line":[91],"(ML)":[92],"is":[93,102,106,117,141,154],"studied":[94],"in":[95,143],"millimeter-wave":[97],"band.":[98],"sensitivity":[101],"0.283/mm2,":[103],"precision":[105],"13.61%,":[107],"minimum":[110],"depth":[112],"that":[113],"be":[115],"identified":[116],"0.2":[118],"mm":[119],"(when":[120],"width":[122],"<inline-formula":[123],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[124],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[125],"<tex-math":[126],"notation=\"LaTeX\">$\\ge":[127],"1.0$":[128],"</tex-math></inline-formula>":[129],"mm).":[130],"An":[131],"equivalent":[132],"circuit":[133,162],"model":[134,153],"type":[137],"traveling-wave":[139],"established":[142],"conjunction":[144],"field":[146],"analysis,":[147],"accuracy":[150],"verified":[155],"by":[156],"comparing":[157],"full-wave":[158],"simulation":[159],"model.":[163],"proposed":[165],"act":[168],"distributed":[171],"SHM":[175],"applications.":[176]},"counts_by_year":[{"year":2025,"cited_by_count":3}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}