{"id":"https://openalex.org/W4413979072","doi":"https://doi.org/10.1109/tim.2025.3606070","title":"A UAV-Based Measurement System for Aircraft Skin Defect Detection Using a State-Space Model Approach","display_name":"A UAV-Based Measurement System for Aircraft Skin Defect Detection Using a State-Space Model Approach","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4413979072","doi":"https://doi.org/10.1109/tim.2025.3606070"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3606070","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3606070","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Mengyao Feng","orcid":"https://orcid.org/0009-0006-0363-2603"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mengyao Feng","raw_affiliation_strings":["School of Aeronautic Science and Engineering, Beihang University, Beijing, China","School of Aeronautic Science and Engineering, Ph.D. student, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0006-0363-2603","affiliations":[{"raw_affiliation_string":"School of Aeronautic Science and Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Aeronautic Science and Engineering, Ph.D. student, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072547367","display_name":"Yuanming Xu","orcid":"https://orcid.org/0000-0001-6759-1851"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuanming Xu","raw_affiliation_strings":["School of Aeronautic Science and Engineering, Beihang University, Beijing, China","School of Aeronautic Science and Engineering, professor, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-6759-1851","affiliations":[{"raw_affiliation_string":"School of Aeronautic Science and Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Aeronautic Science and Engineering, professor, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081209439","display_name":"Wei Dai","orcid":"https://orcid.org/0000-0002-7376-6977"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Dai","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China","School of Reliability and Systems Engineering, associate professor, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-7376-6977","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Reliability and Systems Engineering, associate professor, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":null,"display_name":"Haibo Luo","orcid":"https://orcid.org/0000-0002-0534-5927"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210137199","display_name":"Aerospace Information Research Institute","ror":"https://ror.org/0419fj215","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210137199"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haibo Luo","raw_affiliation_strings":["Chinese Academy of Sciences, Aerospace Information Research Institute, Beijing, China","Aerospace Information Research Institute, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-0534-5927","affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Aerospace Information Research Institute, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210137199"]},{"raw_affiliation_string":"Aerospace Information Research Institute, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210137199"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6028,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.71982568,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/state-space","display_name":"State space","score":0.5068784356117249},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.4715304970741272},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46569880843162537},{"id":"https://openalex.org/keywords/space","display_name":"Space (punctuation)","score":0.4455288350582123},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.3997274339199066},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3608441948890686},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.1401195228099823},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10761529207229614}],"concepts":[{"id":"https://openalex.org/C72434380","wikidata":"https://www.wikidata.org/wiki/Q230930","display_name":"State space","level":2,"score":0.5068784356117249},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.4715304970741272},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46569880843162537},{"id":"https://openalex.org/C2778572836","wikidata":"https://www.wikidata.org/wiki/Q380933","display_name":"Space (punctuation)","level":2,"score":0.4455288350582123},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.3997274339199066},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3608441948890686},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.1401195228099823},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10761529207229614},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3606070","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3606070","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1976676648","https://openalex.org/W1977167297","https://openalex.org/W2053392822","https://openalex.org/W2287615559","https://openalex.org/W2315881467","https://openalex.org/W2734529165","https://openalex.org/W3199496290","https://openalex.org/W4283381895","https://openalex.org/W4385245566","https://openalex.org/W4386495181","https://openalex.org/W4387757664","https://openalex.org/W4389120326","https://openalex.org/W4390422008","https://openalex.org/W4391096511","https://openalex.org/W4391403290","https://openalex.org/W4392154314","https://openalex.org/W4401163756","https://openalex.org/W4401351832","https://openalex.org/W4402124970","https://openalex.org/W4407388222","https://openalex.org/W4407693577","https://openalex.org/W4408852291","https://openalex.org/W4409366556","https://openalex.org/W4409641304","https://openalex.org/W4410295571","https://openalex.org/W6940922502"],"related_works":["https://openalex.org/W2065198926","https://openalex.org/W2115858155","https://openalex.org/W380379685","https://openalex.org/W3176390680","https://openalex.org/W1997897416","https://openalex.org/W2062838854","https://openalex.org/W2340598883","https://openalex.org/W2053031272","https://openalex.org/W1998030383","https://openalex.org/W2081266435"],"abstract_inverted_index":{"This":[0,151],"paper":[1],"presents":[2],"a":[3,39,46,96,154],"unmanned":[4],"aerial":[5],"vehicle(UAV)-based":[6],"vision":[7],"measurement":[8,165],"system":[9],"for":[10,129,147],"real-time":[11,125],"aircraft":[12,138],"skin":[13],"defect":[14],"detection.":[15],"Existing":[16],"small-target":[17],"detection":[18,42,117],"algorithms":[19],"often":[20],"rely":[21],"on":[22,45,108,134],"transformer":[23],"architectures,":[24],"which,":[25],"despite":[26],"their":[27],"accuracy,":[28,118],"suffer":[29],"from":[30],"high":[31],"computational":[32],"complexity.":[33],"To":[34],"address":[35],"this,":[36],"we":[37],"propose":[38],"novel":[40],"object":[41],"approach":[43],"based":[44],"learned":[47],"neural":[48],"state-space":[49],"model,":[50],"where":[51],"image":[52],"features":[53],"are":[54],"represented":[55],"as":[56],"latent":[57],"dynamic":[58,161],"systems":[59],"governed":[60],"by":[61],"recurrent":[62],"state":[63],"updates":[64],"rather":[65],"than":[66],"attention":[67],"mechanisms.":[68],"Experimental":[69],"results":[70],"show":[71],"performance":[72],"gains":[73],"over":[74],"YOLO(You":[75],"Only":[76],"Look":[77],"Once)v8,":[78],"with":[79],"improvements":[80],"of":[81],"2.1%,":[82],"8.1%,":[83],"and":[84,89,136,144],"1.7%":[85],"in":[86,102],"precision,":[87],"recall,":[88],"mAP50,":[90],"respectively.":[91],"The":[92],"proposed":[93],"model":[94],"processes":[95],"single":[97],"640":[98,100],"\u00d7":[99],"frame":[101],"4.2":[103],"ms":[104],"(\u2248":[105],"238":[106],"FPS)":[107],"an":[109],"RTX":[110],"4090,":[111],"demonstrating":[112],"that,":[113],"while":[114],"primarily":[115],"improving":[116],"its":[119],"linear-time":[120],"complexity":[121],"still":[122],"ensures":[123],"the":[124,140,164],"processing":[126],"capability":[127],"required":[128],"UAV-based":[130],"inspection.":[131],"Field":[132],"tests":[133],"helicopters":[135],"transport":[137],"confirm":[139],"system\u2019s":[141],"robustness,":[142],"repeatability,":[143],"practical":[145],"value":[146],"structural":[148],"health":[149],"monitoring.":[150],"work":[152],"contributes":[153],"lightweight,":[155],"efficient":[156],"vision-based":[157],"instrumentation":[158],"solution":[159],"incorporating":[160],"modeling":[162],"into":[163],"process.":[166]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}