{"id":"https://openalex.org/W4413979855","doi":"https://doi.org/10.1109/tim.2025.3606049","title":"KCDet: Keypoint Clustering Detector for Small Bolt Defect Detection in Power Line Inspection","display_name":"KCDet: Keypoint Clustering Detector for Small Bolt Defect Detection in Power Line Inspection","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4413979855","doi":"https://doi.org/10.1109/tim.2025.3606049"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3606049","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3606049","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100343894","display_name":"Min Liu","orcid":"https://orcid.org/0000-0002-3785-6932"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Min Liu","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-3785-6932","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100356616","display_name":"Zhe Li","orcid":"https://orcid.org/0000-0001-7992-6372"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhe Li","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-7992-6372","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Ran Tao","orcid":"https://orcid.org/0009-0003-9715-1656"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ran Tao","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0003-9715-1656","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064438118","display_name":"Yaocheng Li","orcid":"https://orcid.org/0000-0003-3557-7275"},"institutions":[{"id":"https://openalex.org/I153473198","display_name":"North China Electric Power University","ror":"https://ror.org/04qr5t414","country_code":"CN","type":"education","lineage":["https://openalex.org/I153473198"]},{"id":"https://openalex.org/I4392738113","display_name":"China Electric Power Research Institute","ror":"https://ror.org/05ehpzy81","country_code":null,"type":"facility","lineage":["https://openalex.org/I17442442","https://openalex.org/I4392738113"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yaocheng Li","raw_affiliation_strings":["China Electric Power Research Institute, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-3557-7275","affiliations":[{"raw_affiliation_string":"China Electric Power Research Institute, Beijing, China","institution_ids":["https://openalex.org/I153473198","https://openalex.org/I4392738113"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111959438","display_name":"Gehao Sheng","orcid":"https://orcid.org/0000-0002-9454-5284"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gehao Sheng","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-9454-5284","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100343894"],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.31659829,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12707","display_name":"Vehicle License Plate Recognition","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.991599977016449,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.6966354846954346},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.6428825259208679},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.5002884864807129},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4775565266609192},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3749663829803467},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3727366328239441},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.34714043140411377},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.28777503967285156},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.25338566303253174},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10585132241249084}],"concepts":[{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.6966354846954346},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.6428825259208679},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.5002884864807129},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4775565266609192},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3749663829803467},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3727366328239441},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.34714043140411377},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.28777503967285156},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25338566303253174},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10585132241249084},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3606049","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3606049","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W639708223","https://openalex.org/W2964221239","https://openalex.org/W2990763144","https://openalex.org/W3014641072","https://openalex.org/W3098650625","https://openalex.org/W3167976421","https://openalex.org/W3200736696","https://openalex.org/W4214765827","https://openalex.org/W4312363311","https://openalex.org/W4319069027","https://openalex.org/W4376455439","https://openalex.org/W4380032292","https://openalex.org/W4386736854","https://openalex.org/W4387010802","https://openalex.org/W4388505182","https://openalex.org/W4389818047","https://openalex.org/W4390285053","https://openalex.org/W4390813567","https://openalex.org/W4392450179","https://openalex.org/W4393171289","https://openalex.org/W4393405492","https://openalex.org/W4394805164","https://openalex.org/W4394811179","https://openalex.org/W4401692510","https://openalex.org/W4401806551","https://openalex.org/W4401880027","https://openalex.org/W4402754006","https://openalex.org/W4402822601","https://openalex.org/W4403770406"],"related_works":["https://openalex.org/W2366906938","https://openalex.org/W2349391998","https://openalex.org/W4205655149","https://openalex.org/W4298130764","https://openalex.org/W2000775715","https://openalex.org/W2804364458","https://openalex.org/W2074467390","https://openalex.org/W2795393339","https://openalex.org/W2626393719","https://openalex.org/W4390618967"],"abstract_inverted_index":{"The":[0],"UAV-based":[1],"power":[2,178],"line":[3,180],"intelligent":[4],"inspection":[5],"using":[6],"vision-based":[7],"instrumentation":[8],"and":[9,70,117],"measurement":[10],"plays":[11],"a":[12,54,62,80],"crucial":[13],"role":[14],"in":[15,39,43,177],"ensuring":[16],"the":[17,86,100,114,118,124,149,159,170],"safety":[18],"of":[19,61,102,172],"transmission":[20,179],"lines.":[21],"However,":[22],"small":[23],"object":[24,72],"defects,":[25,29],"such":[26],"as":[27,93],"bolt":[28,77,103,140,174],"are":[30,121],"difficult":[31],"to":[32,35,74,112,127,137,158],"detect":[33],"due":[34],"their":[36],"minimal":[37],"size":[38],"captured":[40],"images,":[41],"resulting":[42],"low":[44],"detection":[45,64,82,176],"rates.":[46],"To":[47],"address":[48],"this":[49,51],"issue,":[50],"paper":[52],"proposes":[53],"novel":[55],"keypoint":[56,63,81],"clustering":[57,68,108],"detector":[58],"(KCDet),":[59],"consisting":[60],"network,":[65],"an":[66,71,106,132],"efficient":[67,107],"method,":[69],"detector,":[73],"accurately":[75],"identify":[76,139],"defects.":[78],"Firstly,":[79],"network":[83],"based":[84],"on":[85],"high-resolution":[87,129],"heatmap":[88],"is":[89,110,135],"proposed,":[90],"treating":[91],"bolts":[92],"points":[94],"for":[95],"localization,":[96],"which":[97],"significantly":[98,168],"improves":[99],"accuracy":[101,153,171],"localization.":[104],"Secondly,":[105],"method":[109],"introduced":[111],"cluster":[113,119],"localized":[115],"bolts,":[116],"regions":[120],"cropped":[122],"from":[123,142],"original":[125],"image":[126],"obtain":[128],"sub-images.":[130,144],"Finally,":[131],"improved":[133],"YOLOv11":[134],"presented":[136],"precisely":[138],"defects":[141],"these":[143],"Experimental":[145],"results":[146],"demonstrate":[147],"that":[148],"proposed":[150],"KCDet":[151],"increases":[152],"by":[154],"over":[155],"20%":[156],"compared":[157],"single-model-based":[160],"YOLOv11s":[161],"algorithm":[162],"while":[163],"maintaining":[164],"high":[165],"inference":[166],"speed,":[167],"enhancing":[169],"small-sized":[173],"defect":[175],"inspections.":[181]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}