{"id":"https://openalex.org/W4413861901","doi":"https://doi.org/10.1109/tim.2025.3604132","title":"Induced Voltage Noise Compensation Method Based on CWW + CNN-BiLSTM-Attention","display_name":"Induced Voltage Noise Compensation Method Based on CWW + CNN-BiLSTM-Attention","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4413861901","doi":"https://doi.org/10.1109/tim.2025.3604132"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3604132","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3604132","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065852387","display_name":"Qing Yan","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qing Yan","raw_affiliation_strings":["Chinese Academy of Sciences, Hefei Institutes of Physical Science, Hefei, China","Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-2295-7973","affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Hefei Institutes of Physical Science, Hefei, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"raw_affiliation_string":"Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072409696","display_name":"Yezheng Xiao","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yezheng Xiao","raw_affiliation_strings":["Chinese Academy of Sciences, Hefei Institutes of Physical Science, Hefei, China","Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China"],"raw_orcid":"https://orcid.org/0009-0009-8643-4291","affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Hefei Institutes of Physical Science, Hefei, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"raw_affiliation_string":"Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001990555","display_name":"Qicai Ni","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qicai Ni","raw_affiliation_strings":["Chinese Academy of Sciences, Hefei Institutes of Physical Science, Hefei, China","Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China"],"raw_orcid":"https://orcid.org/0009-0005-6581-1423","affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Hefei Institutes of Physical Science, Hefei, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"raw_affiliation_string":"Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074724714","display_name":"Longgui Zheng","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Longgui Zheng","raw_affiliation_strings":["Chinese Academy of Sciences, Hefei Institutes of Physical Science, Hefei, China","Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China"],"raw_orcid":"https://orcid.org/0009-0007-5084-3224","affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Hefei Institutes of Physical Science, Hefei, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"raw_affiliation_string":"Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100348930","display_name":"Teng Wang","orcid":"https://orcid.org/0000-0001-8171-8708"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Teng Wang","raw_affiliation_strings":["Chinese Academy of Sciences, Hefei Institutes of Physical Science, Hefei, China","Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0001-8171-8708","affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Hefei Institutes of Physical Science, Hefei, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"raw_affiliation_string":"Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007156427","display_name":"Xinxin Zhu","orcid":"https://orcid.org/0000-0002-5070-5194"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinxin Zhu","raw_affiliation_strings":["Chinese Academy of Sciences, Hefei Institutes of Physical Science, Hefei, China","Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-5070-5194","affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Hefei Institutes of Physical Science, Hefei, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"raw_affiliation_string":"Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Yu Chen","orcid":"https://orcid.org/0009-0005-6789-6133"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Chen","raw_affiliation_strings":["Chinese Academy of Sciences, Hefei Institutes of Physical Science, Hefei, China","Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China"],"raw_orcid":"https://orcid.org/0009-0005-6789-6133","affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Hefei Institutes of Physical Science, Hefei, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"raw_affiliation_string":"Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091197346","display_name":"Yanlan Hu","orcid":"https://orcid.org/0000-0002-8052-3340"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanlan Hu","raw_affiliation_strings":["Chinese Academy of Sciences, Hefei Institutes of Physical Science, Hefei, China","Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-8052-3340","affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Hefei Institutes of Physical Science, Hefei, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"raw_affiliation_string":"Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3193,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.54772577,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12451","display_name":"Smart Grid and Power Systems","score":0.809499979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12451","display_name":"Smart Grid and Power Systems","score":0.809499979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10320","display_name":"Neural Networks and Applications","score":0.7813000082969666,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.7793999910354614,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6022395491600037},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.572588324546814},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5511615872383118},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5127938389778137},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.44299817085266113},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4065110683441162},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39448249340057373},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3467384874820709},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24725255370140076},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2407805323600769},{"id":"https://openalex.org/keywords/psychology","display_name":"Psychology","score":0.08317092061042786}],"concepts":[{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6022395491600037},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.572588324546814},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5511615872383118},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5127938389778137},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.44299817085266113},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4065110683441162},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39448249340057373},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3467384874820709},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24725255370140076},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2407805323600769},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.08317092061042786},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3604132","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3604132","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.49000000953674316,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W2014511770","https://openalex.org/W2036370340","https://openalex.org/W2064675550","https://openalex.org/W2082323829","https://openalex.org/W2093866254","https://openalex.org/W2098021760","https://openalex.org/W2107878631","https://openalex.org/W2112796928","https://openalex.org/W2141620986","https://openalex.org/W2164935606","https://openalex.org/W2508457857","https://openalex.org/W2584731199","https://openalex.org/W2598525681","https://openalex.org/W2777072123","https://openalex.org/W2777417212","https://openalex.org/W2938525079","https://openalex.org/W2945443627","https://openalex.org/W2995878215","https://openalex.org/W3007075806","https://openalex.org/W3010398094","https://openalex.org/W3154486561","https://openalex.org/W3161619642","https://openalex.org/W3212604410","https://openalex.org/W4200475431","https://openalex.org/W4366828973","https://openalex.org/W4379931612","https://openalex.org/W4385245566","https://openalex.org/W4386101796","https://openalex.org/W4386918877","https://openalex.org/W4390913656","https://openalex.org/W4392826298","https://openalex.org/W4401974455","https://openalex.org/W4402465564"],"related_works":["https://openalex.org/W2379084545","https://openalex.org/W2365687337","https://openalex.org/W2358180351","https://openalex.org/W2392368077","https://openalex.org/W2365082216","https://openalex.org/W2388018705","https://openalex.org/W2362703586","https://openalex.org/W2389641749","https://openalex.org/W2386832005","https://openalex.org/W2356919096"],"abstract_inverted_index":{"Induced":[0],"voltage":[1,10,29,43,75,153],"noise":[2,30,40,51,76,110],"is":[3],"a":[4,36,49,63,93,116],"significant":[5],"source":[6],"of":[7,24,151],"interference":[8],"in":[9,42],"detection,":[11],"seriously":[12],"affecting":[13],"measurement":[14],"accuracy":[15],"and":[16],"system":[17],"stability.":[18],"In":[19],"the":[20,25,57,73,89,101,108,128,138,149],"complex":[21],"electromagnetic":[22],"environment":[23],"Tokamak":[26,132],"system,":[27],"induced":[28,74],"can":[31],"exceed":[32],"500":[33,79],"V,":[34],"posing":[35],"great":[37],"challenge":[38],"to":[39,55,81,111],"suppression":[41],"detection":[44,154],"signals.":[45],"This":[46],"paper":[47],"presents":[48],"two-stage":[50],"compensation":[52,69,103,144],"approach":[53],"designed":[54],"address":[56],"problem.":[58],"The":[59,119],"first":[60],"stage":[61,91],"utilizes":[62],"hardware-based":[64],"Co-wound":[65],"Wire":[66],"(CWW)":[67],"primary":[68],"method,":[70],"effectively":[71],"reducing":[72],"from":[77],"over":[78,115],"V":[80],"below":[82,112],"10":[83],"V.":[84],"Building":[85],"on":[86,98,127],"this":[87],"foundation,":[88],"second":[90],"introduces":[92],"deep":[94],"learning":[95],"model":[96],"based":[97],"CNN-BiLSTM-Attention":[99],"as":[100],"secondary":[102],"module,":[104],"which":[105],"further":[106],"reduce":[107],"residual":[109],"100":[113],"mV":[114],"1-second":[117],"window.":[118],"proposed":[120],"method":[121,139],"was":[122],"validated":[123],"through":[124],"real-time":[125],"deployment":[126],"Experimental":[129,134],"Advanced":[130],"Superconducting":[131],"(EAST).":[133],"results":[135],"demonstrate":[136],"that":[137],"not":[140],"only":[141],"achieves":[142],"excellent":[143],"effect":[145],"but":[146],"also":[147],"preserves":[148],"integrity":[150],"critical":[152],"signals":[155],"throughout":[156],"operation.":[157]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}