{"id":"https://openalex.org/W4412939958","doi":"https://doi.org/10.1109/tim.2025.3595257","title":"A Technique to Improve Accuracy of S-Parameter Measurements of Coaxial Connectorized Devices at Cryogenic Temperatures","display_name":"A Technique to Improve Accuracy of S-Parameter Measurements of Coaxial Connectorized Devices at Cryogenic Temperatures","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4412939958","doi":"https://doi.org/10.1109/tim.2025.3595257"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3595257","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2025.3595257","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/tim.2025.3595257","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010167563","display_name":"Manoj Stanley","orcid":"https://orcid.org/0000-0003-2276-9323"},"institutions":[{"id":"https://openalex.org/I134421475","display_name":"National Physical Laboratory","ror":"https://ror.org/015w2mp89","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Manoj Stanley","raw_affiliation_strings":["National Physical Laboratory, Teddington, U.K","National Physical Laboratory, Teddington, United Kingdom"],"affiliations":[{"raw_affiliation_string":"National Physical Laboratory, Teddington, U.K","institution_ids":["https://openalex.org/I134421475"]},{"raw_affiliation_string":"National Physical Laboratory, Teddington, United Kingdom","institution_ids":["https://openalex.org/I134421475"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053502057","display_name":"Murat Celep","orcid":"https://orcid.org/0000-0001-7754-4856"},"institutions":[{"id":"https://openalex.org/I134421475","display_name":"National Physical Laboratory","ror":"https://ror.org/015w2mp89","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Murat Celep","raw_affiliation_strings":["National Physical Laboratory, Teddington, U.K","National Physical Laboratory, Teddington, United Kingdom"],"affiliations":[{"raw_affiliation_string":"National Physical Laboratory, Teddington, U.K","institution_ids":["https://openalex.org/I134421475"]},{"raw_affiliation_string":"National Physical Laboratory, Teddington, United Kingdom","institution_ids":["https://openalex.org/I134421475"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001128206","display_name":"Asem Elarabi","orcid":"https://orcid.org/0000-0001-7541-3756"},"institutions":[{"id":"https://openalex.org/I134421475","display_name":"National Physical Laboratory","ror":"https://ror.org/015w2mp89","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Asem Elarabi","raw_affiliation_strings":["National Physical Laboratory, Teddington, U.K","National Physical Laboratory, Teddington, United Kingdom"],"affiliations":[{"raw_affiliation_string":"National Physical Laboratory, Teddington, U.K","institution_ids":["https://openalex.org/I134421475"]},{"raw_affiliation_string":"National Physical Laboratory, Teddington, United Kingdom","institution_ids":["https://openalex.org/I134421475"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063451228","display_name":"Martin Salter","orcid":"https://orcid.org/0000-0002-1185-1076"},"institutions":[{"id":"https://openalex.org/I134421475","display_name":"National Physical Laboratory","ror":"https://ror.org/015w2mp89","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Martin Salter","raw_affiliation_strings":["National Physical Laboratory, Teddington, U.K","National Physical Laboratory, Teddington, United Kingdom"],"affiliations":[{"raw_affiliation_string":"National Physical Laboratory, Teddington, U.K","institution_ids":["https://openalex.org/I134421475"]},{"raw_affiliation_string":"National Physical Laboratory, Teddington, United Kingdom","institution_ids":["https://openalex.org/I134421475"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112855873","display_name":"Dilbagh Singh","orcid":"https://orcid.org/0000-0003-2991-0502"},"institutions":[{"id":"https://openalex.org/I134421475","display_name":"National Physical Laboratory","ror":"https://ror.org/015w2mp89","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Dilbagh Singh","raw_affiliation_strings":["National Physical Laboratory, Teddington, U.K","National Physical Laboratory, Teddington, United Kingdom"],"affiliations":[{"raw_affiliation_string":"National Physical Laboratory, Teddington, U.K","institution_ids":["https://openalex.org/I134421475"]},{"raw_affiliation_string":"National Physical Laboratory, Teddington, United Kingdom","institution_ids":["https://openalex.org/I134421475"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088430117","display_name":"James Skinner","orcid":"https://orcid.org/0000-0001-9753-4225"},"institutions":[{"id":"https://openalex.org/I134421475","display_name":"National Physical Laboratory","ror":"https://ror.org/015w2mp89","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"James Skinner","raw_affiliation_strings":["National Physical Laboratory, Teddington, U.K","National Physical Laboratory, Teddington, United Kingdom"],"affiliations":[{"raw_affiliation_string":"National Physical Laboratory, Teddington, U.K","institution_ids":["https://openalex.org/I134421475"]},{"raw_affiliation_string":"National Physical Laboratory, Teddington, United Kingdom","institution_ids":["https://openalex.org/I134421475"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110107676","display_name":"Shigemitsu Shin","orcid":"https://orcid.org/0000-0002-2616-8026"},"institutions":[{"id":"https://openalex.org/I28777354","display_name":"Sejong University","ror":"https://ror.org/00aft1q37","country_code":"KR","type":"education","lineage":["https://openalex.org/I28777354"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sang-Hee Shin","raw_affiliation_strings":["Department of Artificial Intelligence and Information Technology, Sejong University, Gwangjin, Seoul, South Korea","Sejong University, Gwangjin, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Artificial Intelligence and Information Technology, Sejong University, Gwangjin, Seoul, South Korea","institution_ids":["https://openalex.org/I28777354"]},{"raw_affiliation_string":"Sejong University, Gwangjin, Seoul, South Korea","institution_ids":["https://openalex.org/I28777354"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017117407","display_name":"Nick Ridler","orcid":"https://orcid.org/0000-0002-1462-2914"},"institutions":[{"id":"https://openalex.org/I134421475","display_name":"National Physical Laboratory","ror":"https://ror.org/015w2mp89","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Nick M. Ridler","raw_affiliation_strings":["National Physical Laboratory, Teddington, U.K","National Physical Laboratory, Teddington, United Kingdom"],"affiliations":[{"raw_affiliation_string":"National Physical Laboratory, Teddington, U.K","institution_ids":["https://openalex.org/I134421475"]},{"raw_affiliation_string":"National Physical Laboratory, Teddington, United Kingdom","institution_ids":["https://openalex.org/I134421475"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5010167563"],"corresponding_institution_ids":["https://openalex.org/I134421475"],"apc_list":null,"apc_paid":null,"fwci":0.7467,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.75847138,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.9502000212669373,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.9502000212669373,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.9397000074386597,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/coaxial","display_name":"Coaxial","score":0.6811054944992065},{"id":"https://openalex.org/keywords/cryogenics","display_name":"Cryogenics","score":0.6387701034545898},{"id":"https://openalex.org/keywords/cryogenic-temperature","display_name":"Cryogenic temperature","score":0.49211496114730835},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4678184688091278},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.45793581008911133},{"id":"https://openalex.org/keywords/nuclear-engineering","display_name":"Nuclear engineering","score":0.3555721044540405},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.34847646951675415},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3481246829032898},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.33777564764022827},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32955923676490784},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3238905370235443},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.10999897122383118},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.09027579426765442}],"concepts":[{"id":"https://openalex.org/C51221625","wikidata":"https://www.wikidata.org/wiki/Q1751466","display_name":"Coaxial","level":2,"score":0.6811054944992065},{"id":"https://openalex.org/C179725390","wikidata":"https://www.wikidata.org/wiki/Q192116","display_name":"Cryogenics","level":2,"score":0.6387701034545898},{"id":"https://openalex.org/C2985130431","wikidata":"https://www.wikidata.org/wiki/Q192116","display_name":"Cryogenic temperature","level":2,"score":0.49211496114730835},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4678184688091278},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.45793581008911133},{"id":"https://openalex.org/C116915560","wikidata":"https://www.wikidata.org/wiki/Q83504","display_name":"Nuclear engineering","level":1,"score":0.3555721044540405},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.34847646951675415},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3481246829032898},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.33777564764022827},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32955923676490784},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3238905370235443},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.10999897122383118},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.09027579426765442}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3595257","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2025.3595257","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tim.2025.3595257","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2025.3595257","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.8100000023841858,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W2062174952","https://openalex.org/W2092761910","https://openalex.org/W2141707986","https://openalex.org/W2147240558","https://openalex.org/W2808363667","https://openalex.org/W3096567033","https://openalex.org/W3172343717","https://openalex.org/W4200632065","https://openalex.org/W4226285462","https://openalex.org/W4283078033","https://openalex.org/W4385337857","https://openalex.org/W4386737426","https://openalex.org/W4387717554","https://openalex.org/W4388103869","https://openalex.org/W4392114225","https://openalex.org/W4395462901","https://openalex.org/W4402040302"],"related_works":["https://openalex.org/W4244225764","https://openalex.org/W2080652734","https://openalex.org/W2017432886","https://openalex.org/W1970616762","https://openalex.org/W1973617994","https://openalex.org/W2160424718","https://openalex.org/W2164592883","https://openalex.org/W4211113447","https://openalex.org/W4385363489","https://openalex.org/W1978775516"],"abstract_inverted_index":{"Recent":[0],"developments":[1],"in":[2,22,81,100,137],"microwave-based":[3],"quantum":[4],"computing":[5],"technologies":[6],"have":[7,57],"motivated":[8],"the":[9,12,104,122],"need":[10],"for":[11,27,134],"development":[13],"of":[14,63,107,124,128,160],"new":[15,115],"and":[16,26,74,79,152],"improved":[17],"cryogenic":[18,39,55,64,125,140,153],"microwave":[19],"devices":[20,75,131,162],"packaged":[21],"coaxial":[23,129,161],"connectorized":[24,130],"technology,":[25],"their":[28],"performance":[29],"to":[30,69,76,93,98,119,165],"be":[31],"accurately":[32],"characterized":[33],"through":[34,157],"S-parameter":[35,47,126,158],"measurements":[36,127,159],"made":[37],"at":[38,54,147],"operating":[40],"temperatures.":[41],"To":[42],"facilitate":[43],"such":[44,108,138],"accurate":[45],"characterization,":[46],"measurement":[48,80,90,105,109],"systems":[49],"utilizing":[50],"in-situ":[51],"calibration":[52,72,78,141],"techniques":[53],"temperatures":[56],"been":[58],"developed.":[59],"This":[60],"required":[61],"use":[62],"RF":[65],"switches":[66],"inside":[67],"cryostats":[68],"select":[70],"between":[71],"standards":[73],"perform":[77],"a":[82,114],"single":[83],"cooling":[84],"cycle.":[85],"However,":[86],"this":[87,112],"caused":[88],"significant":[89],"errors":[91],"due":[92,97],"non-identical":[94],"signal":[95],"paths":[96,102],"differences":[99],"switch":[101],"limiting":[103],"accuracy":[106,123],"systems.":[110],"In":[111],"work,":[113],"technique":[116,144],"is":[117,145],"proposed":[118],"significantly":[120],"improve":[121],"by":[132],"accounting":[133],"non-ideal":[135],"effects":[136],"switch-based":[139],"units.":[142],"The":[143],"demonstrated":[146],"room":[148],"temperature":[149,154],"(296":[150],"K)":[151,156],"(1.5":[155],"with":[163],"up":[164],"two":[166],"ports.":[167]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}