{"id":"https://openalex.org/W4412722226","doi":"https://doi.org/10.1109/tim.2025.3593570","title":"Multistage Fault State Evolution Analysis and Modeling of Distribution Cables Driven by Signal Analysis and Insulation Degradation Characteristics","display_name":"Multistage Fault State Evolution Analysis and Modeling of Distribution Cables Driven by Signal Analysis and Insulation Degradation Characteristics","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4412722226","doi":"https://doi.org/10.1109/tim.2025.3593570"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3593570","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3593570","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Xinyi Wang","orcid":"https://orcid.org/0009-0009-6445-5999"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinyi Wang","raw_affiliation_strings":["High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0009-0009-6445-5999","affiliations":[{"raw_affiliation_string":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078742258","display_name":"Guangya Zhu","orcid":"https://orcid.org/0000-0003-3790-4014"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guangya Zhu","raw_affiliation_strings":["High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","College of Electrical Engineering, High Voltage Laboratory, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-3790-4014","affiliations":[{"raw_affiliation_string":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"College of Electrical Engineering, High Voltage Laboratory, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077489891","display_name":"Zhaogui Liu","orcid":"https://orcid.org/0000-0002-8846-8059"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhaogui Liu","raw_affiliation_strings":["High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","College of Electrical Engineering, High Voltage Laboratory, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-8846-8059","affiliations":[{"raw_affiliation_string":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"College of Electrical Engineering, High Voltage Laboratory, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Yan Shao","orcid":"https://orcid.org/0009-0003-1369-9463"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yan Shao","raw_affiliation_strings":["the School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","Southwest Jiaotong University, Chengdu, China"],"raw_orcid":"https://orcid.org/0009-0003-1369-9463","affiliations":[{"raw_affiliation_string":"the School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]},{"raw_affiliation_string":"Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037003531","display_name":"Kai Zhou","orcid":"https://orcid.org/0000-0002-8109-6408"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kai Zhou","raw_affiliation_strings":["High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","College of Electrical Engineering, High Voltage Laboratory, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-8109-6408","affiliations":[{"raw_affiliation_string":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"College of Electrical Engineering, High Voltage Laboratory, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033519367","display_name":"Pengfei Meng","orcid":"https://orcid.org/0000-0002-8279-3491"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pengfei Meng","raw_affiliation_strings":["High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","College of Electrical Engineering, High Voltage Laboratory, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-8279-3491","affiliations":[{"raw_affiliation_string":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"College of Electrical Engineering, High Voltage Laboratory, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"last","author":{"id":null,"display_name":"Changjiu Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changjiu Zhang","raw_affiliation_strings":["High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","College of Electrical Engineering, High Voltage Laboratory, Sichuan University, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"High Voltage Laboratory, College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"College of Electrical Engineering, High Voltage Laboratory, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10903727,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.7308368682861328},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5150494575500488},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.45839178562164307},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.41685670614242554},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.4115196168422699},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3855743706226349},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.31987738609313965},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2809235453605652},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.13105368614196777},{"id":"https://openalex.org/keywords/seismology","display_name":"Seismology","score":0.08695480227470398}],"concepts":[{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.7308368682861328},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5150494575500488},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.45839178562164307},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.41685670614242554},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.4115196168422699},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3855743706226349},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.31987738609313965},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2809235453605652},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.13105368614196777},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.08695480227470398},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3593570","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3593570","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","display_name":"Climate action","score":0.5600000023841858}],"awards":[{"id":"https://openalex.org/G2461668777","display_name":null,"funder_award_id":"5400-202318550A-3-2-ZN","funder_id":"https://openalex.org/F4320326707","funder_display_name":"State Grid Corporation of China"},{"id":"https://openalex.org/G4077621543","display_name":null,"funder_award_id":"2023NSFSC0451","funder_id":"https://openalex.org/F4320329861","funder_display_name":"Natural Science Foundation of Sichuan Province"},{"id":"https://openalex.org/G4760468370","display_name":null,"funder_award_id":"2023NSFSC0820","funder_id":"https://openalex.org/F4320329861","funder_display_name":"Natural Science Foundation of Sichuan Province"},{"id":"https://openalex.org/G6477918544","display_name":null,"funder_award_id":"52107160","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8883337509","display_name":null,"funder_award_id":"62371319","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320326707","display_name":"State Grid Corporation of China","ror":"https://ror.org/05twwhs70"},{"id":"https://openalex.org/F4320329861","display_name":"Natural Science Foundation of Sichuan Province","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1971829806","https://openalex.org/W2080835449","https://openalex.org/W2095736798","https://openalex.org/W2096623941","https://openalex.org/W2099170502","https://openalex.org/W2127804164","https://openalex.org/W2137221525","https://openalex.org/W2155077058","https://openalex.org/W2503284723","https://openalex.org/W2531562075","https://openalex.org/W2805612577","https://openalex.org/W2945351333","https://openalex.org/W2982621072","https://openalex.org/W3177078637","https://openalex.org/W3192915906","https://openalex.org/W4220695269","https://openalex.org/W4225525084","https://openalex.org/W4298130362","https://openalex.org/W4307890369","https://openalex.org/W4312904590","https://openalex.org/W4389104711","https://openalex.org/W4392411442","https://openalex.org/W4392902464","https://openalex.org/W4392910004","https://openalex.org/W4394624932","https://openalex.org/W4399728509","https://openalex.org/W4402629433","https://openalex.org/W4402816796"],"related_works":["https://openalex.org/W2534928293","https://openalex.org/W2150099345","https://openalex.org/W2160318243","https://openalex.org/W1490077415","https://openalex.org/W3004580327","https://openalex.org/W2182874356","https://openalex.org/W3034806817","https://openalex.org/W2375757266","https://openalex.org/W4404095905","https://openalex.org/W2089888251"],"abstract_inverted_index":{"Early":[0],"detection":[1],"of":[2,22,33,68,116,130],"incipient":[3],"cable":[4,48,117],"faults":[5],"is":[6,80,108],"critical":[7],"for":[8],"preventing":[9],"catastrophic":[10],"power":[11],"grid":[12],"failures.":[13],"While":[14],"existing":[15],"diagnostic":[16],"methods":[17],"rely":[18],"on":[19,37,102],"the":[20,31,105,112,128,131],"optimization":[21],"classical":[23],"arc":[24,38],"models,":[25],"their":[26],"accuracy":[27,129],"remains":[28],"constrained":[29],"by":[30],"impaction":[32],"solid":[34],"insulation":[35,72],"degradation":[36],"characteristics.":[39],"To":[40],"resolve":[41],"this":[42],"limitation,":[43],"some":[44],"10":[45],"kV":[46],"XLPE":[47],"samples":[49],"with":[50,60,89,123],"engineered":[51],"defects":[52],"were":[53],"performed":[54],"in":[55],"lab.":[56],"Electrical":[57],"signatures":[58],"synchronized":[59],"physicochemical":[61],"evolution":[62],"are":[63,83,121],"captured.":[64],"Through":[65],"coupling":[66],"analysis":[67],"discharge":[69],"patterns":[70],"and":[71,93],"pyrolysis":[73],"processes,":[74],"a":[75],"tri-phase":[76],"fault":[77],"progression":[78],"model":[79,107],"established,":[81],"which":[82],"high-frequency":[84],"intermittent":[85],"discharge,":[86],"semi-stable":[87],"arcing":[88,95],"carbonization":[90],"path":[91],"formation,":[92],"permanent":[94],"through":[96],"fully":[97],"carbonized":[98],"channels.":[99],"Finally,":[100],"based":[101],"PSCAD":[103],"simulation,":[104],"proposed":[106,132],"utilized":[109],"to":[110,126],"simulate":[111],"disturbance":[113],"signal":[114],"characteristics":[115],"faults.":[118],"Waveform":[119],"results":[120],"compared":[122],"field-recorded":[124],"waveforms":[125],"verify":[127],"model.":[133]},"counts_by_year":[],"updated_date":"2026-07-31T08:31:51.225901","created_date":"2025-10-10T00:00:00"}