{"id":"https://openalex.org/W4412722620","doi":"https://doi.org/10.1109/tim.2025.3588926","title":"Achieving High-Fold Optical Subdivision of a Blazed Grating Interferometer Through Near-Littrow Incidence","display_name":"Achieving High-Fold Optical Subdivision of a Blazed Grating Interferometer Through Near-Littrow Incidence","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4412722620","doi":"https://doi.org/10.1109/tim.2025.3588926"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3588926","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3588926","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://pure.hud.ac.uk/ws/files/115086135/AAM.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101789228","display_name":"Zhenghui Zhang","orcid":"https://orcid.org/0009-0007-9355-9573"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhenghui Zhang","raw_affiliation_strings":["State Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong University, Xi’an, China","State Key Laboratory for Manufacturing System Engineering, Xi\u2019an Jiaotong University, Xi’an, China"],"raw_orcid":"https://orcid.org/0009-0007-9355-9573","affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing System Engineering, Xi\u2019an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008679120","display_name":"Guobo Zhao","orcid":"https://orcid.org/0000-0001-8532-831X"},"institutions":[{"id":"https://openalex.org/I4210144143","display_name":"Inspur (China)","ror":"https://ror.org/0474p4r72","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210144143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guobo Zhao","raw_affiliation_strings":["Inspur Genersoft Company Ltd., Jinan, China","Inspur Genersoft Co., Ltd, Jinan, China"],"raw_orcid":"https://orcid.org/0000-0001-8532-831X","affiliations":[{"raw_affiliation_string":"Inspur Genersoft Company Ltd., Jinan, China","institution_ids":["https://openalex.org/I4210144143"]},{"raw_affiliation_string":"Inspur Genersoft Co., Ltd, Jinan, China","institution_ids":["https://openalex.org/I4210144143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101916993","display_name":"Yaowen Ban","orcid":"https://orcid.org/0000-0003-4645-8415"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yaowen Ban","raw_affiliation_strings":["State Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong University, Xi’an, China","State Key Laboratory for Manufacturing System Engineering, Xi\u2019an Jiaotong University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0003-4645-8415","affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing System Engineering, Xi\u2019an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000879026","display_name":"Xunhan Wang","orcid":"https://orcid.org/0009-0005-9635-6654"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xunhan Wang","raw_affiliation_strings":["State Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong University, Xi’an, China","State Key Laboratory for Manufacturing System Engineering, Xi\u2019an Jiaotong University, Xi’an, China"],"raw_orcid":"https://orcid.org/0009-0005-9635-6654","affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing System Engineering, Xi\u2019an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104265240","display_name":"Biao Lei","orcid":null},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Biao Lei","raw_affiliation_strings":["State Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong University, Xi’an, China","State Key Laboratory for Manufacturing System Engineering, Xi\u2019an Jiaotong University, Xi’an, China"],"raw_orcid":"https://orcid.org/0009-0004-5873-3298","affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing System Engineering, Xi\u2019an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100738116","display_name":"Lanlan Wang","orcid":"https://orcid.org/0000-0001-6730-5237"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lanlan Wang","raw_affiliation_strings":["State Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong University, Xi’an, China","State Key Laboratory for Manufacturing System Engineering, Xi\u2019an Jiaotong University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0001-6730-5237","affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing System Engineering, Xi\u2019an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103124543","display_name":"Bangdao Chen","orcid":"https://orcid.org/0000-0001-9102-1760"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bangdao Chen","raw_affiliation_strings":["State Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong University, Xi’an, China","State Key Laboratory for Manufacturing System Engineering, Xi\u2019an Jiaotong University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0001-9102-1760","affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing System Engineering, Xi\u2019an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101697250","display_name":"Feng Gao","orcid":"https://orcid.org/0000-0003-3835-6929"},"institutions":[{"id":"https://openalex.org/I1299528221","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842","country_code":"GB","type":"government","lineage":["https://openalex.org/I1299528221","https://openalex.org/I4210087105"]},{"id":"https://openalex.org/I133837150","display_name":"University of Huddersfield","ror":"https://ror.org/05t1h8f27","country_code":"GB","type":"education","lineage":["https://openalex.org/I133837150"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Feng Gao","raw_affiliation_strings":["EPSRC Future Metrology Hub, University of Huddersfield, Huddersfield, U.K","EPSRC Future Metrology Hub, University of Huddersfield, Huddersfield, UK"],"raw_orcid":"https://orcid.org/0000-0003-3835-6929","affiliations":[{"raw_affiliation_string":"EPSRC Future Metrology Hub, University of Huddersfield, Huddersfield, U.K","institution_ids":["https://openalex.org/I1299528221","https://openalex.org/I133837150"]},{"raw_affiliation_string":"EPSRC Future Metrology Hub, University of Huddersfield, Huddersfield, UK","institution_ids":["https://openalex.org/I1299528221","https://openalex.org/I133837150"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052852912","display_name":"Xiangqian Jiang","orcid":"https://orcid.org/0000-0001-7949-8507"},"institutions":[{"id":"https://openalex.org/I1299528221","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842","country_code":"GB","type":"government","lineage":["https://openalex.org/I1299528221","https://openalex.org/I4210087105"]},{"id":"https://openalex.org/I133837150","display_name":"University of Huddersfield","ror":"https://ror.org/05t1h8f27","country_code":"GB","type":"education","lineage":["https://openalex.org/I133837150"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Xiangqian Jiang","raw_affiliation_strings":["EPSRC Future Metrology Hub, University of Huddersfield, Huddersfield, U.K","EPSRC Future Metrology Hub, University of Huddersfield, Huddersfield, UK"],"raw_orcid":"https://orcid.org/0000-0001-7949-8507","affiliations":[{"raw_affiliation_string":"EPSRC Future Metrology Hub, University of Huddersfield, Huddersfield, U.K","institution_ids":["https://openalex.org/I1299528221","https://openalex.org/I133837150"]},{"raw_affiliation_string":"EPSRC Future Metrology Hub, University of Huddersfield, Huddersfield, UK","institution_ids":["https://openalex.org/I1299528221","https://openalex.org/I133837150"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075706781","display_name":"Hongzhong Liu","orcid":"https://orcid.org/0000-0001-6875-3509"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongzhong Liu","raw_affiliation_strings":["State Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong University, Xi’an, China","State Key Laboratory for Manufacturing System Engineering, Xi\u2019an Jiaotong University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0001-6875-3509","affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing System Engineering, Xi\u2019an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":10,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.3962,"has_fulltext":true,"cited_by_count":5,"citation_normalized_percentile":{"value":0.88554445,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interferometry","display_name":"Interferometry","score":0.5793671607971191},{"id":"https://openalex.org/keywords/diffraction-grating","display_name":"Diffraction grating","score":0.5150001049041748},{"id":"https://openalex.org/keywords/grating","display_name":"Grating","score":0.5074321627616882},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4915336072444916},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.44148463010787964},{"id":"https://openalex.org/keywords/subdivision","display_name":"Subdivision","score":0.41159120202064514},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.33416810631752014},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2550583779811859},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14857926964759827}],"concepts":[{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.5793671607971191},{"id":"https://openalex.org/C126753812","wikidata":"https://www.wikidata.org/wiki/Q653294","display_name":"Diffraction grating","level":3,"score":0.5150001049041748},{"id":"https://openalex.org/C2777813233","wikidata":"https://www.wikidata.org/wiki/Q1527816","display_name":"Grating","level":2,"score":0.5074321627616882},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4915336072444916},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.44148463010787964},{"id":"https://openalex.org/C143392562","wikidata":"https://www.wikidata.org/wiki/Q449111","display_name":"Subdivision","level":2,"score":0.41159120202064514},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.33416810631752014},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2550583779811859},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14857926964759827},{"id":"https://openalex.org/C147176958","wikidata":"https://www.wikidata.org/wiki/Q77590","display_name":"Civil engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2025.3588926","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3588926","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:pure.atira.dk:publications/40cb23d1-cdc2-4e9e-a291-b4a9ad4350ec","is_oa":true,"landing_page_url":"https://pure.hud.ac.uk/en/publications/40cb23d1-cdc2-4e9e-a291-b4a9ad4350ec","pdf_url":"https://pure.hud.ac.uk/ws/files/115086135/AAM.pdf","source":{"id":"https://openalex.org/S4306402508","display_name":"Huddersfield Research Portal (University of Huddersfield)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I133837150","host_organization_name":"University of Huddersfield","host_organization_lineage":["https://openalex.org/I133837150"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Zhang, Z, Zhao, G, Ban, Y, Wang, X, Lei, B, Wang, L, Chen, B, Gao, F, Jiang, J & Liu, H 2025, 'Achieving High-Fold Optical Subdivision of a Blazed Grating Interferometer Through Near-Littrow Incidence', IEEE Transactions on Instrumentation and Measurement, vol. 74, 7010910. https://doi.org/10.1109/TIM.2025.3588926","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":{"id":"pmh:oai:pure.atira.dk:publications/40cb23d1-cdc2-4e9e-a291-b4a9ad4350ec","is_oa":true,"landing_page_url":"https://pure.hud.ac.uk/en/publications/40cb23d1-cdc2-4e9e-a291-b4a9ad4350ec","pdf_url":"https://pure.hud.ac.uk/ws/files/115086135/AAM.pdf","source":{"id":"https://openalex.org/S4306402508","display_name":"Huddersfield Research Portal (University of Huddersfield)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I133837150","host_organization_name":"University of Huddersfield","host_organization_lineage":["https://openalex.org/I133837150"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Zhang, Z, Zhao, G, Ban, Y, Wang, X, Lei, B, Wang, L, Chen, B, Gao, F, Jiang, J & Liu, H 2025, 'Achieving High-Fold Optical Subdivision of a Blazed Grating Interferometer Through Near-Littrow Incidence', IEEE Transactions on Instrumentation and Measurement, vol. 74, 7010910. https://doi.org/10.1109/TIM.2025.3588926","raw_type":"info:eu-repo/semantics/publishedVersion"},"sustainable_development_goals":[{"score":0.4399999976158142,"id":"https://metadata.un.org/sdg/13","display_name":"Climate action"}],"awards":[{"id":"https://openalex.org/G1368247753","display_name":null,"funder_award_id":"202306280048","funder_id":"https://openalex.org/F4320322725","funder_display_name":"China Scholarship Council"},{"id":"https://openalex.org/G7078920450","display_name":null,"funder_award_id":"SDAST2024QTB025","funder_id":"https://openalex.org/F4320309617","funder_display_name":"National Foundation for Science and Technology Development"},{"id":"https://openalex.org/G8871382617","display_name":null,"funder_award_id":"2023YFB3209404","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320309617","display_name":"National Foundation for Science and Technology Development","ror":"https://ror.org/04rw64z44"},{"id":"https://openalex.org/F4320322725","display_name":"China Scholarship Council","ror":"https://ror.org/04atp4p48"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4412722620.pdf","grobid_xml":"https://content.openalex.org/works/W4412722620.grobid-xml"},"referenced_works_count":43,"referenced_works":["https://openalex.org/W1966207777","https://openalex.org/W1985173861","https://openalex.org/W1991992304","https://openalex.org/W2013504159","https://openalex.org/W2022255804","https://openalex.org/W2023618805","https://openalex.org/W2088936337","https://openalex.org/W2093933867","https://openalex.org/W2097388323","https://openalex.org/W2148075895","https://openalex.org/W2165432463","https://openalex.org/W2308995134","https://openalex.org/W2386195904","https://openalex.org/W2547349196","https://openalex.org/W2774753919","https://openalex.org/W2774909030","https://openalex.org/W2787261804","https://openalex.org/W2789680760","https://openalex.org/W2793668372","https://openalex.org/W2905036344","https://openalex.org/W2923852956","https://openalex.org/W2950721209","https://openalex.org/W2981719502","https://openalex.org/W2997838039","https://openalex.org/W3017767097","https://openalex.org/W3020068583","https://openalex.org/W3160535352","https://openalex.org/W3175061310","https://openalex.org/W3182036077","https://openalex.org/W3198227696","https://openalex.org/W4200212486","https://openalex.org/W4226015332","https://openalex.org/W4236735865","https://openalex.org/W4312840751","https://openalex.org/W4327522770","https://openalex.org/W4378701350","https://openalex.org/W4386850599","https://openalex.org/W4391133554","https://openalex.org/W4392146833","https://openalex.org/W4392399508","https://openalex.org/W4403997681","https://openalex.org/W4408328460","https://openalex.org/W6760449840"],"related_works":["https://openalex.org/W1990165374","https://openalex.org/W2155174779","https://openalex.org/W2260530752","https://openalex.org/W2046527338","https://openalex.org/W2133239258","https://openalex.org/W1997390503","https://openalex.org/W1965007223","https://openalex.org/W2029028893","https://openalex.org/W2073524920","https://openalex.org/W4283512484"],"abstract_inverted_index":{"The":[0,168,201],"multidiffractions":[1],"model":[2,22,174,207,265],"is":[3,52,88,183,277],"commonly":[4],"used":[5],"to":[6,33,91,185,213,254],"increase":[7],"the":[8,17,24,27,30,38,46,55,60,64,69,73,79,84,92,99,105,129,132,138,143,155,159,161,172,179,187,195,205,217,241,249,252,261,267,275,281,284,288],"optical":[9,191,210,258,271,296,303],"subdivision":[10,192,211,272,304],"factor.":[11],"However,":[12],"in":[13,37,78],"practical":[14],"applications,":[15],"as":[16],"diffraction":[18,101,126],"order":[19],"increases,":[20],"this":[21,264],"requires":[23],"size":[25],"of":[26,59,72,104,131,158,163,171,189,197,227,237,260,283],"mirror":[28],"above":[29],"scale":[31,61,74],"grating":[32,62,82,107,133,145,250,285],"be":[34,166,246],"larger,":[35],"resulting":[36],"reading":[39,65],"unit":[40],"being":[41],"too":[42],"bulky.":[43],"In":[44],"addition,":[45],"general":[47],"multiple":[48,120,125],"diffractions":[49,121,164],"arrangement":[50],"direction":[51,58,130],"arranged":[53],"along":[54,128],"relative":[56],"movement":[57],"and":[63,136,193,230,251],"unit,":[66],"which":[67,96],"reduces":[68],"measurement":[70,206,218],"range":[71,226,236],"grating.":[75],"More":[76],"importantly,":[77],"current":[80],"blazed":[81,106,144],"interferometer,":[83],"incident":[85,139,279],"light":[86,140],"beam":[87,141,276],"generally":[89],"perpendicular":[90],"grating\u2019s":[93],"macroscopic":[94],"surface,":[95],"means":[97],"that":[98,204],"maximum":[100],"efficiency":[102],"characteristics":[103],"are":[108,175],"not":[109],"fully":[110],"utilized.":[111],"To":[112],"address":[113],"these":[114],"issues,":[115],"we":[116],"developed":[117],"a":[118,149,224,234,256,294],"novel":[119],"model.":[122],"It":[123],"arranges":[124],"positions":[127],"ruling":[134],"lines":[135],"directs":[137],"onto":[142],"groove":[146,286],"surface":[147,282],"at":[148],"near-Littrow":[150],"angle.":[151],"By":[152],"slightly":[153],"adjusting":[154],"inclination":[156],"angle":[157],"beam,":[160,263],"number":[162],"can":[165,208,245],"controlled.":[167],"operating":[169],"principles":[170],"proposed":[173],"thoroughly":[176],"elucidated.":[177],"Subsequently,":[178],"corresponding":[180,242],"experimental":[181],"setup":[182],"constructed":[184],"validate":[186],"effectiveness":[188],"its":[190,198],"assess":[194],"accuracy":[196,219],"displacement":[199],"measurements.":[200],"results":[202],"indicate":[203],"achieve":[209],"up":[212],"14":[214],"times,":[215],"with":[216],"reaching":[220],"46.54":[221],"nm":[222,232],"within":[223,233],"travel":[225,235],"0.2":[228],"mm":[229],"134.42":[231],"1":[238],"mm.":[239],"If":[240],"gain":[243],"material":[244],"inserted":[247],"between":[248],"reflector":[253],"maintain":[255],"constant":[257],"power":[259],"diffracted":[262],"presents":[266],"potential":[268],"for":[269,299],"substantial":[270],"multiples":[273],"when":[274],"vertically":[278],"on":[280,302],"via":[287],"partial":[289],"reflector.":[290],"This":[291],"may":[292],"establish":[293],"fundamental":[295],"design":[297],"framework":[298],"future":[300],"research":[301],"cavities.":[305]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}