{"id":"https://openalex.org/W4412375158","doi":"https://doi.org/10.1109/tim.2025.3587365","title":"Pattern Matters: The Impact of Projection Patterns on Deep Learning 3-D Profilometry","display_name":"Pattern Matters: The Impact of Projection Patterns on Deep Learning 3-D Profilometry","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4412375158","doi":"https://doi.org/10.1109/tim.2025.3587365"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3587365","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3587365","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078932469","display_name":"Rhys Evans","orcid":"https://orcid.org/0009-0001-2958-5052"},"institutions":[{"id":"https://openalex.org/I35141943","display_name":"Breast International Group","ror":"https://ror.org/0092p0v85","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I35141943"]},{"id":"https://openalex.org/I4210132484","display_name":"VIB-UAntwerp Center for Molecular Neurology","ror":"https://ror.org/041x7eh14","country_code":"BE","type":"facility","lineage":["https://openalex.org/I149213910","https://openalex.org/I2802017950","https://openalex.org/I4210132484"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Rhys G. Evans","raw_affiliation_strings":["Research Group, InViLab, Antwerp, Belgium","research group InViLab, Belgium"],"raw_orcid":"https://orcid.org/0009-0001-2958-5052","affiliations":[{"raw_affiliation_string":"Research Group, InViLab, Antwerp, Belgium","institution_ids":["https://openalex.org/I4210132484"]},{"raw_affiliation_string":"research group InViLab, Belgium","institution_ids":["https://openalex.org/I35141943"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5118968454","display_name":"Stef Bordo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210112645","display_name":"Leefmilieu Brussel","ror":"https://ror.org/02dprkj51","country_code":"BE","type":"other","lineage":["https://openalex.org/I4210112645"]},{"id":"https://openalex.org/I4210119540","display_name":"Province of Antwerp","ror":"https://ror.org/022v8s261","country_code":"BE","type":"government","lineage":["https://openalex.org/I4210119540"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Stef Bordo","raw_affiliation_strings":["Bimef., Antwerp, Flanders, Belgium","Bimef, Belgium"],"raw_orcid":"https://orcid.org/0009-0009-7895-1491","affiliations":[{"raw_affiliation_string":"Bimef., Antwerp, Flanders, Belgium","institution_ids":["https://openalex.org/I4210119540"]},{"raw_affiliation_string":"Bimef, Belgium","institution_ids":["https://openalex.org/I4210112645"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031929289","display_name":"Joris Dirckx","orcid":"https://orcid.org/0000-0002-2664-1207"},"institutions":[{"id":"https://openalex.org/I4210112645","display_name":"Leefmilieu Brussel","ror":"https://ror.org/02dprkj51","country_code":"BE","type":"other","lineage":["https://openalex.org/I4210112645"]},{"id":"https://openalex.org/I4210119540","display_name":"Province of Antwerp","ror":"https://ror.org/022v8s261","country_code":"BE","type":"government","lineage":["https://openalex.org/I4210119540"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Joris J. J. Dirckx","raw_affiliation_strings":["Bimef., Antwerp, Flanders, Belgium","Bimef, Belgium"],"raw_orcid":"https://orcid.org/0000-0002-2664-1207","affiliations":[{"raw_affiliation_string":"Bimef., Antwerp, Flanders, Belgium","institution_ids":["https://openalex.org/I4210119540"]},{"raw_affiliation_string":"Bimef, Belgium","institution_ids":["https://openalex.org/I4210112645"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075964109","display_name":"Sam Van der Jeught","orcid":"https://orcid.org/0000-0002-4184-6147"},"institutions":[{"id":"https://openalex.org/I35141943","display_name":"Breast International Group","ror":"https://ror.org/0092p0v85","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I35141943"]},{"id":"https://openalex.org/I4210132484","display_name":"VIB-UAntwerp Center for Molecular Neurology","ror":"https://ror.org/041x7eh14","country_code":"BE","type":"facility","lineage":["https://openalex.org/I149213910","https://openalex.org/I2802017950","https://openalex.org/I4210132484"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Sam Van der Jeught","raw_affiliation_strings":["Research Group, InViLab, Antwerp, Belgium","research group InViLab, Belgium"],"raw_orcid":"https://orcid.org/0000-0002-4184-6147","affiliations":[{"raw_affiliation_string":"Research Group, InViLab, Antwerp, Belgium","institution_ids":["https://openalex.org/I4210132484"]},{"raw_affiliation_string":"research group InViLab, Belgium","institution_ids":["https://openalex.org/I35141943"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5078932469"],"corresponding_institution_ids":["https://openalex.org/I35141943","https://openalex.org/I4210132484"],"apc_list":null,"apc_paid":null,"fwci":2.2665,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.88863717,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"18"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/profilometer","display_name":"Profilometer","score":0.6877866983413696},{"id":"https://openalex.org/keywords/projection","display_name":"Projection (relational algebra)","score":0.5471237897872925},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5407519340515137},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4744097888469696},{"id":"https://openalex.org/keywords/structured-light-3d-scanner","display_name":"Structured-light 3D scanner","score":0.46422430872917175},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.42992761731147766},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.428966760635376},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.33840417861938477},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2261078953742981},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16860827803611755},{"id":"https://openalex.org/keywords/surface-finish","display_name":"Surface finish","score":0.16683772206306458},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.1412663757801056},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.1233815848827362},{"id":"https://openalex.org/keywords/scanner","display_name":"Scanner","score":0.11994859576225281}],"concepts":[{"id":"https://openalex.org/C79261456","wikidata":"https://www.wikidata.org/wiki/Q443756","display_name":"Profilometer","level":3,"score":0.6877866983413696},{"id":"https://openalex.org/C57493831","wikidata":"https://www.wikidata.org/wiki/Q3134666","display_name":"Projection (relational algebra)","level":2,"score":0.5471237897872925},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5407519340515137},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4744097888469696},{"id":"https://openalex.org/C184577583","wikidata":"https://www.wikidata.org/wiki/Q1485537","display_name":"Structured-light 3D scanner","level":3,"score":0.46422430872917175},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.42992761731147766},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.428966760635376},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.33840417861938477},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2261078953742981},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16860827803611755},{"id":"https://openalex.org/C71039073","wikidata":"https://www.wikidata.org/wiki/Q3439090","display_name":"Surface finish","level":2,"score":0.16683772206306458},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.1412663757801056},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.1233815848827362},{"id":"https://openalex.org/C2779751349","wikidata":"https://www.wikidata.org/wiki/Q1474480","display_name":"Scanner","level":2,"score":0.11994859576225281}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3587365","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3587365","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W1586712130","https://openalex.org/W2171646521","https://openalex.org/W2267603885","https://openalex.org/W2336763592","https://openalex.org/W2804654620","https://openalex.org/W2885945836","https://openalex.org/W2910410733","https://openalex.org/W2948097639","https://openalex.org/W2960994981","https://openalex.org/W2963446712","https://openalex.org/W2974285835","https://openalex.org/W3038484145","https://openalex.org/W3042242965","https://openalex.org/W3046946208","https://openalex.org/W3130399606","https://openalex.org/W3132032273","https://openalex.org/W3136194189","https://openalex.org/W3155339433","https://openalex.org/W3161292253","https://openalex.org/W3177577612","https://openalex.org/W3206595850","https://openalex.org/W4205962726","https://openalex.org/W4210323025","https://openalex.org/W4212939536","https://openalex.org/W4226213795","https://openalex.org/W4240543907","https://openalex.org/W4293527381","https://openalex.org/W4306920806","https://openalex.org/W4310375898","https://openalex.org/W4313541731","https://openalex.org/W4321381456","https://openalex.org/W4322588526","https://openalex.org/W4327852052","https://openalex.org/W4366834062","https://openalex.org/W4381592343","https://openalex.org/W4387204670","https://openalex.org/W4387643715","https://openalex.org/W4388823657","https://openalex.org/W4389493563","https://openalex.org/W4391092194","https://openalex.org/W4393224322","https://openalex.org/W4396671557","https://openalex.org/W4400875592","https://openalex.org/W4400948955"],"related_works":["https://openalex.org/W2045080189","https://openalex.org/W2591989483","https://openalex.org/W2385216742","https://openalex.org/W1984933051","https://openalex.org/W4249939034","https://openalex.org/W2743746609","https://openalex.org/W2019148711","https://openalex.org/W2055482831","https://openalex.org/W4205399159","https://openalex.org/W1988186120"],"abstract_inverted_index":{"In":[0],"the":[1,63,75,87,95,111,130],"3-D":[2],"optical":[3,22],"metrology,":[4],"single-shot":[5,55],"deep":[6,78],"learning-based":[7],"structured":[8,40],"light":[9,41],"profilometry":[10,42],"(SS-DL-SLP)":[11],"has":[12],"gained":[13],"attention":[14],"because":[15],"of":[16,21,97],"its":[17],"measurement":[18,69],"speed,":[19],"simplicity":[20],"setup,":[23],"and":[24,28,105,147],"robustness":[25],"to":[26,61,77,85,143],"noise":[27],"motion":[29],"artifacts.":[30],"The":[31],"chosen":[32],"projection":[33,90,101],"pattern":[34,65,112],"is":[35,140],"a":[36,47],"key":[37],"feature":[38],"within":[39],"(SLP),":[43],"with":[44,110],"or":[45,54],"without":[46],"neural":[48],"network.":[49],"Algorithmic":[50],"processes":[51],"using":[52],"multishot":[53],"instance":[56],"scanning":[57],"require":[58],"in-depth":[59,83],"analyses":[60],"determine":[62],"optimal":[64,89],"for":[66],"their":[67],"intended":[68],"purposes.":[70],"This":[71],"article":[72],"determines":[73],"whether":[74],"transition":[76],"learning":[79],"still":[80],"requires":[81],"such":[82],"research":[84,146],"find":[86],"most":[88],"pattern.":[91],"Our":[92],"study":[93],"highlights":[94],"performance":[96,122],"networks":[98],"when":[99],"unconventional":[100],"patterns":[102],"are":[103,124],"used":[104],"analyzes":[106],"what":[107],"hyperparameters,":[108],"combined":[109],"analyses,":[113],"make":[114],"models":[115],"perform":[116],"better.":[117],"We":[118],"ensure":[119],"that":[120],"these":[121],"optimizations":[123],"not":[125],"model":[126,136],"dependent":[127],"by":[128],"executing":[129],"same":[131],"training":[132],"task":[133],"on":[134],"different":[135],"structures.":[137],"All":[138],"code":[139],"publicly":[141],"available":[142],"facilitate":[144],"further":[145],"promote":[148],"reproducibility:":[149],"<uri":[150],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[151],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">https://github.com/RhysEvan/Pattern-Matters</uri>":[152]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}