{"id":"https://openalex.org/W4412375169","doi":"https://doi.org/10.1109/tim.2025.3587357","title":"Iterative Reconstruction Method With Auto-Updated Seed Point of Monoscopic Deflectometry for Off-Axis Aspheric","display_name":"Iterative Reconstruction Method With Auto-Updated Seed Point of Monoscopic Deflectometry for Off-Axis Aspheric","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4412375169","doi":"https://doi.org/10.1109/tim.2025.3587357"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3587357","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3587357","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11075900","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070719849","display_name":"Menghui Lan","orcid":"https://orcid.org/0000-0002-2212-5889"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Menghui Lan","raw_affiliation_strings":["State Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0002-2212-5889","affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101484448","display_name":"Bing Li","orcid":"https://orcid.org/0000-0002-9083-8952"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bing Li","raw_affiliation_strings":["State Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong University, Xi’an, China","State Key Laboratory for Manufacturing Systems Engineering and the International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technology, Xi’an Jiaotong University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0002-9083-8952","affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing System Engineering, Xi’an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]},{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering and the International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technology, Xi’an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101762898","display_name":"Xiang Wei","orcid":"https://orcid.org/0000-0003-0838-8583"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiang Wei","raw_affiliation_strings":["State Key Laboratory for Manufacturing Systems Engineering and the International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technology, Xi’an Jiaotong University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0003-0838-8583","affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing Systems Engineering and the International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technology, Xi’an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018223216","display_name":"Emanuele Zappa","orcid":"https://orcid.org/0000-0003-3320-9030"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Emanuele Zappa","raw_affiliation_strings":["Department of Mechanical Engineering, Politecnico di Milano, Milan, Italy","Department of Mechanical Engineering, Politecnico di Milan, Milan, Italy"],"raw_orcid":"https://orcid.org/0000-0003-3320-9030","affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Department of Mechanical Engineering, Politecnico di Milan, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.5793,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.83515756,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9872999787330627,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.9526000022888184,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6150824427604675},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.554906964302063},{"id":"https://openalex.org/keywords/iterative-method","display_name":"Iterative method","score":0.5313663482666016},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.514732837677002},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.49826955795288086},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4875335395336151},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.44935253262519836},{"id":"https://openalex.org/keywords/iterative-closest-point","display_name":"Iterative closest point","score":0.4129836857318878},{"id":"https://openalex.org/keywords/computer-graphics","display_name":"Computer graphics (images)","score":0.34230268001556396},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2748625874519348},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.23006576299667358},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.22055897116661072},{"id":"https://openalex.org/keywords/point-cloud","display_name":"Point cloud","score":0.18846967816352844},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.1619027554988861}],"concepts":[{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6150824427604675},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.554906964302063},{"id":"https://openalex.org/C159694833","wikidata":"https://www.wikidata.org/wiki/Q2321565","display_name":"Iterative method","level":2,"score":0.5313663482666016},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.514732837677002},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.49826955795288086},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4875335395336151},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.44935253262519836},{"id":"https://openalex.org/C195958017","wikidata":"https://www.wikidata.org/wiki/Q1675268","display_name":"Iterative closest point","level":3,"score":0.4129836857318878},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.34230268001556396},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2748625874519348},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.23006576299667358},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.22055897116661072},{"id":"https://openalex.org/C131979681","wikidata":"https://www.wikidata.org/wiki/Q1899648","display_name":"Point cloud","level":2,"score":0.18846967816352844},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.1619027554988861}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2025.3587357","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3587357","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:re.public.polimi.it:11311/1294493","is_oa":true,"landing_page_url":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11075900","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:re.public.polimi.it:11311/1294493","is_oa":true,"landing_page_url":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11075900","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4007660215","display_name":null,"funder_award_id":"52105482","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5177550661","display_name":null,"funder_award_id":"202306280263","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":46,"referenced_works":["https://openalex.org/W1968458984","https://openalex.org/W1977583549","https://openalex.org/W2002480829","https://openalex.org/W2009287775","https://openalex.org/W2021378579","https://openalex.org/W2031825376","https://openalex.org/W2045320234","https://openalex.org/W2047097652","https://openalex.org/W2049550935","https://openalex.org/W2060318225","https://openalex.org/W2070036618","https://openalex.org/W2071337709","https://openalex.org/W2096820099","https://openalex.org/W2112731915","https://openalex.org/W2153118043","https://openalex.org/W2163082679","https://openalex.org/W2167667767","https://openalex.org/W2403379900","https://openalex.org/W2472710985","https://openalex.org/W2795953499","https://openalex.org/W2799396353","https://openalex.org/W2889804606","https://openalex.org/W2890365206","https://openalex.org/W2897113328","https://openalex.org/W2898859222","https://openalex.org/W2917363561","https://openalex.org/W2948070325","https://openalex.org/W2966650492","https://openalex.org/W3010898044","https://openalex.org/W3017357266","https://openalex.org/W3081054276","https://openalex.org/W3082166097","https://openalex.org/W3083474960","https://openalex.org/W3138006373","https://openalex.org/W3147799401","https://openalex.org/W3174377411","https://openalex.org/W3204459004","https://openalex.org/W4242659499","https://openalex.org/W4307387799","https://openalex.org/W4307854805","https://openalex.org/W4312702212","https://openalex.org/W4327702732","https://openalex.org/W4377971533","https://openalex.org/W4386778836","https://openalex.org/W4386883178","https://openalex.org/W4389074478"],"related_works":["https://openalex.org/W4244892557","https://openalex.org/W1997869659","https://openalex.org/W188064357","https://openalex.org/W2107386309","https://openalex.org/W2545869789","https://openalex.org/W2141090006","https://openalex.org/W1501002176","https://openalex.org/W1964555484","https://openalex.org/W3048932468","https://openalex.org/W2148504016"],"abstract_inverted_index":{"The":[0,120,176,235],"complex":[1],"surface":[2,129,159,171,258,271],"characteristics":[3],"and":[4,9,31,41,144,185,190,220],"misalignment":[5],"of":[6,12,105,126,135,198,222,229],"the":[7,20,91,103,109,115,127,133,136,141,145,154,168,195,199,203,207,218,223,227,241,244,256,269],"geometric":[8],"optical":[10],"axes":[11],"off-axis":[13,117,169],"aspherical":[14,170],"surfaces":[15],"pose":[16],"major":[17],"challenges":[18],"in":[19,140,243,268],"work":[21],"to":[22,60,193,205,216,264],"develop":[23],"a":[24,38,75,164,265],"measurement":[25,34],"technique":[26],"that":[27,239],"is":[28,37,94,130,150,161,173,181],"accurate,":[29],"effective,":[30],"simple.":[32],"Phase":[33],"deflectometry":[35],"(PMD)":[36],"more":[39,68,182],"convenient":[40],"cost-effective":[42],"method":[43,180,225],"than":[44,163],"interferometry":[45],"for":[46],"measuring":[47],"specular":[48],"objects.":[49],"Nevertheless,":[50],"monocular":[51,81,178],"PMD":[52,66,82,179],"necessitates":[53],"complicated":[54],"processes":[55],"or":[56,112,123],"costly":[57],"additional":[58],"equipment":[59],"resolve":[61],"height-slope":[62],"problems,":[63],"whereas":[64],"binocular":[65],"requires":[67,98],"time-consuming":[69],"matching":[70],"calculations.":[71],"In":[72],"this":[73],"article,":[74],"novel":[76],"iterative":[77,92,142],"strategy":[78],"based":[79],"on":[80,114,255],"technology":[83],"with":[84,226],"an":[85,99],"automatically":[86],"updated":[87,152],"seed":[88,138,208],"point":[89,107,125,139],"during":[90],"process":[93],"proposed,":[95],"which":[96],"only":[97,188,262],"approximate":[100],"estimation":[101],"about":[102],"height":[104,148,197,247],"one":[106],"(either":[108],"lowest,":[110,121],"middle,":[111,122],"highest)":[113],"measured":[116,200,257],"aspheric":[118],"component.":[119],"highest":[124],"reconstructed":[128],"used":[131],"as":[132,233],"target":[134],"auto-updated":[137],"process,":[143],"surface\u2019s":[146],"overall":[147],"information":[149],"then":[151],"until":[153],"difference":[155],"between":[156],"two":[157],"neighboring":[158],"profiles":[160],"less":[162],"certain":[165],"threshold.":[166],"Finally,":[167],"result":[172],"sent":[174],"out.":[175],"proposed":[177,224],"straightforward,":[183],"cost-effective,":[184],"simple,":[186],"requiring":[187],"basic":[189],"low-cost":[191],"tools":[192],"estimate":[194],"initial":[196,246],"component":[201],"without":[202],"need":[204],"obtain":[206],"point\u2019s":[209],"3-D":[210],"coordinate.":[211],"An":[212],"experiment":[213],"was":[214],"performed":[215],"evaluate":[217],"feasibility":[219],"accuracy":[221],"results":[228,236],"high-precision":[230],"contact":[231],"measurements":[232],"benchmarks.":[234],"also":[237],"indicated":[238],"even":[240],"uncertainty":[242],"estimated":[245],"using":[248],"common":[249],"Vernier":[250],"calipers":[251],"has":[252],"little":[253],"effect":[254],"shape,":[259],"since":[260],"it":[261],"leads":[263],"small":[266],"offset":[267],"whole":[270],"location.":[272]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1}],"updated_date":"2026-08-01T09:00:35.917206","created_date":"2025-10-10T00:00:00"}