{"id":"https://openalex.org/W4411484198","doi":"https://doi.org/10.1109/tim.2025.3581623","title":"Effect of Tensile Stress on the Behavior of Iron\u2013Silicon Single Crystal: Magnetization, Magnetostriction, and Magnetic Barkhausen Noise","display_name":"Effect of Tensile Stress on the Behavior of Iron\u2013Silicon Single Crystal: Magnetization, Magnetostriction, and Magnetic Barkhausen Noise","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4411484198","doi":"https://doi.org/10.1109/tim.2025.3581623"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3581623","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3581623","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal.science/hal-05146609v1/file/Manuscript%20_%20pdf%20version.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052897328","display_name":"Eric Wasniewski","orcid":null},"institutions":[{"id":"https://openalex.org/I4210091020","display_name":"Centre Technique des Industries M\u00e9caniques","ror":"https://ror.org/00c051916","country_code":"FR","type":"other","lineage":["https://openalex.org/I4210091020"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Eric Wasniewski","raw_affiliation_strings":["CETIM, Senlis, France"],"raw_orcid":"https://orcid.org/0009-0001-0134-9381","affiliations":[{"raw_affiliation_string":"CETIM, Senlis, France","institution_ids":["https://openalex.org/I4210091020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030863027","display_name":"Laurent Daniel","orcid":"https://orcid.org/0000-0001-5016-4589"},"institutions":[{"id":"https://openalex.org/I102475099","display_name":"Sup\u00e9lec","ror":"https://ror.org/00n7gwn90","country_code":"FR","type":"education","lineage":["https://openalex.org/I102475099"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I3019908861","display_name":"Laboratoire de G\u00e9nie \u00c9lectrique et \u00c9lectronique de Paris","ror":"https://ror.org/02xnnng09","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I277688954","https://openalex.org/I277688954","https://openalex.org/I3019908861","https://openalex.org/I39804081","https://openalex.org/I4210107720"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Laurent Daniel","raw_affiliation_strings":["Centrale Supelec, CNRS, Laboratoire de Génie Electrique et Electronique de Paris, Université Paris-Saclay, Gif-sur-Yvette, France"],"raw_orcid":"https://orcid.org/0000-0001-5016-4589","affiliations":[{"raw_affiliation_string":"Centrale Supelec, CNRS, Laboratoire de Génie Electrique et Electronique de Paris, Université Paris-Saclay, Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I102475099","https://openalex.org/I3019908861","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027319782","display_name":"Mathieu Domenjoud","orcid":"https://orcid.org/0000-0002-7564-3268"},"institutions":[{"id":"https://openalex.org/I102475099","display_name":"Sup\u00e9lec","ror":"https://ror.org/00n7gwn90","country_code":"FR","type":"education","lineage":["https://openalex.org/I102475099"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I3019908861","display_name":"Laboratoire de G\u00e9nie \u00c9lectrique et \u00c9lectronique de Paris","ror":"https://ror.org/02xnnng09","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I277688954","https://openalex.org/I277688954","https://openalex.org/I3019908861","https://openalex.org/I39804081","https://openalex.org/I4210107720"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Mathieu Domenjoud","raw_affiliation_strings":["Centrale Supelec, CNRS, Laboratoire de Génie Electrique et Electronique de Paris, Université Paris-Saclay, Gif-sur-Yvette, France"],"raw_orcid":"https://orcid.org/0000-0002-7564-3268","affiliations":[{"raw_affiliation_string":"Centrale Supelec, CNRS, Laboratoire de Génie Electrique et Electronique de Paris, Université Paris-Saclay, Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I102475099","https://openalex.org/I3019908861","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047406644","display_name":"Patrick Fagan","orcid":null},"institutions":[{"id":"https://openalex.org/I102475099","display_name":"Sup\u00e9lec","ror":"https://ror.org/00n7gwn90","country_code":"FR","type":"education","lineage":["https://openalex.org/I102475099"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I3019908861","display_name":"Laboratoire de G\u00e9nie \u00c9lectrique et \u00c9lectronique de Paris","ror":"https://ror.org/02xnnng09","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I277688954","https://openalex.org/I277688954","https://openalex.org/I3019908861","https://openalex.org/I39804081","https://openalex.org/I4210107720"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Patrick Fagan","raw_affiliation_strings":["Centrale Supelec, CNRS, Laboratoire de Génie Electrique et Electronique de Paris, Université Paris-Saclay, Gif-sur-Yvette, France"],"raw_orcid":"https://orcid.org/0000-0001-7990-3533","affiliations":[{"raw_affiliation_string":"Centrale Supelec, CNRS, Laboratoire de Génie Electrique et Electronique de Paris, Université Paris-Saclay, Gif-sur-Yvette, France","institution_ids":["https://openalex.org/I102475099","https://openalex.org/I3019908861","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100403597","display_name":"Fan Zhang","orcid":"https://orcid.org/0009-0006-1934-5043"},"institutions":[{"id":"https://openalex.org/I4210091020","display_name":"Centre Technique des Industries M\u00e9caniques","ror":"https://ror.org/00c051916","country_code":"FR","type":"other","lineage":["https://openalex.org/I4210091020"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Fan Zhang","raw_affiliation_strings":["CETIM, Senlis, France"],"raw_orcid":"https://orcid.org/0009-0006-1934-5043","affiliations":[{"raw_affiliation_string":"CETIM, Senlis, France","institution_ids":["https://openalex.org/I4210091020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088224587","display_name":"Benjamin Ducharne","orcid":"https://orcid.org/0000-0002-2046-211X"},"institutions":[{"id":"https://openalex.org/I100532134","display_name":"Universit\u00e9 Claude Bernard Lyon 1","ror":"https://ror.org/029brtt94","country_code":"FR","type":"education","lineage":["https://openalex.org/I100532134","https://openalex.org/I203339264"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I178906410","display_name":"Lyon College","ror":"https://ror.org/03c4kec23","country_code":"US","type":"education","lineage":["https://openalex.org/I178906410"]},{"id":"https://openalex.org/I48430043","display_name":"Institut National des Sciences Appliqu\u00e9es de Lyon","ror":"https://ror.org/050jn9y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I203339264","https://openalex.org/I48430043"]}],"countries":["FR","US"],"is_corresponding":false,"raw_author_name":"Benjamin Ducharne","raw_affiliation_strings":["ELyTMaX IRL3757, CNRS, Univ Lyon, INSA Lyon, Centrale Lyon, Université Claude Bernard Lyon 1, Tohoku University, Villeurbanne, France"],"raw_orcid":"https://orcid.org/0000-0002-2046-211X","affiliations":[{"raw_affiliation_string":"ELyTMaX IRL3757, CNRS, Univ Lyon, INSA Lyon, Centrale Lyon, Université Claude Bernard Lyon 1, Tohoku University, Villeurbanne, France","institution_ids":["https://openalex.org/I178906410","https://openalex.org/I48430043","https://openalex.org/I100532134","https://openalex.org/I1294671590"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5052897328"],"corresponding_institution_ids":["https://openalex.org/I4210091020"],"apc_list":null,"apc_paid":null,"fwci":0.7624,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.69762676,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10386","display_name":"Microstructure and Mechanical Properties of Steels","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9854999780654907,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/magnetostriction","display_name":"Magnetostriction","score":0.9529495239257812},{"id":"https://openalex.org/keywords/barkhausen-effect","display_name":"Barkhausen effect","score":0.9370077252388},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7958504557609558},{"id":"https://openalex.org/keywords/magnetization","display_name":"Magnetization","score":0.6442762613296509},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.6145652532577515},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.5766167044639587},{"id":"https://openalex.org/keywords/single-crystal","display_name":"Single crystal","score":0.532968282699585},{"id":"https://openalex.org/keywords/barkhausen-stability-criterion","display_name":"Barkhausen stability criterion","score":0.4837248623371124},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.47882989048957825},{"id":"https://openalex.org/keywords/nuclear-magnetic-resonance","display_name":"Nuclear magnetic resonance","score":0.4605729579925537},{"id":"https://openalex.org/keywords/magnetometer","display_name":"Magnetometer","score":0.44447410106658936},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.42638295888900757},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.31050652265548706},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.2708571255207062},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09416407346725464},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.07126066088676453}],"concepts":[{"id":"https://openalex.org/C72852350","wikidata":"https://www.wikidata.org/wiki/Q840970","display_name":"Magnetostriction","level":3,"score":0.9529495239257812},{"id":"https://openalex.org/C71076449","wikidata":"https://www.wikidata.org/wiki/Q211518","display_name":"Barkhausen effect","level":4,"score":0.9370077252388},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7958504557609558},{"id":"https://openalex.org/C32546565","wikidata":"https://www.wikidata.org/wiki/Q856711","display_name":"Magnetization","level":3,"score":0.6442762613296509},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.6145652532577515},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.5766167044639587},{"id":"https://openalex.org/C73922627","wikidata":"https://www.wikidata.org/wiki/Q754943","display_name":"Single crystal","level":2,"score":0.532968282699585},{"id":"https://openalex.org/C42403620","wikidata":"https://www.wikidata.org/wiki/Q1163709","display_name":"Barkhausen stability criterion","level":4,"score":0.4837248623371124},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.47882989048957825},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.4605729579925537},{"id":"https://openalex.org/C153946474","wikidata":"https://www.wikidata.org/wiki/Q333921","display_name":"Magnetometer","level":3,"score":0.44447410106658936},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.42638295888900757},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.31050652265548706},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.2708571255207062},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09416407346725464},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.07126066088676453},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2025.3581623","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3581623","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-05146609v1","is_oa":true,"landing_page_url":"https://hal.science/hal-05146609","pdf_url":"https://hal.science/hal-05146609v1/file/Manuscript%20_%20pdf%20version.pdf","source":{"id":"https://openalex.org/S4406922466","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement, 2025, pp.1-1. ⟨10.1109/TIM.2025.3581623⟩","raw_type":"Journal articles"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-05146609v1","is_oa":true,"landing_page_url":"https://hal.science/hal-05146609","pdf_url":"https://hal.science/hal-05146609v1/file/Manuscript%20_%20pdf%20version.pdf","source":{"id":"https://openalex.org/S4406922466","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement, 2025, pp.1-1. ⟨10.1109/TIM.2025.3581623⟩","raw_type":"Journal articles"},"sustainable_development_goals":[{"display_name":"Climate action","id":"https://metadata.un.org/sdg/13","score":0.49000000953674316}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4411484198.pdf","grobid_xml":"https://content.openalex.org/works/W4411484198.grobid-xml"},"referenced_works_count":48,"referenced_works":["https://openalex.org/W1483602205","https://openalex.org/W1579821354","https://openalex.org/W1953002842","https://openalex.org/W1965401456","https://openalex.org/W1968634330","https://openalex.org/W1970984724","https://openalex.org/W1971181303","https://openalex.org/W1974977558","https://openalex.org/W1986307419","https://openalex.org/W1987801120","https://openalex.org/W2004962237","https://openalex.org/W2011347246","https://openalex.org/W2017666669","https://openalex.org/W2019459540","https://openalex.org/W2024860496","https://openalex.org/W2027158629","https://openalex.org/W2030846938","https://openalex.org/W2034469576","https://openalex.org/W2042745148","https://openalex.org/W2044408074","https://openalex.org/W2088198450","https://openalex.org/W2091864050","https://openalex.org/W2094430225","https://openalex.org/W2129926609","https://openalex.org/W2143785560","https://openalex.org/W2152121946","https://openalex.org/W2221242966","https://openalex.org/W2338444596","https://openalex.org/W2584783596","https://openalex.org/W2734487763","https://openalex.org/W2790864566","https://openalex.org/W2952278110","https://openalex.org/W2956519986","https://openalex.org/W2996174280","https://openalex.org/W3087716722","https://openalex.org/W3141738070","https://openalex.org/W3151391132","https://openalex.org/W3173823424","https://openalex.org/W3180215034","https://openalex.org/W4205514403","https://openalex.org/W4213354618","https://openalex.org/W4233707795","https://openalex.org/W4294310861","https://openalex.org/W4308289344","https://openalex.org/W4311400684","https://openalex.org/W4375948081","https://openalex.org/W4377294773","https://openalex.org/W4398200022"],"related_works":["https://openalex.org/W2505063725","https://openalex.org/W2076712373","https://openalex.org/W3040446964","https://openalex.org/W2753193064","https://openalex.org/W2044160345","https://openalex.org/W2037666621","https://openalex.org/W1996801981","https://openalex.org/W2095508893","https://openalex.org/W2055743658","https://openalex.org/W2064699831"],"abstract_inverted_index":{"This":[0],"study":[1,72],"investigates":[2],"the":[3,50,55,63,91,98,107,117,125,138],"magneto-elastic":[4,92],"behavior":[5,86],"of":[6,52,109,127,140],"Iron-Silicon":[7],"single":[8],"crystals":[9],"with":[10,19],"predetermined":[11],"crystallographic":[12,114],"orientations.":[13],"For":[14,136],"that":[15],"purpose,":[16],"multi-crystalline":[17],"samples":[18,36],"a":[20,30,151],"large":[21],"single-crystal":[22],"in":[23,116,124,158],"their":[24],"central":[25],"area":[26],"were":[27,37,46],"cut":[28],"from":[29],"large-grain":[31],"high-permeability":[32],"electrical":[33],"steel.":[34],"The":[35,94],"subjected":[38],"to":[39,48,61,71,83,146],"tensile":[40],"stress.":[41],"Three":[42],"complementary":[43],"characterization":[44],"techniques":[45],"employed":[47],"explore":[49],"effect":[51],"stress":[53,134,157],"on":[54,90],"magnetization":[56,118],"mechanisms:":[57],"classical":[58],"hysteresis":[59],"loops":[60],"analyze":[62],"global":[64],"magnetic":[65,67,74,102,141],"response,":[66],"Barkhausen":[68,142],"noise":[69,143],"measurements":[70,82],"local":[73],"domain":[75],"dynamics":[76],"and":[77,80,87,103],"pinning":[78],"effects,":[79],"magnetostriction":[81],"quantify":[84],"strain":[85],"shed":[88],"light":[89],"coupling.":[93],"comparative":[95],"analysis":[96],"reveals":[97],"intricate":[99],"relationships":[100],"between":[101],"mechanical":[104],"properties,":[105],"emphasizing":[106],"role":[108],"microstructural":[110],"features":[111],"such":[112],"as":[113,150],"orientation":[115],"process.":[119],"These":[120],"findings":[121],"can":[122],"help":[123],"definition":[126],"optimal":[128],"non-destructive":[129],"testing":[130],"(NDT)":[131],"conditions":[132],"for":[133,154],"observation.":[135],"instance,":[137],"accumulation":[139],"energy":[144],"up":[145],"saturation":[147],"is":[148],"revealed":[149],"promising":[152],"indicator":[153],"indirectly":[155],"assessing":[156],"ferromagnetic":[159],"materials.":[160]},"counts_by_year":[{"year":2026,"cited_by_count":2}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}