{"id":"https://openalex.org/W4411408542","doi":"https://doi.org/10.1109/tim.2025.3580897","title":"Temperature-Enhanced Type Compensation Method for Large-Range Eddy Current Displacement Sensors","display_name":"Temperature-Enhanced Type Compensation Method for Large-Range Eddy Current Displacement Sensors","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4411408542","doi":"https://doi.org/10.1109/tim.2025.3580897"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3580897","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3580897","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101774648","display_name":"Jie Yuan","orcid":"https://orcid.org/0000-0002-5088-0152"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jie Yuan","raw_affiliation_strings":["School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030433279","display_name":"Kundong Wang","orcid":"https://orcid.org/0000-0003-3969-5148"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kundong Wang","raw_affiliation_strings":["School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085778888","display_name":"Huaming Lei","orcid":"https://orcid.org/0000-0002-0523-8005"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huaming Lei","raw_affiliation_strings":["School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072978256","display_name":"R. T. Zheng","orcid":"https://orcid.org/0009-0006-9615-6684"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Run Zheng","raw_affiliation_strings":["School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101886938","display_name":"Xin Chen","orcid":"https://orcid.org/0000-0001-8431-8304"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Chen","raw_affiliation_strings":["School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101774648"],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.13402933,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.7705596685409546},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.7208523154258728},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6222130060195923},{"id":"https://openalex.org/keywords/displacement","display_name":"Displacement (psychology)","score":0.5846378207206726},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.5549849271774292},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5289193391799927},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.48016586899757385},{"id":"https://openalex.org/keywords/displacement-current","display_name":"Displacement current","score":0.4767273962497711},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.43518736958503723},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4099341034889221},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.380659818649292},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22939085960388184},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.21961474418640137},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.08576437830924988}],"concepts":[{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.7705596685409546},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.7208523154258728},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6222130060195923},{"id":"https://openalex.org/C107551265","wikidata":"https://www.wikidata.org/wiki/Q1458245","display_name":"Displacement (psychology)","level":2,"score":0.5846378207206726},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.5549849271774292},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5289193391799927},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.48016586899757385},{"id":"https://openalex.org/C101142426","wikidata":"https://www.wikidata.org/wiki/Q853178","display_name":"Displacement current","level":3,"score":0.4767273962497711},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.43518736958503723},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4099341034889221},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.380659818649292},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22939085960388184},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21961474418640137},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.08576437830924988},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3580897","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3580897","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.800000011920929,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G4108946813","display_name":null,"funder_award_id":"52075339","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6271444105","display_name":null,"funder_award_id":"USCAST2023-26","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W2046316446","https://openalex.org/W2096941724","https://openalex.org/W2120334652","https://openalex.org/W2148782143","https://openalex.org/W2317924031","https://openalex.org/W2330813276","https://openalex.org/W2803260018","https://openalex.org/W2807804073","https://openalex.org/W2906791055","https://openalex.org/W2965096550","https://openalex.org/W2986559619","https://openalex.org/W3088364508","https://openalex.org/W3118267103","https://openalex.org/W3168099128","https://openalex.org/W3186312683","https://openalex.org/W4214925903","https://openalex.org/W4220768308","https://openalex.org/W4221010232","https://openalex.org/W4226357090","https://openalex.org/W4294643399","https://openalex.org/W4308344203","https://openalex.org/W4318827047","https://openalex.org/W4319865440","https://openalex.org/W4379232550","https://openalex.org/W4385152113","https://openalex.org/W4385330796","https://openalex.org/W4386858124","https://openalex.org/W4388692124","https://openalex.org/W4390285083","https://openalex.org/W4399557905"],"related_works":["https://openalex.org/W1625433261","https://openalex.org/W2290610200","https://openalex.org/W4392240820","https://openalex.org/W2097960635","https://openalex.org/W2070096540","https://openalex.org/W2159907922","https://openalex.org/W1968437424","https://openalex.org/W2937314749","https://openalex.org/W2132954179","https://openalex.org/W2146107442"],"abstract_inverted_index":{"Eddy":[0],"current":[1],"displacement":[2,71,111],"sensors":[3],"(ECDS)":[4,42],"are":[5,14],"widely":[6],"used":[7],"in":[8,91,142],"precision":[9,153],"industrial":[10],"applications,":[11],"but":[12],"they":[13],"susceptible":[15],"to":[16,58,124],"temperature":[17,21,33,46,62,77,89,99,120,144],"drift":[18,63,86,112],"under":[19],"varying":[20],"conditions,":[22],"which":[23],"limits":[24],"their":[25],"measurement":[26,136,154],"accuracy.":[27],"This":[28,48],"study":[29],"proposes":[30],"a":[31,44,119],"novel":[32],"compensation":[34],"method":[35,49,107,132],"aimed":[36],"at":[37],"improving":[38],"the":[39,61,65,69,76,92,130,135,152],"performance":[40],"of":[41,64,79,122,140],"across":[43],"broad":[45],"range.":[47],"utilizes":[50],"phase":[51],"characteristics":[52],"and":[53,85,138],"dual":[54],"AC":[55],"bridge":[56],"technology":[57],"effectively":[59,108],"separate":[60],"probe":[66,93],"coil":[67,94],"from":[68,113],"target":[70],"changes.":[72],"In":[73],"this":[74,106],"way,":[75],"stability":[78],"large-range":[80],"ECDS":[81,141],"is":[82,95],"significantly":[83,133],"enhanced,":[84],"caused":[87],"by":[88],"changes":[90],"further":[96],"eliminated":[97],"through":[98],"calibration.":[100],"Laboratory":[101],"tests":[102],"have":[103],"shown":[104],"that":[105,129],"reduces":[109],"temperature-related":[110],"2093":[114],"ppm/\u2103to":[115],"132":[116],"ppm/\u2103":[117],"within":[118],"range":[121],"20\u00b0C":[123],"100\u00b0C.":[125],"The":[126],"results":[127],"indicate":[128],"proposed":[131],"improves":[134],"accuracy":[137],"reliability":[139],"large":[143],"difference":[145],"environments,":[146],"providing":[147],"important":[148],"technical":[149],"support":[150],"for":[151],"field.":[155]},"counts_by_year":[],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-10-10T00:00:00"}