{"id":"https://openalex.org/W4411408586","doi":"https://doi.org/10.1109/tim.2025.3580881","title":"Aperture-Coded Long-Wave Infrared Hyperspectral Imager With Noncryogenic Optomechanical System","display_name":"Aperture-Coded Long-Wave Infrared Hyperspectral Imager With Noncryogenic Optomechanical System","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4411408586","doi":"https://doi.org/10.1109/tim.2025.3580881"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3580881","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3580881","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5092173121","display_name":"Xiang Li","orcid":"https://orcid.org/0009-0007-5335-0409"},"institutions":[{"id":"https://openalex.org/I4210135723","display_name":"Shanghai Institute of Technical Physics","ror":"https://ror.org/02txedb84","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210135723"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiang Li","raw_affiliation_strings":["Key Laboratory of Space Active Opto-Electronics Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Space Active Opto-Electronics Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China","institution_ids":["https://openalex.org/I4210135723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015698024","display_name":"Liyin Yuan","orcid":"https://orcid.org/0000-0003-0550-0285"},"institutions":[{"id":"https://openalex.org/I4210135723","display_name":"Shanghai Institute of Technical Physics","ror":"https://ror.org/02txedb84","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210135723"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liyin Yuan","raw_affiliation_strings":["Key Laboratory of Space Active Opto-Electronics Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Space Active Opto-Electronics Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China","institution_ids":["https://openalex.org/I4210135723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043137477","display_name":"Chunlai Li","orcid":"https://orcid.org/0000-0003-4364-6867"},"institutions":[{"id":"https://openalex.org/I4210135723","display_name":"Shanghai Institute of Technical Physics","ror":"https://ror.org/02txedb84","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210135723"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunlai Li","raw_affiliation_strings":["Key Laboratory of Space Active Opto-Electronics Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Space Active Opto-Electronics Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China","institution_ids":["https://openalex.org/I4210135723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035075892","display_name":"Xinze Liu","orcid":"https://orcid.org/0000-0001-5362-7948"},"institutions":[{"id":"https://openalex.org/I4210135723","display_name":"Shanghai Institute of Technical Physics","ror":"https://ror.org/02txedb84","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210135723"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinze Liu","raw_affiliation_strings":["Key Laboratory of Space Active Opto-Electronics Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Space Active Opto-Electronics Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China","institution_ids":["https://openalex.org/I4210135723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036318725","display_name":"B. Guo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210135723","display_name":"Shanghai Institute of Technical Physics","ror":"https://ror.org/02txedb84","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210135723"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bingmei Guo","raw_affiliation_strings":["Key Laboratory of Space Active Opto-Electronics Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Space Active Opto-Electronics Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China","institution_ids":["https://openalex.org/I4210135723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025869898","display_name":"Jiawei Lu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210135723","display_name":"Shanghai Institute of Technical Physics","ror":"https://ror.org/02txedb84","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210135723"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiawei Lu","raw_affiliation_strings":["Key Laboratory of Space Active Opto-Electronics Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Space Active Opto-Electronics Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China","institution_ids":["https://openalex.org/I4210135723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101823775","display_name":"Shijie Liu","orcid":"https://orcid.org/0000-0002-8932-5682"},"institutions":[{"id":"https://openalex.org/I4210137766","display_name":"Institute for Advanced Study","ror":"https://ror.org/03xg85719","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210137766"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Shijie Liu","raw_affiliation_strings":["Hangzhou Institute for Advanced Study, University of ChineseAcademy of Sciences, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"Hangzhou Institute for Advanced Study, University of ChineseAcademy of Sciences, Hangzhou, China","institution_ids":["https://openalex.org/I4210137766"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090578036","display_name":"Zhiping He","orcid":"https://orcid.org/0000-0003-3988-7369"},"institutions":[{"id":"https://openalex.org/I4210135723","display_name":"Shanghai Institute of Technical Physics","ror":"https://ror.org/02txedb84","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210135723"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiping He","raw_affiliation_strings":["Key Laboratory of Space Active Opto-Electronics Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Space Active Opto-Electronics Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, China","institution_ids":["https://openalex.org/I4210135723"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5092173121"],"corresponding_institution_ids":["https://openalex.org/I4210135723"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16015409,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12050","display_name":"Optical Polarization and Ellipsometry","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12050","display_name":"Optical Polarization and Ellipsometry","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13493","display_name":"Optical and Acousto-Optic Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hyperspectral-imaging","display_name":"Hyperspectral imaging","score":0.8254379034042358},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.6691076755523682},{"id":"https://openalex.org/keywords/infrared","display_name":"Infrared","score":0.6260817050933838},{"id":"https://openalex.org/keywords/aperture","display_name":"Aperture (computer memory)","score":0.5377732515335083},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.5192318558692932},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5012645721435547},{"id":"https://openalex.org/keywords/coded-aperture","display_name":"Coded aperture","score":0.49761632084846497},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3342655301094055},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.32135704159736633},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.2113196849822998},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.14380845427513123},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.12426623702049255}],"concepts":[{"id":"https://openalex.org/C159078339","wikidata":"https://www.wikidata.org/wiki/Q959005","display_name":"Hyperspectral imaging","level":2,"score":0.8254379034042358},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6691076755523682},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.6260817050933838},{"id":"https://openalex.org/C78336883","wikidata":"https://www.wikidata.org/wiki/Q4779385","display_name":"Aperture (computer memory)","level":2,"score":0.5377732515335083},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.5192318558692932},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5012645721435547},{"id":"https://openalex.org/C2779464207","wikidata":"https://www.wikidata.org/wiki/Q4226196","display_name":"Coded aperture","level":3,"score":0.49761632084846497},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3342655301094055},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.32135704159736633},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.2113196849822998},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.14380845427513123},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.12426623702049255}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3580881","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3580881","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4942433574","display_name":null,"funder_award_id":"D040107","funder_id":"https://openalex.org/F4320321133","funder_display_name":"Chinese Academy of Sciences"},{"id":"https://openalex.org/G6865309876","display_name":null,"funder_award_id":"Y2021071","funder_id":"https://openalex.org/F4320322847","funder_display_name":"Youth Innovation Promotion Association of the Chinese Academy of Sciences"},{"id":"https://openalex.org/G8437389102","display_name":null,"funder_award_id":"Y202058","funder_id":"https://openalex.org/F4320322847","funder_display_name":"Youth Innovation Promotion Association of the Chinese Academy of Sciences"}],"funders":[{"id":"https://openalex.org/F4320321133","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35"},{"id":"https://openalex.org/F4320322847","display_name":"Youth Innovation Promotion Association of the Chinese Academy of Sciences","ror":"https://ror.org/031141b54"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1931038821","https://openalex.org/W1964943395","https://openalex.org/W1968971721","https://openalex.org/W1998707647","https://openalex.org/W2007814781","https://openalex.org/W2008196438","https://openalex.org/W2009304150","https://openalex.org/W2041460684","https://openalex.org/W2045379282","https://openalex.org/W2084591647","https://openalex.org/W2121194215","https://openalex.org/W2127271355","https://openalex.org/W2132984323","https://openalex.org/W2292381980","https://openalex.org/W2294004470","https://openalex.org/W2519100425","https://openalex.org/W2751310355","https://openalex.org/W2967978933","https://openalex.org/W3042268330","https://openalex.org/W3173878314","https://openalex.org/W3182155920","https://openalex.org/W4313203901","https://openalex.org/W4318196266","https://openalex.org/W4387872588"],"related_works":["https://openalex.org/W2072166414","https://openalex.org/W2385371209","https://openalex.org/W4250051149","https://openalex.org/W2083270190","https://openalex.org/W1970762771","https://openalex.org/W2020022812","https://openalex.org/W2072500068","https://openalex.org/W2926694756","https://openalex.org/W3003562737","https://openalex.org/W2333188462"],"abstract_inverted_index":{"The":[0],"long-wave":[1],"infrared":[2],"(LWIR)":[3],"hyperspectral":[4,128],"imagers":[5],"(HSIs)":[6],"typically":[7],"necessitate":[8],"deep":[9,134],"cooling":[10,135],"of":[11,41,58,67,80,115,130,136,156,186,197,202],"their":[12],"opto-mechanical":[13,138,212],"systems":[14,43],"to":[15,125,159,181],"reduce":[16],"instrument":[17],"background":[18,32],"signal,":[19],"thereby":[20],"preventing":[21],"extremely":[22],"weak":[23],"target":[24,106],"signal":[25],"from":[26],"being":[27],"drowned":[28],"out":[29],"by":[30],"the":[31,37,52,59,65,92,109,113,116,137,143,154,167,184,193,200,206,211],"signal.":[33],"This":[34],"treatment":[35],"entails":[36],"design":[38,66],"and":[39,44,54,83,150,163,175,199],"implementation":[40],"refrigeration":[42],"cryogenic":[45],"optical":[46],"systems,":[47],"posing":[48],"significant":[49],"demands":[50],"on":[51,72],"weight":[53],"power":[55],"consumption":[56],"resources":[57],"working":[60],"platform.":[61],"Here,":[62],"we":[63,141],"present":[64],"a":[68,77,131],"LWIR":[69,127],"HSI":[70,99,124,158],"based":[71],"aperture":[73],"coding":[74],"which":[75,121],"features":[76],"spatial":[78],"resolution":[79],"221\u00d7256":[81],"pixels":[82],"100":[84],"spectral":[85,118,164,171,195,208],"channels":[86],"in":[87,112,166,205],"8-12.5\u03bcm":[88],"band.":[89],"Compared":[90],"with":[91,210],"traditional":[93],"single":[94],"slit":[95],"scanning":[96],"HSI,":[97],"our":[98,123,157,187],"acquires":[100],"approximately":[101,203],"50":[102],"times":[103],"more":[104],"enhanced":[105],"radiation":[107],"at":[108,215],"focal":[110],"plane":[111],"case":[114],"same":[117],"channel":[119],"number,":[120],"enables":[122],"acquire":[126,160],"measurements":[129],"scene":[132],"without":[133],"system.":[139],"Lastly,":[140],"show":[142],"imaging":[144],"results":[145,191],"for":[146],"both":[147,161],"indoor":[148],"targets":[149],"outdoor":[151],"targets,":[152],"demonstrating":[153],"ability":[155],"geometric":[162],"information":[165],"scene.":[168],"We":[169],"utilize":[170],"angle":[172],"mapper":[173],"(SAM)":[174],"noise":[176],"equivalent":[177],"temperature":[178],"difference":[179],"(NETD)":[180],"quantitatively":[182],"evaluate":[183],"performance":[185],"HSI.":[188],"Our":[189],"experimental":[190],"reveal":[192],"average":[194],"similarity":[196],"94.2%":[198],"NETD":[201],"0.3K@300K":[204],"8.5-11\u03bcm":[207],"band,":[209],"system":[213],"maintained":[214],"room":[216],"temperature.":[217]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}