{"id":"https://openalex.org/W4411408536","doi":"https://doi.org/10.1109/tim.2025.3580878","title":"A Multiscale Feature Residual Network With Staged Optimization for Unsupervised Cross-Domain Fault Diagnosis","display_name":"A Multiscale Feature Residual Network With Staged Optimization for Unsupervised Cross-Domain Fault Diagnosis","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4411408536","doi":"https://doi.org/10.1109/tim.2025.3580878"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3580878","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3580878","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102860626","display_name":"Changbo He","orcid":"https://orcid.org/0000-0003-4180-5334"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Changbo He","raw_affiliation_strings":["College of Electrical Engineering and Automation, Anhui University, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-4180-5334","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering and Automation, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Qi Meng","orcid":"https://orcid.org/0009-0004-8800-6833"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Meng","raw_affiliation_strings":["College of Electrical Engineering and Automation, Anhui University, Hefei, China"],"raw_orcid":"https://orcid.org/0009-0004-8800-6833","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering and Automation, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091820245","display_name":"Peng Chen","orcid":"https://orcid.org/0000-0002-3265-3079"},"institutions":[{"id":"https://openalex.org/I32574673","display_name":"Shantou University","ror":"https://ror.org/01a099706","country_code":"CN","type":"education","lineage":["https://openalex.org/I32574673"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Chen","raw_affiliation_strings":["College of Engineering and the Key Laboratory of Intelligent Manufacturing Technology, Ministry of Education of China, Shantou University, Shantou, Guangdong, China","Ministry of Education of China, College of Engineering and the Key Laboratory of Intelligent Manufacturing Technology, Shantou University, Shantou, Guangdong, China"],"raw_orcid":"https://orcid.org/0000-0002-3265-3079","affiliations":[{"raw_affiliation_string":"College of Engineering and the Key Laboratory of Intelligent Manufacturing Technology, Ministry of Education of China, Shantou University, Shantou, Guangdong, China","institution_ids":["https://openalex.org/I32574673"]},{"raw_affiliation_string":"Ministry of Education of China, College of Engineering and the Key Laboratory of Intelligent Manufacturing Technology, Shantou University, Shantou, Guangdong, China","institution_ids":["https://openalex.org/I32574673"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012215363","display_name":"Yaqiang Jin","orcid":"https://orcid.org/0000-0001-9072-7948"},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]},{"id":"https://openalex.org/I4210109718","display_name":"Shandong Transportation Research Institute","ror":"https://ror.org/01wcts620","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210109718"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yaqiang Jin","raw_affiliation_strings":["School of Qilu Transportation, Shandong University, Jinan, China"],"raw_orcid":"https://orcid.org/0000-0001-9072-7948","affiliations":[{"raw_affiliation_string":"School of Qilu Transportation, Shandong University, Jinan, China","institution_ids":["https://openalex.org/I4210109718","https://openalex.org/I154099455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066173871","display_name":"Wei Fan","orcid":"https://orcid.org/0000-0002-5980-4527"},"institutions":[{"id":"https://openalex.org/I115592961","display_name":"Jiangsu University","ror":"https://ror.org/03jc41j30","country_code":"CN","type":"education","lineage":["https://openalex.org/I115592961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Fan","raw_affiliation_strings":["School of Mechanical Engineering, Jiangsu University, Zhenjiang, China","School of Mechanical Engineering, Jiangsu University, Zhenjiang, P.R. China"],"raw_orcid":"https://orcid.org/0000-0002-5980-4527","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Jiangsu University, Zhenjiang, China","institution_ids":["https://openalex.org/I115592961"]},{"raw_affiliation_string":"School of Mechanical Engineering, Jiangsu University, Zhenjiang, P.R. China","institution_ids":["https://openalex.org/I115592961"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101866259","display_name":"Zhibo Yang","orcid":"https://orcid.org/0000-0002-9815-5013"},"institutions":[{"id":"https://openalex.org/I87445476","display_name":"Xi'an Jiaotong University","ror":"https://ror.org/017zhmm22","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhibo Yang","raw_affiliation_strings":["State Key Laboratory for Manufacturing and Systems Engineering, Xi’an Jiaotong University, Xi’an, China"],"raw_orcid":"https://orcid.org/0000-0002-9815-5013","affiliations":[{"raw_affiliation_string":"State Key Laboratory for Manufacturing and Systems Engineering, Xi’an Jiaotong University, Xi’an, China","institution_ids":["https://openalex.org/I87445476"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5102860626"],"corresponding_institution_ids":["https://openalex.org/I143868143"],"apc_list":null,"apc_paid":null,"fwci":1.0999,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.781911,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9728999733924866,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9728999733924866,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9713000059127808,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.9469000101089478,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.7545903325080872},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6470432281494141},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.5460666418075562},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.541777491569519},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5182080864906311},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5032641291618347},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4939437508583069},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4771423041820526},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.4719713628292084},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.20217126607894897},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1390966773033142}],"concepts":[{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.7545903325080872},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6470432281494141},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.5460666418075562},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.541777491569519},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5182080864906311},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5032641291618347},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4939437508583069},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4771423041820526},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.4719713628292084},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.20217126607894897},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1390966773033142},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3580878","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3580878","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7099999785423279,"id":"https://metadata.un.org/sdg/13","display_name":"Climate action"}],"awards":[{"id":"https://openalex.org/G1663162310","display_name":null,"funder_award_id":"2025A1515012256","funder_id":"https://openalex.org/F4320317781","funder_display_name":"Guangdong Provincial Postdoctoral Science Foundation"},{"id":"https://openalex.org/G2871344575","display_name":null,"funder_award_id":"52305085","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5237276257","display_name":null,"funder_award_id":"2025A1515012256","funder_id":"https://openalex.org/F4320337111","funder_display_name":"Basic and Applied Basic Research Foundation of Guangdong Province"},{"id":"https://openalex.org/G6524235382","display_name":null,"funder_award_id":"2023M740021","funder_id":"https://openalex.org/F4320321543","funder_display_name":"China Postdoctoral Science Foundation"},{"id":"https://openalex.org/G962627534","display_name":null,"funder_award_id":"52105111","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320317781","display_name":"Guangdong Provincial Postdoctoral Science Foundation","ror":null},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321543","display_name":"China Postdoctoral Science Foundation","ror":"https://ror.org/0426zh255"},{"id":"https://openalex.org/F4320337111","display_name":"Basic and Applied Basic Research Foundation of Guangdong Province","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W243674440","https://openalex.org/W2064323378","https://openalex.org/W2194775991","https://openalex.org/W2530133016","https://openalex.org/W2556345765","https://openalex.org/W2752782242","https://openalex.org/W2889945482","https://openalex.org/W2904218127","https://openalex.org/W2919115771","https://openalex.org/W2921717016","https://openalex.org/W2963532621","https://openalex.org/W2963840672","https://openalex.org/W2964288524","https://openalex.org/W2991521245","https://openalex.org/W2998115938","https://openalex.org/W3009370740","https://openalex.org/W3023275964","https://openalex.org/W3041173183","https://openalex.org/W3158768656","https://openalex.org/W3188482078","https://openalex.org/W3201753566","https://openalex.org/W4250482878","https://openalex.org/W4284889614","https://openalex.org/W4295529416","https://openalex.org/W4309078085","https://openalex.org/W4324290422","https://openalex.org/W4390044439","https://openalex.org/W4400134761","https://openalex.org/W4401836816","https://openalex.org/W4404452017","https://openalex.org/W6683633756","https://openalex.org/W6713955831","https://openalex.org/W6751923770","https://openalex.org/W6755977528","https://openalex.org/W6852177738"],"related_works":["https://openalex.org/W2560215812","https://openalex.org/W2949601986","https://openalex.org/W2788972299","https://openalex.org/W2521347458","https://openalex.org/W2498789492","https://openalex.org/W2972212393","https://openalex.org/W4385301753","https://openalex.org/W3186428265","https://openalex.org/W2171501125","https://openalex.org/W2617234683"],"abstract_inverted_index":{"In":[0],"the":[1,7,18,22,27,82,87,107,127,130,135,141],"fault":[2],"diagnosis":[3],"of":[4,26,30,129,137],"industrial":[5],"equipment,":[6],"traditional":[8],"supervised":[9],"learning":[10],"method":[11,103],"is":[12,46,78,104],"difficult":[13],"to":[14,64,110],"effectively":[15],"deal":[16],"with":[17,42],"unlabeled":[19,138],"data":[20,139],"in":[21,48,133,140],"target":[23,142],"domain":[24],"because":[25],"significant":[28],"differences":[29],"working":[31],"modes.":[32],"To":[33],"address":[34],"this":[35,49],"issue,":[36],"a":[37,73,100],"multi-scale":[38,74],"feature":[39,66,75,97],"residual":[40,60,76,88],"network":[41,77],"staged":[43,101],"optimization":[44,102],"(MFSResnet)":[45],"proposed":[47,131],"paper.":[50],"First,":[51],"an":[52,91],"enhanced":[53,83],"dilated":[54,84],"convolution":[55,85],"module":[56,94],"and":[57,90,124,144],"two":[58,120],"novel":[59],"blocks":[61],"are":[62],"designed":[63],"improve":[65],"representation":[67],"ability.":[68],"Building":[69],"on":[70,119],"these":[71],"components,":[72],"then":[79],"proposed,":[80],"integrating":[81],"module,":[86],"blocks,":[89],"SE":[92],"attention":[93],"for":[95],"effective":[96],"extraction.":[98],"Additionally,":[99],"employed":[105],"throughout":[106],"training":[108],"process":[109],"optimize":[111],"multiple":[112],"loss":[113],"functions.":[114],"Finally,":[115],"experiments":[116],"analysis":[117],"conducted":[118],"bearing":[121],"datasets,":[122],"CWRU":[123],"PU,":[125],"demonstrate":[126],"efficacy":[128],"approach":[132],"addressing":[134],"challenge":[136],"domain,":[143],"its":[145],"superiority":[146],"over":[147],"existing":[148],"methods.":[149]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}