{"id":"https://openalex.org/W4410583833","doi":"https://doi.org/10.1109/tim.2025.3572161","title":"Design and Analysis of a Wide-Range Low-Current Digitizing Platform for Spacecraft-Mounted Plasma Diagnostic Probes","display_name":"Design and Analysis of a Wide-Range Low-Current Digitizing Platform for Spacecraft-Mounted Plasma Diagnostic Probes","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4410583833","doi":"https://doi.org/10.1109/tim.2025.3572161"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3572161","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3572161","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009341669","display_name":"Sreehari Balachandran Nair","orcid":"https://orcid.org/0000-0001-5959-3638"},"institutions":[{"id":"https://openalex.org/I882761360","display_name":"Indian Institute of Space Science and Technology","ror":"https://ror.org/05k37ht14","country_code":"IN","type":"education","lineage":["https://openalex.org/I882761360"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Sreehari Balachandran Nair","raw_affiliation_strings":["Department of Avionics, Indian Institute of Space Science and Technology, Thiruvananthapuram, India"],"raw_orcid":"https://orcid.org/0000-0001-5959-3638","affiliations":[{"raw_affiliation_string":"Department of Avionics, Indian Institute of Space Science and Technology, Thiruvananthapuram, India","institution_ids":["https://openalex.org/I882761360"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041679557","display_name":"C. S. Anoop","orcid":"https://orcid.org/0000-0003-4819-7386"},"institutions":[{"id":"https://openalex.org/I882761360","display_name":"Indian Institute of Space Science and Technology","ror":"https://ror.org/05k37ht14","country_code":"IN","type":"education","lineage":["https://openalex.org/I882761360"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Anoop Chandrika Sreekantan","raw_affiliation_strings":["Department of Avionics, Indian Institute of Space Science and Technology, Thiruvananthapuram, India"],"raw_orcid":"https://orcid.org/0000-0003-4819-7386","affiliations":[{"raw_affiliation_string":"Department of Avionics, Indian Institute of Space Science and Technology, Thiruvananthapuram, India","institution_ids":["https://openalex.org/I882761360"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079465965","display_name":"R. Sudharshan Kaarthik","orcid":"https://orcid.org/0000-0002-5179-714X"},"institutions":[{"id":"https://openalex.org/I882761360","display_name":"Indian Institute of Space Science and Technology","ror":"https://ror.org/05k37ht14","country_code":"IN","type":"education","lineage":["https://openalex.org/I882761360"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"R. Sudharshan Kaarthik","raw_affiliation_strings":["Department of Avionics, Indian Institute of Space Science and Technology, Thiruvananthapuram, India"],"raw_orcid":"https://orcid.org/0000-0002-5179-714X","affiliations":[{"raw_affiliation_string":"Department of Avionics, Indian Institute of Space Science and Technology, Thiruvananthapuram, India","institution_ids":["https://openalex.org/I882761360"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5009341669"],"corresponding_institution_ids":["https://openalex.org/I882761360"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0877289,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10781","display_name":"Plasma Diagnostics and Applications","score":0.9894000291824341,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10781","display_name":"Plasma Diagnostics and Applications","score":0.9894000291824341,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9585999846458435,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9409999847412109,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spacecraft","display_name":"Spacecraft","score":0.7717667818069458},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5677891969680786},{"id":"https://openalex.org/keywords/spacecraft-charging","display_name":"Spacecraft charging","score":0.5244410634040833},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4795624613761902},{"id":"https://openalex.org/keywords/plasma","display_name":"Plasma","score":0.4756214916706085},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42371857166290283},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.42307624220848083},{"id":"https://openalex.org/keywords/plasma-diagnostics","display_name":"Plasma diagnostics","score":0.42018526792526245},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3854008615016937},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3288126587867737},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3083053529262543}],"concepts":[{"id":"https://openalex.org/C29829512","wikidata":"https://www.wikidata.org/wiki/Q40218","display_name":"Spacecraft","level":2,"score":0.7717667818069458},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5677891969680786},{"id":"https://openalex.org/C2776463981","wikidata":"https://www.wikidata.org/wiki/Q7572666","display_name":"Spacecraft charging","level":3,"score":0.5244410634040833},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4795624613761902},{"id":"https://openalex.org/C82706917","wikidata":"https://www.wikidata.org/wiki/Q10251","display_name":"Plasma","level":2,"score":0.4756214916706085},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42371857166290283},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.42307624220848083},{"id":"https://openalex.org/C43503373","wikidata":"https://www.wikidata.org/wiki/Q7201771","display_name":"Plasma diagnostics","level":3,"score":0.42018526792526245},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3854008615016937},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3288126587867737},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3083053529262543},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3572161","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3572161","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6399999856948853}],"awards":[],"funders":[{"id":"https://openalex.org/F4320336990","display_name":"Indian Institute of Space Science and Technology","ror":"https://ror.org/05k37ht14"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W788186576","https://openalex.org/W1973039706","https://openalex.org/W1981652521","https://openalex.org/W1985397964","https://openalex.org/W1988286490","https://openalex.org/W1992249483","https://openalex.org/W1998503048","https://openalex.org/W2006416639","https://openalex.org/W2022776995","https://openalex.org/W2075617494","https://openalex.org/W2083257502","https://openalex.org/W2105298634","https://openalex.org/W2108060133","https://openalex.org/W2134915463","https://openalex.org/W2163360095","https://openalex.org/W2283914786","https://openalex.org/W2515266617","https://openalex.org/W2624782492","https://openalex.org/W2744855382","https://openalex.org/W2790578387","https://openalex.org/W2903601868","https://openalex.org/W2915925867","https://openalex.org/W2921331767","https://openalex.org/W2971777056","https://openalex.org/W3033098781","https://openalex.org/W3132460201","https://openalex.org/W3184044272","https://openalex.org/W3190819389","https://openalex.org/W3210357792","https://openalex.org/W4210407030","https://openalex.org/W4319865979","https://openalex.org/W4385325140","https://openalex.org/W4387986969","https://openalex.org/W4392405803","https://openalex.org/W4402303617","https://openalex.org/W6745444357"],"related_works":["https://openalex.org/W4207051791","https://openalex.org/W2734424875","https://openalex.org/W808042145","https://openalex.org/W3173684615","https://openalex.org/W4248260302","https://openalex.org/W1487784162","https://openalex.org/W1563522559","https://openalex.org/W801624745","https://openalex.org/W2057424080","https://openalex.org/W3211519427"],"abstract_inverted_index":{"This":[0,45],"paper":[1,117,232],"presents":[2],"a":[3,23,32,41,140,152,157,178,222],"digitizing":[4],"platform":[5,186,225],"specifically":[6],"designed":[7,87],"and":[8,70,81,122,132,164,193,237,245],"developed":[9],"for":[10,139,226,239],"interfacing":[11],"spacecraft-mounted":[12],"plasma":[13,227],"diagnostic":[14,228],"probes.":[15,229],"These":[16],"probes":[17],"are":[18],"typically":[19],"current-output":[20],"sensors":[21],"with":[22,74,130,177,190],"wide":[24],"dynamic":[25],"range.":[26],"The":[27,84,116,135,182,202],"proposed":[28,127,218],"circuit":[29,47],"consists":[30],"of":[31,65,92,112,125,143,155,160,184],"probe-specific":[33],"converter":[34],"as":[35,221],"the":[36,50,55,66,90,107,119,126,171,185,209,217,231,234],"primary":[37],"stage,":[38],"followed":[39],"by":[40],"programmable-gain":[42],"analog":[43],"backend.":[44],"backend":[46],"intelligently":[48],"selects":[49],"appropriate":[51],"gain":[52],"based":[53],"on":[54],"input":[56,210],"current":[57,76,141,173,200,211],"magnitude,":[58],"thereby":[59],"minimizing":[60],"digitization":[61],"errors.":[62],"Key":[63],"features":[64],"scheme":[67,219,242],"include":[68],"precise":[69],"controlled":[71],"measurement":[72],"accuracy":[73],"bipolar":[75],"sensing,":[77],"minimal":[78],"error":[79,100],"influence,":[80],"fast":[82],"response.":[83],"architecture":[85],"is":[86,103,137],"to":[88,105,146,207],"mitigate":[89],"effects":[91],"ON":[93],"resistance":[94],"in":[95,243],"gain-stage":[96],"switches.":[97],"Additionally,":[98,230],"an":[99,165],"compensation":[101],"mechanism":[102],"introduced":[104],"ensure":[106],"sensor":[108],"output":[109,203],"remains":[110],"independent":[111],"its":[113],"operating":[114],"conditions.":[115],"details":[118],"design,":[120],"error,":[121],"noise":[123],"analysis":[124],"platform,":[128],"along":[129],"simulation":[131],"experimental":[133],"results.":[134],"system":[136],"evaluated":[138],"range":[142],"\u00b1500":[144],"pA":[145],"\u00b15":[147],"\u03bcA.":[148],"Hardware":[149],"tests":[150],"demonstrate":[151],"maximum":[153],"nonlinearity":[154],"1.15%,":[156],"conversion":[158],"time":[159],"approximately":[161],"5":[162],"ms,":[163],"SNR":[166],"exceeding":[167],"46":[168],"dB,":[169],"across":[170],"entire":[172],"span":[174],"when":[175],"used":[176],"10-bit,":[179],"5V":[180],"ADC.":[181],"effectiveness":[183],"was":[187,205],"further":[188],"tested":[189],"Langmuir":[191],"Probes":[192],"Retarding":[194],"Potential":[195],"Analyzers":[196],"using":[197],"their":[198],"respective":[199],"profiles.":[201],"profile":[204],"observed":[206],"trace":[208],"profile.":[212],"Test":[213],"results":[214],"confirm":[215],"that":[216],"serves":[220],"cost-effective,":[223],"universal":[224],"discusses":[233],"design":[235],"considerations":[236],"guidelines":[238],"implementing":[240],"this":[241],"space":[244],"other":[246],"relevant":[247],"applications.":[248]},"counts_by_year":[],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}