{"id":"https://openalex.org/W4410359274","doi":"https://doi.org/10.1109/tim.2025.3569883","title":"A High Timing Resolution and Data Rate Pulse Generator for Automatic Test Equipment Applications","display_name":"A High Timing Resolution and Data Rate Pulse Generator for Automatic Test Equipment Applications","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4410359274","doi":"https://doi.org/10.1109/tim.2025.3569883"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3569883","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3569883","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025566121","display_name":"Jen\u2010Chieh Liu","orcid":"https://orcid.org/0000-0002-7045-6586"},"institutions":[{"id":"https://openalex.org/I125934054","display_name":"National United University","ror":"https://ror.org/04twccc71","country_code":"TW","type":"education","lineage":["https://openalex.org/I125934054"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Jen-Chieh Liu","raw_affiliation_strings":["Department of Electrical Engineering, National United University, Miaoli, Taiwan","Department of Electrical Engineering, National United University, Miaoli, Taiwan (R.O.C.)"],"raw_orcid":"https://orcid.org/0000-0002-7045-6586","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National United University, Miaoli, Taiwan","institution_ids":["https://openalex.org/I125934054"]},{"raw_affiliation_string":"Department of Electrical Engineering, National United University, Miaoli, Taiwan (R.O.C.)","institution_ids":["https://openalex.org/I125934054"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070363184","display_name":"Chi-Hua Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I125934054","display_name":"National United University","ror":"https://ror.org/04twccc71","country_code":"TW","type":"education","lineage":["https://openalex.org/I125934054"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chi-Hua Chen","raw_affiliation_strings":["Department of Electrical Engineering, National United University, Miaoli, Taiwan","Department of Electrical Engineering, National United University, Miaoli, Taiwan (R.O.C.)"],"raw_orcid":"https://orcid.org/0009-0008-5990-1950","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National United University, Miaoli, Taiwan","institution_ids":["https://openalex.org/I125934054"]},{"raw_affiliation_string":"Department of Electrical Engineering, National United University, Miaoli, Taiwan (R.O.C.)","institution_ids":["https://openalex.org/I125934054"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041027776","display_name":"Chengxuan Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I125934054","display_name":"National United University","ror":"https://ror.org/04twccc71","country_code":"TW","type":"education","lineage":["https://openalex.org/I125934054"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Cheng-En Wu","raw_affiliation_strings":["Department of Electrical Engineering, National United University, Miaoli, Taiwan","Department of Electrical Engineering, National United University, Miaoli, Taiwan (R.O.C.)"],"raw_orcid":"https://orcid.org/0009-0005-3292-8270","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National United University, Miaoli, Taiwan","institution_ids":["https://openalex.org/I125934054"]},{"raw_affiliation_string":"Department of Electrical Engineering, National United University, Miaoli, Taiwan (R.O.C.)","institution_ids":["https://openalex.org/I125934054"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5025566121"],"corresponding_institution_ids":["https://openalex.org/I125934054"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.1061573,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9769999980926514,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9763000011444092,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.6176720857620239},{"id":"https://openalex.org/keywords/test-equipment","display_name":"Test equipment","score":0.5558809638023376},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4991304874420166},{"id":"https://openalex.org/keywords/pulse-generator","display_name":"Pulse generator","score":0.46462708711624146},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.429749995470047},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.4285414218902588},{"id":"https://openalex.org/keywords/system-testing","display_name":"System testing","score":0.42196720838546753},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3820345103740692},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.30859625339508057},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2716357111930847},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.2013990581035614},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1950562596321106},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.13531339168548584}],"concepts":[{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.6176720857620239},{"id":"https://openalex.org/C2983725658","wikidata":"https://www.wikidata.org/wiki/Q7705768","display_name":"Test equipment","level":2,"score":0.5558809638023376},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4991304874420166},{"id":"https://openalex.org/C51319974","wikidata":"https://www.wikidata.org/wiki/Q3509564","display_name":"Pulse generator","level":3,"score":0.46462708711624146},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.429749995470047},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.4285414218902588},{"id":"https://openalex.org/C7166840","wikidata":"https://www.wikidata.org/wiki/Q1199682","display_name":"System testing","level":2,"score":0.42196720838546753},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3820345103740692},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.30859625339508057},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2716357111930847},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.2013990581035614},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1950562596321106},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.13531339168548584},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3569883","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3569883","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7200000286102295,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1985740413","https://openalex.org/W2071060149","https://openalex.org/W2131515592","https://openalex.org/W2134713152","https://openalex.org/W2147078733","https://openalex.org/W2148093371","https://openalex.org/W2466301954","https://openalex.org/W2782157112","https://openalex.org/W2783815772","https://openalex.org/W2945007033","https://openalex.org/W3044100547","https://openalex.org/W3178931952","https://openalex.org/W4387491075","https://openalex.org/W4391640275","https://openalex.org/W4404056580","https://openalex.org/W4407900555","https://openalex.org/W6662566798"],"related_works":["https://openalex.org/W2804445880","https://openalex.org/W1576709211","https://openalex.org/W2013730419","https://openalex.org/W2399945334","https://openalex.org/W2886943583","https://openalex.org/W1484726954","https://openalex.org/W2374839528","https://openalex.org/W2039845474","https://openalex.org/W2536501001","https://openalex.org/W2082719370"],"abstract_inverted_index":{"Arbitrary":[0],"waveform":[1,77],"generators":[2,7,18],"(AWG)":[3],"and":[4,24,67,85,90,101,175,181,260,283,304,308,314],"algorithmic":[5],"pattern":[6],"(ALPG)":[8],"typically":[9],"adopt":[10],"the":[11,21,96,106,110,113,116,146,153,207,211,215,225,229,252,257,296,305],"functionality":[12],"achieved":[13],"by":[14],"combining":[15],"multiple":[16,36],"pulse":[17],"(PGs).":[19],"If":[20],"data":[22,98,292],"rate":[23,99,293],"timing":[25,51,80,102,143,173,227,248,306],"resolution":[26,52,144,174,307],"of":[27,53,82,145,210,254,278,286,295],"a":[28,41,50,68,75,79,87,121,126,197,234,270,275,322],"single":[29],"PG":[30,48,61,216,297,324],"can":[31,190],"be":[32],"efficiently":[33],"improved,":[34],"using":[35,269],"PGs":[37],"will":[38],"result":[39],"in":[40,44,239,256],"multiplicative":[42],"increase":[43],"performance.":[45],"The":[46,59,72,142,156,186,264,291],"2Gbps":[47],"with":[49,78,109,133,233,274],"1.97":[54,83,312],"ps":[55,84,313],"has":[56],"been":[57],"designed.":[58],"proposed":[60,203,230],"uses":[62,115],"an":[63,91,161],"edge":[64],"combiner":[65],"(EC)":[66],"phase-locked":[69],"loop":[70],"(PLL).":[71],"EC":[73,114],"provides":[74],"programmable":[76],"interval":[81],"employs":[86],"counter":[88],"scheme":[89,189,201],"MOS":[92,231],"varactor":[93,232],"to":[94,124,137,164,204,217,243,301],"define":[95],"operational":[97,128],"range":[100,177,209,294],"resolution.":[103,167],"To":[104],"combine":[105],"period":[107],"window":[108,136],"PLL":[111,154],"output,":[112],"WIN":[117,130],"controller,":[118],"which":[119],"incorporates":[120],"count-up":[122],"counter,":[123],"enable":[125],"wide":[127],"range.":[129],"controller":[131],"operates":[132],"only":[134],"one":[135],"simplify":[138],"its":[139],"sampled":[140],"circuit.":[141],"coarse-tuning":[147],"stage":[148,158],"(CTS)":[149],"was":[150,267],"determined":[151],"from":[152],"period.":[155],"fine-tuning":[157],"(FTS)":[159],"introduces":[160],"auto-calibration":[162,169],"circuit":[163],"achieve":[165,191,244],"high-timing":[166],"This":[168],"technique":[170],"ensures":[171],"consistent":[172],"tuning":[176,208],"under":[178,221],"process,":[179,273],"voltage,":[180],"temperature":[182],"variations":[183],"(PVT)":[184],"variations.":[185,223],"digital-type":[187],"calibration":[188],"low":[192],"power":[193,262,284],"consumption.":[194,263],"In":[195],"addition,":[196],"replica":[198],"delay":[199,258],"line":[200,259],"is":[202,241,325],"compensate":[205],"for":[206,247,328],"FTS,":[212],"thereby":[213,250],"enabling":[214],"maintain":[218],"high-accuracy":[219],"waveforms":[220],"PVT":[222],"For":[224],"high":[226],"resolution,":[228,249],"digital-to-analog":[235],"converter,":[236],"DACs,":[237],"(MOS-DAC)":[238],"FTS":[240],"adopted":[242],"multi-bit":[245],"control":[246],"reducing":[251],"number":[253],"stages":[255],"minimizing":[261],"test":[265,330],"chip":[266],"fabricated":[268],"90-nm":[271],"CMOS":[272],"core":[276],"area":[277],"215":[279],"\u00d7":[280],"367":[281],"\u03bcm2":[282],"consumption":[285],"less":[287],"than":[288],"10.55":[289],"mW.":[290],"spanned":[298],"977.6":[299],"kbps":[300],"2":[302],"Gbps,":[303],"average":[309],"accuracy":[310],"were":[311],"\u00b11.18":[315],"LSB":[316],"(Least":[317],"Significant":[318],"Bit),":[319],"respectively.":[320],"Therefore,":[321],"well-designed":[323],"highly":[326],"beneficial":[327],"automatic":[329],"equipment":[331],"(ATE)":[332],"systems.":[333]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}