{"id":"https://openalex.org/W4410294719","doi":"https://doi.org/10.1109/tim.2025.3568997","title":"Hint-DETR: A Transfer Learning Model Based on DETR for Few-Shot Defect Detection","display_name":"Hint-DETR: A Transfer Learning Model Based on DETR for Few-Shot Defect Detection","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4410294719","doi":"https://doi.org/10.1109/tim.2025.3568997"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3568997","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3568997","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068679305","display_name":"Yu Liu","orcid":"https://orcid.org/0000-0002-4191-5974"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yu Liu","raw_affiliation_strings":["School of Automation Science and Engineering, South China University of Technology, Guangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-4191-5974","affiliations":[{"raw_affiliation_string":"School of Automation Science and Engineering, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010361778","display_name":"Gengchen Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gengchen Zhang","raw_affiliation_strings":["School of Automation Science and Engineering, South China University of Technology, Guangzhou, China"],"raw_orcid":"https://orcid.org/0009-0002-1851-4838","affiliations":[{"raw_affiliation_string":"School of Automation Science and Engineering, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025834715","display_name":"Xing Li","orcid":"https://orcid.org/0000-0002-4920-806X"},"institutions":[{"id":"https://openalex.org/I2799850029","display_name":"Dongguan University of Technology","ror":"https://ror.org/01m8p7q42","country_code":"CN","type":"education","lineage":["https://openalex.org/I2799850029"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xing Li","raw_affiliation_strings":["School of Electrical Engineering and Intelligentization, Dongguan University of Technology, Dongguan, China"],"raw_orcid":"https://orcid.org/0000-0002-4920-806X","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Intelligentization, Dongguan University of Technology, Dongguan, China","institution_ids":["https://openalex.org/I2799850029"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5068679305"],"corresponding_institution_ids":["https://openalex.org/I90610280"],"apc_list":null,"apc_paid":null,"fwci":3.171,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.91312978,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9876999855041504,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9876999855041504,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9735000133514404,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9506000280380249,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/one-shot","display_name":"One shot","score":0.5337154865264893},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49443578720092773},{"id":"https://openalex.org/keywords/transfer-of-learning","display_name":"Transfer of learning","score":0.4702928066253662},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2812843322753906},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12879633903503418}],"concepts":[{"id":"https://openalex.org/C2992734406","wikidata":"https://www.wikidata.org/wiki/Q413267","display_name":"One shot","level":2,"score":0.5337154865264893},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49443578720092773},{"id":"https://openalex.org/C150899416","wikidata":"https://www.wikidata.org/wiki/Q1820378","display_name":"Transfer of learning","level":2,"score":0.4702928066253662},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2812843322753906},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12879633903503418},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3568997","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3568997","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G165371350","display_name":null,"funder_award_id":"62273095","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4482583160","display_name":null,"funder_award_id":"62433011","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5006912042","display_name":null,"funder_award_id":"2021B0101200001","funder_id":"https://openalex.org/F4320336405","funder_display_name":"Special Project for Research and Development in Key areas of Guangdong Province"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320336405","display_name":"Special Project for Research and Development in Key areas of Guangdong Province","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":48,"referenced_works":["https://openalex.org/W1536680647","https://openalex.org/W2193145675","https://openalex.org/W2418691539","https://openalex.org/W2565639579","https://openalex.org/W2589306531","https://openalex.org/W2770908349","https://openalex.org/W2788210750","https://openalex.org/W2793387000","https://openalex.org/W2902856291","https://openalex.org/W2944303778","https://openalex.org/W2963037989","https://openalex.org/W2963786238","https://openalex.org/W2989676862","https://openalex.org/W3039107295","https://openalex.org/W3096609285","https://openalex.org/W3096857588","https://openalex.org/W3097651496","https://openalex.org/W3119943851","https://openalex.org/W3154360923","https://openalex.org/W3165924482","https://openalex.org/W3169575272","https://openalex.org/W3169708801","https://openalex.org/W3195969653","https://openalex.org/W3199093552","https://openalex.org/W3217496751","https://openalex.org/W4211237505","https://openalex.org/W4213022356","https://openalex.org/W4214627427","https://openalex.org/W4281787891","https://openalex.org/W4289535682","https://openalex.org/W4294608622","https://openalex.org/W4294811295","https://openalex.org/W4295308345","https://openalex.org/W4312312588","https://openalex.org/W4312642299","https://openalex.org/W4312651322","https://openalex.org/W4380032292","https://openalex.org/W4385245566","https://openalex.org/W4386071535","https://openalex.org/W4390872318","https://openalex.org/W4399301962","https://openalex.org/W4402754006","https://openalex.org/W6620707391","https://openalex.org/W6768454739","https://openalex.org/W6774983715","https://openalex.org/W6784094891","https://openalex.org/W6793267612","https://openalex.org/W6811230874"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"Defect":[0,66],"detection,":[1],"which":[2],"ensures":[3],"production":[4],"stability":[5],"and":[6,40,67,70,127,183],"final":[7],"product":[8],"quality,":[9],"is":[10,214],"a":[11,49,100,121],"critical":[12],"part":[13],"of":[14,23,26,36,65,117,124,139,187,198],"modern":[15],"intelligent":[16],"manufacturing":[17],"processes.":[18],"To":[19,167],"address":[20],"the":[21,24,28,34,79,86,96,106,113,118,129,137,140,156,185,199],"challenge":[22],"difficulty":[25],"training":[27],"large":[29],"model":[30,97,119],"networks":[31],"due":[32],"to":[33,78,82,85,111,135,154],"scarcity":[35],"labeled":[37],"negative":[38],"samples":[39,126],"detecting":[41],"defects":[42],"with":[43,194],"ambiguous":[44],"semantic":[45],"features,":[46],"we":[47,172],"propose":[48],"novel":[50],"few-shot":[51,87,175,190,211],"defect":[52,88,107,114,125,176,181,207],"detection":[53,89,159,192,208],"method":[54,204],"based":[55],"on":[56],"transfer":[57],"learning,":[58],"called":[59],"Hint-DETR.":[60,195],"Two":[61],"modules,":[62],"Memory":[63],"Bank":[64],"Background":[68],"(MBDB)":[69],"Spatial":[71],"Feature":[72],"Information":[73],"Prompt":[74],"(SFIP),":[75],"were":[76],"added":[77],"DETR":[80,157],"network":[81],"adapt":[83],"it":[84],"task.":[90],"The":[91,143,196],"MBDB":[92],"module":[93,145],"can":[94],"assist":[95],"in":[98,210],"learning":[99],"memory":[101],"bank":[102],"that":[103,202],"contains":[104,128],"all":[105],"class":[108],"feature":[109,148,152],"information":[110,149],"improve":[112],"perception":[115],"ability":[116,160],"using":[120,178],"small":[122],"number":[123],"background":[130],"suppression":[131],"loss":[132],"function":[133],"designed":[134],"reduce":[136],"interference":[138],"complex":[141],"background.":[142],"SFIP":[144],"extracts":[146],"spatial":[147],"from":[150],"multi-scale":[151,162],"maps":[153],"enhance":[155],"network\u2019s":[158],"for":[161],"targets,":[163],"particularly":[164],"small-scale":[165],"targets.":[166],"assess":[168],"our":[169,203],"method\u2019s":[170],"performance,":[171],"created":[173],"two":[174],"datasets":[177,182],"publicly":[179],"available":[180,215],"compared":[184],"performance":[186],"some":[188],"state-of-the-art":[189],"object":[191],"methods":[193],"results":[197],"experiment":[200],"demonstrate":[201],"has":[205],"superior":[206],"capability":[209],"settings.":[212],"Code":[213],"at":[216],"https://github.com/yunyou727/Hint-DETR.":[217]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}