{"id":"https://openalex.org/W4410294754","doi":"https://doi.org/10.1109/tim.2025.3568972","title":"Hybrid Resolver Model Generalization for Fault Condition Modeling: A Promising Tool for Reliability Study","display_name":"Hybrid Resolver Model Generalization for Fault Condition Modeling: A Promising Tool for Reliability Study","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4410294754","doi":"https://doi.org/10.1109/tim.2025.3568972"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3568972","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3568972","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090035558","display_name":"MohammadSadegh KhajueeZadeh","orcid":"https://orcid.org/0000-0002-9839-8111"},"institutions":[{"id":"https://openalex.org/I141945490","display_name":"University of British Columbia","ror":"https://ror.org/03rmrcq20","country_code":"CA","type":"education","lineage":["https://openalex.org/I141945490"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Mohammadsadegh Khajueezadeh","raw_affiliation_strings":["Electrical and Computer Engineering Department, The University of British Columbia, Vancouver, BC, Canada","Electrical and Computer Engineering Department, The University of British Columbia, Canada"],"raw_orcid":"https://orcid.org/0000-0002-9839-8111","affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, The University of British Columbia, Vancouver, BC, Canada","institution_ids":["https://openalex.org/I141945490"]},{"raw_affiliation_string":"Electrical and Computer Engineering Department, The University of British Columbia, Canada","institution_ids":["https://openalex.org/I141945490"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051162034","display_name":"Farid Tootoonchian","orcid":"https://orcid.org/0000-0002-9955-7591"},"institutions":[{"id":"https://openalex.org/I67009956","display_name":"Iran University of Science and Technology","ror":"https://ror.org/01jw2p796","country_code":"IR","type":"education","lineage":["https://openalex.org/I67009956"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Farid Tootoonchian","raw_affiliation_strings":["Department of Electrical Engineering, Iran University of Science and Technology, Tehran, Iran"],"raw_orcid":"https://orcid.org/0000-0002-9955-7591","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Iran University of Science and Technology, Tehran, Iran","institution_ids":["https://openalex.org/I67009956"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5115024082","display_name":"Ali Pourghoraba","orcid":null},"institutions":[{"id":"https://openalex.org/I67009956","display_name":"Iran University of Science and Technology","ror":"https://ror.org/01jw2p796","country_code":"IR","type":"education","lineage":["https://openalex.org/I67009956"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Ali Pourghoraba","raw_affiliation_strings":["Department of Electrical Engineering, Iran University of Science and Technology, Tehran, Iran"],"raw_orcid":"https://orcid.org/0009-0003-1529-2392","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Iran University of Science and Technology, Tehran, Iran","institution_ids":["https://openalex.org/I67009956"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.1081,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.78258311,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9884999990463257,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9876999855041504,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resolver","display_name":"Resolver","score":0.9179038405418396},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6171404123306274},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5619184970855713},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5544169545173645},{"id":"https://openalex.org/keywords/generalization","display_name":"Generalization","score":0.5223977565765381},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.47250688076019287},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28531962633132935},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1366252601146698},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08610504865646362}],"concepts":[{"id":"https://openalex.org/C80156102","wikidata":"https://www.wikidata.org/wiki/Q788036","display_name":"Resolver","level":3,"score":0.9179038405418396},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6171404123306274},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5619184970855713},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5544169545173645},{"id":"https://openalex.org/C177148314","wikidata":"https://www.wikidata.org/wiki/Q170084","display_name":"Generalization","level":2,"score":0.5223977565765381},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.47250688076019287},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28531962633132935},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1366252601146698},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08610504865646362},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3568972","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3568972","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","score":0.47999998927116394,"display_name":"Climate action"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1862524646","https://openalex.org/W2901250616","https://openalex.org/W2968509939","https://openalex.org/W3026160111","https://openalex.org/W3111196876","https://openalex.org/W3161474042","https://openalex.org/W3162877656","https://openalex.org/W3163067897","https://openalex.org/W3168704517","https://openalex.org/W3184906701","https://openalex.org/W4234418117","https://openalex.org/W4309235167","https://openalex.org/W4312686148","https://openalex.org/W4312785826","https://openalex.org/W4320005596","https://openalex.org/W4379033944","https://openalex.org/W4385569710","https://openalex.org/W4386879108","https://openalex.org/W4391807818","https://openalex.org/W4394896892"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4233600955","https://openalex.org/W4322734194","https://openalex.org/W3116237489","https://openalex.org/W4404996554","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935"],"abstract_inverted_index":{"Resolvers,":[0],"like":[1],"all":[2],"electromagnetic":[3],"devices,":[4],"are":[5,103],"constantly":[6],"under":[7,87],"investigation,":[8],"both":[9,207],"operationally":[10],"and":[11,97,172,179,193,209,215,227],"structurally.":[12],"In":[13,49],"this":[14,50],"regard,":[15],"proposing":[16],"a":[17,29,52,78,116,132,138],"modeling":[18],"methodology":[19],"that":[20],"can":[21],"save":[22],"significant":[23,203],"time":[24,204],"without":[25],"compromising":[26],"accuracy":[27,231],"is":[28,56,124,135,225],"big":[30],"honor,":[31],"as":[32,115,137,175,177],"each":[33],"of":[34,45,75,81,99,101,108,165,189,217,232],"the":[35,46,62,73,106,143,154,160,187,190,213,218,222,230,233],"other":[36],"analytical":[37],"methodologies":[38],"fails":[39],"to":[40,61,68,141,149,157],"meet":[41],"at":[42],"least":[43],"one":[44],"above":[47,63],"conditions.":[48],"study,":[51],"generalized":[53],"hybrid":[54],"model":[55,112,156,192,235],"suggested":[57,144,155,191,219,234],"that,":[58],"in":[59,72,93,105,147,170,206],"addition":[60],"benefits,":[64],"has":[65],"sufficient":[66],"capability":[67],"ease":[69],"reliability":[70],"study":[71,140,224],"field":[74],"resolvers,":[76],"where":[77],"large":[79,121],"number":[80],"faulty":[82,163,210],"conditions":[83,164],"must":[84],"be":[85],"investigated":[86],"different":[88],"operating":[89],"conditions,":[90,211],"including":[91],"changes":[92],"angular":[94],"velocity,":[95],"voltage,":[96],"frequency":[98],"excitation\u2014all":[100],"which":[102,123],"highlighted":[104],"context":[107],"fault":[109,127],"coverage.":[110],"This":[111],"also":[113],"serves":[114],"promising":[117],"tool":[118],"for":[119,126,159],"generating":[120],"datasets,":[122],"advantageous":[125],"diagnosis.":[128],"A":[129],"resolver":[130],"with":[131,202],"non-uniform":[133],"airgap":[134],"chosen":[136],"case":[139,223],"challenge":[142],"model,":[145],"particularly":[146],"relation":[148],"eccentricity":[150,181],"faults.":[151,182],"We":[152],"generalize":[153],"account":[158],"most":[161],"common":[162],"resolvers:":[166],"inter-turn":[167],"short":[168],"circuits":[169],"signal":[171],"excitation":[173],"windings,":[174],"well":[176],"static":[178],"dynamic":[180],"The":[183],"close":[184],"agreement":[185],"between":[186],"results":[188],"those":[194],"from":[195],"Time-Stepping":[196],"Finite":[197],"Element":[198],"Analysis":[199],"(TS-FEA),":[200],"along":[201],"savings":[205],"healthy":[208],"highlights":[212],"generality":[214],"proficiency":[216],"model.":[220],"Finally,":[221],"prototyped,":[226],"we":[228],"verify":[229],"experimentally.":[236]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}