{"id":"https://openalex.org/W4410342950","doi":"https://doi.org/10.1109/tim.2025.3568966","title":"Generative Models Training Based on FEM Simulations Toward Improved Defect Detection","display_name":"Generative Models Training Based on FEM Simulations Toward Improved Defect Detection","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4410342950","doi":"https://doi.org/10.1109/tim.2025.3568966"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3568966","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3568966","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5092948292","display_name":"Anastasios Tzelepakis","orcid":"https://orcid.org/0009-0004-4341-5852"},"institutions":[{"id":"https://openalex.org/I4210093649","display_name":"Information Technologies Institute","ror":"https://ror.org/0069akp70","country_code":"GR","type":"nonprofit","lineage":["https://openalex.org/I4210093649"]},{"id":"https://openalex.org/I4210134249","display_name":"Centre for Research and Technology Hellas","ror":"https://ror.org/03bndpq63","country_code":"GR","type":"facility","lineage":["https://openalex.org/I4210134249"]}],"countries":["GR"],"is_corresponding":true,"raw_author_name":"Anastasios Tzelepakis","raw_affiliation_strings":["Information Technologies Institute, Centre for Research and Technology Hellas, Thessaloniki, Greece"],"affiliations":[{"raw_affiliation_string":"Information Technologies Institute, Centre for Research and Technology Hellas, Thessaloniki, Greece","institution_ids":["https://openalex.org/I4210093649","https://openalex.org/I4210134249"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013666330","display_name":"Nikolaos Dimitriou","orcid":"https://orcid.org/0000-0002-6650-7758"},"institutions":[{"id":"https://openalex.org/I4210093649","display_name":"Information Technologies Institute","ror":"https://ror.org/0069akp70","country_code":"GR","type":"nonprofit","lineage":["https://openalex.org/I4210093649"]},{"id":"https://openalex.org/I4210134249","display_name":"Centre for Research and Technology Hellas","ror":"https://ror.org/03bndpq63","country_code":"GR","type":"facility","lineage":["https://openalex.org/I4210134249"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Nikolaos Dimitriou","raw_affiliation_strings":["Information Technologies Institute, Centre for Research and Technology Hellas, Thessaloniki, Greece"],"affiliations":[{"raw_affiliation_string":"Information Technologies Institute, Centre for Research and Technology Hellas, Thessaloniki, Greece","institution_ids":["https://openalex.org/I4210093649","https://openalex.org/I4210134249"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078900673","display_name":"Paschalis Charalampous","orcid":"https://orcid.org/0000-0002-9399-4387"},"institutions":[{"id":"https://openalex.org/I4210093649","display_name":"Information Technologies Institute","ror":"https://ror.org/0069akp70","country_code":"GR","type":"nonprofit","lineage":["https://openalex.org/I4210093649"]},{"id":"https://openalex.org/I4210134249","display_name":"Centre for Research and Technology Hellas","ror":"https://ror.org/03bndpq63","country_code":"GR","type":"facility","lineage":["https://openalex.org/I4210134249"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Paschalis Charalampous","raw_affiliation_strings":["Information Technologies Institute, Centre for Research and Technology Hellas, Thessaloniki, Greece"],"affiliations":[{"raw_affiliation_string":"Information Technologies Institute, Centre for Research and Technology Hellas, Thessaloniki, Greece","institution_ids":["https://openalex.org/I4210093649","https://openalex.org/I4210134249"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048357181","display_name":"Konstantinos Tsongas","orcid":"https://orcid.org/0000-0001-7050-5432"},"institutions":[{"id":"https://openalex.org/I183898223","display_name":"International Hellenic University","ror":"https://ror.org/00708jp83","country_code":"GR","type":"education","lineage":["https://openalex.org/I183898223"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Konstantinos Tsongas","raw_affiliation_strings":["Industrial Engineering and Management Department, International Hellenic University, Thessaloniki, Greece"],"affiliations":[{"raw_affiliation_string":"Industrial Engineering and Management Department, International Hellenic University, Thessaloniki, Greece","institution_ids":["https://openalex.org/I183898223"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029519781","display_name":"Dimitrios Tzetzis","orcid":"https://orcid.org/0000-0001-5006-5759"},"institutions":[{"id":"https://openalex.org/I183898223","display_name":"International Hellenic University","ror":"https://ror.org/00708jp83","country_code":"GR","type":"education","lineage":["https://openalex.org/I183898223"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Dimitrios Tzetzis","raw_affiliation_strings":["Digital Manufacturing and Materials Characterization Laboratory, School of Science and Technology, International Hellenic University, Thessaloniki, Greece","School of Science and Technology, Digital Manufacturing and Materials Characterization Laboratory, International Hellenic University, Thessaloniki, Greece"],"affiliations":[{"raw_affiliation_string":"Digital Manufacturing and Materials Characterization Laboratory, School of Science and Technology, International Hellenic University, Thessaloniki, Greece","institution_ids":["https://openalex.org/I183898223"]},{"raw_affiliation_string":"School of Science and Technology, Digital Manufacturing and Materials Characterization Laboratory, International Hellenic University, Thessaloniki, Greece","institution_ids":["https://openalex.org/I183898223"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087452615","display_name":"Dimitrios Tzovaras","orcid":"https://orcid.org/0000-0001-6915-6722"},"institutions":[{"id":"https://openalex.org/I4210093649","display_name":"Information Technologies Institute","ror":"https://ror.org/0069akp70","country_code":"GR","type":"nonprofit","lineage":["https://openalex.org/I4210093649"]},{"id":"https://openalex.org/I4210134249","display_name":"Centre for Research and Technology Hellas","ror":"https://ror.org/03bndpq63","country_code":"GR","type":"facility","lineage":["https://openalex.org/I4210134249"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Dimitrios Tzovaras","raw_affiliation_strings":["Information Technologies Institute, Centre for Research and Technology Hellas, Thessaloniki, Greece"],"affiliations":[{"raw_affiliation_string":"Information Technologies Institute, Centre for Research and Technology Hellas, Thessaloniki, Greece","institution_ids":["https://openalex.org/I4210093649","https://openalex.org/I4210134249"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5092948292"],"corresponding_institution_ids":["https://openalex.org/I4210093649","https://openalex.org/I4210134249"],"apc_list":null,"apc_paid":null,"fwci":2.3748,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.88761892,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9800000190734863,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9800000190734863,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9592000246047974,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.6878020167350769},{"id":"https://openalex.org/keywords/training","display_name":"Training (meteorology)","score":0.6753427982330322},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5627228617668152},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.47224682569503784},{"id":"https://openalex.org/keywords/generative-grammar","display_name":"Generative grammar","score":0.46859923005104065},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3906533718109131},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3724900484085083},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2405206859111786},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.1652507781982422},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11052942276000977}],"concepts":[{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.6878020167350769},{"id":"https://openalex.org/C2777211547","wikidata":"https://www.wikidata.org/wiki/Q17141490","display_name":"Training (meteorology)","level":2,"score":0.6753427982330322},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5627228617668152},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.47224682569503784},{"id":"https://openalex.org/C39890363","wikidata":"https://www.wikidata.org/wiki/Q36108","display_name":"Generative grammar","level":2,"score":0.46859923005104065},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3906533718109131},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3724900484085083},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2405206859111786},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.1652507781982422},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11052942276000977},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3568966","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2025.3568966","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G6906693415","display_name":null,"funder_award_id":"ENCIRCLE","funder_id":"https://openalex.org/F4320334322","funder_display_name":"HORIZON EUROPE Framework Programme"},{"id":"https://openalex.org/G736715944","display_name":null,"funder_award_id":"958264","funder_id":"https://openalex.org/F4320320300","funder_display_name":"European Commission"}],"funders":[{"id":"https://openalex.org/F4320320300","display_name":"European Commission","ror":"https://ror.org/00k4n6c32"},{"id":"https://openalex.org/F4320334322","display_name":"HORIZON EUROPE Framework Programme","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1541162015","https://openalex.org/W1901129140","https://openalex.org/W2028900022","https://openalex.org/W2084646644","https://openalex.org/W2168069928","https://openalex.org/W2810922123","https://openalex.org/W2987128843","https://openalex.org/W2998636909","https://openalex.org/W3019560754","https://openalex.org/W3020892735","https://openalex.org/W3100487172","https://openalex.org/W3120387510","https://openalex.org/W3135198812","https://openalex.org/W3192859305","https://openalex.org/W3194250276","https://openalex.org/W4224253391","https://openalex.org/W4224982622","https://openalex.org/W4225834168","https://openalex.org/W4285213318","https://openalex.org/W4319597842","https://openalex.org/W4365505756","https://openalex.org/W4388705578","https://openalex.org/W4390357076","https://openalex.org/W4400906024","https://openalex.org/W4404317078","https://openalex.org/W6720275808"],"related_works":["https://openalex.org/W230091440","https://openalex.org/W2380075625","https://openalex.org/W2233261550","https://openalex.org/W2810751659","https://openalex.org/W258997015","https://openalex.org/W2997094352","https://openalex.org/W3216976533","https://openalex.org/W100620283","https://openalex.org/W2495260952","https://openalex.org/W4366179611"],"abstract_inverted_index":{"Defect":[0],"prediction":[1],"and":[2,108,123],"quality":[3],"control":[4],"are":[5,27],"critical":[6],"in":[7,89,134],"manufacturing,":[8,74],"where":[9],"Convolutional":[10],"Neural":[11],"Networks":[12],"(CNNs)":[13],"demonstrate":[14],"significant":[15],"potential.":[16],"However,":[17],"traditional":[18,97],"Finite":[19],"Element":[20],"Method":[21],"(FEM)":[22],"simulations,":[23,60],"despite":[24],"their":[25],"accuracy,":[26],"hindered":[28],"by":[29],"high":[30],"computational":[31],"demands.":[32],"This":[33],"paper":[34],"introduces":[35],"a":[36,65,102,121],"novel":[37],"framework":[38,85],"that":[39],"integrates":[40],"FEM":[41,59,99],"simulations":[42,129],"with":[43,113,130],"generative":[44,66],"CNNs":[45],"to":[46,68,126],"predict":[47,69],"strain":[48,70,78],"distributions":[49,71],"during":[50,72],"antenna":[51,73],"manufacturing.":[52,135],"By":[53],"employing":[54],"physics-informed":[55],"dataset":[56],"generation":[57],"from":[58],"the":[61,84,94,117],"proposed":[62],"method":[63],"trains":[64],"CNN":[67],"enabling":[75],"physically":[76],"consistent":[77],"predictions.":[79],"Validated":[80],"against":[81],"FEM-calculated":[82],"data,":[83],"demonstrates":[86],"its":[87],"efficacy":[88],"defect":[90],"prevention,":[91],"while":[92],"addressing":[93],"limitations":[95],"of":[96,105],"offline":[98],"capabilities.":[100],"Furthermore,":[101],"comprehensive":[103],"analysis":[104],"weight":[106],"initialization":[107],"cost":[109],"function":[110],"choices,":[111],"along":[112],"experimental":[114],"validation,":[115],"highlights":[116],"method\u2019s":[118],"efficiency,":[119],"establishing":[120],"cost-effective":[122],"practical":[124],"approach":[125],"integrating":[127],"numerical":[128],"CNN-based":[131],"deep":[132],"learning":[133]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-05-14T00:00:00"}