{"id":"https://openalex.org/W4410295580","doi":"https://doi.org/10.1109/tim.2025.3568960","title":"Characterization of Matrix Profile Technique for Enhanced Detection of Events in Sampled Values Data Streams","display_name":"Characterization of Matrix Profile Technique for Enhanced Detection of Events in Sampled Values Data Streams","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4410295580","doi":"https://doi.org/10.1109/tim.2025.3568960"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3568960","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2025.3568960","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/tim.2025.3568960","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057770797","display_name":"Paolo Castello","orcid":"https://orcid.org/0000-0002-8767-6243"},"institutions":[{"id":"https://openalex.org/I172446870","display_name":"University of Cagliari","ror":"https://ror.org/003109y17","country_code":"IT","type":"education","lineage":["https://openalex.org/I172446870"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Paolo Castello","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, University of Cagliari, Cagliari, Italy"],"raw_orcid":"https://orcid.org/0000-0002-8767-6243","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, University of Cagliari, Cagliari, Italy","institution_ids":["https://openalex.org/I172446870"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008004705","display_name":"Guglielmo Frigo","orcid":"https://orcid.org/0000-0002-5762-4354"},"institutions":[{"id":"https://openalex.org/I4210103407","display_name":"Swiss Federal Institute of Metrology","ror":"https://ror.org/0115xv923","country_code":"CH","type":"government","lineage":["https://openalex.org/I4210103407"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Guglielmo Frigo","raw_affiliation_strings":["Electrical Energy and Power Laboratory, Federal Institute of Metrology METAS, Bern-Wabern, Switzerland"],"raw_orcid":"https://orcid.org/0000-0002-5762-4354","affiliations":[{"raw_affiliation_string":"Electrical Energy and Power Laboratory, Federal Institute of Metrology METAS, Bern-Wabern, Switzerland","institution_ids":["https://openalex.org/I4210103407"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084721120","display_name":"Davide Sitzia","orcid":"https://orcid.org/0000-0003-3014-2555"},"institutions":[{"id":"https://openalex.org/I172446870","display_name":"University of Cagliari","ror":"https://ror.org/003109y17","country_code":"IT","type":"education","lineage":["https://openalex.org/I172446870"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Davide Sitzia","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, University of Cagliari, Cagliari, Italy"],"raw_orcid":"https://orcid.org/0000-0003-3014-2555","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, University of Cagliari, Cagliari, Italy","institution_ids":["https://openalex.org/I172446870"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074674050","display_name":"Sara Sulis","orcid":"https://orcid.org/0000-0002-8848-426X"},"institutions":[{"id":"https://openalex.org/I172446870","display_name":"University of Cagliari","ror":"https://ror.org/003109y17","country_code":"IT","type":"education","lineage":["https://openalex.org/I172446870"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Sara Sulis","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, University of Cagliari, Cagliari, Italy"],"raw_orcid":"https://orcid.org/0000-0002-8848-426X","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, University of Cagliari, Cagliari, Italy","institution_ids":["https://openalex.org/I172446870"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":5.6138,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.95382224,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12761","display_name":"Data Stream Mining Techniques","score":0.9810000061988831,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12761","display_name":"Data Stream Mining Techniques","score":0.9810000061988831,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10320","display_name":"Neural Networks and Applications","score":0.9347000122070312,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9150000214576721,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/streams","display_name":"STREAMS","score":0.5913699865341187},{"id":"https://openalex.org/keywords/matrix","display_name":"Matrix (chemical analysis)","score":0.535226047039032},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.4371304512023926},{"id":"https://openalex.org/keywords/data-stream-mining","display_name":"Data stream mining","score":0.42449259757995605},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.35163649916648865},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3049735724925995},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.2819536328315735}],"concepts":[{"id":"https://openalex.org/C42090638","wikidata":"https://www.wikidata.org/wiki/Q4048907","display_name":"STREAMS","level":2,"score":0.5913699865341187},{"id":"https://openalex.org/C106487976","wikidata":"https://www.wikidata.org/wiki/Q685816","display_name":"Matrix (chemical analysis)","level":2,"score":0.535226047039032},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.4371304512023926},{"id":"https://openalex.org/C89198739","wikidata":"https://www.wikidata.org/wiki/Q3079880","display_name":"Data stream mining","level":2,"score":0.42449259757995605},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35163649916648865},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3049735724925995},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2819536328315735},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2025.3568960","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2025.3568960","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:iris.unica.it:11584/448445","is_oa":true,"landing_page_url":"https://ieeexplore.ieee.org/document/11000336","pdf_url":null,"source":{"id":"https://openalex.org/S4377196293","display_name":"UNICA IRIS Institutional Research Information System (University of Cagliari)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I172446870","host_organization_name":"University of Cagliari","host_organization_lineage":["https://openalex.org/I172446870"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.1109/tim.2025.3568960","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2025.3568960","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1998099960","https://openalex.org/W2019971481","https://openalex.org/W2053853038","https://openalex.org/W2126704684","https://openalex.org/W2132984323","https://openalex.org/W2168702748","https://openalex.org/W2557519602","https://openalex.org/W2562415914","https://openalex.org/W2583336059","https://openalex.org/W2584499795","https://openalex.org/W2765281869","https://openalex.org/W2954179392","https://openalex.org/W2963440486","https://openalex.org/W3004164154","https://openalex.org/W3009415957","https://openalex.org/W3145645118","https://openalex.org/W3209220199","https://openalex.org/W4248442892","https://openalex.org/W4253167061","https://openalex.org/W4254168075","https://openalex.org/W4283746682","https://openalex.org/W4285128214","https://openalex.org/W4292547173","https://openalex.org/W4312341648","https://openalex.org/W4323663366","https://openalex.org/W4381194881","https://openalex.org/W4385621222","https://openalex.org/W4387385615","https://openalex.org/W4388116259","https://openalex.org/W4390120242","https://openalex.org/W4391305548","https://openalex.org/W4403276932","https://openalex.org/W6803203626"],"related_works":["https://openalex.org/W4293083682","https://openalex.org/W2061507057","https://openalex.org/W807005383","https://openalex.org/W2182399080","https://openalex.org/W1501624740","https://openalex.org/W1984941792","https://openalex.org/W2369440580","https://openalex.org/W2106570241","https://openalex.org/W3144654663","https://openalex.org/W2109863941"],"abstract_inverted_index":{"In":[0,82],"the":[1,17,21,25,36,47,73,79,99,106,114,138,152],"architecture":[2],"described":[3],"by":[4],"IEC":[5],"61850":[6],"standards,":[7],"merging":[8,13],"units":[9,14],"(MUs)":[10],"and":[11,32,38,72,104,147,158,164,196],"stand-alone":[12],"(SAMUs)":[15],"are":[16,171],"initial":[18],"elements":[19],"in":[20,78,95,126,151,185],"measurement":[22],"chain,":[23],"with":[24,178],"main":[26],"function":[27,91],"of":[28,49,51,65,113,137,154,200],"acquiring":[29],"analog":[30],"voltage":[31,133],"current":[33],"signals,":[34],"digitizing":[35],"samples":[37,155],"transmitting":[39],"them":[40],"to":[41,62,75,92,119,194,206],"intelligent":[42],"electronic":[43],"devices":[44],"(IEDs)":[45],"for":[46,123,182],"evaluation":[48],"metrics":[50],"interest.":[52],"Since":[53],"they":[54],"produce":[55],"digital":[56],"data,":[57],"it":[58],"is":[59,117,141,176],"therefore":[60],"possible":[61],"design":[63],"extensions":[64],"their":[66],"functionality":[67],"that":[68],"include":[69],"data":[70],"processing":[71],"ability":[74],"identify":[76],"events":[77,131,170],"power":[80],"grids.":[81],"this":[83,85],"context,":[84],"paper":[86],"characterizes":[87],"an":[88],"event":[89],"identification":[90],"be":[93],"implemented":[94],"MUs,":[96],"based":[97],"on":[98],"matrix":[100],"profile":[101],"(MP)":[102],"technique":[103,116,140],"considering":[105],"Python":[107],"library":[108],"Stumpy.":[109],"A":[110],"comprehensive":[111],"characterization":[112],"MP":[115,139,174],"presented":[118],"evaluate":[120],"its":[121,192,198],"effectiveness":[122],"identifying":[124],"discords":[125],"signals":[127,163],"such":[128,167],"as":[129,168],"rapid":[130],"or":[132],"dips.":[134],"The":[135,173,188],"behavior":[136],"analyzed":[142],"under":[143],"different":[144,159],"signal":[145],"conditions":[146,166],"configurations,":[148],"including":[149],"variations":[150],"number":[153],"per":[156],"cycle":[157],"window":[160],"lengths.":[161],"Noisy":[162],"challenging":[165],"overlapping":[169],"considered.":[172],"performance":[175],"compared":[177],"other":[179],"techniques":[180],"used":[181],"discord":[183],"detection":[184],"time":[186],"series.":[187],"results":[189],"obtained":[190],"prove":[191],"robustness":[193],"noise":[195],"confirm":[197],"ease":[199],"use,":[201],"needing":[202],"only":[203],"one":[204],"parameter":[205],"operate.":[207]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":1}],"updated_date":"2026-08-12T21:12:35.861297","created_date":"2025-10-10T00:00:00"}