{"id":"https://openalex.org/W4409537047","doi":"https://doi.org/10.1109/tim.2025.3561772","title":"Determination of Parasitic Inductance of Surge Protective Devices","display_name":"Determination of Parasitic Inductance of Surge Protective Devices","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4409537047","doi":"https://doi.org/10.1109/tim.2025.3561772"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2025.3561772","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2025.3561772","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/tim.2025.3561772","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036577968","display_name":"Alexandros Y. Hadjicostas","orcid":"https://orcid.org/0000-0002-2871-1686"},"institutions":[{"id":"https://openalex.org/I21370196","display_name":"Aristotle University of Thessaloniki","ror":"https://ror.org/02j61yw88","country_code":"GR","type":"education","lineage":["https://openalex.org/I21370196"]}],"countries":["GR"],"is_corresponding":true,"raw_author_name":"Alexandros Y. Hadjicostas","raw_affiliation_strings":["High Voltage Laboratory, School of Electrical and Computer Engineering, Aristotle University of Thessaloniki, Thessaloniki, Greece","School of Electrical and Computer Engineering, High Voltage Laboratory, Aristotle University of Thessaloniki, Thessaloniki, Greece"],"affiliations":[{"raw_affiliation_string":"High Voltage Laboratory, School of Electrical and Computer Engineering, Aristotle University of Thessaloniki, Thessaloniki, Greece","institution_ids":["https://openalex.org/I21370196"]},{"raw_affiliation_string":"School of Electrical and Computer Engineering, High Voltage Laboratory, Aristotle University of Thessaloniki, Thessaloniki, Greece","institution_ids":["https://openalex.org/I21370196"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016445351","display_name":"Andreas I. Chrysochos","orcid":"https://orcid.org/0000-0002-5712-3859"},"institutions":[{"id":"https://openalex.org/I2800885372","display_name":"Hellenic Telecommunications Organization (Greece)","ror":"https://ror.org/031e3n874","country_code":"GR","type":"company","lineage":["https://openalex.org/I2800885372"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Andreas I. Chrysochos","raw_affiliation_strings":["Research and Development Department, Hellenic Cables, Maroussi, Athens, Greece","R&D Department, Hellenic Cables, Maroussi, Athens, Greece"],"affiliations":[{"raw_affiliation_string":"Research and Development Department, Hellenic Cables, Maroussi, Athens, Greece","institution_ids":["https://openalex.org/I2800885372"]},{"raw_affiliation_string":"R&D Department, Hellenic Cables, Maroussi, Athens, Greece","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031885799","display_name":"Stylianos Koumlis","orcid":null},"institutions":[{"id":"https://openalex.org/I2800885372","display_name":"Hellenic Telecommunications Organization (Greece)","ror":"https://ror.org/031e3n874","country_code":"GR","type":"company","lineage":["https://openalex.org/I2800885372"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Stylianos Koumlis","raw_affiliation_strings":["Research and Development Department, Hellenic Cables, Maroussi, Athens, Greece","R&D Department, Hellenic Cables, Maroussi, Athens, Greece"],"affiliations":[{"raw_affiliation_string":"Research and Development Department, Hellenic Cables, Maroussi, Athens, Greece","institution_ids":["https://openalex.org/I2800885372"]},{"raw_affiliation_string":"R&D Department, Hellenic Cables, Maroussi, Athens, Greece","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040433468","display_name":"Georgios D. Peppas","orcid":"https://orcid.org/0000-0002-8791-1477"},"institutions":[{"id":"https://openalex.org/I55741626","display_name":"Technical University of Crete","ror":"https://ror.org/03f8bz564","country_code":"GR","type":"education","lineage":["https://openalex.org/I55741626"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Georgios D. Peppas","raw_affiliation_strings":["School of Electrical and Computer Engineering, Technical University of Crete, Chania, Greece","School of Electrical & Computer Engineering, Technical University of Crete, Chania, Greece"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Technical University of Crete, Chania, Greece","institution_ids":["https://openalex.org/I55741626"]},{"raw_affiliation_string":"School of Electrical & Computer Engineering, Technical University of Crete, Chania, Greece","institution_ids":["https://openalex.org/I55741626"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068523793","display_name":"Thomas E. Tsovilis","orcid":"https://orcid.org/0000-0001-8701-8761"},"institutions":[{"id":"https://openalex.org/I21370196","display_name":"Aristotle University of Thessaloniki","ror":"https://ror.org/02j61yw88","country_code":"GR","type":"education","lineage":["https://openalex.org/I21370196"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Thomas Tsovilis","raw_affiliation_strings":["High Voltage Laboratory, School of Electrical and Computer Engineering, Aristotle University of Thessaloniki, Thessaloniki, Greece","School of Electrical and Computer Engineering, High Voltage Laboratory, Aristotle University of Thessaloniki, Thessaloniki, Greece"],"affiliations":[{"raw_affiliation_string":"High Voltage Laboratory, School of Electrical and Computer Engineering, Aristotle University of Thessaloniki, Thessaloniki, Greece","institution_ids":["https://openalex.org/I21370196"]},{"raw_affiliation_string":"School of Electrical and Computer Engineering, High Voltage Laboratory, Aristotle University of Thessaloniki, Thessaloniki, Greece","institution_ids":["https://openalex.org/I21370196"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5036577968"],"corresponding_institution_ids":["https://openalex.org/I21370196"],"apc_list":null,"apc_paid":null,"fwci":3.7836,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.93620005,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"74","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14076","display_name":"Material Properties and Failure Mechanisms","score":0.9369999766349792,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14076","display_name":"Material Properties and Failure Mechanisms","score":0.9369999766349792,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13891","display_name":"Engineering Diagnostics and Reliability","score":0.9352999925613403,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.7370544672012329},{"id":"https://openalex.org/keywords/surge","display_name":"Surge","score":0.7091790437698364},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4819481074810028},{"id":"https://openalex.org/keywords/parasitic-element","display_name":"Parasitic element","score":0.45518583059310913},{"id":"https://openalex.org/keywords/parasitic-extraction","display_name":"Parasitic extraction","score":0.4265100657939911},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.422294557094574},{"id":"https://openalex.org/keywords/equivalent-series-inductance","display_name":"Equivalent series inductance","score":0.42096126079559326},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4102506637573242},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3626757562160492},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.35323143005371094},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3391364812850952},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.33682236075401306},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3361256718635559}],"concepts":[{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.7370544672012329},{"id":"https://openalex.org/C154108245","wikidata":"https://www.wikidata.org/wiki/Q287381","display_name":"Surge","level":2,"score":0.7091790437698364},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4819481074810028},{"id":"https://openalex.org/C71367568","wikidata":"https://www.wikidata.org/wiki/Q3363655","display_name":"Parasitic element","level":2,"score":0.45518583059310913},{"id":"https://openalex.org/C159818811","wikidata":"https://www.wikidata.org/wiki/Q7135947","display_name":"Parasitic extraction","level":2,"score":0.4265100657939911},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.422294557094574},{"id":"https://openalex.org/C141490761","wikidata":"https://www.wikidata.org/wiki/Q5384728","display_name":"Equivalent series inductance","level":4,"score":0.42096126079559326},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4102506637573242},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3626757562160492},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.35323143005371094},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3391364812850952},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.33682236075401306},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3361256718635559}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2025.3561772","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2025.3561772","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tim.2025.3561772","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2025.3561772","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/2","display_name":"Zero hunger","score":0.4099999964237213}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W1481924192","https://openalex.org/W2058450626","https://openalex.org/W2140954014","https://openalex.org/W2143638821","https://openalex.org/W2144058715","https://openalex.org/W2164993212","https://openalex.org/W2166031912","https://openalex.org/W2504158155","https://openalex.org/W2898242281","https://openalex.org/W2898251706","https://openalex.org/W2967174824","https://openalex.org/W2988876392","https://openalex.org/W3010374740","https://openalex.org/W3019573060","https://openalex.org/W3083992906","https://openalex.org/W3093596960","https://openalex.org/W3135603231","https://openalex.org/W3137527919","https://openalex.org/W3163861753","https://openalex.org/W3215924756","https://openalex.org/W4200593826","https://openalex.org/W4238360112","https://openalex.org/W4243304631","https://openalex.org/W4249584193","https://openalex.org/W4250482016","https://openalex.org/W4252959991","https://openalex.org/W4292261572","https://openalex.org/W4300377221","https://openalex.org/W4320006690","https://openalex.org/W4367164349","https://openalex.org/W4385574575","https://openalex.org/W4386495234","https://openalex.org/W4387038190","https://openalex.org/W4393171308","https://openalex.org/W4402979538","https://openalex.org/W4403331478","https://openalex.org/W4406046880","https://openalex.org/W6881889154"],"related_works":["https://openalex.org/W3205678237","https://openalex.org/W2039404188","https://openalex.org/W2371924276","https://openalex.org/W2116997708","https://openalex.org/W1989252551","https://openalex.org/W2142193574","https://openalex.org/W2131243320","https://openalex.org/W2511382130","https://openalex.org/W3023438983","https://openalex.org/W2010768602"],"abstract_inverted_index":{"This":[0,23],"work":[1],"investigates":[2],"the":[3,11,27,59,65,81,93,116,119,129,136,140,144,158,164,172,195],"effectiveness":[4],"of":[5,14,31,61,68,118,139,157,186],"various":[6],"state-of-the-art":[7],"techniques":[8],"for":[9,163,194],"determining":[10,128],"parasitic":[12,62,66,94,130,137],"inductance":[13,63,67,138],"surge":[15,32,74,146,160,167],"protective":[16,33,75,168],"devices":[17,34,76],"across":[18],"a":[19],"wide":[20],"frequency":[21],"range.":[22],"is":[24,77,133,149],"critical,":[25],"as":[26],"intrinsic":[28],"inductive":[29],"characteristics":[30],"influence":[35],"their":[36,43],"maximum":[37,173],"residual":[38,174],"voltage,":[39],"which":[40],"directly":[41],"affects":[42],"protection":[44,141,197],"efficiency":[45],"against":[46],"fast-front":[47],"transients":[48],"with":[49,84,189],"high":[50],"current":[51,102,147,161,185],"derivatives.":[52],"To":[53],"provide":[54],"an":[55,190],"innovative":[56],"solution":[57],"to":[58,91,114,151,181],"problem":[60],"determination,":[64],"single-phase":[69],"and":[70,104,122,170],"three-phase":[71,165],"DIN":[72],"rail":[73],"estimated":[78],"by":[79,177],"replacing":[80],"voltage-limiting":[82],"components":[83],"copper":[85],"blocks.":[86],"Three":[87],"methods":[88,121],"are":[89,112],"employed":[90],"estimate":[92],"inductance:":[95],"(i)":[96],"Impedance":[97],"spectroscopy":[98],"measurements,":[99],"(ii)":[100],"impulse":[101],"tests,":[103],"(iii)":[105],"finite":[106],"element":[107],"analysis":[108],"simulations.":[109],"The":[110],"results":[111],"analyzed":[113],"evaluate":[115],"accuracy":[117],"proposed":[120],"address":[123],"key":[124],"challenges":[125],"encountered":[126],"in":[127],"inductance.":[131],"It":[132],"found":[134],"that":[135,156],"mode":[142],"exhibiting":[143],"longer":[145],"path":[148,162],"up":[150],"1.6":[152],"times":[153],"greater":[154],"than":[155],"shortest":[159],"(3+1)":[166],"device,":[169],"consequently":[171],"voltage":[175],"increases":[176],"~10%":[178],"when":[179],"subjected":[180],"its":[182],"nominal":[183],"discharge":[184],"20":[187],"kA":[188],"8/20":[191],"\u03bcs":[192],"waveform":[193],"same":[196],"modes.":[198]},"counts_by_year":[{"year":2025,"cited_by_count":7}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}